Development of B‐doped Si multiple delta‐layer reference materials for SIMS profiling

B‐doped Si multiple delta‐layers (MDL) were developed as certified reference materials (CRM) for secondary ion mass spectrometry (SIMS) depth profiling analysis. Two CRMs with different delta‐layer spacing were grown by ion beam sputter deposition (IBSD). The nominal spacing of the MDL for shallow junction analysis is 10 nm and that for high energy SIMS is 50 nm. The total thickness of the film was certified by high resolution transmission electron microscopy (HR‐TEM). The B‐doped Si MDLs can be used to evaluate SIMS depth resolution and to calibrate the depth scale. A consistency check of the calibration of stylus profilometers for measurement of sputter depth is another possible application. The crater depths measured by a stylus profilometer showed a good linear relationship with the thickness measured from SIMS profiling using the calibrated film thickness for depth scale calibration. The sputtering rate of the amorphous Si thin film grown by sputter deposition was found to be the same as that of the crystalline Si substrate, which means that the sputtering rate measured with these CRMs can be applied to a real analysis of crystalline Si. Copyright © 2005 John Wiley & Sons, Ltd.     

New Phosphors for White LEDs

White light-emitting diodes (WLEDs) have matched the emission efficiency of florescent lights and will rapidly spread as light source for homes and offices in the next 5 to 10 years. WLEDs provide a light element having a semiconductor light emitting layer (blue or UV LEDs) and photoluminescence phosphors. GaN-based highly efficient blue InGaN LEDs combined with phosphors can produce white light. These solid-state LED lamps have a number of advantages over conventional incandescent bulbs and halogen lamps, such as high efficiency to convert electrical energy into light, reliability, and long operating lifetime (about 100,000 hours). For the purpose of development of high energy-efficient white light sources, we need to produce highly efficient new phosphors, which can absorb excitation energy from blue or UV LEDs and generate emissions.In this paper, we investigate the development of blue or UV LEDs by the appropriate combination of new phosphors which can lead us to obtain high brightness white light. The criteria of choosing the best phosphors, for blue (380-450 nm) and UV (360-400 nm) LEDs, strongly depends on the absorption and emission of the phosphors. Moreover, the balance light between the light emission from blue LEDs and the yellow YAG:Ce,Gd phosphor is important to obtain white light with high color temperature. The phosphors with high efficiency which can be excited by UV LEDs are important to obtain the white light with high color rendering index.     

白光有机发光二极管的最新进展

有机发光二极管(Organic Light-Emitting Diodes,OLEDs)以其制备工艺简单、成本低、发光颜色可在可见光区内任意调节以及易于大面积制作和柔韧弯曲等优点,被认为是未来重要的显示技术之一,在未来照明光源领域也显示了诱人的应用前景.一般认为,如果OLED的发光效率超过100 lm/W,就有可能取代一般照明.本文综述了实现白光OLED的方法及其最新进展,并对白光OLED存在的问题及其发展趋势进行了讨论.     

聚合物材料缺口冲击强度与断面粗糙度参数Rs的关系

金属材料断面粗糙度的测定描述及其与材料性能间的关系已有很多报道,研究结果表明,随断面粗糙度表征参量（分形维数ＤＦ,表面粗糙度参数ＲＳ）增大,金属材料的一些宏观力学性能（断裂韧性ＫＩＣ,冲击韧性ａＫ,疲劳门槛值ΔＫｔｈ等）增高,但这些研究都较少涉及材料的断裂机制［１～３］．聚合物材料断面粗糙度的定量研究较少,有关聚合物材料断面粗糙度与材料韧性间关系的定量结论也不一致［４,５］,体现出聚合物材料断面粗糙度定量分析的复杂性．本文通过对不同试验温度下几种聚合物材料冲击断面粗糙度的定量测定,研究了聚合物材…     

超疏水涂层表面粗糙结构对防覆冰性能的影响

结冰给交通、电力输送和航空等领域带来极大的安全隐患,研究防覆冰技术具有重要的应用价值。目前最具前景的防冰方法是涂层防冰,本文介绍了疏水涂层的构建方法,阐述了涂层疏水性和疏冰性之间的关系;重点论证了涂层表面粗糙结构对其防覆冰性能的影响,指出防覆冰涂层研发中存在的问题,并对该领域的发展趋势进行了分析和展望。     

稀土发光材料在固体白光LED照明中的应用

固体白光发光二极管将成为21世纪新一代的节能光源. 要实现白光发射的重要途径之一是利用稀土发光材料的荧光转换技术, 把InGaN半导体管芯发射的460 nm蓝光或400 nm近紫外光转换成白光. 分别就这两种管芯报道了我们研制的发射蓝、绿、黄、红等不同颜色的稀土发光材料： YAG：Ce, Ca1-xSrxS：Eu^2＋, Ga2S3：Eu^2＋, MGa2S4：Eu^2＋（M=Ca, Sr, Ba）, SrGa^2＋xS4＋y：Eu^2＋, （Ca1-xSrx）Se：Eu^2＋, SrLaGa3S6O：Eu^2＋, （M1, M2）10（PO4）6X2, （M1=Ca, Sr, Ba; M2=Eu, Mn; X=F, Cl, Br）, NaEu0.92Sm0.08（MoO4）2, 并报道了由它们制成的白光发光二极管的色坐标、相关色温和显色指数等参数.     

Surface Changes of Ochrobactrum Anthropi in Cr（Ⅵ） Treatment for 1 Hour

Bioremediation has been a considerable method for treating Cr（VI） contamination. Bacterial surface changes of Ochrobactrum anthropi during Cr biosorption was investigated in this study. We found that Cr adsorption capacity increased with the increase of initial Cr（Ⅵ） concentration. Atomic force microscope （AFM） morphologic analysis combined with surface roughness analysis indicated that the bacterial surfaces became rougher during Cr uptake process. X-ray photoelectron spectroscopy （XPS） showed that Cr（Ⅲ） was adsorbed on the bacterial surfaces. Fourier transform infrared （FT-IR） analysis showed that surface functional groups including C-O and C-N might be involved in the Cr biosorption process.