Luminescence and lattice defects in Cu In S2

We have studied the cathodoluminescence of single crystals of Cu In S₂ obtained by iodine chemical transport. As grown crystals and crystals annealed in In, S, (In + S), or in vacuum, were used. Two types of spectrum were observed, one for n type crystals due to S vacancies, and the other for p type or compensated crystals, which is interpreted as donor-acceptor pair transitions (determined by Time Resolved Speetroscopy) between the S vacancy (donor ~90 meV) and the Cu vacancy (acceptor ~45 meV), and by the corresponding free-to-bound transitions.     

Preparation,electrical properties and annealing of ZnGeAs2

Crystals of ZnGeAs₂ have been grown from solution (Zn_xAs_y solvent). Electrical properties of crystals before and after annealing in arsenic or phosphorus vapors are reported. The crystals are always (p) type. Assuming the electrical properties of the as grown crystals to be due to the zinc and arsenic vacancies, a mechanism is given to explain the change in free carrier concentration during annealing. A good fit is obtained between the observed and the calculated values.     

Properties of erbium silicate doped with chromium in porous silicon

The possible formation of chromium-doped erbium silicate Er₂SiO₅: Cr in thin layers of porous silicon is demonstrated. This paper reports on studies of the photoluminescence, electron paramagnetic resonance, and transverse current transport in porous silicon layers (with different chromium and erbium contents) grown on n-and p-silicon single crystals heavily doped with shallow impurities. The Er₂SiO₅: Cr phase with the photoluminescence maxima at approximately 1.3 and 1.5 μm manifests itself after high-temperature annealing at 1000°C. The introduction of erbium and annealing at 700°C increase the intensity of the red photoluminescence of porous silicon by several factors. The decrease in the electrical conductivity of porous silicon suggests the onset of the formation of erbium silicate. The current-voltage characteristics exhibit a nonlinear behavior with an exponential dependence of the current on the voltage due to the discrete electron tunneling. An electron paramagnetic resonance spectrum of P _b centers in p-type heavily doped silicon is observed for the first time.     

Growth,electrical conductivity and microindentation studies of CuInS2 single crystals

Summary Single crystals of copper indium disulfide (CuInS₂) have been grown by chemical-vapour transport technique (CVT) using iodine as the transporting agent. The obtained phase was checked by X-ray diffractometry and the presence of copper, indium and sulfur in the grown crystals was confirmed by Energy-Dispersive Spectrum Analysis (EDSA). The mechanical properties of the grown crystals were studied using microindentation analysis. Optical-transmission measurements were done to determine the energy gap of the grown crystals. The four-probe technique was used to measure the electrical properties of the grown crystals. The as-grown crystals were found to bep-type conducting and they were converted ton-type by suitable annealing treatment. The electrical parameters of bothn- andp-type crystals were measured.     

Mobility of charge carriers in porous silicon layers

The (conduction) mobility of majority charge carriers in porous silicon layers of the n and p types is estimated by joint measurements of electrical conductivity and free charge carrier concentration, which is determined from IR absorption spectra. Adsorption of donor and acceptor molecules leading to a change in local electric fields in the structure is used to identify the processes controlling the mobility in porous silicon. It is found that adsorption of acceptor and donor molecules at porous silicon of the p and n types, respectively, leads to a strong increase in electrical conductivity, which is associated with an increase in the concentration of free carrier as well as in their mobility. The increase in the mobility of charge carriers as a result of adsorption indicates the key role of potential barriers at the boundaries of silicon nanocrystals and may be due to a decrease in the barrier height as a result of adsorption.     

Deformation of germanium under the joint action of an electric current and a magnetic field

The specific features in the behavior of deformation characteristics of low-ohmic p-type germanium single crystals subjected to different types of combined plastic deformation and the anisotropy of the electrical resistance of specimens in the longitudinal and transverse directions have been investigated. Both the acceptor and donor actions of dislocations have been observed in the motion of charge carriers along the direction of compression of the specimen. Under conditions of the joint action of a weak magnetic field and a combined plastic deformation, a decrease in the macroplasticity effects has been revealed. Anisotropy of the electrical resistance of p-Ge specimens in the longitudinal and transverse directions has been found. A possible explanation of the observed effect is given.     

Relation entre proprietes electriques et defauts de reseau dans ZnSiAs2 Partie I—analyse de l'energie d'ionisation

The electrical properties of crystals of the ternary semiconducting compound ZnSiAs₂ grown either by horizontal vapor phase transport or by the Bridgman method are reported.The resistivity and the Hall coefficient in the temperature range 77–300 K or 4.2–300 K have been measured and explained taking into account the asymmetry of the effective mass. All crystals arep-type with only one acceptor energy level between 7 × 10⁻³ eV and 0.32 eV, and are generally highly compensated. Annealing in zinc or arsenic vapor at 873 K induces a shift of the energy level vs annealing time.The position of the energy level vs annealing time has been explained in terms of intrinsic defects such as Schottky defects (As or Zn vacancies). The latter are accompanied by anti-structural disorder on the zinc sites. The different values of the energy levels created by the Schottky defects are attributed to a concentration effect; this may lead to the formation of an impurity band in some samples.     

Effect of electron irradiation on the galvanomagnetic properties of In<Subscript>x</Subscript>Bi<Subscript>2−<Emphasis Type="Italic">x</Emphasis></Subscript>Te<Subscript>3</Subscript> semiconductor single crystals

The effect of 5-MeV electron irradiation of p-In_xBi_2?xTe₃ single crystals (x=0, 0.04, 0.07), performed at 250 K, on the galvanomagnetic properties of the crystals was studied. The irradiation was shown to change the conduction from the p to the n type. Annealing at temperatures of 310–390 K restores the conduction to the p type. The reversal of the conduction type and variation of the carrier concentration can be accounted for by an increase in the concentration of charged point radiation defects produced in In_xBi_2?xTe₃ by irradiation. Electron irradiation of p-type Te single crystals reduces the electrical resistivity without reversing the conduction type. Annealing restores the original properties almost completely.     

Optoelectronic effects in p-CdGeAs2 single crystals and structures based on them

Spectra of inelastic light scattering by optical phonons in p-CdGeAs₂ single crystals were obtained for the first time. The observed clear polarization dependence and the absence of any appreciable dependence of the intensity and frequency of the observed lines when the sample is swept in ≈300 μm steps indicates these CdGeAs₂ single crystals grown by directional crystallization from a near-stoichiometric flux, are of high quality and homogeneous. The type of symmetry of the observed phonon lines is interpreted and it is shown that the force constants in CdGeAs₂ and CdSnP₂ crystals differ slightly. Temperature dependences of the electrical conductivity and the Hall constant were studied in oriented homogeneous p-CdGeAs₂ single crystals. It was established that the conductivity of these crystals is determined by the deep acceptor level E _A=0.175 eV and has the degree of compensation 0.5–0.6. The temperature dependence of the Hall mobility reflects the competition between impurity and lattice mechanisms of hole scattering. The photosensitivity of In/CdGeAs₂ surface barrier structures reaches 20 μA/W at T=300 K and remains at this level within the fundamental absorption of CdGeAs₂. It is concluded that these structures may be used as wide-band photoconverters for natural light and as selective photoanalyzers for linearly polarized radiation. Fiz. Tverd. Tela (St. Petersburg) 40, 212–216 (February 1998)     

Modification of the surface state and doping of CdTe and CdZnTe crystals by pulsed laser irradiation

The photoelectric and electrical properties of high-resistivity p-like CdTe and Cd_0.96Zn_0.04Te single crystals and barrier structures on their base before and after laser irradiation in different conditions are studied. Irradiation of samples with nanosecond ruby laser pulses was carried out in two different ways. In the first case, the Cd(Zn)Te crystals were subjected to laser action directly from the surface and irradiation within a certain range of intensities resulted in a decrease in the surface recombination rate and increase in the photoconductivity signal. The surface region with a wider bandgap in CdZnTe crystals was formed. In the second case, the samples were irradiated from the side pre-coated with a relatively thick In dopant film and it caused rectification in the I-V characteristics as a result of laser-induced doping of the thin Cd(Zn)Te surface region and formation of a built-in p-n junction. The application of the fabricated M-p-n structured In/Cd(Zn)Te/Au diodes for X-ray and γ-ray detectors is discussed.     

p-type characteristics of ZnSe:Li3N grown by a closed Bridgman method

We intend to search a new method to prepare high-quality and large-size p-ZnSe single crystal. In this study, ZnSe:Li₃N single crystal is grown by a vertical Bridgman method using a closed double-crucible. The photoluminescence (PL) spectrum of the as-grown ZnSe:Li₃N crystal at 8 K shows very strong donor–acceptor pair (DAP) and very weak exciton emissions. In order to activate doped Li₃N, ZnSe:Li₃N single crystal is annealed at high temperature in Zn-saturated atmosphere. By selecting suitable annealing conditions, a very strong I₁ emission line related to shallow acceptor is observed. The capacitance–voltage (C–V) characteristics indicate that the annealed ZnSe:Li₃N single crystal is a p-type conduction. Furthermore, the acceptor concentration and ionization energy are estimated by examining the temperature dependences of the free-to-acceptor (FA) emission, the behaviors of Li and N are investigated, and the new emission at 2.34 eV is discussed.     

Effect of charge carriers on the magnetic properties of the CdCr<Subscript>2</Subscript>Se<Subscript>4</Subscript> ferromagnetic semiconductor

The results of an investigation into how the composition of annealing mixtures influences the Curie temperature of single crystals of the CdCr₂Se₄ ferromagnetic semiconductor are reported. The mechanism of doping of single crystals is analyzed, and the role played by each of the components of the annealing batch is established. It is concluded that the indirect exchange involving n-type carriers near impurity gallium ions leads to a sharp increase in the phase transition temperature (from 130 to 172 K) of the samples. The dependences of the magnetization of samples with different phase transition temperatures on the temperature and magnetic field are compared.     

Study of acceptor states in CdTe by donor-acceptor pair excitation luminescence

Excitation of donor-acceptor pair luminescence has been studied in CdTe doped with lithium or chlorine. The excitation spectrum of the lithium acceptor is determined and fitted with the effective mass theory of Baldereschi and Lipari. Revised values of the valence band parameters are deduced: μ = 0.8, δ = 0.054, Ry = 24 meV. The analysis of the 1.45 eV luminescence band in compensated Cl-doped crystals shows the existence of donor-acceptor pair transitions. Three acceptor centers are identified: E_A = 89, 111 and 119 meV, and the contribution of a deep donor (E_D > 40 meV) is demonstrated. Besides intracentre type excitation transitions of the 1.45 eV band have been observed in non-compensated chlorine-doped crystals. Thus several recombination channels and distinct acceptor states contribute to the composite 1.45 eV luminescence band.     

Photoluminescence and EPR of porous silicon formed on <Emphasis Type="Italic">n</Emphasis><Superscript>+</Superscript> and <Emphasis Type="Italic">p</Emphasis><Superscript>+</Superscript> single crystals implanted with boron and phosphorus ions

The effect of combined doping by shallow donor and acceptor impurities on boosting the quantum yield of porous-silicon photoluminescence (PL) in the visible and near IR range was studied using phosphorus and boron ion implantation. Nonuniform doping of samples and subsequent oxidizing annealing were performed before and after porous silicon was formed on silicon single crystals strongly doped by arsenic or boron up to ≈10¹⁹ cm^?3. The concentration of known P_b centers of nonradiative recombination was controlled by electron paramagnetic resonance. It is shown that there is an optimal joined content of shallow donors and acceptors that provides a maximum PL intensity in the vicinity of the red part of the visible spectrum. According to estimates, the PL quantum yield in the transitional n ⁺⁺-p ⁺ or p ⁺⁺-n ⁺ layer of porous silicon increases by two orders of magnitude as compared to that in porous silicon formed on silicon not subjected to ion irradiation.     

Lifetime spectra of positrons in deformed Ge

Positron lifetime measurements have been performed inn-type andp-type germanium single crystals deformed by compression. The results are compared with those of deformed GaAs single crystals obtained by the authors previously. In bothn andp-type germanium the lifetime τ₁ and its intensityI ₁ decreased with deformation. Using the trapping model, the trapping rates of positrons by dislocations are obtained, which in turn gave the cross width of the dislocation as 20.0 Å and 8.2 Å forn-type andp-type germanium, respectively. In terms of Read's model the fraction of the dangling bonds occupied by electrons is obtained to 0.26 in then-type germanium. This value was smaller than those obtained forn-type GaAs, i.e., 0.46 and 0.50 for Ga- and As-dislocation, respectively. It is found that doping causes the trapping of positrons. Inp-type germanium the fractionf was determined to 0.25 in terms of Schröter and Labusch's model.     

Deep level structure and compensation mechanism in In-doped CdTe crystals

Deep Level Transient Spectroscopy (DLTS) and Optical Deep Level Transient Spectroscopy (ODLTS) experiments have been conducted on a series of In-doped CdTe crystals grown by the Bridgman or the travelling heater (THM) methods using Te as the solvent. The THM samples are n-type but strongly compensated. Annealing at 700°C under high Cd vapour pressure leads to a decompensation of the crystals. The electron concentration is then a measure of the donor (In) concentration, which was in the range 3 × 10¹⁶−1.5 × 10¹⁸cm⁻³. Six and eight electron traps are, respectively detected in the non-annealed and annealed samples at a concentration level 10²–10³ times below the net electron concentration. They cover the energy range 0.2–0.8 eV. Similar traps are found in both types of crystals, the concentration of which increases with In content and after annealing. The presence of In interstitial-type defects is suggested. A main hole trap at 0.12eV is detected by ODLTS in compensated samples with a concentration close to the donor concentration. Low temperature electrical measurements show that this trap is ionized under equilibrium conditions. It appears to be the main compensating acceptor centre. A plausible microscopic structure is In_cdV_cd. This study shows that In-doped CdTe grown by THM is electrically compensated and that In-containing neutral associates or precipitates play a minor role in the compensation mechanism.     

Features of the semiconductor-metal transition in GaAs at ultrahigh pressures: New intermediate phases

Using the thermopower method (Seebeck effect), the semiconductor-metal transition that occurs in gallium arsenide single crystals of n and p types at ultrahigh pressures P above ～11–18 GPa has been studied. It has been found that the transition in n-type samples begins at lower pressures. In the region of the semiconductor-metal phase transition, features have been observed on the thermopower dependences S(P). These features indicate that lattices intermediate between the initial semiconductor structure of zinc blende and the Cmcm high-pressure orthorhombic metallic phase are formed. By analogy with ZnTe, one intermediate phase (semiconductor with hole conductivity) is suggested to have the cinnabar structure and the second intermediate phase (semimetallic with electron conductivity) possibly has the SC16 structure. A model of the semiconductor-metal transition is discussed. The behavior of the thermoelectric properties in GaAs under pressure is compared with the behavior of these properties in other A_NB_8?N semiconductors, which also undergo the transition to the metallic state.     

Thermoelectric properties and structural instability of type-I clathrate Ba8Ga16Sn30 at high temperatures

Type-I clathrate Ba₈Ga₁₆Sn₃₀ is known as a typical example showing glass-like behavior in the thermal conductivity at low temperatures. We report on thermoelectric properties above room temperature for the p- and n-type single crystals which were grown from Ga–Sn double flux and Sn single flux, respectively. The measurements of electrical resistivity showed hysteretic behaviors when the sample was heated to 600 K. Powder X-ray diffraction analysis indicated that the type-I structure changed to the type-VIII after the sample was heated to 600 K. By using the data of Seebeck coefficient, electrical resistivity, and thermal conductivity, we estimated the dimensionless figure of merit ZT for the type-I Ba₈Ga₁₆Sn₃₀. For the p- and n-type samples, the values of ZT reach 0.58 and 0.50 at around 450 K, respectively, which values are approximately half of those for the type-VIII counterparts.     

Electron beam induced current investigation of planar photodiode structures on InSb crystals

Multielement planar photodiode structures produced on InSb crystals using Be⁺ ion implantation to form a p ⁺-n junction and anodic oxidation to protect the surface are studied in the Electron Beam Induced Current (EBIC) mode. It is found that the initial crystal doping level affects the EBIC distribution across the crystal surface outside the planar boundaries of the p ⁺-n junction. It is shown that the most perfect p ⁺-n junctions are formed on crystals with the highest resistivity when the lowest values of the implantation energy and dose are applied and pulse photon postimplantation annealing is used. The diffusion lengths in all the types of the structures in study are estimated. It is found that the level of anodic oxide charging by the electron beam depends on the electrolyte composition used in the anodic treatment.     

Mechanisms of charge transfer and magnetoresistance in CuInSe<Subscript>2</Subscript>

The electrical conductivity and magnetoresistance effect of n and p types of CuInSe₂ single crystals were studied within the temperature range of 4.2–300 K and within magnetic fields of up to 6 T. It was found that the hopping mechanism of conductivity dominates in the temperature range of 4.2–100 K. A peculiarity of electrical conductivity behavior, accompanied by a change in the magnetoresistance sign in the vicinity of T ≈ 60 K, was revealed.