X‐ray fluorescence analysis with a pyroelectric x‐ray generator

Several types of handy x‐ray fluorescence spectrometers are presented. The results obtained with a Niton spectrometer are presented as a goal to develop a laboratory‐made spectrometer using an Amptek Cool‐X pyroelectric x‐ray generator. A small and cheap charge‐up x‐ray emitting device and its spectrum are also presented. Handy x‐ray spectrometers are now progressing rapidly and the detection limits are in the range of a few ppm for certain elements. Copyright © 2005 John Wiley & Sons, Ltd.     

Portable x‐ray fluorescence spectrometer with a pyroelectric x‐ray generator

A portable x‐ray fluorescence spectrometer was assembled with an x‐ray generator that was driven by a 9 V dry electric battery. Several possible optimum geometries of the x‐ray generator and detector were evaluated, and the results showed that the intensity of fluorescent x‐rays was strong enough when the angle between the x‐ray generator and detector was as small as 30°. The geometrically optimized x‐ray spectrometer was applied to the analysis of paints, plastics and aluminum foils. Pigments in paint and toxic elements in plastic could be easily detected with on‐site analysis. Fe in aluminum foil was quantitatively determined down to the sub‐% level. The detection limit of Fe was 180 ppm for 100 s of measurement. Copyright © 2005 John Wiley & Sons, Ltd.     

High‐resolution microanalysis of suspended particulate matter using a transition edge sensor microcalorimeter x‐ray spectrometer

Suspended particulate matter (SPM) collected in the urban area of Tokyo was analyzed using a transition edge sensor (TES) microcalorimeter x‐ray detector mounted on a FE‐SEM system. This prototype microcalorimeter spectrometer with an energy resolution of 19 eV identified some severe peak overlaps in the spectra measured by the traditional Si(Li) solid state detector, including S Kα with Pb Mα, Zn Lα with Na Kα, and Ti Kα with Ba Lα. In addition, the TES microcalorimeter showed good spatial resolution for the microanalysis of SPM. The focused ion beam(FIB) was successfully applied to fabricate a cross section of a single SPM particle. The chemical compositonal difference between surface and inner parts, and among different surface parts of the SPM was also determined. Through combination of the FIB technique and the TES microcalorimeter, we achieved a better understanding of the SPM. Copyright © 2009 John Wiley & Sons, Ltd.     

Performance of polycapillary x‐ray lens for x‐ray sources with various spot sizes

The performance of a polycapillary x‐ray lens (PCXRL) is related to the spot size of the x‐ray source. The transmission efficiency of the PCXRL decreases generally with the increase of the x‐ray source spot size. Both the output focal spot size of a focusing PCXRL and the divergence of a parallel PCXRL increase with increasing source spot size. A large source spot size results in more ‘escape halo’, which affects the measured transmission efficiency and the measured output focal spot size. Copyright © 2007 John Wiley & Sons, Ltd.     

The capabilities of an electrically cooled energy‐dispersive x‐ray detector for quantitative x‐ray fluorescence analysis

The capabilities of the Si PIN diode x‐ray detector were determined and compared with those of a standard Si(Li) detector. The x‐ray fluorescence (XRF) analysis systems assembled with these two detectors included annular radioisotope excitation sources of Cd‐109 and Fe‐55. The systems were calibrated for sensitivity and quantification was performed with fundamental parameters software. Based on the analysis of the standard reference material NIST 2710 (Montana soil), the elemental sensitivities and the limits of detection of both systems were obtained. The elemental sensitivities of the Si PIN detector for fluorescence x‐rays in the energy range up to 10 keV were comparable to those of the Si(Li) detector. At higher fluorescence x‐ray energies the sensitivity of the Si PIN detector gradually decreased and was smaller by a factor of ～4 at 20 keV. The reason was mainly the small thickness of the sensitive volume of the Si PIN diode (0.2 mm) and therefore the smaller relative efficiency of this detector. The assessed limits of detection (LODs) were comparable for the two detectors, which was mainly due to the lower spectral background of the Si PIN detector in excitation with the Cd‐109 source as a result of its smaller sensitive thickness. The accuracy of elemental determinations for the two detectors was comparable and within the limits of the assessed uncertainties, which were calculated considering all the steps of the analysis, i.e. spectrum measurement and analysis, sensitivity calibration and quantification. Copyright © 2004 John Wiley & Sons, Ltd.     

Superconducting tunnel junctions as detectors for high‐resolution x‐ray spectroscopy

Superconducting tunnel junctions (STJs) are a type of cryogenic detector with a working temperature of about 100 mK. They allow the combination of low energy threshold, high quantum efficiency and good count rate capability with an excellent energy resolution; at an x‐ray energy of 5.9 keV an energy resolution of 10.8 eV (FWHM) has been achieved. The detector system described is based on STJs which consist of two superconducting Al electrodes separated by a thin dielectric tunnel barrier. The tunneling process of quasi‐particles created by deposition of energy in the electrodes leads to a detectable current signal. The STJ is equipped with a superconducting Pb absorber which is read out via phonons. The Pb absorber increases absorption efficiency (～50% at 6 keV) and suppresses detector artefacts. The degeneration of Pb, most probably due to oxidation, is overcome by the introduction of a protective SiO layer on top of the absorber. This layer leads to a slight reduction of energy resolution. Nevertheless, a resolution of 9.7 eV at 1.7 keV and of ～20 eV at 5.9 keV could be realized with a prototype detector. Currently this STJ‐based detector system is being incorporated into a prototype cryogenic spectrometer for XRF analysis. Copyright © 2004 John Wiley & Sons, Ltd.     

High‐resolution spectroscopy on an X‐ray absorption beamline

A bent‐crystal spectrometer based on the Rowland circle geometry has been installed and tested on the BM30b/FAME beamline at the European Synchrotron Radiation Facility to improve its performances. The energy resolution of the spectrometer allows different kinds of measurements to be performed, including X‐ray absorption spectroscopy, resonant inelastic X‐ray scattering and X‐ray Raman scattering experiments. The simplicity of the experimental device makes it easily implemented on a classical X‐ray absorption beamline. This improvement in the fluorescence detection is of particular importance when the probed element is embedded in a complex and/or heavy matrix, for example in environmental sciences.     

Calculation of attenuation and x‐ray fluorescence intensities for non‐parallel x‐ray beams

With the nowadays widespreaded use of x‐ray optics in x‐ray fluorescence analysis, large convergence or divergence angles can occur. This experimental situation violates a basic assumption of the usual fundamental parameter quantification procedure. In order to take beam divergences in micro x‐ray fluorescence analysis into account, a way of calculating fluorescence intensities numerically by Monte Carlo integration is described. For three examples of typical micro‐XRF set‐ups the fluorescence intensities and their deviation from the parallel beam geometry are calculated. Furthermore, we propose a new approach with ‘equivalent angles’ which correct for the beam divergences in fundamental parameter methods. Copyright © 2003 John Wiley & Sons, Ltd.     

Semiconductor Peltier‐cooled detectors for x‐ray fluorescence analysis

We discuss recent results obtained in the development of Si(Li), Si p–i–n, CdTe p–i–n and CdZnTe x‐ray detectors with Peltier coolers for fabrication of laboratory and portable XRF analyzers. The characteristics of Si(Li) Peltier‐cooled detectors are close to those of detectors cooled with the liquid nitrogen and remain the most preferred type of detectors for the tasks of x‐ray fluorescence analysis. Considerable success was obtained in the improvement of the characteristics of CdTe p–i–n detectors and CdZnTe detectors with a metal–semiconductor–metal structure, effective in the energy range up to 100 keV. The spectra of all detectors are presented. Copyright © 2004 John Wiley & Sons, Ltd.     

Short soft x‐ray sources

In this work we report on the characterization of pulsed soft x‐rays emitted from laser‐produced plasma. The plasma was generated by a pulsed KrF excimer laser focused on pure Si, Cu and Ta targets by 40, 80 and 120 mJ laser energies. The utilized detector was a very sensitive Faraday cup which opportunely biased was able to record time‐resolved signals of x‐rays and to estimate their energy. The found x‐rays energy values were compared with the ion temperature of the plasma obtained by fitting the time‐resolved ion current signals with a shifted Maxwell‐Boltzmann velocity distribution. The results showed that the laser‐produced Ta plasma induced bunches of x‐rays having in average the highest energy values and it was also characterized by ion temperature higher than the ones of the laser‐produced Si and Cu plasmas. Copyright © 2009 John Wiley & Sons, Ltd.     

Characterization of homemade x‐ray polycapillaries

The possibilities of performing non‐destructive elemental microanalysis with synchrotron radiation by means of homemade polycapillary optics are described. Using fiber glass technology, monolithic polycapillary half‐lenses were made by drawing packages of glass capillaries at high temperature in a heating furnace. The performance of polycapillary half‐lenses with different geometries was evaluated. A gold knife‐edge scanned at the output of the lenses was used to determine the spot size at different distances. Measurements of photon flux impinging on the entrance end of the lenses and photon flux leaving the lenses were used to obtain the transmission efficiency. The polycapillary half‐lens made in our laboratory was used in a series of XRF microanalysis tests using white beam. The overall efficiency of the system was studied by means of establishing detection limits for various elements in an organic sample. Copyright © 2008 John Wiley & Sons, Ltd.     

HOPG as powerful x‐ray optics

A new method of producing strongly bent highly oriented pyrolytic graphite (HOPG) is presented. The method allows one to make a crystal of almost arbitrary shape, but has some thickness limits. A review of the results obtained on this type of crystal by different laboratories during the last 10 years is given. An x‐ray intensity gain from a synchrotron radiation source and Mo Kα tube beams of one order of magnitude could be achieved when using a crystal of optimized shape. The application of the crystals for secondary monochromatization in EDXRF improves by one order of magnitude the detection limits for the elements of interest. Copyright © 2003 John Wiley & Sons, Ltd.     

Active region of x‐ray emission

The active region of x‐ray emission was studied. The x‐ray emission rates for K and L x‐rays were calculated as a function of the maximum radial distance in integration of matrix elements for radiative transitions and the radius of the active region of x‐ray emission was determined. This radius depends on the multipolarity of the transition and also the sum of numbers of nodes of the wavefunctions concerned. The approximate expression for the radius of the active region is obtained in terms of the mean radius of the wavefunction for the initial vacancy state. Applications of the present results to multiple ionization and to chemical effects are discussed. Copyright © 2005 John Wiley & Sons, Ltd.     

Application of selected fundamental parameters in x‐ray fluorescence analysis

The effectiveness of selected fundamental parameters in x‐ray fluorescence analysis previously proposed by the authors was examined with a few examples. Some synthetic fused binary disks were prepared and measured to obtain the measured binary coefficients. The theoretical influence coefficients were also calculated based on the synthetic specimens and measuring conditions using those selected fundamental parameters and compared with the measured values. It was found that the theoretical influence coefficients calculated with selected fundamental parameters agreed better with measured values than those calculated with original parameters. The synthetic fused disks, some Au–Ag–Cu alloys and some Chinese rock reference materials were measured and quantitatively calculated with the program NRLXRF, that uses original parameters, and with NRL301, that uses selected fundamental parameters, using only one calibration standard for fused disks and only pure elements for alloys. The relative errors of the results from NRL301 are much smaller than those from NRLXRF. Data for the example of pressed powders of cement published in an NBS Technical Note were also calculated with NRL301 with one calibration standard. The results are comparable to those from NBSGSC obtained with seven calibration standards. Copyright © 2003 John Wiley & Sons, Ltd.     

Micro‐beam x‐ray fluorescence analysis of individual particles with correction for absorption effects

A method of correction for absorption effects in micro‐beam x‐ray fluorescence analysis is described. A fast, energy‐dispersive, silicon drift detector (SDD) was used to measure the primary x‐ray beam transmitted through the sample. The absorption factors were calculated using the data acquired with the SDD. The possibility of using the coherently, incoherently and multiple scattered primary radiation for determining the mass of individual particles was examined. The proposed methods were validated with the use of NIST K3089 glass micro‐spheres of known composition. Copyright © 2006 John Wiley & Sons, Ltd.     

Nanoresolution interface studies in thin films by synchrotron x‐ray diffraction and by using x‐ray waveguide structure

In the last years we performed several measurements with synchrotron radiation of several facilities to reveal interesting interface phenomena on the nanoscale. We used both x‐ray diffraction [1] , [2] (XRD) and spectrometry techniques. In this paper, we briefly summarize the results obtained from diffraction measurements, which lead us to our recent grazing incidence x‐ray fluorescence analysis (GIXRF) and extended x‐ray absorption fine structure (EXAFS) experiments. We show how a combination of experimental methods of GIXRF analysis and EXAFS spectroscopy in fluorescence detection with x‐ray standing waves (XSW) technique was applied for the depth profiling of a‐Si/Co/a‐Si layers with nanometer resolution to monitor the growth of CoSi intermetallic phase. The investigated layers were placed into the waveguide structure formed by two Ta films to increase sensitivity and accuracy of the measurements. Copyright © 2009 John Wiley & Sons, Ltd.     

Empirical coefficients models for x‐ray fluorescence analysis of intermediate‐thickness samples

Empirical coefficients models for correction of matrix effects in intermediate‐thickness samples are presented. Two proposed mathematical models correct simultaneously matrix effects and various masses per unit area of the samples. In the first model, it is necessary to know the masses per unit area of the samples and in the second model masses are predicted from the scattered radiation. To calculate coefficients of the models, a series of multi‐element intermediate‐thickness standards with various compositions and various masses per unit area are required. The models were tested experimentally using synthetic samples pressed into pellets and geological certificate reference materials collected on a membrane filter. The calculated concentrations were in good agreement with the certificate values. Copyright © 2004 John Wiley & Sons, Ltd.     

High‐energy‐resolution diced spherical quartz analyzers for resonant inelastic X‐ray scattering

A novel diced spherical quartz analyzer for use in resonant inelastic X‐ray scattering (RIXS) is introduced, achieving an unprecedented energy resolution of 10.53 meV at the Ir L₃ absorption edge (11.215 keV). In this work the fabrication process and the characterization of the analyzer are presented, and an example of a RIXS spectrum of magnetic excitations in a Sr₃Ir₂O₇ sample is shown.     

High‐resolution stress mapping of polycrystalline alumina compression using synchrotron X‐ray diffraction

The ability to achieve uniform stress in uniaxial compression tests of polycrystalline alumina is of significance for the calibration of piezospectroscopic coefficients as well as strength studies in ceramics. In this study high‐energy X‐rays were used to capture powder diffraction profiles over a half‐section of a polycrystalline alumina parallelepiped sample under an increasing uniaxial compressive load. The data were converted to strain and results were used for stress mapping of the sample. Stress maps from the study quantify the higher stresses at the sample–platen contact interface and reveal the evolution of the stress distribution in these specimens with load. For the geometry of the samples used, at the center section of the specimen the overall magnitudes of the compressive stresses were found to be 20% higher compared with the average expected theoretical stress based on the applied load and cross‐sectional area. The observed compressive stresses at the corners of the parallelepiped specimen were 62% higher and shear stresses were observed at the specimen interface to the load mechanism. The effects, seen at the interface, can lead to premature failure at these locations and can affect the accuracy of calibration of spectral peaks with stress as well as compression strength measurements. The results provide important information that can be used to establish guidelines on material and geometry considerations in developing compression tests on high‐strength ceramics.