X-ray Peltier cooled detectors for X-ray fluorescence analysis

The recent results on development of X-ray Si(Li), Si-planar and CdTe p-i-n detectors cooled by Peltier coolers for fabrication of laboratory and portable XRF analysers for different applications are discussed.

Low detection limits of XRF analysers are provided by increasing of detectors sensitive surface; improvement of their spectrometrical characteristics; decreasing of front-end-electronics noise level; Peltier coolers and vacuum chambers cooling modes optimization.

Solution of all mentioned tasks allowed to develop Peltier cooled detectors with the following performances:

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Advantages and disadvantages of all types of detectors for X-ray fluorescence analysis are compared. Spectra are presented. Application of different XRF analysers based on developed detectors in medicine, environmental science, industry, cryminalistics and history of art are demonstrated.     

Development of an X-ray fluorescence spectrometric method for the analysis of atmospheric aerosol samples

A simple, rapid method was developed for the analysis of aerosol samples by X-ray fluorescence spectrometry. Aerosol measurements were made using various sample supports (Whatman and Teflon filters, Prolene® foil). The calibration procedure was carried out by dripping 500 μl of a gradually diluted multi-elemental standard solution (CertiPUR® 11355) onto the top of the sample supports, which were then dried at ambient temperature. Thirteen elements, namely Na, Al, K, Ca, Cr, Mn, Fe, Co, Ni, Cu, Zn, Sr and Pb were calibrated and quantified. The optimal measurement parameters (excitation conditions, measuring times for each element) were determined on the basis of blank values and the amplitude of the signals. The filters were covered with Ta or Re plates to ensure infinite thickness for the penetration depth of the primary X-ray beam. It was also demonstrated that these plates served as a secondary target. The accuracy, precision and detection limits (0.01–0.18 mg/kg) were calculated. All the analytical parameters were better when Teflon filters and Prolene® foil were used than in the case of Whatman quartz fibre filters.     

The influence of scattering processes in quantitative X-ray fluorescence analysis

Existing theory was used to develop a fundamental parameter (FP) computer program for quantitative X-ray fluorescence (XRF) spectrometry in which scattering interactions are taken into account. The program is suited for polychromatic radiation and composite samples and is used to estimate the errors that result from neglecting the scattering contributions in the analysis of samples in a low Z matrix when the spectrometer is calibrated either on pure elements or on standards similar to the samples.     

Energy-dispersive X-ray fluorescence spectrometer for analysis of conventional and micro-samples: Preliminary assessment

The energy-dispersive X-ray fluorescence spectrometer for analysis of conventional and micro-samples using pinhole collimators of various sizes is developed. The measurements can be performed in the air or, in order to decrease the absorption of long-wavelength radiation of low-Z elements, in helium atmosphere. The sample is excited by the air-cooled Rh target X-ray tube of ca. 100 μm nominal focal spot size and maximum power 75 W. The X-ray spectra of the samples are collected by thermoelectrically cooled Si-PIN detector. The tungsten pinhole collimators of the size holes from 50 to 2000 μm are placed between primary filter and analyzed sample to reduce size of analyzed area. The sample can be moved using the X–Y stage. The position of the sample is monitored by CCD camera and two laser pointers. The beam spot sizes for various collimators are evaluated by the thin-wire and knife-edge methods. Beside the beam spot sizes, the loss of radiation intensity and the changes of spectral distribution of the incident radiation caused by applying various collimators are also investigated. The sample-surface-down geometry in the designed spectrometer allows for a simple analysis of various samples: solutions, loose powders, solid samples of conventional size and micro-samples.     

X射线荧光光谱法测定羰化反应液及催化剂中的铑

建立了以波长色散X射线荧光光谱仪直接测定羰化反应液及催化剂中铑含量的定量分析方法, 采用甲苯为溶剂的铑催化剂溶液做校准曲线标准样品, 铑质量分数测量范围为10～1000 μg/g, 在总测量时间为20 s时, 其检出限为2.2 μg/g. 15次的平行重复测试结果, 相对标准偏差为0.94%. 溶液厚度实验说明, 当溶液的厚度超过14.7 mm时可视为达到无限厚. 并将不同样品同时进行了XRF测试和原子吸收法测量, 结果一致.     

A maximum information utilization approach in X-ray fluorescence analysis

X-ray fluorescence data bases have significant contradictions, and inconsistencies. We have identified that the main source of the contradictions, after the human factors, is rooted in the signal processing approaches. We have developed signal processors to overcome many of the problems by maximizing the information available to the analyst. These non-paralyzable, fully digital signal processors have yielded improved resolution, line shape, tailing and pile up recognition. The signal processors account for and register all events, sorting them into two spectra, one spectrum for the desirable or accepted events, and one spectrum for the rejected events. The information contained in the rejected spectrum is mandatory to have control over the measurement and to make a proper accounting and allocation of the events. It has established the basis for the application of the fundamental parameter method approach. A fundamental parameter program was also developed. The primary X-ray line shape (Lorentzian) is convoluted with a system line shape (Gaussian) and corrected for the sample material absorption, X-ray absorbers and detector efficiency. The peaks also can have, a lower and upper energy side tailing, including the physical interaction based long range functions. It also employs a peak and continuum pile up and can handle layered samples of up to five layers. The application of a fundamental parameter method demands the proper equipment characterization. We have also developed an inverse fundamental parameter method software package for equipment characterisation. The program calculates the excitation function at the sample position and the detector efficiency, supplying an internally consistent system.     

Extended fine structure in characteristic X-ray fluorescence: A novel structural analysis method of condensed systems

An oscillation similar to that in extended X-ray absorption fine structure (EXAFS) is found in characteristic X-ray fluorescence spectra, originating from a quantum interference effect during the X-ray emission process in a solid. We observe the oscillating fine structure in the radiative Auger X-ray fluorescence spectra of aluminum metal. The Al-Al interatomic distances are successfully reproduced by the Fourier transform of the fine structure. Thus, the present method has the potential to become a convenient alternative to EXAFS measurement for light elements.     

Determination of cadmium and lead in plastic material from waste electronic equipment using solid sampling graphite furnace atomic absorption spectrometry

The European initiatives to minimize waste electric and electronic equipment (WEEE) and the restriction of hazardous substances (RoHS) had a major impact on the routine control of hazardous substances, including toxic trace metals, such as cadmium and lead, in all kinds of materials that are used in electric and electronic equipment. Instead of analyzing a whole computer, cell phone or television set, individual parts are normally investigated in order to simplify the analytical task. Plastic components are important constituents of electronic equipment, and a potential source of toxic trace metals that are added as catalysts, stabilizers or colorants. As high-tech plastic materials are designed to be resistant against chemical attack, they are usually difficult to bring into solution. A procedure is proposed in the present work that uses direct solid sampling graphite furnace atomic absorption spectrometry and calibration against aqueous standards. The method is sensitive, fast, and it does not require any sample preparation. The limits of detection of 0.1 mg kg^− 1 for Cd and 0.6 mg kg^− 1 for Pb are more than adequate for the purpose. Additional means are presented for reducing the sensitivity in order to cope with high analyte concentration. The method has been tested analyzing two certified reference materials, and good agreement with certified values has been obtained.     

Preparation of reference materials for the determination of RoHS-relevant flame retardants in styrenic polymers

Reference materials for the analysis of polybrominated diphenyl ethers, polybrominated biphenyls and other common brominated flame retardants (FR) in styrenic polymers were prepared to suit the demands of actual restriction of the use of certain hazardous substances in electrical and electronic equipment analytics. Three methods of preparation were employed, viz. pellet forming, dissolution/vaporisation and extrusion, whereby extrusion proved to be the most suitable method. For extrusion, three procedures of pre-mixing were investigated: the polymers were either mixed with FR powder, FR solutions or FR concentrates that were taken from waste industrial polymers. The latter procedure proved to be most appropriate in terms of analyte concentration, predictability and recovery. The homogeneity of the samples, as well as the chemical and thermal long-term stabilities, was investigated. The result was an optimised method to prepare a suitable reference material for laboratory use. Figure   Electronic supplementary material  The online version of this article (doi:) contains supplementary material, which is available to authorized users.     

Application of X-ray fluorescence analytical techniques in phytoremediation and plant biology studies

Phytoremediation is an emerging technology that employs the use of higher plants for the clean-up of contaminated environments. Progress in the field is however handicapped by limited knowledge of the biological processes involved in plant metal uptake, translocation, tolerance and plant–microbe–soil interactions; therefore a better understanding of the basic biological mechanisms involved in plant/microbe/soil/contaminant interactions would allow further optimization of phytoremediation technologies. In view of the needs of global environmental protection, it is important that in phytoremediation and plant biology studies the analytical procedures for elemental determination in plant tissues and soil should be fast and cheap, with simple sample preparation, and of adequate accuracy and reproducibility. The aim of this study was therefore to present the main characteristics, sample preparation protocols and applications of X-ray fluorescence-based analytical techniques (energy dispersive X-ray fluorescence spectrometry—EDXRF, total reflection X-ray fluorescence spectrometry—TXRF and micro-proton induced X-ray emission—micro-PIXE). Element concentrations in plant leaves from metal polluted and non-polluted sites, as well as standard reference materials, were analyzed by the mentioned techniques, and additionally by instrumental neutron activation analysis (INAA) and atomic absorption spectrometry (AAS). The results were compared and critically evaluated in order to assess the performance and capability of X-ray fluorescence-based techniques in phytoremediation and plant biology studies. It is the EDXRF, which is recommended as suitable to be used in the analyses of a large number of samples, because it is multi-elemental, requires only simple preparation of sample material, and it is analytically comparable to the most frequently used instrumental chemical techniques. The TXRF is compatible to FAAS in sample preparation, but relative to AAS it is fast, sensitive and multi-elemental. The micro-PIXE technique requires rather expensive instrumentation, but offers multi-elemental analysis on the tissue and cellular level.     

Radioisotope sources for X-ray fluorescence analysis

Problems involved in developing radioisotope sources and the characteristics of potentially useful radioisotopes for X-ray fluorescence analysis are presented. Some of the isotopes, which are not in use but look very promising, are indicated.     

Uranium determination at ppb levels by X-ray fluorescence after its preconcentration on polyurethane foam

A sensitive method based on the preconcentration of uranium on powdered polyurethane foam (PUF) has been developed to determinate this element in water samples by X-ray florescence. Uranium at ppb levels was sorbed as the salicylate complex on powdered PUF at pH 4.0. The resulting PUF was filtered through a filter paper and used for X-ray fluorescence measurements. For 50 μg/l of uranium the coefficient of variation for five measurements is 5% and the detection limit is 5.5 μg/l. The interference level of various ions and ligands was studied and optimum conditions were developed to determine uranium in reference materials, waste water, mine drainage, and sea water.     

Development of standards for reliable surface analyses by ISO technical committee 201 on surface chemical analysis

The need for reliable surface analyses together with quality‐management requirements for analytical laboratories led the International Organization for Standardization (ISO) to form its Technical Committee (TC) 201 on Surface Chemical Analysis in 1991. This article describes the organization of TC 201, the strategies that have been found useful for identifying and assessing possible projects for new international standards, and the 57 international standards and other documents prepared to date by TC 201. Standards have now been developed for Auger‐electron spectroscopy, glow‐discharge spectroscopy, various types of scanning probe microscopy, secondary‐ion mass spectrometry, sputter‐depth profiling, total‐reflection X‐ray fluorescence spectroscopy, X‐ray photoelectron spectroscopy, and X‐ray reflectometry. In addition, standards have been developed with definitions of terms used in surface chemical analysis; the handling, preparation of specimens for surface analysis; information and data‐transfer formats; and methods for determining the lateral resolution of beam‐based methods of surface analysis. Copyright © 2014 John Wiley & Sons, Ltd.     

粉末压片-X荧光光谱法测定过磷酸钙中硫含量

硫是过磷酸钙中重要营养指标之一,为准确快速测定过磷酸钙中硫的含量,试验采用粉末压片-X荧光光谱法,将过磷酸钙试样充分干燥后研磨至粒度小于74 μm,采用硼酸镶边,在压力18 Mpa条件下保压30 s,制成样片。通过在过磷酸钙样品中添加不同质量的纯物质硫酸钙（质量分数范围1.52 %～17.21 %）,经过专用混匀设备混合均匀后,与试样压片相同条件下压制标准样片,作为过磷酸钙中硫的标准样品,建立硫标准曲线,曲线线性相关系数R2为0.9995,采用经验系数法校正干扰,建立了粉末压片-波长色散X射线荧光光谱法测定过磷酸钙中硫含量的方法, 方法检出限为0.002 %。对3个不同硫含量的过磷酸钙样品采用本实验方法重复测量7次,RSD在1.4 %~3.1 %,方法精密度性好,同时用高温燃烧红外光谱法和电感耦合等离子发射光谱法对比,三者测量结果相对极差小于2.0 %,测量结果无显著性差异。此方法不需要对样品进行熔融或溶解,样品制备简单,数据准确度和稳定性好,分析效率高,适合大批量样品中硫的测定。     

Quantitative X-ray fluorescence analysis of multielemental subjects of complex shape without implementation of reference standards

A theoretical dependence of the ratio of intensities of X-ray fluorescence lines of chemical elements on the ratio of their concentration in a sample is suggested. The effect of various experimental factors on parameters of the obtained model is considered. A method of quantitative X-ray fluorescence analysis of multielemental subjects using the suggested calibration dependence without the implementation of reference standards is described. The adequacy and analytical advantages of the developed approach are demonstrated for the determination of the elemental composition of a sample of a metal alloy of complex shape.     

X-ray fluorescence analysis of rocks

Summary Modern methods for the determination of various elements in geological materials by XRFA are reviewed. XRFA theory and metrological characteristics are discussed in detail.

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Röntgenfluorescenzanalyse von Gesteinen

     

Analysis of non-organic elements in plant foliage using polarised X-ray fluorescence spectrometry

An X-ray fluorescence (XRF) method for the rapid and non-destructive analysis of 30 non-organic elements in plant leaves over five orders of magnitude concentration from several percentage of dry weight to sub-milligram per kilogram, is described. There is a growing need for a simple method of monitoring non-organic trace elements in plant material, especially those which accumulate in soils with application of fertilisers, both inorganic and biosolids. Earlier attempts to use XRF for the analysis of plant material suffered from sensitivity loss due to the high background of organic matrices caused by scattering of the X-ray source. We overcome this by using polarised X-ray sources in a Cartesian geometrical arrangement with sample and energy dispersive detector (EDPXRF), a configuration which can achieve an order of magnitude reduction in background compared with unpolarised sources. Further sensitivity gains are made using a high power tube as a source of primary X-rays and for some analytes employing secondary targets for near-monochromatic excitation. Sample preparation is simple involving only pulverising and briquetting of dried samples. Accuracy is evaluated by comparing data obtained for the suite of NIST plant leaf samples (NIST 1515 apple leaves, NIST 1547 peach leaves, NIST 1570a spinach leaves, NIST 1573a tomato leaves and NIST 1575a pine needles) and tobacco leaf standards CTA-OTL-1 and CTA-VTL-2. The data compare well over the whole concentration range and the method provides a rapid analytical tool for monitoring potentially toxic trace elements in all types of foliage with adequate sensitivity for many purposes.     

Optimisation of total-reflection X-ray fluorescence for aerosol analysis

The capabilities of total-reflection X-ray fluorescence (TXRF) analysis were investigated to develop an efficient, simple, rapid and low cost analytical method for aerosols. The technique involves direct impaction of airborne particulate matter on the quartz sample-reflector discs for TXRF. Special attention was paid to bounce-off effects, and hence the aerosol size distributions for the impactor stages; influence of siliconizing the quartz discs on the adhesion of particles; choice of the internal standard; local distribution of the material deposited on the quartz disc; and alternative materials for aerosol collection. Moreover, the proposed method could be used in combination with a one-stage impactor for total aerosol mass collection and analysis.     

X射线荧光光谱分析

作为《分析试验室》定期评述“X射线荧光光谱分析”系列评论第八篇,本文收集国内学者在1998年7月至2000年6月期间公开发表在国内外期刊和国际会议文集上的129篇论文,并对此期间对我国X射线荧光光谱分析的概况、发展和国际上的地位进行了讲述,内容包括仪器及维修、基体校正、数据处理方法、谱分析方法的研究、标样及样品制备、全反射X射线荧光光谱、同步辐射光源X射线荧光光谱、粒子激发X射线发射、X射线荧光光谱分析方法研究及其应用。