Relative intensities in x-ray photoelectron spectra: Part IV. The effect of elastic scattering in a solid on the free path of electrons and their angular distribution

A new expression for the intensity of X-ray photoelectron spectra is derived with due allowance for multiple elastic scattering of photoelectrons durin     

Relative intensities in X-ray photoelectron spectra.: Part VIII

The photoionization cross-sections for the 3s and 3p shells of atomic Si, P, S, and Cl and the S²⁺ ion, and for the 2s and 2p shells of atomic F have been calculated using the random-phase approximation with exchange (RPAE) for the average-configuration term. Using the theoretical atomic cross-section values, the partial cross-sections for photoionization of the SF₆ molecule have been calculated for hv ? 54 eV and the photoelectron spectra have been interpreted. The calculation of relative intensities in the photoelectron spectra of H₂S is presented. The influence of the effective charge of an atom on the photoionization cross-section value for a molecular level is shown.     

Relative intensities in X-ray photoelectron spectra. Part IX. Estimates for photoelectron mean free paths taking into account elastic collisions in a solid

By means of the Monte Carlo method the angular dependences of photoelectron peak intensities have been calculated for substrates covered with films of various thicknesses D. The calculations have been carried out for several sets of parameters of the elastic and inelastic interactions of electrons with solids and for various experimental geometries. On the basis of numerical theoretical results, analytical expressions are derived for estimating the difference between the effective mean free path of photoelectrons (λ_eff) and the inelastic mean free path (λ_n) in solids. These expressions are used to analyse experimental data for the determination of thin-film thicknesses by means of ESCA. It is concluded that the values determined experimentally are apparently D/λ_eff ratios — not D/λ_n, as is usually assumed. The importance of the results obtained is discussed with reference to the determination of photoelectron mean free paths in solids and of thin-film thicknesses by means of ESCA.     

Relative intensities in x-ray photoelectron spectra. Part II

Experimental data on the relative intensities of X-ray photoelectron lines of some elements with 22 ? Z ? 56, and the calculations for the photoionization cross-sections for inner levels of some elements with 21 ? Z ? 63 are reported. The relationship between photoionization relative cross-sections and line relative intensities is examined. Theoretical values of the photoionization cross-sections were used in the calculations of relative intensities of molecular valence levels for AO₄^x? (A = Cl, S, P, Se, As), AF₆^x? (A = S, Si, Al), COS, CS₂ and H₂S.     

Relative intensities in x-ray photoelectron spectra. Part VI. The spectra of He(I), He(II), Y Mζ and Zr Mζ

The 2s- and 2p-electron photoionization cross-sections at photon energies up to 190 eV have been calculated, using the RPAE method for averaged configurations of the C, N, O and Ne atoms. The RPAE method ensures a more accurate relation between the cross-sections, 2s/2p, than that obtained using the Hartree—Fock method. Within the framework of the Gelius—Siegbahn model, but with the use of theoretical atomic cross-sections, we have calculated the photoionization cross-sections for He(I), He(II), Y Mζ, Zr Mζ for CH₄, C₂H₆, C₃H₈, C₂H₄, C₂H₂, NH₃, H₂O, CN^?, N₂, CO, CO₂, N₂O and NO₂^? molecules. For CO, N₂, CO₂, N₂O and H₂O molecules, a comparison is made between the theoretical and experimental cross-sections for hν < 60 eV. The calculated absolute and relative values of the molecular-orbital cross-sections are in reasonable agreement with experiment, especially at hν ? 40 eV. The calculations correctly reproduce the change in intensities under the transition He(I) → He(II). We have shown that our calculations have a significant advantage over those performed using the PW and OPW approximations. It is shown for NO, N₂, CO, H₂O, CH₄, NH₃ and N₂O molecules that the total photoionization cross-section calculated taking into account the real structure of the molecular orbitals is in better agreement with the experimental photoabsorption cross-section than is the sum of the cross-sections for the atoms in a molecule.     

Quantitative XPS: I. Analysis of X-ray photoelectron intensities from elemental data in a digital photoelectron database

An analysis of the correlation of theoretical predictions for photoelectron intensities is made with experimental data from an XPS digital database for 46 solid elements measured using a spectrometer with calibrated intensity and energy scales. This analysis covers single element samples measured for Al and Mg K X-rays. The spectral data are for widescans at 1 eV energy intervals with kinetic energies from 200 to 1506 eV using Al X-rays and to 1273 eV using Mg X-rays. In addition are narrow scans around the photoelectron peaks at 0.1 eV energy intervals. All spectra have the instrument intensity/energy response function removed so that the peak areas are proportional to the number of electrons emitted per steradian per incident K photon. Correlations are made for the ionisation cross sections of Scofield and the inelastic mean free paths given by the TPP-2M formula. The correlations are excellent, apart from a factor which may be associated with the background removal arising from the use of the Tougaard Universal cross section. These correlations lead directly to pure element relative sensitivity factors suitable for quantitative analysis. General equations are also provided to extract values for a new form of relative sensitivity factor for an average matrix. These average matrix relative sensitivity factors lead to simpler equations involving matrix factors that are effectively unity instead of the traditional values in the range 0.3 to 3.0.     

Hydrolysis-condensation reactions of titanium alkoxides in thin films: A study of the steric hindrance effect by X-ray photoelectron spectroscopy

An original approach based on X-ray photoelectron spectroscopy (XPS) is proposed to study the influence of the surrounding humidity on the hydrolysis-condensation reactions of five titanium alkoxides in thin films. More precisely, the influence of the nature of the ligands (propoxide, butoxide, isopropoxide, phenoxide, and 9H-carbazole-9-yl-ethyl-oxy) on the reaction rate was evidenced. The reaction advancement was evaluated by comparing XPS chemical compositions to theoretical compositions calculated for all the possible rates. XPS chemical environment information allowed validating the reliability of this approach through the evaluation of the condensation state. In both approaches, the influence of the steric hindrance on the reactivity of titanium alkoxides was highlighted to be similar to what has been previously observed in solution. Theses results corroborate the validity of our XPS approach to determine titanium alkoxide hydrolysis-condensation reactions in the specific application of thin films.