A comparison study of electroluminescence from Au/native oxide/p-Si and Au/porous Si diodes

Visible electroluminescence (EL) has been observed from a Au/native oxide/p-Si diode and has been studied in comparison with the EL from a Au/porous Si diode. Both diodes share similarities in current-voltage characteristics, EL spectra, and electrical input power dependence of integrated EL intensity. However, Au/porous Si exhibits quite strong photoluminescence (PL) while Au/native oxide/p-Si does not show any measurable PL. For the Au/native oxide/p-Si diode, when the native oxide layer was removed in 1% HF solution, no detectable EL has been observed. These experimental results indicate that the native oxide layer plays a key role in light emission from the Au/native oxide/p-Si diode, and show that the luminescence mechanism for Au/native oxide/p-Si diodes is similar to that for the Au/porous Si diode. This comparative study may aid in elucidation of the EL mechanism of porous silicon.     

On the role of moisture in the ageing and restoration processes in ZnS: Cu electroluminophores

An investigation is carried out on the simultaneous effect of wet atmosphere and exciting electric field on aged electroluminescent ZnS: Cu cells (ELC), due to which a better stability and an increase of brightness up to 30% were registered. A model is proposed for the ageing process in ELC in a dry atmosphere, based on the partial reduction of the second Cu_2?xS (0 ? x ? 1) phase, and a model is suggested for the brightness restoration of ELC in wet atmosphere also, based on the partial oxidation of Cu₂S.     

Comparison of confinement characters between porous silicon and silicon nanowires

Confinement character and its effects on photoluminescence (PL) properties are theoretically investigated and compared between porous silicon (p-Si) and silicon nanowires (Si-NWs). The method is based on the application of the tight-binding technique using the minimal sp³-basis set, including the second-nearest-neighbor interactions. The results show that the quantum confinement (QC) is not entirely controlled by the porosity, rather it is mainly affected by the average distance between pores (d). The p-Si is found to exhibit weaker confinement character than Si-NWs. The confinement energy of charge carriers decays against d exponentially for p-Si and via a power-law for Si-NWs. This latter type of QC is much stronger and is somewhat similar to the case of a single particle in a quantum box. The excellent fit to the PL data demonstrates that the experimental samples of p-Si do exhibit strong QC character and thus reveals the possibility of silicon clustering into nano-crystals and/or nanowires. Furthermore, the results show that the passivation of the surface dangling bonds by the hydrogen atoms plays an essential role in preventing the appearance of gap states and consequently enhances the optical qualities of the produced structures. The oscillator strength (OS) is found to increase exponentially with energy in Si-NWs confirming the strong confinement character of carriers. Our theoretical findings suggest the existence of Si nanocrystals (Si-NCs) of sizes 1-3 nm and/or Si-NWs of cross-sectional sizes in the 1-3 nm range inside the experimental p-Si samples. The experimentally-observed strong photoluminescence from p-Si should be in favor of an exhibition of 3D-confinement character. The favorable comparison of our theoretical results with the experimental data consolidates our above claims.     

n-ZnO/LaAlO3/p-Si heterojunction for visible-blind UV detection

A visible-blind UV photodetector (PD) using a double heterojunction of n-ZnO/LaAlO3 (LAO)/p-Si was demonstrated. Inserted LAO layers exhibit electrical insulating properties and serve as blocking layers for photoexcited electrons from p-Si to n-ZnO, leading to an enhanced rectification ratio and a visible-blind UV detectivity of the n-ZnO/LAO/p-Si PDs due to the high potential barrier between LAO and p-Si layers (~2.0 eV). These results support the use of n-ZnO/LAO/p-Si PDs in the visible-blind UV PDs in a visible-light environment.     

Synthesis and characterization of p-GaSe thin films and the analyses of I–V and C–V measurements of p-GaSe/p-Si heterojunction under electron irradiation

Gallium Selenide (GaSe) thin films were grown by the electrochemical deposition (ECD) technique on Indium tin oxide (ITO) and p-Si (100) substrates. The Electron paramagnetic resonance (EPR) spectrum of GaSe thin films’ growth on ITO was recorded at room temperature. According to EPR results, the g value of an EPR signal obtained for GaSe deposited on ITO is 2.0012?±?0.0005. In/GaSe/p-Si heterojunction was irradiated with high-energy (6?MeV) and low-dose (1.53?×?10¹⁰?e^??cm^?2) electrons. The ideality factor of the In/GaSe/p-Si device was calculated as 1.24 and barrier height was determined as 0.82?eV from I–V measurements before irradiation. Acceptor concentration, built-in potential and barrier height of the In/GaSe/p-Si device were also obtained as 0.72?×?10^14?cm^?3, 0.65?eV and 0.97?eV from C–V measurements, respectively. After irradiation, the ideality factor n and barrier height Φ_b values of the In/GaSe/p-Si device were calculated as 1.55 and 0.781?eV, respectively. Acceptor concentration, the built-in potential and barrier height values of the In/GaSe/p-Si device have also shown a decrease after 6?MeV electron irradiation. This change in heterojunction device parameters shows that current transport does not obey thermionic emission, and thus tunneling could be active due to the defects formed by irradiation at the In–GaSe interface.     

Nickel-disilicide-assisted excimer laser crystallization of amorphous silicon

Polycrystalline silicon (poly-Si) thin film has been prepared by means of nickel-disilicide (NiSi多晶硅 受激准分子激光器结晶 结晶化 界面晶粒生长polycrystalline silicon, excimer laser crystallization,Ni-disilicide, Ni-metal-induced lateral crystallization, two-interface grain growthProject supported by the National High Technology Development Program of China (Grant No 2002AA303250) and by the National Natural Science Foundation of China (Grant No 60576056).9/7/2005 12:00:00 AM3/6/2006 12:00:00 AMPolycrystalline silicon （poly-Si） thin film has been prepared by means of nickel-disilicide （NiSi2） assisted excimer laser crystallization （ELC）. The process to prepare a sample includes two steps. One step consists of the formation of NiSi2 precipitates by heat-treating the dehydrogenated amorphous silicon （a-Si） coated with a thin layer of Ni. And the other step consists of the formation of poly-Si grains by means of ELC. According to the test results of scanning electron microscopy （SEM）, another grain growth model named two-interface grain growth has been proposed to contrast with the conventional Ni-metal-induced lateral crystallization （Ni-MILC） model and the ELC model. That is, an additional grain growth interface other than that in conventional ELC is formed, which consists of NiSi2 precipitates and a-Si. The processes for grain growth according to various excimer laser energy densities delivered to the a-Si film have been discussed. It is discovered that grains with needle shape and most of a uniform orientation are formed which grow up with NiSi2 precipitates as seeds. The reason for the formation of such grains which are different from that of Ni-MILC without migration of Ni atoms is not clear. Our model and analysis point out a method to prepare grains with needle shape and mostly of a uniform orientation. If such grains are utilized to make thin-film transistor, its characteristics may be improved.     

Electrochemical formation and properties of thin polyaniline films on Au(111) and p-Si(111)

The specific aspects of phase formation phenomena involved in electrodeposition of conducting polymer layers are critically discussed. The mechanism of formation and the properties of electrodeposited thin polyaniline (PANI) films on Au(111) and p-Si(111) are investigated by means of transient measurements, cyclic voltammetry, electrochemical impedance spectroscopy and atomic force microscopy (AFM). Experimental results show that the initial stages of PANI electrodeposition on Au(111) can be described by a model including progressive appearance and preferential 2D growth of polymer islands. The electropolymerization process on p-Si(111) substrates is preceded by anodic formation of an inhomogeneous thin SiO₂ layer giving rise to a progressive appearance and growth of 3D PANI islands. The electrochemical redox properties of electrodeposited PANI films on p-Si(111) are influenced strongly by the electronic band structure of silicon. PACS 81.10.Aj; 82.45.Wx; 82.45.Vp     

Barrier height enhancement of metal/semiconductor contact by an enzyme biofilm interlayer

A metal/interlayer/semiconductor (Al/enzyme/p-Si) MIS device was fabricated using α-amylase enzyme as a thin biofilm interlayer. It was observed that the device showed an excellent rectifying behavior and the barrier height value of 0.78?eV for Al/α-amylase/p-Si was meaningfully larger than the one of 0.58?eV for conventional Al/p-Si metal/semiconductor (MS) contact. Enhancement of the interfacial potential barrier of Al/p-Si MS diode was realized using enzyme interlayer by influencing the space charge region of Si semiconductor. The electrical properties of the structure were executed by the help of current–voltage and capacitance–voltage measurements. The photovoltaic properties of the structure were executed under a solar simulator with AM1.5 global filter between 40 and 100?mW/cm² illumination conditions. It was also reported that the α-amylase enzyme produced from Bacillus licheniformis had a 3.65?eV band gap value obtained from optical method.     

Epitropic Liquid-Crystal Hexadecane Layer in the Rheological Model of a Heterophase Interlayer

The hydrodynamic model of a heterophase interlayer of a liquid, which includes an epitropic liquid-crystal (ELC) layer, is supplemented with its structural-rheological model. The application of these models and the technique developed for processing the results of viscosity measurements for n-hexadecane interlayers in the tribotriads has made it possible to conduct a detailed determination of the properties of its ELC layer and the overlapped layer, such as the equilibrium thickness and viscosity, their temperature variation, and the activations energy of the viscous flow.     

Field-induced transition from homeotropic to planar geometry in the SmC* phase of an electroclinic liquid crystal

The optical and electrical behavior was investigated of a symmetric liquid crystal (LC) cell: ITO–silane–LC–silane–ITO. The silane layer induces a perfect homeotropic alignment of the molecules of the studied electroclinic liquid crystal (ELC) material, BDH 764E. A field-induced transition from the perfect homeotropic to planar orientation in the chiral smectic C (SmC*) and smectic A (SmA) phases of the ELC was observed. Optical and dielectric studies were performed for both alignment (geometry) modes. The field-induced transition from the homeotropic to planar orientation was studied vis-à-vis the high negative dielectric anisotropy obtained in the studied material. Such an ELC with large negative dielectric anisotropy and perfect homeotropic alignment may have important implications for modern LC display technology.     

Ag纳米颗粒对富Ag二氧化硅薄膜电致发光谱的影响

利用磁控溅射和热退火在硅衬底上制备了Ag纳米颗粒镶嵌的氧化硅薄膜(SiO2∶ Ag),制作了电致发光结构ITO/SiO2∶Ag/p-Si,观测到了可见区的电致发光.发现薄膜中的Ag纳米颗粒不仅成倍地提高器件的发光强度,还明显地移动电致发光的峰位.Ag含量越高,颗粒越大,发光峰位越红移.氧化硅中的发光中心与纳米Ag间的电...     

Graphene/silicon photoelectrode with high and stable photoelectrochemical response in aqueous solution

The graphene (Gr)/Si electrodes were fabricated by electrophoresis method and then following an annealing process. The p-Si surface was found to be covered completely with successive and transparent Gr sheets, and thus the impairment of aqueous solution on the photoelectrochemical capability of silicon could be avoided. This annealing process was a key process for improving the adhesion of Gr/Si interface. After annealing at 400 °C, the Gr/Si electrodes displayed high photoresponse ability and high stability in aqueous solution. The carriers transfer between Gr and Si is discussed on the basis of the semiconductor energy band theory. The results demonstrated that the Gr/Si electrodes would be a promising candidate as solar energy materials using in aqueous solution.     

Micro-Raman spectroscopy characterization of polycrystalline silicon films fabricated by excimer laser crystallization

The rapid recrystallization of amorphous silicon films utilizing excimer laser crystallization (ELC) is presented. The resulting poly-Si films are characterized by Raman spectroscopy. Polycrystalline silicon (poly-Si) films with higher crystallinity can be realized by a dehydrogenation process before ELC. Raman spectra as a function of various excimer laser energy densities are demonstrated. The crystallinity and residual stress of the poly-Si films are determined and discussed.     

Rapid determination of surface roughness of polycrystalline silicon following frontside and backside excimer laser irradiation

Excimer-laser crystallization (ELC) is the most commonly employed technology for fabricating low-temperature polycrystalline silicon (LTPS). Investigations on the surface roughness of polycrystalline silicon (poly-Si) thin films have become an important issue because the surface roughness of poly-Si thin films is widely believed to be related to its electrical characteristics. In this study, we develop a simple optical measurement system for rapid surface roughness measurements of poly-Si thin films fabricated by frontside ELC and backside ELC. We find that the incident angle of 20° is a good candidate for measuring the surface roughness of poly-Si thin films. The surface roughness of polycrystalline silicon thin films can be determined rapidly from the reflected peak power density measured by the optical system developed using the prediction equation. The maximum measurement error rate of the optical measurement system developed is less than 9.71%. The savings in measurement time of the surface roughness of poly-Si thin films is up to 83%. The method of backside ELC is suggested for batch production of low-temperature polycrystalline silicon thin-film transistors due to the lower surface roughness of poly-Si films and higher laser-beam utilization efficiency.     

Evolution of microstructure in polycrystalline silicon thin films upon excimer laser crystallization

Polycrystalline silicon (poly-Si) films fabricated by pulsed excimer laser crystallization (ELC) have been investigated using time-resolved optical measurements, scanning-electron microscopy, and cross-sectional transmission-electron microscopy. Detailed crystallization mechanisms are proposed to interpret the microstructure evolution of poly-Si films for both frontside and backside ELC. It is found that the backside ELC is a good candidate for the manufacturing of low-temperature polycrystalline silicon because of the high laser efficiency and low surface roughness of the poly-Si films.     

Solidification velocity in liquid silicon during excimer laser crystallization

Excimer laser crystallization (ELC) is commonly employed to fabricate low-temperature polycrystalline silicon. A time-resolved in-situ optical system with nanosecond response time is developed to monitor and record the phase transformation process during ELC. The average solidification velocity of liquid silicon (liquid Si) is investigated from the optical spectra recorded by a fast oscilloscope. It is found that the average solidification velocities of liquid Si in the partial-melting and complete-melting regimes are fundamentally different. In the partial-melting regime, the average solidification velocity decreases with increasing excimer laser energy density; while in the complete-melting regime, it increases abruptly due to the presence of deeply supercooled liquid Si.     

聚乙烯咔唑超分子膜／p－Si体系的表面光电压谱研究

利用ＬＢ技术，以二十碳酸作辅助成膜材料，在疏水处理的Ｐ－Ｓｉ上分别制备了２、４、６、１０和２０层聚乙烯咔唑（ＰＶＫ）超分子膜。对这种体系的表面光电压谱（ＳＰＳ）研究结果表明，表面光电压随ＰＶＫ膜层数的增加而增强，在紫外区增强较为明显。随着膜层数的增加，表面光电压有趋于饱和的趋势。膜对基底的敏化主要是由于ＰＶＫ的光导电性引起的。     

Liquid-crystalline characteristics of cellulose derivatives: Binary and ternary mixtures of ethyl cellulose,hydroxypropyl cellulose,and acrylic acid

Phase behavior in binary and ternary mixtures of ethyl cellulose (EC), hydroxypropyl cellulose (HPC), and acrylic acid (AA) was investigated by optical techniques including polarized-light microscopy (POM), refractometry, UV absorption, and circular dichroism (CD) spectrophotometries, and laser-light scattering. Both derivatives of cellulose formed a cholesteric liquid-crystal phase in concentrated solutions in AA. EC and HPC homopolymer solutions in AA showed iridescent colors in the concentration range of 42–50 wt% and 65–80 wt%, respectively. In the 30–50 wt% HPC/AA solutions, an optical image with fingerprint-like patterns was observed between crossed polars. CD revealed that the cholesteric helical sense was right-handed in the HPC/AA mesophase, while the EC/AA mesophase formed left-handed structures. Anisotropic samples of HPC/AA and EC/AA also showed a POM image with a grid-like texture, which was much coarser in the former system compared with that in the latter. A phase diagram constructed for the ternary system EC/HPC/AA was divided into five distinct regions: (1) isotropic (I) monophase, (2) I + HPC mesophase (HLC), (3) I + HLC + EC mesophase (ELC), (4) HLC + ELC, and (5) anisotropic monophase, with the optical appearance changeable depending on polymer composition and concentration. In region 5 the anisotropic system was apparently monophasic in POM observations; however, CD and UV results indicated that the biphasic separation into the two cholesteric structures still occurred. Optical anisotropy and phase behavior were also examined for the EC/ HPC binary blends prepared from solutions and melt.     

Fabrication of large-grain polycrystalline Ge films using absorptive films

Amorphous germanium (a-Ge) films in samples with or without an absorptive film are crystallized by short-pulse XeF excimer laser crystallization (ELC). An in situ time-resolved optical reflection and transmission (TRORT) monitoring system combining a cw He-Ne probe laser, a digital oscilloscope and two photodetectors is developed to investigate the melting and resolidification dynamics of Ge films during ELC. TRORT measurements reveal that the longest melt duration is prolonged from 250 to 1000 ns by adding absorptive films in the samples. Absorptive films are shown to be effective in improving the melt duration of the molten state and the grain size of polycrystalline Ge films. The grain size with a diameter of approximately 12 μm can be fabricated in the superlateral growth regime for 90-nm-thick a-Ge films at room temperature in air by single-shot ELC.