Comparison of energy‐loss functions from REELS spectra with surface and bulk energy loss functions for Ag

Effective energy‐loss functions were derived from the reflection electron energy‐loss spectroscopy (REELS) spectra of Ag by an extended Landau approach. The effective energy‐loss functions obtained are close to the surface energy‐loss function in the low‐energy‐loss region, but tend to be closer to the bulk energy‐loss function in the higher energy‐loss region for higher primary energy. The REELS spectra incorporating the effective energy‐loss function are also reproduced in a Monte‐Carlo simulation model and confirm that the simulation reproduces the experimental REELS spectra with considerable success. Copyright © 2003 John Wiley & Sons, Ltd.     

Construction of database of effective energy‐loss functions

Effective energy‐loss functions for Al, Cu, Ag and Au were derived from the reflection electron energy‐loss spectroscopy (REELS) spectra for 1 keV electrons using extended Landau theory. Features of the obtained effective energy‐loss functions are close to those of optical surface energy‐loss functions, revealing the significant contribution of the low energy loss below a few tens of electron‐volts in the REELS spectrum for Cu, Ag and Au. The REELS spectra were reproduced using the newly derived effective energy‐loss functions, leading to the confirmation that this type of database of the effective energy‐loss function is very useful not only for more comprehensive understanding of the measured spectrum of surface electron spectroscopies but also for practical background subtraction in surface electron spectroscopy. Copyright © 2003 John Wiley & Sons, Ltd.     

Monte‐Carlo simulation of secondary electron emission by x‐ray irradiation—an application of x‐ray absorption near‐edge structure (XANES)

A Monte‐Carlo simulation program has been developed for describing x‐ray absorption near‐edge structure (XANES) observed by synchrotron radiation. The Monte‐Carlo simulation was applied for interpreting XANES spectroscopy on a polycrystalline Ag specimen under synchrotron irradiation with photon energy 3340–3390 eV around the absorption edge of the Ag L_α line at 3352 eV. The results clearly indicate that Monte‐Carlo simulation describes the experimental results with considerable success. Dependence of secondary electron yield on the incident angle of synchrotron radiation was also studied. Copyright © 2004 John Wiley & Sons, Ltd.     

Characterization of high‐aspect‐ratio periodic structures by X‐ray photoelectron spectroscopy

X‐ray photoelectron spectroscopy (XPS) is a powerful surface characterization technique often relied on for quantification of surface species and coverages. Investigation of silicon microrods, considered a model for high‐aspect‐ratio structures, at different angles with respect to substrate normal was determined to have a significant impact on the relative sensitivity of surface‐bound species on rods relative to the base substrate. Comparison between planar silicon and microrod arrays demonstrates that the angular dependence is complicated and that careful studies must optimize conditions to differentiate between surfaces. In addition, the use of reverse angle resolved XPS, where the substrate is turned away from the X‐ray source, is shown to assist in simplifying the spectrum by removing underlying signal from the substrate near the base. Copyright © 2016 John Wiley & Sons, Ltd.     

Hydrosilation of 1‐alkyne at nearly flat,terraced, homogeneously hydrogen‐terminated silicon (100) surfaces

An experimental study of the derivatization of Si(100) surfaces with 1‐octyne has been carried out via x‐ray photoelectron spectroscopy at different take‐off angles, and infrared absorption spectroscopy in attenuated total reflection mode and atomic force microscopy have been used to characterize the pristine surface. Our study has shown that it is possible to prepare nearly flat, terraced, homogeneously hydrogen‐terminated Si(100) surfaces via exposure to H₂ at high temperature (1100 °C) and that these surfaces may be functionalized with hydrocarbon moieties by simple immersion in the unsaturated hydrocarbon at ～200 °C. Copyright © 2004 John Wiley & Sons, Ltd.     

Effects of elastic scattering and analyzer‐acceptance angle on the analysis of angle‐resolved X‐ray photoelectron spectroscopy data

We have made calculations of N 1s, O 1s, Si(oxide) 2p, Hf 4f, and Si(substrate) 2p photoelectron intensities at selected emission angles for films of SiO_1.6N_0.4 and HfO_1.9N_0.1 of various thicknesses on silicon. These calculations were made with the National Institute of Standards and Technology (NIST) Database for Simulation of Electron Spectra for Surface Analysis (SESSA) to investigate effects of elastic scattering and analyzer‐acceptance angle that could be relevant in the analysis of angle‐resolved X‐ray photoelectron spectroscopy (ARXPS) experiments. The simulations were made for an XPS configuration with a fixed angle between the X‐ray source (i.e. for the sample‐tilting mode of ARXPS) and with Al and Cu Kα X‐ray sources. The no‐loss intensities changed appreciably as elastic scattering was switched ‘on’ and ‘off’, but changing the analyzer‐acceptance angle had a smaller effect. Ratios of intensities for each line from the overlayer film for the least realistic model condition (elastic scattering switched ‘off’, small analyzer‐acceptance angle) to those from the most realistic model condition (elastic scattering switched ‘on’, finite analyzer‐acceptance angle) changed relatively slowly with emission angle, but the corresponding intensity ratio for the Si(substrate) 2p line changed appreciably with emission angle. The latter changes, in particular, indicate that neglect of elastic‐scattering effects can lead to erroneous results in the analysis of measured ARXPS data. The elastic‐scattering effects were larger in HfO_1.9N_0.1 than in SiO_1.6N_0.4 (due to the larger average atomic number in the former compound) and were larger with the Al Kα X‐ray source than with the Cu Kα source because of the larger cross sections for elastic scattering at the lower photoelectron energies. Copyright © 2010 John Wiley & Sons, Ltd.     

Surface modification of ultra‐high molecular weight polyethylene fibers by chromic acid

Ultra‐high molecular weight polyethylene (UHMWPE) fibers were modified by chromic acid. The effects of surface modification were evaluated with Fourier transform infrared spectroscopy (FTIR), X‐ray photoelectron spectroscopy (XPS), contact angle measurement, and scanning electron microscope (SEM). The results showed that both the content of O‐containing functional groups and surface roughness of modified fibers increased. The polar groups on the modified fiber surface decreased the contact angles with water and ethylene glycol, as evidenced by contact angle measurement. The tensile test results showed the strength and the elongation at break of UHMWPE fibers decreased but the modulus increased after chromic acid modification. Copyright © 2016 John Wiley & Sons, Ltd.     

Monte‐Carlo simulation of spatial distribution of x‐rays in multi‐film targets. II: Spatial distribution of continuous x‐rays and temperature elevation in W/Al film targets

A Monte‐Carlo simulation written in C++ has been developed to describe spatial distributions of energy dissipation and x‐rays generated by penetrating kilovolt electrons in a multi‐film target. To evaluate the x‐ray source, especially its size and intensity, the use of brightness is proposed as a figure of merit. The Monte‐Carlo simulation approach was applied to a W (5 µm)/Al (200 µm) film target, which has been in practical use as an x‐ray source of small size with high emissivity. The result demonstrates that the experiment had considerable success. The optimum operating condition for the W (5 µm)/Al (200 µm) target in practical use has also been proposed by considering temperature elevation, spot size of electron beam, x‐ray source size and x‐ray intensity. Copyright © 2005 John Wiley & Sons, Ltd.     

Thickness and coverage determination of multilayer with an island‐like overlayer by hard X‐ray photoelectron spectroscopy at multiple photon energies

To obtain depth profiles of the elemental composition of materials, we propose the use of hard X‐ray photoelectron spectroscopy (HAXPES) over a range of incident photon energies (PEs). Photoelectron intensities are measured as a function of PE and take‐off angle (TOA) from a multilayer sample (Au/SiO₂/Si). The top layer of the sample (Au) formed an island‐like structure, which we modeled as bumps and dips (surface roughness). The PE dependence, measured at angles close to the surface normal, is consistent with the theoretical results, in contrast to the TOA dependence. The Au coverage and layer thicknesses are calculated by curve fitting using experimental and theoretical results. Copyright © 2014 John Wiley & Sons, Ltd.     

Comparative study of self‐assembly of a range of monofunctional aliphatic molecules on magnetron‐sputtered aluminium

The adsorption of a range of organic molecules from toluene onto the oxidized surface of magnetron‐sputtered aluminium metal is studied using sessile drop water contact angle measurements. Molecules with different head group functionalities and various chain lengths are considered, including alkyl carboxylic acids, alkyl phosphonic acids, alkyl amines, alkyl trimethoxysilanes, alkyl trichlorosilanes and epoxy alkanes. Alkyl phosphonic and carboxylic acids are identified as readily forming the most well‐packed monolayers on the aluminium surface, whereas the others adsorb less well and the chlorosilanes polymerize as a result of combination with moisture to form a thick deposit. The high‐adsorption‐density monolayers of alkyl phosphonic and carboxylic acids were studied using polarization modulation infrared reflection–absorption spectroscopy (PM‐IRRAS) and x‐ray photoelectron spectroscopy (XPS): PM‐IRRAS reveals relatively poorer ordering of the C₁₀ alkyl carboxylic acid monolayer compared with that formed from the phosphonic acid, and XPS data suggest that this is likely to relate to a lower ability to displace preadsorbed volatile organic compounds. Copyright © 2004 John Wiley & Sons, Ltd.     

Micropore formation mechanism in iridium coating after high‐temperature treatment

Noble metal iridium is of great interest for high‐temperature applications and extreme environments. A high (110)‐oriented iridium coating was prepared by a double glow plasma process on the surface of niobium substrate. The morphology and composition of the coating were determined by scanning electron microscopy, energy‐dispersive X‐ray spectroscopy and X‐ray photoelectron spectroscopy, respectively. The phase of the coating was identified by X‐ray diffraction analysis. The misorientation angle distributions of grains on the surface and cross section of the coating were characterized by electron backscatter diffraction system. The uniform and pure iridium coating consisted of the submicrometer‐sized columnar grains with high‐angle boundary. The mean misorientation angles on the surface and cross section of the coating were 38.6° and 45.6°, respectively. After high‐temperature treatment, the coating was composed of equiaxed grains with distinct grain boundaries. Micropores appeared on the fracture surface of the coating. The micropore formation mechanism in Ir coating after high‐temperature treatment was investigated. Copyright © 2016 John Wiley & Sons, Ltd.     

Rational Design of Ag/TiO2 Nanosystems by a Combined RF‐Sputtering/Sol‐Gel Approach

The present work is devoted to the preparation of Ag/TiO₂ nanosystems by an original synthetic strategy, based on the radio‐frequency (RF) sputtering of silver particles on titania‐based xerogels prepared by the sol–gel (SG) route. This approach takes advantage of the synergy between the microporous xerogel structure and the infiltration power characterizing RF‐sputtering, whose combination enables the obtainment of a tailored dispersion of Ag‐containing particles into the titania matrix. In addition, the system′s chemico‐physical features can be tuned further through proper ex situ thermal treatments in air at 400 and 600 °C. The synthesized composites are extensively characterized by the joint use of complementary techniques, that is, X‐ray photoelectron and X‐ray excited Auger electron spectroscopies (XPS, XE‐AES), secondary ion mass spectrometry (SIMS), glancing incidence X‐ray diffraction (GIXRD), field emission scanning electron microscopy (FE–SEM), transmission electron microscopy (TEM), electron diffraction (ED), high‐angle annular dark field scanning TEM (HAADF–STEM), energy‐filtered TEM (EF–TEM) and optical absorption spectroscopy. Finally, the photocatalytic performances of selected samples in the decomposition of the azo‐dye Plasmocorinth B are preliminarily investigated. The obtained results highlight the possibility of tailoring the system characteristics over a broad range, directly influencing their eventual functional properties.     

X‐ray photoelectron spectroscopic study of Tencel treated with a cationic β‐cyclodextrin derivative

The interaction and the durability to laundering of a cationic β‐cyclodextrin derivative applied to Tencel were examined by x‐ray photoelectron spectroscopy (XPS). The N1(s) XPS spectra of the cationic β‐cyclodextrin treated substrates revealed the presence of the applied finish on the fibre surface and that the durability of the applied finish to hand‐wash was good. However, the cationic β‐cyclodextrin derivative showed poor durability to the ISO CO6/C2S wash protocol. Copyright © 2009 John Wiley & Sons, Ltd.     

X‐ray‐induced degradation of OEG‐terminated SAMs on silica surfaces during XPS characterization

Oligo ethylene glycol layers are widely used in biosensor applications, mainly for their anti‐fouling abilities. Such surfaces are often characterized by X‐ray photoelectron spectroscopy (XPS) as this method allows a precise determination of the surface chemical composition. We show herein that X‐rays used during XPS characterization quickly and significantly degrade oligo ethylene glycol immobilized onto silica substrates. It is therefore necessary to introduce a correcting factor to assess the true (i.e. without degradation) corresponding ether contribution in the XPS spectrum of such organic layers. Eventually, fluorescence scans show the loss of anti‐fouling properties of the degraded surface, leading to greater amounts of adsorbed (fluorescently labeled) protein. Copyright © 2015 John Wiley & Sons, Ltd.     

Effective attenuation lengths for photoelectrons in thin films of silicon oxynitride and hafnium oxynitride on silicon

We have used the National Institute of Standards and Technology Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) to simulate photoelectron intensities for thin films of SiO_1.6N_0.4 and HfO_1.9N_0.1 on silicon with excitation by Al Kα X‐rays. We considered Si 2p_3/2 photoelectrons from SiO_1.6N_0.4 and the substrate and Hf 4f_7/2 photoelectrons from HfO_1.9N_0.1. The simulations were performed for ranges of film thicknesses and photoelectron emission angles and for two common configurations for X‐ray photoelectron spectroscopy (XPS), the sample‐tilting configuration and the Theta Probe configuration. We determined photoelectron effective attenuation lengths (EALs) by two methods, one by analyzing photoelectron intensities as a function of film thickness for each emission angle (Method 1) and the other by analyzing photoelectron intensities as a function of emission angle for each film thickness (Method 2). Our analyses were made with simple expressions that had been derived with the assumption that elastic‐scattering effects were negligible. We found that EALs from both methods were systematically larger for the Theta Probe configuration, by amounts varying between 1% and 5%, than those for the sample‐tilting configuration. These differences were attributed to anisotropy effects in the photoionization cross section that are expected to occur in the former configuration. Generally, similar EALs were found by each method for each film material although larger EALs were found from Method 2 for film thicknesses less than 1.5 nm. SESSA is a useful tool for showing how elastic scattering of photoelectrons modifies EALs for particular materials, film thicknesses, and XPS configurations. Copyright © 2012 John Wiley & Sons, Ltd.     

A High Sensitive TNT Sensor Based on Electrochemically Reduced Graphene Oxide‐Poly(amidoamine) Modified Electrode

In this paper, the electrochemically reduced graphene oxide‐poly(amidoamine) hybrid (ErGO‐PAMAM) have been used for fabrication of TNT electrochemical sensor. The prepared modified electrode is characterized with X‐ray photoelectron spectroscopy (XPS), fourier transform infrared spectroscopy (FT‐IR), electrochemical impedance spectroscopy (EIS), energy‐dispersive X‐ray (EDX) spectroscopy, scanning electron microscopy (SEM) and atomic force microscope (AFM). Based on obtained results, it is can be seen that the ErGO‐PAMAM/GCE has high response to TNT than the other graphene based modified electrodes. The resulting electrochemical sensor exhibited good response to TNT with linear range from 0.05 to 1.2 ppm with a low detection limit of 0.0015 ppm.     

Study of the degradation of plasma‐oxidized polystyrene by time‐ and angle‐resolved x‐ray photoelectron spectroscopy

Angle‐resolved x‐ray photoelectron spectroscopy (ARXPS) measurements were made, in repeated sequences employing Al and Mg x‐ray sources alternately, on a polystyrene sample that had been exposed to an oxygen plasma. It was observed that oxygen was lost from the sample over a period of 5 h and 40 min. The ARXPS data sets were corrected for the time displacement between consecutive measurements at different photoemission angles and fitted with three simple models in order to extract oxygen concentration–depth profiles, consistent with the data, as a function of time. The oxygen depth profiles were found to evolve in a consistent manner, indicating both a loss of average oxygen content and thickness in the ‘oxidized polymer layer’. Copyright © 2003 John Wiley & Sons, Ltd.     

Peak shape analysis of Ag 3d core‐level X‐ray photoelectron spectra of Au@Ag core‐shell nanoparticles using an asymmetric Gaussian–Lorentzian mixed function

This article reports on the peak shape analysis of X‐ray photoelectron spectra of gold‐silver core‐shell (Au@Ag) nanoparticles (NPs) using an asymmetric Gaussian–Lorentzian mixed function. Unlike Ag NPs, Au@Ag NPs have no oxide peak and show asymmetric line shape with a high energy tail in Ag 3d core‐level spectra. A monotonic increase in the Ag 3d binding energy and a decrease in the degree of asymmetry with increasing the Ag shell thickness were observed supporting the occurrence of charge transfer from Au core to Ag shell. Copyright © 2012 John Wiley & Sons, Ltd.     

Visible‐light photocatalytic activity of Ag@MIL‐125(Ti) microspheres

Ag nanoparticle (NP)‐decorated MIL‐125(Ti) microspheres (Ag@MIL‐125(Ti)) were firstly fabricated via a facile hydrothermal and following photo‐reduction method. The photocatalysts were characterized using X‐ray diffraction, scanning and transmission electron microscopies, X‐ray photoelectron spectroscopy and UV–visible diffuse reflectance spectroscopy. The characterization results indicated that Ag NPs were dispersed on the surface of MIL‐125(Ti) microspheres, and the Ag NPs had a uniform diameter of about 40 nm. The composites exhibited excellent visible‐light absorption, due to the modification with the Ag NPs. The photocatalytic activity for the visible‐light‐promoted degradation of Rhodamine B was improved through the optimization of the amount of Ag loaded as a co‐catalyst, this amount being determined as 3 wt%. Additionally, studies performed using radical scavengers indicated that O₂^? and e^? served as the main reactive species. The catalyst can be reused at least five times without significant loss of its catalytic activity. Furthermore, a photocatalytic mechanism for degradation of organics over Ag@MIL‐125(Ti) is also proposed. Copyright © 2015 John Wiley & Sons, Ltd.     

Binding property and structure of aromatic isocyanide self‐assembly monolayers on Ag and Au surfaces

The binding property of p‐biphenyl isocyanide self‐assembled monolayers (SAMs) on Au and Ag was investigated by temperature‐dependent surface‐enhanced Raman spectroscopy (SERS). p‐Biphenyl isocyanide was found to desorb on Ag at a low temperature of ～393 K whereas it appeared to remain enduring at a high temperature of ～453 K for Au. Structures of p‐biphenyl isocyanide SAMs on Au and Ag flat films were checked by means of near‐edge x‐ray absorption fine structure spectroscopy (NEXAFS) at the two different normal (90° ) and grazing (20° ) angles of the incident x‐ray beam. Our results suggested that the SAMs prepared by p‐biphenyl isocyanide should have a relatively disordered structure even at room temperature on both Au and Ag, as indicated from an insubstantial change in NEXAFS spectra at the two different angles from those of p‐biphenyl thiolate and p‐biphenyl methanethiolate. The weakness of the isocyanide–metal bond in comparison with the sulphur–metal bond may result in both low surface coverage and orientational disorder. A density functional theory calculation method was employed to attempt to explain the difference in stability for phenyl isocyanide on Ag and Au surfaces. Our calculation result yielded a lower binding energy of phenyl isocyanide on Ag than that on Au, consistent with the temperature‐dependent Raman results. Copyright © 2005 John Wiley & Sons, Ltd.