混浊介质二维后向漫散射穆勒矩阵的测量

研制了一套实验系统用于测量混浊介质的后向漫散射穆勒矩阵.在系统中,激光被调制成所需偏振态,聚焦于混浊介质表面.利用CCD相机配合相应的偏振元件,测量入射点周围区域的后向散射光中特定偏振态的能量空间分布,并由测量值计算出介质的后向漫散射穆勒矩阵.描述了系统的组成、测量原理以及方法,分别测量了消偏振分光棱镜的反射穆勒矩阵和浓度1.5％的脂肪乳溶液的后向漫散射穆勒矩阵.实验证明:该系统能够完全消除样品表面镜面反射光的干扰,精确的测量混浊介质的后向漫散射穆勒矩阵;并可望用于生物组织的研究中.     

Two-dimensional depth-resolved Mueller matrix characterization of biological tissue by optical coherence tomography

We built a polarization-sensitive optical coherence tomographic system and measured the two-dimensional depth-resolved full 4 x 4 Mueller matrix of biological tissue for what is believed to be the first time. The Mueller matrix measurements, which we made by varying the polarization states of the light source and the detector, yielded a complete characterization of the polarization property of the tissue sample. The initial experimental results indicated that this new approach reveals some tissue structures that are not perceptible in standard optical coherence tomography.     

Optical-fiber-based Mueller optical coherence tomography

An optical-fiber-based multichannel polarization-sensitive Mueller optical coherence tomography (OCT) system was built to acquire the Jones or Mueller matrix of a scattering medium, such as biological tissue. For the first time to our knowledge, fiber-based polarization-sensitive OCT was dynamically calibrated to eliminate the polarization distortion caused by the single-mode optical fiber in the sample arm, thereby overcoming a key technical impediment to the application of optical fibers in this technology. The round-trip Jones matrix of the sampling fiber was acquired from the reflecting surface of the sample for each depth scan (A scan) with our OCT system. A new rigorous algorithm was then used to retrieve the calibrated polarization properties of the sample. This algorithm was validated with experimental data. The skin of a rat was imaged with this fiber-based system.     

基于Mueller矩阵成像椭偏仪的纳米结构几何参数大面积测量

为了实现有效的工艺监控, 在批量化纳米制造中对纳米结构的关键尺寸等几何参数进行快速、低成本、非破坏性的精确测量具有十分重要的意义. 光学散射仪目前已经发展成为批量化纳米制造中纳米结构几何参数在线测量的一种重要手段. 传统光学散射测量技术只能获得光斑照射区内待测参数的平均值, 而对小于光斑照射区内样品的微小变化难以准确分析. 此外, 由于其只能进行单点测试, 必须要移动样品台进行扫描才能获得大面积区域内待测参数的分布信息, 从而严重影响测试效率. 为此, 本文将传统光学散射测量技术与显微成像技术相结合, 提出利用Mueller矩阵成像椭偏仪实现纳米结构几何参数的大面积快速准确测量. Mueller矩阵成像椭偏仪具有传统Mueller矩阵椭偏仪测量信息全、光谱灵敏度高的优势, 同时又有显微成像技术高空间分辨率的优点, 有望为批量化纳米制造中纳米结构几何参数提供一种大面积、快速、低成本、非破坏性的精确测量新途径.     

Calculations of the Mueller matrix for scattering of light from two-dimensional surfaces

Abstract

Results are presented of an analysis of the Mueller matrix parameters for the problem of scattering of light from two-dimensional rough surfaces. The Mueller matrix fully describes the polarization properties of the scattered light. It is shown, using symmetry arguments, that for normal incidence it is necessary to measure the Mueller matrix terms in only one plane, thus reducing the amount of data to be analysed. Examples of the form of the Mueller matrix terms are calculated using a simple ray-trace approach.     

基于Mueller矩阵椭偏仪的纳米压印模板与光刻胶光栅结构准确测量

在纳米压印工艺中,对模板和压印结构的几何参数进行快速、低成本、非破坏性地准确测量具有非常重要的意义.与传统光谱椭偏仪只能改变波长和入射角2个测量条件并且在每一组测量条件下只能获得振幅比和相位差2个测量参数相比,Mueller矩阵椭偏仪可以改变波长、入射角和方位角3个测量条件,而且在每一组测量条件下都可以获得一个4×4阶Mueller矩阵共16个参数,因此可以获得更为丰富的测量信息.通过选择合适的测量条件配置,充分利用Mueller矩阵中的测量信息,有望实现更为准确的纳米结构测量.基于此,本文利用自主研制的Mueller矩阵椭偏仪对硅基光栅模板和纳米压印光刻胶光栅结构进行了测量.实验结果表明,通过对Mueller矩阵椭偏仪进行测量条件优化配置,并且在光学特性建模时考虑测量过程中出现的退偏效应,可以实现压印工艺中纳米结构线宽、线高、侧壁角以及残胶厚度等几何参数更为准确的测量,同时对于纳米压印光刻胶光栅结构还可以直接得到光斑照射区域内残胶厚度的不均匀性参数.     

Spectroscopic Mueller matrix polarimeter using four-channeled spectra

A Mueller matrix polarimeter acquired for four-channeled spectra is proposed. Both the polarizing and analyzing optics of this system consist of a linear polarizer and a high-order retarder. The polarizing elements can modulate the polarization states in the wavenumber space. By applying a Fourier transform method to a single-channeled spectrum, nine elements of the Mueller matrix can be deconvoluted without modifying the configuration of either the polarizing or analyzing optics. It is thus possible to determine the wavelength dependence of all the Mueller matrix elements from four-channeled spectra obtained using four different configurations for the polarizing and analyzing optics. The performance of this method is evaluated by measuring polarization properties, such as retardance, azimuthal angle, and linear diattenuation, from the obtained Mueller matrix in wavenumber space.     

Polarimetry group theory analysis in biological tissue phantoms by Mueller coherency matrix

The characterization of biological tissues by optical techniques provides several advantages over other techniques. Optical techniques enable to perform high resolution and contrast imaging, in a non-invasive way and with no-contact. Biological tissues are turbid media that strongly scatter light. The ultrastructure of some tissues makes them present a certain degree of anisotropy. Both scattering and anisotropy affect light polarization. Some pathologies alter these characteristics of the tissue. As a consequence polarized light can be used to extract additional information and achieve a better diagnosis.In this work, Group Theory is applied to analyse the polarization behavior of several samples. Firstly, the Mueller matrix for each sample is measured. Then, the Mueller Coherency matrix is obtained by means of the SU(4)-O + (6) homomorphism. Finally, the target decomposition theorem is applied by analyzing the eigenvalues and eigenvectors, and subsequently the different polarimetric effects are separated. In this way, the contrast of tissue imaging can be increased. This analysis is applied to biological tissue phantoms, which consisted on glucose suspensions of polystyrene spheres with different scatterer concentrations. Their behaviour can be modeled by means of single or multiple scattering depending on the concentration, either in the Rayleigh or Mie regimes. The same procedure could be used in a wide range of applications, like the study of cancerous cells that grow without control in cell cultures, or erythrocytes monitoring in anemia. The technique also has a great potential to be applied in Polarization Sensitive Optical Coherence Tomography (PS-OCT).     

The connection between Mueller and Jones matrices of polarization optics

A necessary and sufficient condition for the 4 × 4 Mueller matrix to be derivable from the 2 × 2 Jones matrix is obtained. This condition allows one to determine if a given Mueller matrix describes a totally polarized system or a partially polarized (depolarizing) system. The result of Barakat is analysed in the light of this condition. A recently reported experimentally measured Mueller matrix is examined using this condition and is shown to represent a partially polarized system.     

Mueller matrix determination for one-dimensional rough surfaces: Four reduced measurement equivalent sets

There are several methods for the experimental determination of the Mueller matrix (MM) for a general scattering system. For the case of scattering in the plane-of-incidence, we apply the direct method of Mueller matrix ellipsometry to determine the MM associated to a one-dimensional scattering system. We show the MM for a 1-D surface can be determined with four different measurements from four equivalent sets consisting of four Stokes vector inputs and four analyzers. We show all the possible measurements can be reduced to a single set of four different intensity measurements.     

Mueller matrix for characterization of one-dimensional rough perfectly reflecting surfaces in a conical configuration

Theoretical results of the use of a Mueller matrix to characterize a one-dimensional rough perfectly reflecting, single-scattering surface in a conical configuration are presented. The conical Mueller matrix (CMM) is derived from the known Mueller matrix of this kind of surface in the plane of incidence [the plane Mueller matrix (PMM)]. The key argument is that, as the PMM is considered to be a Mueller-Jones matrix, an appropriate rotation of the complex amplitude matrix provides the conic Mueller matrix.     

Properties of high-numerical-aperture Mueller-matrix polarimeters

To our knowledge there has been very little work done to establish the theoretical basis of high-NA Mueller matrix polarimetry. We consider how high-NA polarimetry differs from traditional wide-field polarimetry. We show that confocal polarimetry leads to an averaging of the sample Jones matrices, each of which is associated with one of the incident plane waves comprising the incident focused field and that a conventional polarimeter leads to an averaging of sample Mueller matrices. We conclude with an example.     

Polarization state and Mueller matrix measurements in terahertz-time domain spectroscopy

We derive the complete formulae governing the polarization state measurement in terahertz-time domain spectroscopy (THz-TDS) by using a rotatable THz polarizer. Four Stokes parameters can be uniquely obtained by spectrally-resolved measurement in THz-TDS. Further, we propose a new approach to measure the Mueller matrix of a pure birefringent material, using THz-TDS, by rotating the material under test. Based on the above techniques, we successfully measured the Mueller matrices of a quartz crystal in the frequency domain.     

随机介质背散射二维Mueller矩阵的数值模拟与分析

推导了随机介质背散射Mueller矩阵的直接计算公式,并运用矢量Monte Carlo方法进行了数值模拟.结果表明随机介质背散射二维Mueller矩阵方位关系随散射系数的减小而增强,而与微粒大小关系不大;Mueller矩阵元素绝对值的空间分布随径向呈近似指数规律衰减,矩阵元素的方位变化具有周期性.对称系统的二维Mueller矩阵的花样图中仅有7幅独立,其余9幅可通过对称、旋转变换得到.     

Numerical study of the characterization of forward scattering Mueller matrix patterns of turbid media with triple forward scattering assumption

We propose a triple forward scattering model to numerically investigate the forward scattering Mueller matrix of a turbid medium. The calculated results show that the Mueller matrix based on the triple scattering model can completely describe the basic symmetries and azimuthal structures of the forward scattering Mueller matrix of a turbid medium. The results show that the forward scattering Mueller matrix is characterized with special symmetric structure compared with backscattering Mueller matrix patterns. The method will extend the investigation to light scattering mechanism from cells and to diagnosis of diabetes and other blood related diseases.     

The estimation of surface roughness with the utilization of Mueller matrix

Roughness is an important parameter to describe the microtopography of target surface. In the field of roughness detection, constraints on traditional methods are significant. Meanwhile, polarization imaging technology is gradually mature in recent years. In this paper, a method of roughness estimation with Mueller matrix is presented. Battery of lenses with fixed orientation have been introduced to produce a facula on the measured surface. Polarized information of each pixel can be obtained with the lenses of known position. According to the polarized information and Lambertian model, Stocks vector, Mueller matrix, and reflected Mueller matrix of each pixel can be acquired. Therefore, the roughness information of target surface can be obtained according to the relationship between roughness information and elements of matrix. Experimental results show that with the proposed method, efficiency of roughness detection can be improved without precision deducing. It can lay a foundation for extending the application of roughness into the field of object identification.     

Identification and characterization of optically active materials excited by sources in the chiral medium

Biological and chemical materials that possess chiral properties can be identified and characterized through their optical activity. Optical activity (Optical Rotation and Circular Dichroism) manifests itself through the measurement of select elements of the Mueller matrix that are proportional to the cross polarized reflection and transmission coefficients for waves that are incident in free space upon the optically active medium. Thus no polar decomposition is required to identify optical activity. Thus it is not necessary to measure all sixteen elements of the Mueller Matrix. We analyze here in detail the case when the exciting sources lie below the interface in the chiral material, which could be a fluid. Explicit expressions, to within first order of the chiral measure, are obtained for the corresponding reflection and transmission matrices for circularly and linearly polarized waves. These results are compared with the results for excitations above the interface in free space. Significant differences are found between the corresponding expressions for the reflection and transmission matrices, they are related to the Mueller matrix elements and the Differential Circular Reflection. These results have numerous biological, biochemical, and medical applications.     

Transformation matrices for the Mueller-Jones formalism

The Mueller-Jones (MJ) or pure Mueller matrix formulation has been reported by using two different matrix transformations in a condensed representation. The possibility to find other transformation matrices is explored. A complete set of unitary operators (R) is found to be closely related with the MJ matrices and with the evolution of pure states on the Poincaré sphere surface. We propose an alternative deduction for the condensed representation of the MJ matrices, obtained by using the Kronecker product operation and use of R unitary matrices as a tool to combine different Mueller matrices and changes of polarized states on the Poincarè sphere surface. Finally, it is shown explicitly that the columns of the transformation matrices are the eigenvectors of the MJ matrix associated to a non-depolarizing optical system and a corollary is established as a criterion to differentiate a Mueller matrix from an MJ matrix.     

Snapshot imaging Mueller matrix polarimeter using polarization gratings

A snapshot imaging Mueller matrix polarimeter (SIMMP) is theoretically described and empirically demonstrated through simulation. Spatial polarization fringes are localized onto a sample by incorporating polarization gratings (PGs) into a polarization generator module. These fringes modulate the Mueller matrix (MM) components of the sample, which are subsequently isolated with PGs in an analyzer module. The MM components are amplitude modulated onto spatial carrier frequencies which, due to the PGs, maintain high visibility in spectrally broadband illumination. An interference model of the SIMMP is provided, followed by methods of reconstruction and calibration. Lastly, a numerical simulation is used to demonstrate the system's performance in the presence of noise.     

基于双折射晶体的快拍穆勒矩阵成像测偏原理分析

针对传统穆勒矩阵成像测偏仪包含活动部件,需进行多次测量,容易产生测量误差,不能对运动目标或动态场景进行同时、实时测量等问题,提出了一种以改进型萨瓦偏光镜为核心分光器件的快拍Mueller矩阵成像测偏技术(MSP-SMMIP).它不含任何活动部件,能通过单次快拍测量获取目标强度图像和全部16个穆勒矩阵阵元图像.它主要由偏振态产生和偏振态分析两部分组成,偏振干涉条纹通过偏振态产生光路后定位于测试样品上,随后这些条纹通过空间载频将样品的Mueller矩阵分量编码,经偏振态分析光路成像于焦平面上.采用斯托克斯矢量-穆勒矩阵形式阐明了光场偏振态被MSP-SMMIP调制的过程,给出了其像面干涉图表达式,讨论了Mueller矩阵反演和系统定标的方法.基于CCD相机参数分析了系统的光学指标.通过数值模拟实验给出模拟测量结果,通过定性和定量评价测量结果表明该系统的可行性.MSP-SMMIP技术具有稳态、快拍、结构简洁、易定标、可同时实时获取目标强度图像和全部Mueller矩阵阵元图像的显著特点.