The first microbeam synchrotron X‐ray fluorescence beamline at the Siam Photon Laboratory

The first microbeam synchrotron X‐ray fluorescence (µ‐SXRF) beamline using continuous synchrotron radiation from Siam Photon Source has been constructed and commissioned as of August 2011. Utilizing an X‐ray capillary half‐lens allows synchrotron radiation from a 1.4 T bending magnet of the 1.2 GeV electron storage ring to be focused from a few millimeters‐sized beam to a micrometer‐sized beam. This beamline was originally designed for deep X‐ray lithography (DXL) and was one of the first two operational beamlines at this facility. A modification has been carried out to the beamline in order to additionally enable µ‐SXRF and synchrotron X‐ray powder diffraction (SXPD). Modifications included the installation of a new chamber housing a Si(111) crystal to extract 8 keV synchrotron radiation from the white X‐ray beam (for SXPD), a fixed aperture and three gate valves. Two end‐stations incorporating optics and detectors for µ‐SXRF and SXPD have then been installed immediately upstream of the DXL station, with the three techniques sharing available beam time. The µ‐SXRF station utilizes a polycapillary half‐lens for X‐ray focusing. This optic focuses X‐ray white beam from 5 mm × 2 mm (H × V) at the entrance of the lens down to a diameter of 100 µm FWHM measured at a sample position 22 mm (lens focal point) downstream of the lens exit. The end‐station also incorporates an XYZ motorized sample holder with 25 mm travel per axis, a 5× ZEISS microscope objective with 5 mm × 5 mm field of view coupled to a CCD camera looking to the sample, and an AMPTEK single‐element Si (PIN) solid‐state detector for fluorescence detection. A graphic user interface data acquisition program using the LabVIEW platform has also been developed in‐house to generate a series of single‐column data which are compatible with available XRF data‐processing software. Finally, to test the performance of the µ‐SXRF beamline, an elemental surface profile has been obtained for a piece of ancient pottery from the Ban Chiang archaeological site, a UNESCO heritage site. It was found that the newly constructed µ‐SXRF technique was able to clearly distinguish the distribution of different elements on the specimen.     

Monte Carlo simulation code for confocal 3D micro‐beam X‐ray fluorescence analysis of stratified materials

Stratified materials are of great importance for many branches of modern industry, e.g. electronics or optics and for biomedical applications. Examination of chemical composition of individual layers and determination of their thickness helps to get information on their properties and function. A confocal 3D micro X‐ray fluorescence (3D µXRF) spectroscopy is an analytical method giving the possibility to investigate 3D distribution of chemical elements in a sample with spatial resolution in the micrometer regime in a non‐destructive way. Thin foils of Ti, Cu and Au, a bulk sample of Cu and a three‐layered sandwich sample, made of two thin Fe/Ni alloy foils, separated by polypropylene, were used as test samples. A Monte Carlo (MC) simulation code for the determination of elemental concentrations and thickness of individual layers in stratified materials with the use of confocal 3D µXRF spectroscopy was developed. The X‐ray intensity profiles versus the depth below surface, obtained from 3D µXRF experiments, MC simulation and an analytical approach were compared. Correlation coefficients between experimental versus simulated, and experimental versus analytical model X‐ray profiles were calculated. The correlation coefficients were comparable for both methods and exceeded 99%. The experimental X‐ray intensity profiles were deconvoluted with iterative MC simulation and by using analytical expression. The MC method produced slightly more accurate elemental concentrations and thickness of successive layers as compared to the results of the analytical approach. This MC code is a robust tool for simulation of scanning confocal 3D µXRF experiments on stratified materials and for quantitative interpretation of experimental results. Copyright © 2011 John Wiley & Sons, Ltd.     

Fast‐scanning high‐flux microprobe for biological X‐ray fluorescence microscopy and microXAS

There is a growing interest in the biomedical community in obtaining information concerning the distribution and local chemical environment of metals in tissues and cells. Recently, biological X‐ray fluorescence microscopy (XFM) has emerged as the tool of choice to address these questions. A fast‐scanning high‐flux X‐ray microprobe, built around a recently commissioned pair of 200 mm‐long Rh‐coated silicon Kirkpatrick–Baez mirrors, has been constructed at BioCAT beamline 18ID at the Advanced Photon Source. The new optical system delivers a flux of 1.3 × 10¹² photons s^?1 into a minimum focal spot size of ～3–5 µm FWHM. A set of Si drift detectors and bent Laue crystal analyzers may be used in combination with standard ionization chambers for X‐ray fluorescence measurements. BioCAT's scanning software allows fast continuous scans to be performed while acquiring and storing full multichannel analyzer spectra per pixel on‐the‐fly with minimal overhead time (<20 ms per pixel). Together, the high‐flux X‐ray microbeam and the rapid‐scanning capabilities of the BioCAT beamline allow the collection of XFM and micro X‐ray absorption spectroscopy (microXAS) measurements from as many as 48 tissue sections per day. This paper reports the commissioning results of the new instrument with representative XFM and microXAS results from tissue samples.     

A high‐resolution X‐ray fluorescence spectrometer and its application at SSRF

A high‐resolution X‐ray fluorescence spectrometer based on Rowland circle geometry was developed and installed at BL14W1 XAFS beamline of Shanghai Synchrotron Radiation Facility. The spectrometer mainly consists of three parts: a sample holder, a spherically curved Si crystal, and an avalanche photodiode detector. The simplicity of the spectrometer makes it easily assembled on the general purpose X‐ray absorption beamline. X‐ray emission spectroscopy and high‐resolution X‐ray absorption near edge spectroscopy can be carried out by using this spectrometer. X‐ray emission preliminary results with high‐resolution about 3 eV of Mn compounds were obtained, which confirmed the feasibility of the spectrometer. The application about Eu (III) retention on manganese dioxide was also studied using this spectrometer. Compared with conventional X‐ray absorption fine structure spectroscopy technique, the fluorescence peak of probed element [Eu (III) Lα] and matrix constituents (Mn Kα) were discriminated using this technique, indicating its superiority in fluorescence detection. Copyright © 2013 John Wiley & Sons, Ltd.     

Combined X‐ray diffraction and alpha particle X‐ray spectrometer analysis of geologic materials

The shallow interrogation depth of the lightest elements (Na, Mg, Al, and Si) detected by the particle‐induced X‐ray emission branch of the Curiosity Rover's alpha particle X‐ray spectrometer suggests that the X‐rays of these elements very likely emerge from a single mineral grain. This reality violates the assumption of atomic homogeneity at the micron scale made in both existing spectrum‐reduction approaches for the alpha particle X‐ray spectrometer. Consequently, analytical results for these elements in igneous geochemical reference materials exhibit deviations from certified concentrations in a manner that can be related to the total alkali‐silica diagram. A computer code is introduced here to provide quantitative prediction of these deviations using the mineral abundances determined from X‐ray diffraction. The latter are converted to area coverage fractions to represent the sample surface, and a fundamental parameters computation predicts the elemental X‐ray yields from each mineral and sums these. In this process, the chemistry of each individual mineral has to be varied by an iterative simplex approach; X‐ray yields are computed and compared with the peak areas from the fit of the bulk sample. When the difference between mineral yields and peak areas for each element are minimized, the mineral formulae are set and elemental X‐ray yields provided. The ratio between the summed mineral X‐ray yields and the corresponding yields based on the homogeneity assumption may then be compared directly with the concentration deviations measured in our earlier work. For several rock types, good agreement is found, thereby consolidating our understanding of the effects of sample mineralogy on alpha particle X‐ray spectrometer results. Copyright © 2017 John Wiley & Sons, Ltd.     

Microcrystallography using single‐bounce monocapillary optics

X‐ray microbeams have become increasingly valuable in protein crystallography. A number of synchrotron beamlines worldwide have adapted to handling smaller and more challenging samples by providing a combination of high‐precision sample‐positioning hardware, special visible‐light optics for sample visualization, and small‐diameter X‐ray beams with low background scatter. Most commonly, X‐ray microbeams with diameters ranging from 50 µm to 1 µm are produced by Kirkpatrick and Baez mirrors in combination with defining apertures and scatter guards. A simple alternative based on single‐bounce glass monocapillary X‐ray optics is presented. The basic capillary design considerations are discussed and a practical and robust implementation that capitalizes on existing beamline hardware is presented. A design for mounting the capillary is presented which eliminates parasitic scattering and reduces deformations of the optic to a degree suitable for use on next‐generation X‐ray sources. Comparison of diffraction data statistics for microcrystals using microbeam and conventional aperture‐collimated beam shows that capillary‐focused beam can deliver significant improvement. Statistics also confirm that the annular beam profile produced by the capillary optic does not impact data quality in an observable way. Examples are given of new structures recently solved using this technology. Single‐bounce monocapillary optics can offer an attractive alternative for retrofitting existing beamlines for microcrystallography.     

Elemental depth profiling with a wire in microbeam X‐ray fluorescence analysis

This study proposes simple techniques involving the use of a thin wire set close to the sample surface to measure the elemental depth distribution in microbeam X‐ray fluorescence analysis. One is the X‐ray fluorescence detection in energy‐dispersive mode using a solid‐state detector in combination with the sample movement, and the other is in projection mode using an X‐ray charge‐coupled device camera. The minimum depth resolution (spatial resolution) obtained with a thin Mo wire is about 15 µm. Compared with a confocal depth‐profiling method, wire depth‐profile analysis is easy to implement, flexible, and has reasonable sensitivity. Copyright © 2011 John Wiley & Sons, Ltd.     

Hard X‐ray microbeam lithography using a Fresnel zone plate with a long focal length

Focused hard X‐ray microbeams for use in X‐ray nanolithography have been investigated. A 7.5 keV X‐ray beam generated at an undulator was focused to about 3 µm using a Fresnel zone plate fabricated on silicon. The focused X‐ray beam retains a high degree of collimation owing to the long focal length of the zone plate, which greatly facilitates hard X‐ray nanoscale lithography. The focused X‐ray microbeam was successfully utilized to fabricate patterns with features as small as 100 nm on a photoresist.     

ED‐XRF set‐up for size‐segregated aerosol samples analysis

The knowledge of size‐segregated elemental concentrations in atmospheric particulate matter (PM) gives a useful contribution to the complete chemical characterisation; this information can be obtained by sampling with multi‐stage cascade impactors. In this work, samples were collected using a low‐pressure 12‐stage Small Deposit Impactor and a 13‐stage rotating Micro Orifice Uniform Deposit Impactor^?. Both impactors collect the aerosol in an inhomogeneous geometry, which needs a special set‐up for X‐ray analysis. This work aims at setting up an energy dispersive X‐ray fluorescence (ED‐XRF) spectrometer to analyse quantitatively size‐segregated samples obtained by these impactors. The analysis of cascade impactor samples by ED‐XRF is not customary; therefore, as additional consistency test some samples were analysed also by particle‐induced X‐ray emission (PIXE), which is more frequently applied to size‐segregated samples characterised by small PM quantities. A very good agreement between ED‐XRF and PIXE results was obtained for all the detected elements in samples collected with both impactors. The good inter‐comparability proves that our methodology is reliable for analysing size‐segregated samples by ED‐XRF technique. The advantage of this approach is that ED‐XRF is cheaper, easier to use, and more widespread than PIXE, thus promoting an intensive use of multi‐stage impactors. Copyright © 2011 John Wiley & Sons, Ltd.     

Development of variable‐magnification X‐ray Bragg optics

A novel X‐ray Bragg optics is proposed for variable‐magnification of an X‐ray beam. This X‐ray Bragg optics is composed of two magnifiers in a crossed arrangement, and the magnification factor, M, is controlled through the azimuth angle of each magnifier. The basic properties of the X‐ray optics such as the magnification factor, image transformation matrix and intrinsic acceptance angle are described based on the dynamical theory of X‐ray diffraction. The feasibility of the variable‐magnification X‐ray Bragg optics was verified at the vertical‐wiggler beamline BL‐14B of the Photon Factory. For X‐ray Bragg magnifiers, Si(220) crystals with an asymmetric angle of 14° were used. The magnification factor was calculated to be tunable between 0.1 and 10.0 at a wavelength of 0.112 nm. At various magnification factors (M≥ 1.0), X‐ray images of a nylon mesh were observed with an air‐cooled X‐ray CCD camera. Image deformation caused by the optics could be corrected by using a 2 × 2 transformation matrix and bilinear interpolation method. Not only absorption‐contrast but also edge‐contrast due to Fresnel diffraction was observed in the magnified images.     

X‐Tream quality assurance in synchrotron X‐ray microbeam radiation therapy

Microbeam radiation therapy (MRT) is a novel irradiation technique for brain tumours treatment currently under development at the European Synchrotron Radiation Facility in Grenoble, France. The technique is based on the spatial fractionation of a highly brilliant synchrotron X‐ray beam into an array of microbeams using a multi‐slit collimator (MSC). After promising pre‐clinical results, veterinary trials have recently commenced requiring the need for dedicated quality assurance (QA) procedures. The quality of MRT treatment demands reproducible and precise spatial fractionation of the incoming synchrotron beam. The intensity profile of the microbeams must also be quickly and quantitatively characterized prior to each treatment for comparison with that used for input to the dose‐planning calculations. The Centre for Medical Radiation Physics (University of Wollongong, Australia) has developed an X‐ray treatment monitoring system (X‐Tream) which incorporates a high‐spatial‐resolution silicon strip detector (SSD) specifically designed for MRT. In‐air measurements of the horizontal profile of the intrinsic microbeam X‐ray field in order to determine the relative intensity of each microbeam are presented, and the alignment of the MSC is also assessed. The results show that the SSD is able to resolve individual microbeams which therefore provides invaluable QA of the horizontal field size and microbeam number and shape. They also demonstrate that the SSD used in the X‐Tream system is very sensitive to any small misalignment of the MSC. In order to allow as rapid QA as possible, a fast alignment procedure of the SSD based on X‐ray imaging with a low‐intensity low‐energy beam has been developed and is presented in this publication.     

Micro‐PIXE analysis of doped SiO2 fibres intended as TL dosimeters for radiation measurements

Sample elemental concentrations can be determined using the microbeam proton‐induced X‐ray emission (PIXE) technique, providing non‐destructive simultaneous low‐background multi‐element analysis. Present interest concerns analysis of Ge‐doped SiO₂ fibres intended as high spatial‐resolution thermoluminescence (TL) dosimeters for radiation measurements in place of their more typical applications in telecommunications. During fibres fabrication, defined amounts of the Ge dopant are added, the dopant more usually having a determining role in the transmission properties of the fibre. Characteristic X‐rays produced in PIXE analysis provide information on the relative distribution of elements within a sample, as in for instance Ge and Si concentrations, the Ge acting as point defect centres that promote TL. With the dopant tending to diffuse in and away from the fibre core, it is essential to define the sample matrix composition in order to accurately evaluate the X‐ray yield. This is determined in part using simultaneous Rutherford Back Scattering analysis. In present work, PIXE/Rutherford Back Scattering measurements have been employed to ascertain dopant concentrations of fibres that have been fabricated at the University of Malaya with a view to improving TL yield. Present results concern cylindrical fibres, nominally with 4%, 6% and 8% weight peak Ge concentrations and flat fibres of nominal 6% weight Ge concentration. For the cylindrical fibres, Ge dopant concentration has been found to be in the range of 2.41–4.56%, 6.44–8.29% and 10.27–12.25% weight, respectively, while for the flat fibres, the Ge concentration range is broader, at 0.07–6.55% weight. Copyright © 2014 John Wiley & Sons, Ltd.     

KB scanning of X‐ray beam for Laue microdiffraction on accelero‐phobic samples: application to in situ mechanically loaded nanowires

A mapping technique has been developed where a sub‐micrometer focused polychromatic X‐ray beam is scanned across a stationary sample instead of scanning the sample in front of the X‐ray microbeam. This method is applied to a gold nanowire during its mechanical loading using the tip of an atomic force microscope. During the loading process, such a sample is `accelero‐phobic', i.e. the sample scanning stages must not to be moved to avoid parasitic additional load. Without beam scanning, only one single position within the sample can be probed during the test. The probed material point may even change because of drifts or movements induced by the test itself. The new scanning approach facilitates the in situ mapping of the entire wire giving access to the evolution of the wire shape as well as to the boundary conditions. This novel scanning technique opens promising perspectives for studies where sample motion is forbidden because of the sample environment.     

High‐flux hard X‐ray microbeam using a single‐bounce capillary with doubly focused undulator beam

A pre‐focused X‐ray beam at 12 keV and 9 keV has been used to illuminate a single‐bounce capillary in order to generate a high‐flux X‐ray microbeam. The BioCAT undulator X‐ray beamline 18ID at the Advanced Photon Source was used to generate the pre‐focused beam containing 1.2 × 10¹³ photons s^?1 using a sagittal‐focusing double‐crystal monochromator and a bimorph mirror. The capillary entrance was aligned with the focal point of the pre‐focused beam in order to accept the full flux of the undulator beam. Two alignment configurations were tested: (i) where the center of the capillary was aligned with the pre‐focused beam (`in‐line') and (ii) where one side of the capillary was aligned with the beam (`off‐line'). The latter arrangement delivered more flux (3.3 × 10¹² photons s^?1) and smaller spot sizes (≤10 µm FWHM in both directions) for a photon flux density of 4.2 × 10¹⁰ photons s^?1µm^?2. The combination of the beamline main optics with a large‐working‐distance (approximately 24 mm) capillary used in this experiment makes it suitable for many microprobe fluorescence applications that require a micrometer‐size X‐ray beam and high flux density. These features are advantageous for biological samples, where typical metal concentrations are in the range of a few ng cm^?2. Micro‐XANES experiments are also feasible using this combined optical arrangement.     

Time‐ and spatial‐resolved XAFS spectroscopy in a single shot: new analytical possibilities for in situ material characterization

A new concept that comprises both time‐ and lateral‐resolved X‐ray absorption fine‐structure information simultaneously in a single shot is presented. This uncomplicated set‐up was tested at the BAMline at BESSY‐II (Berlin, Germany). The primary broadband beam was generated by a double multilayer monochromator. The transmitted beam through the sample is diffracted by a convexly bent Si (111) crystal, producing a divergent beam. This, in turn, is collected by either an energy‐sensitive area detector, the so‐called color X‐ray camera, or by an area‐sensitive detector based on a CCD camera, in θ–2θ geometry. The first tests were performed with thin metal foils and some iron oxide mixtures. A time resolution of lower than 1 s together with a spatial resolution in one dimension of at least 50 µm is achieved.     

Si PIN X‐ray photon counter

A Si PIN detector for visible light detection, instead of a Geiger‐Müller tube, is applied to X‐ray photon counting. We counted radiation from a checking source of a Geiger‐Müller counter with a Si PIN counter and with a Geiger‐Müller counter. White X‐ray of energy up to 20 keV emitted from a pyroelectric X‐ray emitter was also counted, and the Si PIN X‐ray counter showed a similar curve of count rate versus source distance in both measurements. Pulse counting was performed by spectroscopy circuits. An audio digitizer with computer software for signal processing was also used to simplify the photon counter. A plot of count rate versus time was obtained with this setup. With simple pulse counting circuits, Si PIN X‐ray counters have advantages such as compact structure, low cost and easy application. Copyright © 2011 John Wiley & Sons, Ltd.     

Determination of the Al content in aluminum‐modified SiO2 stationary phases using X‐ray scattering spectroscopy

This paper describes the determination of aluminum in the presence of silica using a method based on X‐ray scattering spectrometry coupled with chemometric tools (principal component analysis and partial least squares) that treat samples according to their Al concentrations. Samples were prepared by mixing Al and Si oxides. X‐ray spectra of all samples, including pure oxides of aluminum and silicon, were submitted to the chemometric tools. Principal component analysis results show that it is possible to classify three subgroups of Al (low, medium and high Al content), whereas partial least squares 1 was used to construct calibration and cross‐validation models for Al in the presence of Si. The method is simple, fast, does not require sample dissolution prior to analysis, is of low cost and can be applied as a routine procedure. The method was used to quantify Al in some chromatographic stationary phases covered with a layer of Al₂O₃. Good correlations with low errors were obtained. Copyright © 2013 John Wiley & Sons, Ltd.     

Characterization of x‐rays emerging from between reflector and sample carrier in reflector‐assisted TXRF analysis

The possible application of an Si reflector, which is placed just above the sample carrier in total reflection x‐ray fluorescence (TXRF) analysis, was investigated. The x‐rays that were emitted from an Mo tube and passed between the Si reflector and the Si sample carrier were analyzed with an Si drift detector. In our experimental setup, the angle between the reflector and the sample carrier can be changed by adjusting the inclination of the reflector. The intensity of the x‐rays that emerged from between the two Si surfaces drastically changed depending on the reflector angle. At a proper reflector angle, this intensity showed a maximum and, in addition, the Compton peak in the x‐ray spectrum was suppressed. When this x‐ray beam was used for excitation of TXRF signals, the highest intensity of x‐ray fluorescence emitted from the sample was detected, indicating that these experimental conditions are useful for the enhancement of TXRF intensities. Copyright © 2004 John Wiley & Sons, Ltd.     

Microdistribution of lead in human teeth using microbeam synchrotron radiation X‐ray fluorescence (μ‐SRXRF)

Lead (Pb) exposure is known to be associated with adverse effects on human health, especially during the prenatal period and early childhood. The Pb content in teeth has been suggested as a useful biomarker for the evaluation of cumulative Pb exposure. This study was designed to employ the microbeam synchrotron radiation X‐ray fluorescence technique to determine the microdistribution of Pb within the tooth to evaluate the reliability of the technique and the effectiveness of tooth Pb as a biomarker of Pb exposure. The results showed that in the incisor sample, Pb primarily deposited in secondary dentine region close to the pulp and secondarily at enamel exterior. In addition, Pb colocalised with Zn, indicating a positive correlation between Pb and Zn. By contrast, in the two molar samples, Pb accumulated principally in the pulp, and secondarily in the enamel. At the same time, Pb in these two molar samples colocalised with Ca instead of Zn as was observed in the incisor sample. Several batches of line scans further confirmed the conclusions. The feasibility of using microbeam synchrotron radiation X‐ray fluorescence to determine the microdistribution of Pb in teeth and of using the tooth Pb, especially in dentine, as a biomarker was discussed. Copyright © 2016 John Wiley & Sons, Ltd.     

Optimized energy dispersive X‐ray fluorescence analysis of atmospheric aerosols collected at pristine and perturbed Amazon Basin sites

Elemental composition of aerosols is important to source apportionment studies and to understand atmospheric processes that influence aerosol composition. Energy dispersive X‐ray fluorescence spectroscopy was applied for measuring the elemental composition of Amazonian atmospheric aerosols. The instrument used was a spectrometer Epsilon 5, PANalytical B.V., with tridimensional geometry that reduces the background signal with a polarized X‐ray detection. The measurement conditions were optimized for low‐Z elements, e.g. Mg, Al, Si, that are present at very low concentrations in the Amazon. From Na to K, our detection limits are about 50% to 75% lower than previously published results for similar instrument. Calibration was performed using Micromatter standards, except for P whose standard was produced by nebulization of an aqueous solution of KH₂PO₄ at our laboratory. The multi‐element reference material National Institute of Standards and Technology–2783 (air particulate filter) was used for evaluating the accuracy of the calibration procedure of the 22 elements in our standard analysis routine, and the uncertainty associated with calibration procedures was evaluated. The overall performance of the instrument and validation of our measurements were assessed by comparison with results obtained from parallel analysis using particle‐induced X‐ray emission and another Epsilon 5 spectrometer. The elemental composition in 660 samples collected at a pristine site in the Amazon Basin and of 1416 samples collected at a site perturbed by land use change was determined. Our measurements show trace elements associated with biogenic aerosols, soil dust, biomass burning, and sea‐salt, even for the very low concentrations as observed in Amazonia. Copyright © 2014 John Wiley & Sons, Ltd.