Influence of the Si(111)-7×7 surface reconstruction on the diffusion of strontium atoms

The diffusion of strontium atoms on the Si(111) surface at room temperature has been investigated using scanning tunnel microscopy and simulation carried out in terms of the density functional theory and the Monte Carlo method. It has been found that the reconstruction of a clean silicon surface with a 7 × 7 structure has a profound effect on the diffusion process. The average velocity of motion of a strontium atom in a unit cell of the 7 × 7 structure has been calculated. The main diffusion paths of a strontium atom and the corresponding activation energies have been determined. It has been demonstrated that the formation of scanning tunnel microscope images of the Si(111)-7 × 7 surface with adsorbed strontium atoms is significantly affected by the shift of the electron density from the strontium atom to the nearest neighbor silicon adatoms in the 7 × 7 structure.     

Fluorine etching on the Si(111)-7×7 surfaces using fluorinated fullerene

Fluorine etching on the Si(1 1 1)-7×7 surfaces using fluorinated fullerene molecules as a fluorine source has been investigated. At room temperature, adsorbed fluorinated fullerene molecules reacted with the Si(1 1 1)-7×7 surface to create a localized distribution of fluorine on the surface. Nanoscale etch pits were created by annealing at 300 °C, due to the adsorption of the fluorine localized around the C₆₀F_x molecules. Annealing at 400 °C resulted in the delocalized fluorine distribution on the surface and healing of the etch pits, due to the enhancement of the diffusion of both the fluorine and silicon atoms. Subsequent annealing at 500 °C led to desorption of SiF₂ reactants formed on the surface. The fluorine diffusion process was found to be an elemental process in the etching because the diffusion of adsorbed fluorines is a key for the formation of the SiF₂ species and their subsequent desorption.     

Reflection electron microscope study of hydrogen atom adsorption on Si(111)7 × 7 surfaces

Si(111)7 × 7 surfaces were exposed to hydrogen atoms and changes of the surfaces during the exposure and subsequent annealing were in-situ observed by ultrahigh vacuum reflection electron microscopy. At room temperature the structure transformed to the so-called δ−7 ×7 structure which gave superlattice reflections mainly along lines which connect the neighboring fundamental reflections. The surface images did not show orientational domains, which indicated that the δ−7 × 7 structure is not composed of three domains of a 7 × 1 structure. Atomic step configurations did not change during the process. This was also the case when the δ−7 × 7 structure transformed to the 7 × 7 structure of the clean surface by annealing above 450 °C.     

Formation of Br-terminated Si6 rings during etching of Si(111)-7 × 7

Scanning tunneling microscopy was used to study the morphological evolution of Si(111)-7 × 7 exposed to molecular bromine. Etching at 900 K results in the removal of adatoms and conversion from the 7 × 7 surface to a 1 × 1 Br-terminated structure. Removal is dominated by bilayer step retreat with edge profiles that reflect etching anisotropies. Unique structures attributed to regrowth of Si released during step etching were consistent with six-membered Si rings terminated with Br. The distribution of such rings near the steps reflects the local bonding and etching anisotropies for the steps. Theoretical analyses of these rings terminated with Cl determine bond lengths, bond angles, and charge transfer within the ring.     

Site selective SiH4 adsorption on Si(111)(7 × 7) surfaces

Scanning tunneling microscopy (STM) was used to investigate room temperature adsorption and dissociation of SiH₄ on Si(111)(7 × 7) surfaces. The data show a pronounced site selectivity for this process. Initially the reaction involves exclusively the corner holes and the adjacent Si adatoms of the (7 × 7) reconstruction, with preferential adsorption of SiH₃ groups in the corner holes and of H atoms on one of the adjacent corner adatoms. For higher SiH₄ exposures the reactivity of the corner adatoms is significantly reduced, hydrogen adsorption occurs preferentially on the center adatoms. Deposited SiH_x groups (x = 2, 3) nucleate now in small clusters on the terraces. A higher density of these SiH_x clusters on domain boundaries or at steps indicates a higher reactivity of these defect sites.     

Oscillatory diffusion in gold submonolayers over the Si(111)7 × 7 surface

A gold-deposited area of 0.1 mm diameter and several monolayers thick on the Si(111)7 × 7 surface is annealed at 700° C. In the diffusion process, the concentric oscillatory rings of the √3 × √3 and 5 × 1 structures are formed in an area of 0.4 mm diameter and observed by the dark field image in scanning LEED microscopy in an ultra-high vacuum. The diffusion is apparently independent of surface steps and crystallographic orientation from a macroscopic viewpoint. The formation of the periodic rings with the different surface structures and coverages is interpreted by using the surface diffusion equation and regarded as an intermediate phase prior to achieving the equilibrium state.     

Adsorption of Perylene on Si(111)(7×7)

We investigate the adsorption of organic molecular semiconductor perylene on(7 × 7) reconstructed Si(111)surface by ultraviolet photoemission spectroscopy.It is observed that seven features that derive from the organic material are located at 0.71,2.24,4.0,5.9,7.46,8.65 and 9.95 eV in binding energy.The theoretical calculation results reveal the most stable adsorption geometry of organic molecule perylene on Si(111)(7 × 7) substrates is at the beginning of deposition.     

Kinetic Monte Carlo simulations of Si/Si(111)7×7 homoepitaxy

Kinetic processes that influence epitaxial growth of thin films are being more and more explored. Recent observations of growth on reconstructed surfaces suggested that material attachment to existing islands may be hindered by a barrier to attachment. We present a kinetic Monte Carlo model of Si/Si(111)7×7 homoepitaxy with the barrier to attachment implemented. We show that this model successfully reproduces available experimental results obtained during initial stages of growth and during surface relaxation. We show that the high scaling exponents experimentally observed are due to specific growth kinetics of the Si/Si(111)7×7 system. Presented at the VIII-th Symposium on Surface Physics, Třešt’ Castle, Czech Republic, June 28 – July 2, 1999. This work was supported by the Grant Agency of the Czech Republic, project GAČR 202/97/1109 and by the Volkswagen Stiftung.     

Adsorption of O2 and CO2 on the Si(111)-7 × 7 surfaces

The interaction of O₂ and CO₂ with the Si(111)-7 × 7 surface has been studied with X-ray photoelectron spectroscopy (XPS). It was found that both O₂ and CO₂ molecules can readily oxidize the Si(111)-7 × 7 surface to form thin oxide films. Two oxygen species were identified in the oxide film: oxygen atoms binding to on-top sites of adatom/rest atoms with an O 1s binding energy of ~ 533 eV as well as to bridge sites of adatom/rest atom backbonds at ~ 532 eV. These two oxygen species can be interconverted thermally during the annealing process. Due to the low oxidation capability, the silicon oxide film formed by CO₂ has a lower O/Si ratio than that of O₂.     

Formation and local electronic structure of Ge clusters on Si（111）-7×7 surfaces

We report the formation and local electronic structure of Ge clusters on the Si(111)-7$\times $7 surface studied by using variable temperature scanning tunnelling microscopy (VT-STM) and low-temperature scanning tunnelling spectroscopy (STS). Atom-resolved STM images reveal that the Ge atoms are prone to forming clusters with 1.0~nm in diameter for coverage up to 0.12~ML. Such Ge clusters preferentially nucleate at the centre of the faulted-half unit cells, leading to the `dark sites' of Si centre adatoms from the surrounding three unfaulted-half unit cells in filled-state images. Bias-dependent STM images show the charge transfer from the neighbouring Si adatoms to Ge clusters. Low-temperature STS of the Ge clusters reveals that there is a band gap on the Ge cluster and the large voltage threshold is about 0.9~V.     

Effect of NH3 adsorption on the atomic structure of Si(111) √3 × √3 - Al and Si(111) √3 × √3 - Ag surfaces

The room temperature (RT) adsorption of ammonia (NH₃) on Si(111)√3 × √3-Al and Si(111)√3 × √3-Ag surfaces has been studied using LEED and AES. The transformation from Si(111)√3 × √3-Al surface structure to Si(111)1 × 1-(Al, H) upon NH₃ exposure has been found to be similar to the previously observed structural transformation induced by exposure in the atomic hydrogen. It has been demonstrated that the transformation is caused by hydrogen atoms which are generated by NH₃ dissociation on the Si(111)√3 × √3-Al surface. It has been estimated that about 0.1 ML of ammonia molecules is needed to complete the structural transformation. No interaction of NH₃ with the Si(111)√3 × √3-Ag surface has been found. The dissociation of NH₃ molecules is believed to be impossible on this surface     

Patterns in Ge cluster growth on clean and oxidized Si(111)-(7 × 7) surfaces

Ge atoms have been deposited on domain-patterned clean Si(111)-(7 × 7) and oxidized Si(111)-(7 × 7) surfaces. Clustering of Ge from the deposited Ge adatoms on these two kinds of surfaces shows contrasting patterns. On the clean Si surface, clustering predominantly occurs on domain boundaries, which include step edges on two sides. This leaves small domains denuded. Ge diffusion length has been estimated from the size of these denuded domains. For large domains, additional clustering is observed within the domains. For the oxidized Si surface, the pattern formation is in sharp contrast with that for the clean Si surface. In this case the domain boundaries remain relatively empty and there is strong clustering within the domains leading to the formation of dense Ge nanoislands within the domains. This contrasting pattern formation has been explained via a reaction diffusion model.     

STM study of nucleation of Ag on Si(111)−(7 × 7) surface

Initial stages of Ag on Si(111)−(7 × 7) surface nucleation were studied at submonolayer coverage. Samples were prepared by thermal evaporation of Ag from tungsten wire under UHV conditions (p<2.5 × 10⁻⁸ Pa). Various deposition rates (0.002–0.1 ML s⁻¹) were used to prepare Ag island films with coverages (0.002–2) ML (1 ML ≈ 7.58 × 10¹⁴ atoms cm⁻²) at room temperature. We observed preferential growth on faulted half unit cells (F cells). At constant coverage both the island density and ratio of occupied F and U (unfaulted) cells are independent of the deposition rate, which is an evidence for dominant influence of substrate structure. The preference of nucleation in the F cells against U cells decreases with the coverage until the ratio is 1:1 for 1 ML Ag film. We have observed that presence of an Ag island in any type of the half unit cell (F or U) considerably reduces nucleation probability in neighbouring cells. This results in forming of structural patterns observed among randomly grown Ag-islands which is a new feature found for Ag/Si(111)−(7 × 7) system. Presented at the VIII-th Symposium on Surface Physics, Třešt’ Castle, Czech Republic, June 28 – July 2, 1999. This work was supported by the Grant Agency of Charles University — projects GAUK 34/97 and 147/99, by the Grant Agency of Czech Republic — project GAČR 202/97/1109 and by the Ministry of Education grant VS 97116.     

A straight domain boundary of single-atom width on a Si(111)-(7 × 7) surface

Using scanning tunneling microscopy (STM), we have observed an antiphase domain boundary of single-atom width on a Si(111)-(7 × 7) surface. The extra row of adatoms forming the boundary lies on the unfaulted half of the 7 × 7 unit cell, in agreement with total energy calculations using the first-principles self-consistent pseudofunction method. The filled-state STM image shows a missing interior adatom on the unfaulted half, in agreement with calculations of the partial density of states of an adatom surrounded by three rest-atoms.     

Si(111)7×7结构模型的稳定性研究

本文基于有相互作用的结构件的概念,对Si(111)7×7结构模型的稳定性进行研究。利用紧束缚法,计算了各种结构件的形成能及其相互作用能。由这些结构件可灵活地构成各种大单胞的表面结构并对其进行总能计算,而避免了大工作量的计算。对Si(111)5×5和7×7DAS模型,我们得到其表面能分别为-0.467eV和-0.477eV,与Qian和Chadi的结果很接近。并指出,Harrison提出的7×7吸附原子模型和Binnig等人提出的7×7吸附原子-空位模型都是不稳定的。     

Atomic geometry of Si(111) 7×7 by dynamical low-energy electron diffraction

A complete determination of individual atomic coordinates for the Si(111) 7×7 surface has been carried out by dynamical low-energy electron diffraction. The dimer-adatom-stacking fault (DAS) model, after large vertical and lateral relaxations, was found to produce calculated spectra in remarkably good agreement with the data. Atoms in the faulted half of the unit cell are raised from those of the unfaulted half. Adatoms at corner sites are higher than those at center sites.     

Site discrimination of adatoms in Si(111)-7 × 7 by noncontact atomic force microscopy

Site discrimination of adatoms in Si(111)-7 × 7 by dynamic mode noncontact atomic force microscopy (NC-AFM) in ultrahigh vacuum has been demonstrated. At a fixed frequency shift, NC-AFM images were acquired at various amplitudes. At amplitudes less than 30 nm_p-p, no atomic image was observed. At 33 nm_p-p, clearly resolved atomic images showed 6 bright atoms in one half of each 7 × 7 unit cell and 6 less bright atoms in the other half of each unit cell. Furthermore, the corner adatoms were observed to be higher. At 36 nm_p-p, such differences were not observed. The observed site differences are not derived by the differences in the actual positions of adatoms, but by the differences in the interactions between the atom at the AFM tip apex and the adatoms on the Si surface.