Synthesis of well-defined tower-shaped 1,3,5-trisubstituted adamantanes incorporating a macrocyclic trilactam ring system

We describe the synthesis of two novel well-defined tower-shaped 1,3,5-trisubstituted adamantanes 30 and 33 that incorporate a macrocyclic trilactam ring system. Each nanoscale molecule has a broad tripodal base consisting of three identical sulfur-containing termini as the tripod feet, 4-acetylsulfanylmethylphenyl units in the case of 30 and 3,5-bis(acetylsulfanylmethyl)phenyl units in the case of 33. The sulfur atoms are designed to bind the molecules trivalently to the apex of a gold-coated commercial AFM tip through formation of three S-Au bonds. The rigid adamantane-derived head unit with a single hydrogen atom at the apex is designed to scan the sample. Molecules 30 and 33 are synthesized from 1,3,5-triethynyladamantane by a series of Sonogashira coupling reactions involving terminal alkynes and aryl iodides. A macrocyclic trilactam unit is included for added rigidity. We demonstrate that molecule 30 is sufficiently large and rigid to be visualized by a conventional AFM tip. These nanoscale molecules may also find application as chemically well-defined nanoscale objects for calibration of AFM tips.     

Nanoscale 1,3,5,7-tetrasubstituted adamantanes and p-substituted tetraphenyl-methanes for AFM applications

[structure: see text] Tetrahedrally shaped nanoscale molecules 18-20 were synthesized from the corresponding tetraiodide by a series of Sonogashira coupling reactions. Three of the sulfur-containing termini are intended for eventual binding to a gold-coated conventional AFM tip, while the fourth terminus scans the sample. AFM images of 19 demonstrate that the molecule is sufficiently large and rigid to be imaged by a conventional AFM tip.     

Rearrangements in an alkylthiolate self-assembled monolayer using electrostatic interactions between nanoscale asperity and organomercaptan molecules

Chemically induced rearrangements of amphifunctional molecules have been demonstrated using strong nonuniform electric fields (10(8)-10(10) V m(-1)) induced in the vicinity of nanoscale asperities. Electrostatic interactions utilizing these rearrangements of alkylthiolates assembled on Au(111) result in the nanopatterning of raised nanostructure (1.5-9 nm high, 15-100 nm wide) arrays on a second time scale by manipulating an atomic force microscope (AFM) tip above the monolayer. It is suspected that, as a result of the oxidative cleavage initiated by a weak bias of the tip, the S end of the alkylthiolate chain carrying a sulfenium cation is attracted to the (lifting) tip, forming bi- and higher-layer structures in the vicinity of the tip apex. Stabilization of the multiple-layered structures is accomplished via mutual attraction and entanglement of hydrocarbon chains. The rearrangements suggest a novel and general approach for nanoscale architecture in self-assembled systems.     

碳纳米管原子力显微镜针尖对脱氧核糖核酸高分辨率成像研究

运用自制的碳纳米管原子力显微镜针尖,在液体中观察了脱氧核糖核酸（DNA）分子的精细结构。结果表明,运用碳纳米管针尖获得的DNA分子的高度与电子显微镜的结果非常接近,且没有造成样品的变形损伤;碳纳米管针尖得到的DNA分子的宽度与真实值相近,减小了原子力显微镜成像的增宽效应,这是用传统的硅针尖无法获得的。DNA分子精细结构的高分辨率图像的获得为研究其功能提供了有价值的信息。     

Nanoscale patterning of alkyl monolayers on silicon using the atomic force microscope

Self-assembled monolayers (SAMs) of 1-alkenes on hydrogen-passivated silicon substrates were successfully patterned on the nanometer scale using an atomic force microscope (AFM) probe tip. Nanoshaving experiments on alkyl monolayers formed on H-Si(111) not only demonstrate the flexibility of this technique but also show that patterning with an AFM probe is a viable method for creating well-defined, nanoscale features in a monolayer matrix in a reproducible and controlled manner. Features of varying depths (2-15 nm) were created in the alkyl monolayers by controlling the applied load and the number of etching scans made at high applied loads. The patterning on these SAM films is compared with the patterning of alkyl siloxane monolayers on silicon and mica.     

The role of few-asperity contacts in adhesion

The surface roughness of a few asperities and their influence on the work of adhesion is of scientific interest. Macroscale and nanoscale adhesion data have seemingly given inconsistent results. Despite the importance of bridging the gap between the two regimes, little experimental work has been done, presumably due to the difficulty of the experiment needed to determine how small amounts of surface roughness might influence adhesion data lying in between the two scales. To investigate the role of few-asperity contacts in adhesion, the pull-off force was measured between different sized atomic-force microscope (AFM) tips (with different roughnesses) and sample surfaces that had well-controlled material properties. There were seventeen tips of four different types, with radii from 200 nm to 60 microm. The samples were unpatterned single crystal silicon with a chemical silicon dioxide surface resulting from a standard silicon wafer clean. Some of the samples were treated with a few angstroms of vapor deposited diphenylsiloxane. We observed that the uncorrected (for surface roughness) pull-off force was independent of the radius of the AFM tip, which was contrary to all continuum-mechanics model predictions. To explain this behavior, we assumed that the interactions between the AFM tip and sample were additive, material properties were constant, and that the AFM tip, asperities, and sample surfaces were of uniform density. Based on these assumptions, we calculated a simple correction due to the measured root mean square (RMS) surface roughness of the AFM tips. The simple correction for the RMS surface roughness resulted in the expected dependence of the pull-off force on radius, but the magnitudes were higher than expected. Commercial and heat-treated AFM tips have minimal surface roughness and result in magnitudes that are more reliable. The relative uncertainty for the pull-off force was estimated to be 10%. In this paper, we derive how the cantilever and tip parameters contribute to the measured pull-off force and show how the corrected results compare with theory. Although much work is still needed, the work presented here should advance the understanding of adhesion between the macroscale and nanoscale regimes.     

Quantitative Assessment of Tip Effects in Single‐Molecule High‐Speed Atomic Force Microscopy Using DNA Origami Substrates

High‐speed atomic force microscopy (HS‐AFM) is widely employed in the investigation of dynamic biomolecular processes at a single‐molecule level. However, it remains an open and somewhat controversial question, how these processes are affected by the rapidly scanned AFM tip. While tip effects are commonly believed to be of minor importance in strongly binding systems, weaker interactions may significantly be disturbed. Herein, we quantitatively assess the role of tip effects in a strongly binding system using a DNA origami‐based single‐molecule assay. Despite its femtomolar dissociation constant, we find that HS‐AFM imaging can disrupt monodentate binding of streptavidin (SAv) to biotin (Bt) even under gentle scanning conditions. To a lesser extent, this is also observed for the much stronger bidentate SAv–Bt complex. The presented DNA origami‐based assay can be universally employed to quantify tip effects in strongly and weakly binding systems and to optimize the experimental settings for their reliable HS‐AFM imaging.     

Nanografting of alkanethiols by tapping mode atomic force microscopy

Nanografting, an atomic force microscopy (AFM) based nanolithography technique, is becoming a popular method for patterning self-assembled monolayers (SAMs). In this technique, a nanoscale patch of a thiol-on-gold SAM is exchanged with a different thiol by the action of an AFM tip operated in contact mode at high load. The results are then imaged in topographic or lateral force microscopy again at low values of the load. One of the problems of contact mode nanografting is that monolayers of large molecules such as proteins are likely to be deformed, damaged, or even removed from the surface by contact mode imaging even when small loads are used. Furthermore, we need to note that the stiffness of the cantilevers used in contact mode is different than that of the cantilevers used in tapping mode and that tip changing in the course of an experiment can be quite inconvenient. Here, we show that a monolayer on a gold substrate can be nanografted using tapping mode AFM (also referred to as amplitude modulation AFM) rather than the commonly used contact mode. While the grafting parameters are somewhat trickier to choose, the results demonstrate that nanografting in tapping mode can make patches of the same quality as those made by contact mode, therefore allowing for gentle imaging of the grafted molecules and the whole SAM without changing the microscope tip.     

Microscopic origin of the humidity dependence of the adhesion force in atomic force microscopy

Water condenses between an atomic force microscope (AFM) tip and a surface to form a nanoscale bridge that produces a significant adhesion force on the tip. As humidity increases, the water bridge always becomes wider but the adhesion force sometimes decreases. The authors show that the humidity dependence of the adhesion force is intimately related to the structural properties of the underlying water bridge. A wide bridge whose width does not vary much with tip-surface distance can increase its volume as distance is increased. In this case, the adhesion force decreases as humidity rises. Narrow bridges whose width decreases rapidly with increasing tip-surface distance give the opposite result. This connection between humidity dependence of the adhesion force and the structural susceptibility of the water bridge is illustrated by performing Monte Carlo simulations for AFM tips with various hydrophilicities.     

AFM-induced amine deprotection: triggering localized bond cleavage by application of tip/substrate voltage bias for the surface self-assembly of nanosized dendritic objects

An alpha,alpha-dimethyl-3,5-dimethoxybenzyloxycarbonyl (DDZ)-protected amine monolayer can be selectively deprotected by the application of a voltage bias from a conducting AFM tip to afford localized nanoscale patterns that can be visualized by self-assembly of dendritic molecular objects with terminal carboxylic acid groups and different aspect ratios.     

Synthesis and manipulation of high aspect ratio gold nanorods grown directly on surfaces

Here we describe the synthesis of Au nanorods directly on glass surfaces using seed-mediated deposition of Au from AuCl4- onto surface-attached 3-5 nm diameter Au nanoparticles (AuNPs) in the presence of cetyltrimethylammonium bromide (CTAB). The average length (200 nm to 1.2 microm) and aspect ratio (6-22) of the nanorods increases with increasing AuCl4- concentration. Short, low aspect ratio Au nanorods are manipulated with an atomic force microscopy (AFM) tip, while longer, high aspect ratio nanorods are bent and broken with the AFM tip.     

Chemical imaging of the surface of self-assembled polystyrene-b-poly(methyl methacrylate) diblock copolymer films using apertureless near-field IR microscopy

The nanoscale chemical composition variations of the surfaces of thin films of polystyrene- b-poly(methyl methacrylate) (PS- b-PMMA) diblock copolymers are investigated using apertureless near-field IR microscopy. The scattering of the incident infrared beam from a modulated atomic force microscopy (AFM) tip is probed using homodyne detection and demodulation at the tip oscillation frequency. An increase in the IR attenuation is observed in the PMMA-rich domains with a wavenumber dependence that is consistent with the bulk absorption spectrum. The results indicate that even though a small topography-induced artifact can be observed in the near-field images, the chemical signature of the sample is detected clearly.     

Dip-pen刻蚀技术直接构建聚-L-赖氨酸纳米结构

Dip-pen纳米刻蚀技术(简称DPN技术)为在目标基底上沉积一个有序或连续的图案提供了一条简单而有效的途径,DPN技术是一种直接书写的扫描探针刻蚀技术,它使用原子力显微镜探针针尖,在一定的驱动力下,直接将化学试剂“墨水”转移到目标基底上．近年来,利用DPN技术已经成功地实现了多种“墨水一基底”组合。     

Site-specific fabrication of nanoscale heterostructures: local chemical modification of GaN nanowires using electrochemical dip-pen nanolithography

This article describes a new method for site-specific, atomic force microscope (AFM) fabrication of nanowire heterostructures using electrochemical dip-pen nanolithography (E-DPN). We have demonstrated that E-DPN is ideally suited for the in situ modification of nanoscale electronic devices; the AFM tip and the nanowire device can be used as electrodes and the reactants for the modification can be introduced by coating them onto the AFM tip. Specifically, we have created GaN nanowire heterostructures by a local electrochemical reaction between the nanowire and a tip-applied KOH "ink" to produce gallium nitride/gallium oxide heterostructures. By controlling the ambient humidity, reaction voltage, and reaction time, good control over the modification geometry is obtained. Furthermore, after selective chemical etching of gallium oxide, unique diameter-modulated nanowire structures can be produced. Finally, we have demonstrated the unique device fabrication capabilities of this technique by performing in situ modification of GaN nanowire devices and characterizing the device electronic transport properties. These results demonstrate that small modifications of nanowire devices can lead to large changes in the nanowire electron transport properties.     

Nanopatterning of alkynes on hydrogen-terminated silicon surfaces by scanning probe-induced cathodic electrografting

The electrochemical cathodic electrografting reaction, previously demonstrated on bulk silicon surfaces, can be patterned on the nanoscale utilizing conducting probe atomic force microscopy (CP-AFM). Alkyne electrografting is a particularly useful chemical technique since it leads to direct covalent attachment of conjugated alkynes to silicon. In addition, application of a forward bias during the reaction renders the surface less sensitive to oxidation and the resulting monolayers are very stable in air and basic aqueous solution. Alkyne monolayer lines can be drawn down to 40 nm resolution using a Pt-coated AFM tip, and the heights of the monolayers scale with the molecular length of the alkyne. The tip is biased (+) and the surface is biased (-) to drive the cathodic electrografting reaction under ambient conditions. The resistance of the monolayers to fluoride, as well as friction force microscopy, indicate that the alkynes are covalently bonded to the surface, not oxide-based, and hydrophobic. The reaction does not work with alkenes, and therefore hydrosilylation is not the primary mode of reaction. Wider lines (300 nm) can be produced using broadened Pt-coated AFM tips. This reaction could be important for the interfacing of conjugated molecules directly to silicon in a spatially controlled fashion.     

Unbinding Molecular Recognition Force Maps of Localized Single Receptor Molecules by Atomic Force Microscopy

Atomic force microscopy is a technique capable to study biological recognition processes at the single‐molecule level. In this work we operate the AFM in a force‐scan based mode, the jumping mode, where simultaneous topographic and tip–sample adhesion maps are acquired. This approach obtains the unbinding force between a well‐defined receptor molecule and a ligand attached to the AFM tip. The method is applied to the avidin–biotin system. In contrast with previous data, we obtain laterally resolved adhesion maps of avidin–biotin unbinding forces highly correlated with single avidin molecules in the corresponding topographic map. The scanning rate 250 pixel s^?1 (2 min for a 128×128 image) is limited by the hydrodynamic drag force. We are able to build a rupture‐force distribution histogram that corresponds to a single defined molecule. Furthermore, we find that due to the motility of the polymer used as spacer to anchor the ligand to the tip, its direction at rupture does not generally coincide with the normal to the tip–sample, this introduces an appreciable error in the measured force.     

Controllable formation of nanoscale patterns on TiO2 by conductive-AFM nanolithography

We report on the nanopatterning of double-bond-terminated silane (5-hexenyltrichlorosilane, HTCS) molecules on titania (TiO2) using conductive atomic force microscopy (AFM). The influences of tip electrostatic potential and scanning velocity, relative humidity and of the repeated application of voltage on the topographic height, width, and hydrophilic and hydrophobic contrast of the resultant patterns were investigated. Tip voltage and tip velocity ( v) were applied between -10 V 相似文献   

Direct-writing of polymer nanostructures: poly(thiophene) nanowires on semiconducting and insulating surfaces.

A new technique for direct-writing of polymer nanostructures on insulating and semiconducting surfaces based on Electrochemical Dip-Pen Nanolithography (E-DPN) is described. The technique is based on electrochemical polymerization of monomers directly underneath the AFM tip. Sub-50 nm poly-3,4-ethylenedioxythiophene lines can be easily created. Such capability to direct-write and pattern polymeric materials with interesting electronic and electrooptical properties at the nanoscale creates a number of opportunities since a large variety of monomers are available.     

Influence of molecular weight on nanoscale modification of poly(methyl methacrylate) due to simultaneous mechanical and chemical stimulation

We report observations of poly(methyl methacrylate) films modified by the synergistic effect of solvent exposure and mechanical stress applied by the tip of an atomic force microscope (AFM). We show that these modifications are sensitive to polymer molecular weight as well as solvent strength and the force applied by the tip. Small-area scanning often produces localized patches of raised material as well as depressed areas. The volume change associated with the depressed areas generally increases with increasing solvent strength, increasing applied normal force, and decreasing polymer molecular weight. In contrast, the volume change associated with the raised patches is greatest for 25-145K Mw films in 60 and 100% ethanol solutions. In each case, the normal force applied by the AFM tip must exceed a threshold to significantly modify the surface; this threshold is associated with an increase in lateral force applied by the AFM tip during small-area scanning. We attribute the raised patches to mechanically enhanced swelling due to diffusion of solvent into near-surface material. Permanent net volume loss, when observed, is attributed to localized polymer dissolution.     

Simple test system for single molecule recognition force microscopy

We have established an easy-to-use test system for detecting receptor-ligand interactions on the single molecule level using atomic force microscopy (AFM). For this, avidin-biotin, probably the best characterized receptor-ligand pair, was chosen. AFM sensors were prepared containing tethered biotin molecules at sufficiently low surface concentrations appropriate for single molecule studies. A biotin tether, consisting of a 6 nm poly(ethylene glycol) (PEG) chain and a functional succinimide group at the other end, was newly synthesized and covalently coupled to amine-functionalized AFM tips. In particular, PEG₈₀₀ diamine was glutarylated, the mono-adduct NH₂-PEG-COOH was isolated by ion exchange chromatography and reacted with biotin succinimidylester to give biotin-PEG-COOH which was then activated as N-hydroxysuccinimide (NHS) ester to give the biotin-PEG-NHS conjugate which was coupled to the aminofunctionalized AFM tip. The motional freedom provided by PEG allows for free rotation of the biotin molecule on the AFM sensor and for specific binding to avidin which had been adsorbed to mica surfaces via electrostatic interactions. Specific avidin-biotin recognition events were discriminated from nonspecific tip-mica adhesion by their typical unbinding force (∼40 pN at 1.4 nN/s loading rate), unbinding length (<13 nm), the characteristic nonlinear force-distance relation of the PEG linker, and by specific block with excess of free d-biotin. The convenience of the test system allowed to evaluate, and compare, different methods and conditions of tip aminofunctionalization with respect to specific binding and nonspecific adhesion. It is concluded that this system is well suited as calibration or start-up kit for single molecule recognition force microscopy.