Qualitative analysis of spin-dependent tunneling in a ferromagnetic metal-insulator-ferromagnetic metal junction

A qualitative analysis of spin-dependent tunneling in ferromagnetic metal-insulator-ferromagnetic metal junctions is performed using the WKB approximation and a parabolic band model. It is shown that, as distinct from other tunneling characteristics, only electrons moving at large angles in the plane of the tunnel barrier contribute to the magnetoresistance. The cause of the rapid decrease in the junction magnetoresistance upon applying a bias voltage across the junction is ascertained. It is shown that this cause is attributed to the mirror character of tunneling and remains valid within the framework of more complicated models.     

Josephson coupling and Fiske dynamics in ferromagnetic tunnel junctions

We report on the fabrication of Nb/AlO _x /Pd_0.82Ni_0.18/Nb superconductor/insulator/ferromagnetic metal/superconductor (SIFS) Josephson junctions with high critical current densities, large normal resistance times area products, high quality factors, and very good spatial uniformity. For these junctions a transition from 0- to π-coupling is observed for a thickness d _F @\simeq 6 nm of the ferromagnetic Pd_0.82Ni_0.18 interlayer. The magnetic field dependence of the π-coupled junctions demonstrates good spatial homogeneity of the tunneling barrier and ferromagnetic interlayer. Magnetic characterization shows that the Pd_0.82Ni_0.18 has an out-of-plane anisotropy and large saturation magnetization, indicating negligible dead layers at the interfaces. A careful analysis of Fiske modes provides information on the junction quality factor and the relevant damping mechanisms up to about 400 GHz. Whereas losses due to quasiparticle tunneling dominate at low frequencies, the damping is dominated by the finite surface resistance of the junction electrodes at high frequencies. High quality factors of up to 30 around 200 GHz have been achieved. Our analysis shows that the fabricated junctions are promising for applications in superconducting quantum circuits or quantum tunneling experiments.     

Experimental barrier heights and the image potential in scanning tunneling microscopy

The effect of the classical image potential on the tunnel-barrier heights deduced from scanning tunneling microscopy is considered. An earlier prediction that the image potential should lead to an observable difference in barrier heights as deduced from two different measurements is shown to be incorrect. Using an approximation to the full multiple image potential we find that the barrier height deduced from the variation of current with tunnel-barrier width is extremely close to the unreduced work function, and we discuss what characteristic of the image potential leads to this result.     

压缩应变载荷下氮化镓隧道结微观压电特性及其巨压电电阻效应

电子器件可控性研究在日益追求器件智能化和可控化的当今社会至关重要. 基于第一性原理和量子输运计算, 本文研究了压缩应变载荷对氮化镓(GaN)隧道结基态电学性质和电流输运的影响, 在原子尺度上窥视了氮化镓隧道结的微观压电性, 验证了其内在的巨压电电阻(GPR)效应. 计算结果表明, 压缩应变载荷可以调节隧道结内氮化镓势垒层的电势能降、内建电场、电荷密度和极化强度, 进而实现对隧道结电流输运和隧穿电阻的调控. 在-1.0 V的偏置电压下, -5%的压缩应变载荷将使氮化镓隧道结的隧穿电阻增至4倍. 本研究展现了氮化镓隧道结在可控电子器件中的应用潜力, 也展现了应变工程在调控电子器件性能方面的光明前景.     

The effect of superconducting fluctuations on the resistance of tunneling junction: The existence of ultrathin surface layer in NbN films

The effect of superconducting fluctuations on quasi-particle current of tunneling junction is discussed. The anomalous contribution in tunneling current from interacting across the barrier fluctuations is found. It gives rise to pseudogap minimum in R_d(V). Similar dependence is observed experimentally in NbN-I-Pb junctions. Reasons are given to suggest that there is some ultrathin layer on the surface of NbN films whose properties drastically differ from the bulk one.     

Tunnel magnetoresistance oscillations in a ferromagnet-insulator-ferromagnet system

A model of spin-dependent transport of electrons through a ferromagnet-insulator-ferromagnet structure is developed. It takes into account the image forces, tunnel barrier parameters, and effective masses of an electron tunneling in the barrier and in the ferromagnetic electrode in the free electron approximation. Calculations for an iron-aluminum oxide-iron structure show that, with an increase in the bias voltage, the tunnel magnetoresistance decreases monotonically and then breaks into damped oscillations caused by the interference of the electrons’ wave functions in the conduction region of the potential barrier. The image forces increase the tunnel magnetoresistance by two or three times.     

Imaging of spatial structures in superconducting tunnel junctions by electron-beam scanning

The voltage change caused in a current-biased superconducting tunnel junction by scanning the junction surface with an electron beam can serve to generate a two-dimensional image of spatial structures within the specimen. Depending upon the bias point during the scanning process, an image of local variations in the tunneling current density due to variations of the tunnel barrier resistance or in the energy gaps of the electrodes is obtained. PbAuIn/PbBi cross-line and SiO-window junctions have been used to demonstrate this imaging technique.     

Inelastic resonant tunneling

A general expression for the resonant contribution to a tunneling current has been obtained and analyzed in the tunneling Hamiltonian approximation. Two types of resonant tunneling structures are considered: structures with a random impurity distribution and double-barrier structures, where the resonant level results from size quantization. The effect of temperature on the current-voltage curves of tunneling structures is discussed. The study of the effect of potential barrier profile on the d ² I/dV ² line shape is of interest for experiments in inelastic tunneling spectroscopy. Various experimental situations where the inelastic component of the tunneling current can become comparable to the elastic one are discussed. Fiz. Tverd. Tela (St. Petersburg) 40, 1151–1155 (June 1998)     

Theory of resonant tunneling through the insulator conduction band of a thin film metal-insulator-metal (MIM) heterojunction

An “atomic” model of an insulating barrier between two free-electron model metals is used to investigate resonant tunneling across the insulator in the presence of a medium to large, externally applied electric field (bias). The exact numerically calculated tunneling current exhibits a pronounced oscillatory bias dependence superposed on the dominant roughly exponential tunneling characteristic. The interpretation of these results in terms of an internal field emission or Fowler-Nordheim type tunneling subject to “periodic deviations” (or interferences) seems plausible and was suggested by Maserjian. To test this conjecture, a trapezoidal barrier model of our “atomic” model analyzed numerically. As expected, the trapezoidal barrier model could only qualitatively reproduce the oscillatory bias dependence of the barrier transmissivity and of the current. Furthermore this limited agreement depends on allowing the effective mass in the barrier to become a strictly adjustable parameter. This failure of the conventional model of the junction can be interpreted as follows: (i) For moderate external (bias) fields the trapezoidal barrier fails to account for the correct position dependence of the Blochwave vector in the insulator's conduction band, hence the correct interference conditions cannot be reproduced. (ii) For large external fields the band model itself begins to fail. An explanation of oscillatory bias dependence at the tunneling current in terms of splitting of the insulator's conduction band into a set of discrete Stark levels is suggested. It is demonstrated that a fit of the oscillatory tunneling characteristics in the “Fowler-Nordheim regime” is not a reliable technique to determine the effective mass in the thin insulating film of tunneling junctions over the energy interval containing the forbidden gap and the adjoining conduction-band.     

Analytical modeling of electrical characteristics of coaxial nanowire FETs

In this paper, an analytical approach based on ballistic current transport is presented to investigate the electrical characteristics of the coaxial nanowire field effect transistor (CNWFET). The potential distribution along the nanowire is derived analytically by applying Laplace equation. In addition to application of WKB approximation and ballistic transport, tunneling process and quantum state of energy are implemented to determine the amount of electron transport along the nanowire from the source to the drain terminals. To consider the tunneling phenomena, WKB approximation is used and the transmission coefficients on both sides of the channel are obtained separately. In ballistic regime, an expression for channel current in terms of the bias voltages and Schottky barrier height (SBH) is derived. The results confirm a close correlation between the current equation of this work and the results presented via other approaches.     

Interplay of conductance, force, and structural change in metallic point contacts

The coupling between two atomically sharp nanocontacts provides tunable access to a fundamental underlying interaction: the formation of the bond between two atoms as they are brought into contact. Here we report a detailed experimental and theoretical analysis of the relation between the chemical force and the tunneling current during bond formation in atom-scale metallic junctions and their dependence on distance, junction structure, and material. We found that the short-range force as well as the conductance in two prototypical metal junctions depend exponentially on the distance and that they have essentially the same exponents. In the transition regime between tunneling and point contact, large short-range forces generate structural relaxations which are concomitant with modifications of the surface electronic structure and the collapse of the tunneling barrier.     

磁性隧道结中的量子相干输运研究

采用散射矩阵的方法研究了铁磁/绝缘层/半导体/绝缘层/铁磁(FM/I/SM/I/FM)磁性双隧道结的量子相干输运特性.研究发现当隧穿电子平均自由程(l_p)和中间层半导体厚度(L)可比拟时双结隧道磁阻(TMR)将随L的变化产生量子振荡,当l_p远大于L时振荡拐点处出现cut-off波矢,分析表明cut-off波矢主要是来自于隧道结两边的铁磁和半导体层隧穿电子动量波矢的高度不匹配性,随着L关键词： cut-off 波矢 量子相干 振荡 隧道磁阻     

The tunneling magnetoresistance in GaMnAs/GaAs/GaMnAs junctions

The tunneling magnetoresistance (TMR) in GaMnAs/GaAs/GaMnAs magnetic tunnel junctions is studied under an extended coherent tunneling approach where both the contributions of the light holes and the heavy holes and their mutual competitions are investigated. It is shown that the TMR ratio can increase with decreasing the barrier strength, which is different from the results in the conventional magnetic tunnel junctions but a good news for the applications. It is also shown that the presence of the pinholes in the thin barrier layer gives a possible explanation of the peak in the barrier thickness dependence of the TMR ratio.     

Conductance anomalies of small tunnel junctions inside the Coulomb gap

A small-capacitance normal tunnel deviates significantly from equilibrium because each tunneling event turns the junction voltage almost upside-down. If such a sudden perturbation occurs locally, Fermi liquid theory guarantees that infinitely many electron-hole pairs should be created near the Fermi surface. It is predicted that such an infrared-divergent shake-up combined with the electromagnetic environment leads to subgap conductance anomalies for two categories of junctions. For symmetric junctions whose electrodes have the same electronic properties, a nonvanishing subgap conductance is shown to be inevitable even if the environmental impedance is infinite. This effect smoothes the current-voltage (I–V) characteristic and shifts the Coulomb offset extrapolated back from the high-voltage part of theI–V curve. For asymmetric junctions, whose electrodes have different electronic affinities, tunneling conductance is enhanced in one direction and suppressed in the other; that is, the junctions exhibit a diode effect. In particular, when the tunneling resistance is much smaller than the resistance quantum and the current flows in the favorable direction, a strong tendency towards establishing phase coherence is shown to emerge, as in Josephson junctions, resulting in infinite differential conductance at zero bias voltage.     

A comparison of barrier type tunnel junction and point contact tunnel junction formed on the same highT c material

By making a combination of both point contact and barrier type tunnel junctions on a single sample of the highT _c superconductor BSCCO (2212) single crystal, we have shown that as the tunneling tip is slowly retracted from the surface a point contact junction gradually evolves from a N-S short to a high resistance tunnel junction. The scaled dynamic conductance (dI/dV) of this point contact tunnel junction becomes almost identical to that of a conventional barrier type tunnel junction and both show a linear dI/dV —V curve. The observation implies that at high resistance a point contact junction behaves in the same way as a barrier type tunnel junction. We suggested that the almost linear tunneling conductance obtained in both the cases most likely arises due to an intrinsic characteristic of the surface of the crystal comprising of a mosaic of superconducting regions of the order of a few nanometers. We also conclude that the barrierless (N-S) point contact obtained by piercing the surface oxide layer of the crystal shows Andreev reflection which we suggest as the origin of the zero bias anomaly often observed in point contact junctions.     

Disturbance of tunneling coherence by oxygen vacancy in epitaxial Fe/MgO/Fe magnetic tunnel junctions

Oxygen vacancies in the MgO barriers of epitaxial Fe/MgO/Fe magnetic tunnel junctions are observed to introduce symmetry-breaking scatterings and hence open up channels for noncoherent tunneling processes that follow the normal WKB approximation. The evanescent waves inside the MgO barrier thus experience two-step tunneling, the coherent followed by the noncoherent process, and lead to lower tunnel magnetoresistance, higher junction resistance, as well as increased bias and temperature dependence. The characteristic length of the symmetry scattering process is determined to be about 1.6 nm.     

Entangled electron current through finite size normal-superconductor tunneling structures

We investigate theoretically the simultaneous tunneling of two electrons from a superconductor into a normal metal at low temperatures and voltages. Such an emission process is shown to be equivalent to the Andreev reflection of an incident hole. We obtain a local tunneling Hamiltonian that permits to investigate transport through interfaces of arbitrary geometry and potential barrier shapes. We prove that the bilinear momentum dependence of the low-energy tunneling matrix element translates into a real space Hamiltonian involving the normal derivatives of the electron fields in each electrode. The angular distribution of the electron current as it is emitted into the normal metal is analyzed for various experimental setups. We show that, in a full three-dimensional problem, the neglect of the momentum dependence of tunneling causes a violation of unitarity and leads to the wrong thermodynamic (broad interface) limit. More importantly for current research on quantum information devices, in the case of an interface made of two narrow tunneling contacts separated by a distance r, the assumption of momentum-independent hopping yields a nonlocally entangled electron current that decays with a prefactor proportional to r ^-2 instead of the correct r ^-4.Received: 14 June 2004, Published online: 24 September 2004PACS: 74.45. + c Proximity effects; Andreev effect; SN and SNS junctions - 74.50. + r Tunneling phenomena; point contacts, weak links, Josephson effects     

Graphene-based tunnel junction

The tunneling current in a junction formed by graphene half-planes and bilayer graphene with two possible packing types and two possible orientations of the crystal lattice is calculated by the Green’s function technique in the framework of the tight-binding approximation. It is shown that the band structure of graphene oriented toward the junction by the armchair-type edges leads to a power-law dependence of the tunneling current on applied voltage being specific for each specific kind of graphene. The characteristic features of this dependence are determined by the change in the number of transport channels with the growth of the applied voltage. For all junctions under study with zigzag edges oriented toward each other, it is found that the tunneling current exhibits characteristic peaks related to the existence of the localized edge states. The effects induced by the gate voltage are also studied. For the structures with zigzag edges, it is shown that the effect of switching off/on takes place for the junctions. The junctions formed by the graphene armchair edges do not exhibit any pronounced switching phenomena and the growth of the bias voltage results in higher values of the conductivity.     

Spin torque, tunnel-current spin polarization, and magnetoresistance in MgO magnetic tunnel junctions

We employ the spin-torque response of magnetic tunnel junctions with ultrathin MgO tunnel barrier layers to investigate the relationship between spin transfer and tunnel magnetoresistance (TMR) under finite bias, and find that the spin torque per unit current exerted on the free layer decreases by < 10% over a bias range where the TMR decreases by > 40%. This is inconsistent with free-electron-like spin-polarized tunneling and reduced-surface-magnetism models of the TMR bias dependence, but is consistent with magnetic-state-dependent decay lengths in the tunnel barrier.     

Oxide growth and tunneling characteristics of Sn-SnO x -Sn junctions

Sn—SnO _x —Sn tunneling junctions were prepared by thermal oxidation of vacuum deposited Sn-films. The thickness growth of the oxide was followed by ellipsometric measurements. From logarithmic conductivity measurements the barrier heights were determined. The tunneling characteristic could be well described by the two-band-tunneling model using a value of 0.14 for the ratio of the effective masses in the oxide and the metal.