Analysis of Fe-Si layered structures by reflected electron energy loss spectroscopy and inelastic scattering cross-section

This paper reports on our study of the formation of an interface of layered structures in the Fe-Si system by reflected electron energy loss spectroscopy (REELS). Quantitative element analysis was performed using the product of the mean length of the inelastic free path by the inelastic scattering cross-section of electrons. It is shown that the Fe-Si interface is quite uniform.     

Inelastic scattering and energy loss of swift electron beams in biologically relevant materials

The inelastic mean free path and the stopping power of swift electrons in relevant biomaterials, such as liquid water, DNA, protein, lipid, carotene, sugar, and ice are calculated in the framework of the dielectric formalism. The Mermin Energy Loss Function – Generalized Oscillator Strength model is used to determine the energy loss function of these materials for arbitrary energy and momentum transfer using electron energy‐loss spectroscopy data as input. To ensure the consistency of the model, efforts are made so that both the Kramers–Kronig and f‐sum rules are fulfilled to better than 2%. Our findings indicate sizeable differences in the inelastic mean free path and stopping power among these biomaterials for low‐energy electrons. For example, at 100‐eV electron energy, the inelastic mean free path in protein is 25% smaller than for water and around 10% smaller than for the other biomaterials. The stopping power values of protein, DNA, and sugar are rather similar but 20% larger than for water. Taking into account these results, we conclude that electron interactions with living tissues at the nanometric scale cannot be reliably described using only liquid water as the surrogate of the biological target. Copyright © 2016 John Wiley & Sons, Ltd.     

Obtaining quantitative information on surface excitations from reflection electron energy‐loss spectroscopy (REELS)

A new analysis of reflection electron energy‐loss spectroscopy (REELS) spectra is presented. Assuming inelastic scattering in the bulk to be quantitatively understood, this method provides the distribution of energy losses in a single surface excitation in absolute units without the use of any fitting parameters. For this purpose, REELS spectra are decomposed into contributions corresponding to surface and volume excitations in two steps: first the contribution of multiple volume excitations is eliminated from the spectra and subsequently the distribution of energy losses in a single surface scattering event is retrieved. This decomposition is possible if surface and bulk excitations are uncorrelated, a condition that is fulfilled for medium‐energy electrons because the thickness of the surface scattering layer is small compared with the electron elastic mean free path. The developed method is successfully applied to REELS spectra of several materials. The resulting distributions of energy losses in an individual surface excitation are in good agreement with theory. In particular, the so‐called begrenzungs effect, i.e. the reduction of the intensity of bulk losses due to coupling with surface excitations near the boundary of a solid‐state plasma, becomes clearly observable in this way. Copyright © 2003 John Wiley & Sons, Ltd.     

Comparison of energy‐loss functions from REELS spectra with surface and bulk energy loss functions for Ag

Effective energy‐loss functions were derived from the reflection electron energy‐loss spectroscopy (REELS) spectra of Ag by an extended Landau approach. The effective energy‐loss functions obtained are close to the surface energy‐loss function in the low‐energy‐loss region, but tend to be closer to the bulk energy‐loss function in the higher energy‐loss region for higher primary energy. The REELS spectra incorporating the effective energy‐loss function are also reproduced in a Monte‐Carlo simulation model and confirm that the simulation reproduces the experimental REELS spectra with considerable success. Copyright © 2003 John Wiley & Sons, Ltd.     

Inelastic mean free path of low‐energy electrons in condensed media: beyond the standard models

The most established approach for ‘practical’ calculations of the inelastic mean free path (IMFP) of low‐energy electrons (~10 eV to ~10 keV) is based on optical‐data models of the dielectric function. Despite nearly four decades of efforts, the IMFP of low‐energy electrons is often not known with the desired accuracy. A universal conclusion is that the predictions of the most popular models are in rather fair agreement above a few hundred electron volts but exhibit considerable differences at lower energies. However, this is the energy range where their two main approximations, namely, the random‐phase approximation (RPA) and the Born approximation, may be invalid. After a short overview of the most popular optical‐data models, we present an approach to include exchange and correlation (XC) effects in IMFP calculations, thus going beyond the RPA and Born approximation. The key element is the so‐called many‐body local‐field correction (LFC). XC effects among the screening electrons are included using a time‐dependent local‐density approximation for the LFC. Additional XC effects related to the incident and struck electrons are included through the vertex correction calculated using a screened‐Hubbard formula for the LFC. The results presented for liquid water reveal that XC may increase the IMFP by 15–45% from its Born–RPA value, yielding much better agreement with available experimental data. The present work provides a manageable, yet rigorous, approach to improve upon the standard models for IMFP calculations, through the inclusion of XC effects at both the level of screening and the level of interaction. Copyright © 2015 John Wiley & Sons, Ltd.     

Momentum transfer effects in near surface electron energy loss

We examine two formulations for the differential surface excitation parameter (DSEP): one provided by Tung et al. and the other given by the Chen–Kwei position‐dependent differential inverse inelastic mean free path integrated over the electron trajectory. We demonstrate that the latter converges to the former provided that the dielectric function of the solid does not depend on the momentum transfer or it depends on just the momentum transfer component parallel to the surface. Tung's DSEP represents therefore an approximation to the Chen–Kwei DSEP calculated for a dielectric function with no restrictions on the momentum dependence. The approximation is shown to work in the limit of small momentum transfer and to imply an error of 4%–5% for electrons traveling through the solid with energy E = 1 keV. Copyright © 2015 John Wiley & Sons, Ltd.     

Structural characterization of modern and fossilized charcoal produced in natural fires as determined by using electron energy loss spectroscopy

Charcoal produced in natural fires is widespread, but surprisingly little is known about its structure and stability. TEM and electron energy loss spectroscopy (EELS) were used to characterize the organized graphite-like microcrystallites and amorphous nonorganized phases of modern charcoal that had been produced in natural fires. In addition, a semiordered structure was identified in two modern charcoal samples. Fossilized charcoal contains fewer graphite-like microcrystallites than modern samples. EELS spectra confirmed that the dominant structure in fossilized charcoal is amorphous carbon. EELS measurements also revealed that only the nonorganized phase contains oxygen, which indicates that the degradation of the fossilized charcoal structure occurs mainly through oxidation processes. The few graphite-like microcrystallites found in fossilized charcoal were composed of onion-like structures that are probably less prone to oxidation owing to their rounded structures.     

Determination of the parameters of atomic pair correlations in nickel oxide films by the electron energy loss fine structure method

The electron energy loss extended fine structure (EELFS) spectra were obtained from the pure nickel surface (M _2,3 EELFS) of a stoichiometric NiO film (NiM _2,3 and OK EELFS spectra) and the “nonhomogeneous” oxide film on the surface of nickel Ni-O (NiM _2,3 and OK EELFS spectra). The amplitudes and intensities of electron transitions for the core levels of atoms were calculated with regard for the multiplicity of electron impact excitation of the corresponding core levels of atoms. The corresponding normalized oscillating terms were isolated using the results of calculations based on the experimental EELFS spectra. Agreement between the experimental and calculated (on Ni and NiO test objects) data showed that the theoretical approaches used and the calculated data for describing the EELFS spectra are good approximations. Using the results of calculations and the parameters of secondary electron elastic scattering (FEEF-8 data) we obtained the atomic pair correlation functions from the experimental normalized oscillating parts of the EELFS spectra by Tikhonov’s regularization method.     

Surface excitations in electron spectroscopy. Part I: dielectric formalism and Monte Carlo algorithm

The theory describing energy losses of charged non‐relativistic projectiles crossing a planar interface is derived on the basis of the Maxwell equations, outlining the physical assumptions of the model in great detail. The employed approach is very general in that various common models for surface excitations (such as the specular reflection model) can be obtained by an appropriate choice of parameter values. The dynamics of charged projectiles near surfaces is examined by calculations of the induced surface charge and the depth‐ and direction‐dependent differential inelastic inverse mean free path (DIIMFP) and stopping power. The effect of several simplifications frequently encountered in the literature is investigated: differences of up to 100% are found in heights, widths, and positions of peaks in the DIIMFP. The presented model is implemented in a Monte Carlo algorithm for the simulation of the electron transport relevant for surface electron spectroscopy. Simulated reflection electron energy loss spectra are in good agreement with experiment on an absolute scale. Copyright © 2012 John Wiley & Sons, Ltd.     

Report on the 42nd IUVSTA workshop ‘Electron scattering in solids: from fundamental concepts to practical applications’

A summary is given of the workshop entitled ‘Electron Scattering in Solids: from fundamental concepts to practical applications,’ which was held in Debrecen, Hungary, on July 4–8, 2004, under the sponsorship of the International Union of Vacuum Science, Technique, and Applications (IUVSTA). This workshop was held to review the present status and level of understanding of electron‐scattering processes in solids, to identify issues of key importance (hot topics) in the light of the most recent scientific results, and to stimulate discussions leading to a deeper understanding and new solutions of current problems. This report contains summaries of presentations and discussions in sessions on elastic scattering of electrons by atoms and solids, inelastic scattering of electrons in solids, modeling of electron transport in solids and applications, and software. The principal areas of application include Auger‐electron spectroscopy (AES), X‐ray photoelectron spectroscopy, elastic‐peak electron spectroscopy (EPES), reflection electron energy‐loss spectroscopy (REELS), secondary‐electron microscopy, electron‐probe microanalysis (EPMA), and the use of coincidence techniques in electron‐scattering experiments. A major focus of the workshop was determination of the inelastic mean free path of electrons for various surface spectroscopies, particularly corrections for surface and core‐hole effects. Published in 2005 by John Wiley & Sons, Ltd.     

Electron inelastic mean free path (IMFP) values of Kapton,polyethylene (PE), polymethylmethacrylate (PMMA), polystyrene (PS) and polytetrafluoroethylene (PTFE) measured with elastic peak electron spectroscopy (EPES)

Elastic peak electron spectroscopy (EPES) was employed to measure the inelastic mean free path (IMFP) for energies between 500 and 1600 eV for five insulating organic compounds: Kapton, polyethylene (PE), poly(methyl methacrylate) (PMMA), polystyrene (PS) and polytetrafluoroethylene (PTFE). A Ni and a Si sample were used as reference materials to avoid measurement of the elastic reflection coefficient in absolute units. Correction of experimental elastic peak intensities for surface excitations was performed which turned out to be essential. The results are compared with recent evaluations of optical constants to yield the IMFP in the literature giving satisfactory agreement, with deviations generally below 20%. Investigation of the kinematics in an electron reflection experiment shows that the dispersion coefficient used in REELS data analysis cannot be identified with the true plasmon dispersion.     

Evaluation of robustness to surface conditions of the target factor analysis method for determining the dielectric function from reflection electron energy loss spectra: Application to GaAs

Target factor analysis (TFA) of a series of angle‐resolved reflection electron energy loss spectra (REELS) was recently demonstrated to be a useful method to determine bulk energy loss functions (ELFs), which by the TFA are separated from the surface‐loss structures of REELS. The dielectric function is then readily derived by Kramers–Kronig analysis of the ELF. The advantage of the method compared with other methods, which are also based on the analysis of REELS, is that the condition of the outermost surface region is unimportant because the excitations that occur there are removed by the TFA and ideally a pure bulk component is determined. Our method is thus particularly useful for determining the ELF from compound materials that are hard to clean without modifying the outermost atomic layers. In this paper, the robustness of the method was studied by applying it to three GaAs samples with different surface compositions caused by different surface cleaning methods. The results showed that when electrons of energy 3000–4500 eV were used, the resulting bulk ELFs were essentially identical except for small differences for the sample that had the largest thickness of the modified surface layer. It is concluded that this is a useful method, provided that the thickness of the modified layer is kept to a minimum by using shallow angle sputtering and by using REELS electrons at a sufficiently high energy that a major part of the electron trajectories are at a depth larger than the thickness of the modified surface layer. Copyright © 2013 John Wiley & Sons, Ltd.     

Calculations of electron inelastic mean free paths. X. Data for 41 elemental solids over the 50 eV to 200 keV range with the relativistic full Penn algorithm

We have calculated inelastic mean free paths (IMFPs) for 41 elemental solids (Li, Be, graphite, diamond, glassy C, Na, Mg, Al, Si, K, Sc, Ti, V, Cr, Fe, Co, Ni, Cu, Ge, Y, Nb, Mo, Ru, Rh, Pd, Ag, In, Sn, Cs, Gd, Tb, Dy, Hf, Ta, W, Re, Os, Ir, Pt, Au, and Bi) for electron energies from 50 eV to 200 keV. The IMFPs were calculated from measured energy loss functions for each solid with a relativistic version of the full Penn algorithm. The calculated IMFPs could be fitted to a modified form of the relativistic Bethe equation for inelastic scattering of electrons in matter for energies from 50 eV to 200 keV. The average root‐mean‐square (RMS) deviation in these fits was 0.68%. The IMFPs were also compared with IMFPs from a relativistic version of our predictive Tanuma, and Powell and Penn (TPP‐2M) equation that was developed from a modified form of the relativistic Bethe equation. In these comparisons, the average RMS deviation was 11.9% for energies between 50 eV and 200 keV. This RMS deviation is almost the same as that found previously in a similar comparison for the 50 eV to 30 keV range (12.3%). Relatively large RMS deviations were found for diamond, graphite, and cesium as in our previous comparisons. If these three elements were excluded in the comparisons, the average RMS deviation was 8.9% between 50 eV and 200 keV. The relativistic TPP‐2M equation can thus be used to estimate IMFPs in solid materials for energies between 50 eV and 200 keV. We found satisfactory agreement between our calculated IMFPs and those from recent calculations and from measurements at energies of 100 and 200 keV. Copyright © 2015 John Wiley & Sons, Ltd.     

Improved depth information from routine analysis of the inelastic background of XPS and HAXPES spectra using optimized two- and three-parameter cross-sections

Determination of the depth distribution of complex nanostructures by X-ray photoelectron spectroscopy (XPS) inelastic background analysis may be complicated if the sample materials have widely different inelastic scattering cross-sections. It was recently demonstrated that this may be solved by using a mixture of cross-sections. This permits retrieval of depth distributions of complex stacks and deeply buried layers with a typical 5% accuracy. This requires however that the cross-sections of the individual sample materials are known which is often not the case and this can complicate practical use for routine analysis. In this paper, we explore to what extent a suitable two- or three-parameter cross-section can be defined independent of prior knowledge of the cross-sections involved but simply defined by fitting the cross-section parameters to the spectrum being analyzed. This paper presents a theoretical study following our recent paper that explored how to make the best choice of inelastic mean free path and inelastic scattering cross-section for the inelastic background analysis with the Quases-Tougaard software. It was previously shown that a rough analysis of the inelastic background could give a good idea of the depth distribution. Here, we demonstrate with model spectra from buried layers created with Quases-Tougaard Generate software that a rather accurate analysis can be performed for very different cases with an average ~5% error. This analysis is easy to apply as it only needs the two- or three-parameter cross-sections generated with the Quases-Tougaard software. This study is aimed to improve routine analysis of the inelastic background of XPS and hard X-ray photoelectron spectroscopy (HAXPES) spectra.     

Adsorption of carbon monoxide and oxygen on transition metal surfaces: A comparative study of the results from electron spectroscopy and theoretical calculations

Results of investigations on the adsorption of CO andO ₂ on transition metal surfaces by employinguv and x-ray photoelectron spectroscopy and electron energy loss spectroscopy (eels) are presented. Results of molecular orbital calculations on adsorbed CO and O₂ are also discussed. Some of the interesting aspects discussed are, satellites in the O(ls) region due to adsorbed CO, vibrationaleels of adsorbed O₂ and dissociation energy profiles of adsorbed O₂ on clean surfaces as well as surfaces covered with potassium or presorbed atomic oxygen. Contribution No 245 from the Solid State and Structural Chemistry Unit.     

Measurement of the surface excitation parameter of Kapton,polyethylene (PE), polymethyl methacrylate (PMMA), polystyrene (PS) and polytetrafluoroethylene (PTFE)

Reflection electron energy loss spectra (REELS) were measured for five insulating organic compounds: Kapton, polyethylene (PE), poly(methyl methacrylate) (PMMA), polystyrene (PS) and polytetrafluoroethylene (PTFE), as well as for Ni and Si, in the energy range between 200 and 1600 eV. The average number of surface excitations for a single surface crossing were determined from the experimental data and were found to be considerably smaller than for earlier studied materials, which mainly consisted of elemental metals [Surf. Sci. 486(2001)L461]. The surface excitation parameter, a material parameter used to quantify the relative intensity of surface losses in (photo)electron spectroscopy, was extracted from the data and compared with values found in the literature. The results indicate that surface excitations only have a minor influence on quantification of XPS spectra of polymers. On the other hand, a correction for surface excitations turns out to be essential for measurements of the electron inelastic mean free path of polymers when a metal is used as reference material.