The capabilities of an electrically cooled energy‐dispersive x‐ray detector for quantitative x‐ray fluorescence analysis

The capabilities of the Si PIN diode x‐ray detector were determined and compared with those of a standard Si(Li) detector. The x‐ray fluorescence (XRF) analysis systems assembled with these two detectors included annular radioisotope excitation sources of Cd‐109 and Fe‐55. The systems were calibrated for sensitivity and quantification was performed with fundamental parameters software. Based on the analysis of the standard reference material NIST 2710 (Montana soil), the elemental sensitivities and the limits of detection of both systems were obtained. The elemental sensitivities of the Si PIN detector for fluorescence x‐rays in the energy range up to 10 keV were comparable to those of the Si(Li) detector. At higher fluorescence x‐ray energies the sensitivity of the Si PIN detector gradually decreased and was smaller by a factor of ～4 at 20 keV. The reason was mainly the small thickness of the sensitive volume of the Si PIN diode (0.2 mm) and therefore the smaller relative efficiency of this detector. The assessed limits of detection (LODs) were comparable for the two detectors, which was mainly due to the lower spectral background of the Si PIN detector in excitation with the Cd‐109 source as a result of its smaller sensitive thickness. The accuracy of elemental determinations for the two detectors was comparable and within the limits of the assessed uncertainties, which were calculated considering all the steps of the analysis, i.e. spectrum measurement and analysis, sensitivity calibration and quantification. Copyright © 2004 John Wiley & Sons, Ltd.     

Application of the backscatter fundamental parameter method for in situ element determination using a portable energy‐dispersive x‐ray fluorescence spectrometer

The backscatter fundamental parameter (BFP) algorithm was adapted and modified for the use with a portable energy‐dispersive x‐ray fluorescence (EDXRF) spectrometer system. The method utilizes coherently and incoherently scattered peaks of primary radiation to estimate the ‘dark matrix’ of the analysed sample. A so‐called ‘full fundamental parameter’ model was implemented in the algorithm, allowing a simple calibration of the method using only one standard sample. To improve the accuracy of the method, the differential mass scattering cross‐sections were used. The algorithm also takes into account the secondary excitation effects. The method was applied to element determinations in various matrices with minimum sample preparation. It was tested in the laboratory with homogeneous samples prepared from standard reference materials and was also successfully applied to in situ element determinations in soil. The analyses were performed using a portable XRF spectrometer equipped with a ¹⁰⁹Cd radioisotope source and an Si‐PIN photodiode detector. The BFP algorithm was found to perform well for the analysis of loose powder samples containing an unknown fraction of ‘dark matrix,’ and therefore it is regarded as suitable for in situ element determinations. Copyright © 2003 John Wiley & Sons, Ltd.     

Artificial peaks in energy dispersive X‐ray spectra: sum peaks,escape peaks,and diffraction peaks

Sum peaks, escape peaks, and diffraction peaks are considered artificial or spurious peaks in energy dispersive X‐ray spectrometry. Experimental examples are given, which showed that escape and diffraction peaks can add up to become sum peaks. These artificial peaks are not weak, and great care must be taken to differentiate them from peaks due to impurity or trace elements. The relationship between the intensity of a sum peak and the original peaks is illustrated using computer simulation as well as probability theory. Copyright © 2016 John Wiley & Sons, Ltd.     

Evaluation of the uncertainty of element determination using the energy‐dispersive x‐ray fluorescence technique and the emission–transmission method

A detailed study of the uncertainty quantification procedure for the determination of element mass fractions in a soil matrix by using energy‐dispersive x‐ray fluorescence spectrometry and the emission–transmission method was carried out. The particular case of secondary target excitation with an Mo target and Mo anode x‐ray tube was addressed. The effects of simplification of the theoretical model on the determined mass fractions of elements were studied. The main contributions to the uncertainty were identified and the ways of reducing their magnitude were indicated. The approach was found to be helpful in designing an optimum analytical strategy. It can also be used as guidance for assessing the uncertainty in other modes of x‐ray fluorescence analysis. Copyright © 2003 John Wiley & Sons, Ltd.     

Portable x‐ray fluorescence spectrometer with a pyroelectric x‐ray generator

A portable x‐ray fluorescence spectrometer was assembled with an x‐ray generator that was driven by a 9 V dry electric battery. Several possible optimum geometries of the x‐ray generator and detector were evaluated, and the results showed that the intensity of fluorescent x‐rays was strong enough when the angle between the x‐ray generator and detector was as small as 30°. The geometrically optimized x‐ray spectrometer was applied to the analysis of paints, plastics and aluminum foils. Pigments in paint and toxic elements in plastic could be easily detected with on‐site analysis. Fe in aluminum foil was quantitatively determined down to the sub‐% level. The detection limit of Fe was 180 ppm for 100 s of measurement. Copyright © 2005 John Wiley & Sons, Ltd.     

Background estimation based on Fourier Transform in the energy‐dispersive X‐ray fluorescence analysis

This paper discusses a new method of background estimation in the energy‐dispersive X‐ray fluorescence (EDXRF) analysis, which is based on Fourier Transform (in this paper, we call it Fourier Transform background estimation method). Compared with the Sensitive Nonlinear Iterative Peak method, the new method has the feature of FWHM independence. It has been proved that a background can be estimated automatically and accurately by the new method in the synthesized spectrum and the spectra from measurement. Fourier Transform background estimation method can estimate the background accurately in the EDXRF spectrum using an X‐ray tube source. Copyright © 2011 John Wiley & Sons, Ltd.     

Time dependence characterization of Pb and Br concentrations in samples from ombrotrophic peat bogs in Austria and Poland by energy‐dispersive x‐ray fluorescence spectrometry

It long has been known that ombrotrophic peat bog preserves the record of the atmospheric deposition of metal pollutants. In this paper, the results of an investigation of two peat cores taken in Austria from Langmoos bog located near a motorway and one taken in southern Poland located far away from main roads are presented. The concentration levels of Pb and Br in dated peat cores were studied in order to find out whether the close location of a motorway to a bog will influence the contents of these elements in peat. Copyright © 2002 John Wiley & Sons, Ltd.     

Calculation of attenuation and x‐ray fluorescence intensities for non‐parallel x‐ray beams

With the nowadays widespreaded use of x‐ray optics in x‐ray fluorescence analysis, large convergence or divergence angles can occur. This experimental situation violates a basic assumption of the usual fundamental parameter quantification procedure. In order to take beam divergences in micro x‐ray fluorescence analysis into account, a way of calculating fluorescence intensities numerically by Monte Carlo integration is described. For three examples of typical micro‐XRF set‐ups the fluorescence intensities and their deviation from the parallel beam geometry are calculated. Furthermore, we propose a new approach with ‘equivalent angles’ which correct for the beam divergences in fundamental parameter methods. Copyright © 2003 John Wiley & Sons, Ltd.     

Wavelength‐dispersive x‐ray fluorescence measurements on organic matrices: application to milk‐based products

A simple and fast method for the determination of a series of analytes (sodium, magnesium, phosphorus, sulfur, chlorine, potassium, calcium, iron, zinc) in milk‐based products by wavelength‐dispersive x‐ray fluorescence spectrometry was developed and validated. Reference values were obtained by inductively coupled plasma optical emission spectroscopy and by potentiometry for chloride. The investigated samples were commercial products obtained from various parts of the world. Pellets of 4 g were prepared under 2 t pressure. For each sample, three pellets were prepared and analysed. Limits of quantification and repeatabilities were evaluated for the described analytes. Calibrations were established with 29 samples and validation of the method was made using a second set of 29 samples. An evaluation of this alternative method was done by comparison with data from the reference methods, using robust statistics. Copyright © 2004 John Wiley & Sons, Ltd.     

X‐ray fluorescence analysis with a pyroelectric x‐ray generator

Several types of handy x‐ray fluorescence spectrometers are presented. The results obtained with a Niton spectrometer are presented as a goal to develop a laboratory‐made spectrometer using an Amptek Cool‐X pyroelectric x‐ray generator. A small and cheap charge‐up x‐ray emitting device and its spectrum are also presented. Handy x‐ray spectrometers are now progressing rapidly and the detection limits are in the range of a few ppm for certain elements. Copyright © 2005 John Wiley & Sons, Ltd.     

Energy‐dispersive x‐ray fluorescence analysis of modern coloured glasses from Marinha Grande (Portugal)

The elemental composition (K, Ca, Ti, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Sr, Ba, Nd and Pb) of modern coloured glasses was obtained by energy‐dispersive x‐ray fluorescence (EDXRF) spectrometry. This non‐destructive technique is frequently used in the analysis of historical glass objects. Two reference glasses were also measured to assess the overall accuracy of the EDXRF method. Reference and unknown glasses were analysed without any preparation. The coloured glass samples studied belong to the Glass Museum of Marinha Grande and were chosen from two distinct collections, which were characterized by the different concentrations of some elements (K, Ti, Cr, Mn, Fe, Ba and Pb). The determined major elements allowed the identification of two raw materials used in glass manufacture, sand and lime. Multivariate statistical analysis, namely principal component extraction, simplified the identification of some of the colouring chemical elements, associating them with the different colours of the glass objects. Copyright © 2003 John Wiley & Sons, Ltd.     

Application of high‐energy polarized energy‐dispersive x‐ray fluorescence spectrometry to the determination of trace levels of As,Hg, and Pb in certifiable color additives

Advances in x‐ray fluorescence (XRF) using high‐energy polarized energy‐dispersive (ED)XRF spectrometry (PEDXRF) were applied to the determination of trace As, Hg, and Pb in various color additives subject to batch certification by the U.S. Food and Drug Administration (FDA). The objectives of this study were to simplify sample preparation for quantitative determination of these elements and, if possible, to achieve improved sensitivity and detection limits compared to techniques currently used for certification. PEDXRF was compared with wavelength‐dispersive x‐ray fluorescence spectrometry (WDXRF) and inductively coupled plasma – mass spectrometry (ICP‐MS) for the analysis of trace levels of As, Hg, and Pb in certifiable color additives. For these light matrices, PEDXRF provided better signal‐to‐noise and allowed quantitation in smaller amounts of color additive relative to WDXRF and equal or better precision to ICP‐MS. Determination of these trace elements in a variety of color additives was possible relative to calibrations generated from one color additive using specimens prepared simply by pouring the color additive powder into an XRF sample cup. Published 2016. This article is a U.S. Government work and is in the public domain in the USA     

Semiconductor Peltier‐cooled detectors for x‐ray fluorescence analysis

We discuss recent results obtained in the development of Si(Li), Si p–i–n, CdTe p–i–n and CdZnTe x‐ray detectors with Peltier coolers for fabrication of laboratory and portable XRF analyzers. The characteristics of Si(Li) Peltier‐cooled detectors are close to those of detectors cooled with the liquid nitrogen and remain the most preferred type of detectors for the tasks of x‐ray fluorescence analysis. Considerable success was obtained in the improvement of the characteristics of CdTe p–i–n detectors and CdZnTe detectors with a metal–semiconductor–metal structure, effective in the energy range up to 100 keV. The spectra of all detectors are presented. Copyright © 2004 John Wiley & Sons, Ltd.     

Total reflection x‐ray fluorescence analysis—a review

Total reflection x‐ray fluorescence analysis (TXRF) is a special energy‐dispersive x‐ray analytical technique extending XRF down to the ultra trace element range. Detection limits of picograms or nanograms per gram levels are reached with x‐ray tube excitation. Using synchrotron radiation as excitation source, femtogram levels are detectable, particularly important for Si wafer surface analysis. TXRF is specially suited for applications in which only a very small amount of sample is available, as only a few micrograms are required for the analysis. In this review, an overview of theoretical principles, advantages, instrumentation, quantification and application is given. Chemical analysis as well as surface analysis including depth profiling and thin‐film characterization is described. Special research results on extension to low‐Z elements, excitation with synchrotron radiation and x‐ray absorption spectroscopy (XAS) for chemical speciation at trace levels are reviewed. Copyright © 2007 John Wiley & Sons, Ltd.     

Application of selected fundamental parameters in x‐ray fluorescence analysis

The effectiveness of selected fundamental parameters in x‐ray fluorescence analysis previously proposed by the authors was examined with a few examples. Some synthetic fused binary disks were prepared and measured to obtain the measured binary coefficients. The theoretical influence coefficients were also calculated based on the synthetic specimens and measuring conditions using those selected fundamental parameters and compared with the measured values. It was found that the theoretical influence coefficients calculated with selected fundamental parameters agreed better with measured values than those calculated with original parameters. The synthetic fused disks, some Au–Ag–Cu alloys and some Chinese rock reference materials were measured and quantitatively calculated with the program NRLXRF, that uses original parameters, and with NRL301, that uses selected fundamental parameters, using only one calibration standard for fused disks and only pure elements for alloys. The relative errors of the results from NRL301 are much smaller than those from NRLXRF. Data for the example of pressed powders of cement published in an NBS Technical Note were also calculated with NRL301 with one calibration standard. The results are comparable to those from NBSGSC obtained with seven calibration standards. Copyright © 2003 John Wiley & Sons, Ltd.     

A new approach to synchrotron energy‐dispersive X‐ray diffraction computed tomography

A new data collection strategy for performing synchrotron energy‐dispersive X‐ray diffraction computed tomography has been devised. This method is analogous to angle‐dispersive X‐ray diffraction whose diffraction signal originates from a line formed by intersection of the incident X‐ray beam and the sample. Energy resolution is preserved by using a collimator which defines a small sampling voxel. This voxel is translated in a series of parallel straight lines covering the whole sample and the operation is repeated at different rotation angles, thus generating one diffraction pattern per translation and rotation step. The method has been tested by imaging a specially designed phantom object, devised to be a demanding validator for X‐ray diffraction imaging. The relative strengths and weaknesses of the method have been analysed with respect to the classic angle‐dispersive technique. The reconstruction accuracy of the method is good, although an absorption correction is required for lower energy diffraction because of the large path lengths involved. The spatial resolution is only limited to the width of the scanning beam owing to the novel collection strategy. The current temporal resolution is poor, with a scan taking several hours. The method is best suited to studying large objects (e.g. for engineering and materials science applications) because it does not suffer from diffraction peak broadening effects irrespective of the sample size, in contrast to the angle‐dispersive case.     

A fast energy‐dispersive multi‐element detector for X‐ray absorption spectroscopy

In this paper results are presented from fluorescence‐yield X‐ray absorption fine‐structure spectroscopy measurements with a new seven‐cell silicon drift detector (SDD) module. The complete module, including an integrated circuit for the detector readout, was developed and realised at DESY utilizing a monolithic seven‐cell SDD. The new detector module is optimized for applications like XAFS which require an energy resolution of ～250–300 eV (FWHM Mn Kα) at high count rates. Measurements during the commissioning phase proved the excellent performance for this type of application.     

Determination of effective atomic numbers and mass attenuation coefficients of samples using in‐situ energy‐dispersive X‐ray fluorescence analysis

The matrix effect has a major impact on energy‐dispersive X‐ray fluorescence analysis (EDXRFA) and is difficult to be evaluated due to that the contents of some low‐atomic‐number elements cannot be identified by in‐situ EDXRFA. Up to today, the fundamental parameter algorithm proposed by Rousseau has been widely applied to correct the matrix effect. Accordingly, determining the matrix and mass attenuation coefficient (μ/ρ) of sample is a key issue for the fundamental parameter algorithm. In present work, the method to deduce μ/ρ by effective atomic number (Z_eff) was studied. First, the relationship between Z_eff and coherence to Compton scatting ratio (R) of the incident X‐ray was determined by standard samples. Then, we deduce Z_eff and their μ/ρ. The value of μ/ρ deduced by our method is in good agreement with that calculated by WinXCOM, and the relative change (Δ) is less than 7%. We also deduced Z_eff and their μ/ρ of Chinese national standard soil samples employing our method and good agreement with the calculated values were also obtained. We found that the agreement between experimental values of μ/ρ with theoretical values by WinXCOM still exists when the energy of the incident X‐ray is greater than 4 keV, and the Δ is less than 10%. The result indicates that our method may be applied directly to in‐situ EDXRFA.