Analysis of the oxidation of cellulose fibres by titration and XPS

The purpose of this study was to evaluate the effect of selective oxidation on the surface properties of cotton cellulose fibres. Four different methods to evaluate the accessibility, nature and content of ionisable acidic groups (charge) in the fibres were applied: potentiometric and conductometric titrations, polyelectrolyte adsorption and X-ray photoelectron spectroscopy (XPS). The results from this combination of methods show that two processes take place when the oxidation method is applied: elimination of low molecular mass non-cellulosic compounds and formation of new acidic groups in the cellulose chains. Which of these processes is predominating depends on oxidation time, but the first one is initially more important. Polyelectrolyte adsorption and XPS show that the surface concentration of acidic groups is considerably lower than the bulk concentration, i.e. during oxidation the content of carboxyl groups in the surface region decreases, while it increases in amorphous regions. The decrease is due to the dissolution of low molecular weight compounds; the increase is due to the formation of new acidic groups. The use of titration methods in combination with XPS appears to be a very useful tool for identification of the formation and distribution of ionic groups in cotton fibres and their surfaces.     

Combined IR and XPS analysis of the native (1 0 0) surface of single‐crystalline silicon after HFaq etching

A combined analysis, based on angle‐resolved X‐ray photoelectron spectroscopy and multiple‐internal‐reflection infrared spectroscopy, of the (1 0 0) silicon surface after etching in dilute aqueous solution of HF is presented. The analysis shows that the surface is mainly formed by a heterogeneous distribution of SiH, SiH₂ and SiH₃ terminations, but contains (in addition to sub‐stoichiometric oxidized silicon) a form of reduced silicon, not consistent with the currently accepted picture of the native HF_aq‐etched surface. Copyright © 2007 John Wiley & Sons, Ltd.     

Low‐energy ion scattering: Determining overlayer thickness for functionalized gold nanoparticles

With the widespread use of engineered nanoparticles for biomedical applications, detailed surface characterization is essential for ensuring reproducibility and the quality/suitability of the surface chemistry to the task at hand. One important surface property to be quantified is the overlayer thickness of self‐assembled monolayer (SAM) functionalized nanoparticles, as this information provides insight into SAM ordering and assembly. We demonstrate the application of high sensitivity low‐energy ion scattering (HS‐LEIS) as a new analytical method for the fast thickness characterization of SAM functionalized gold nanoparticles (AuNPs). HS‐LEIS demonstrates that a complete SAM is formed on 16‐mercaptohexadecanoic acid (C16COOH) functionalized 14 nm AuNPs. HS‐LEIS also experimentally provides SAM thickness values that are in good agreement with previously reported results from simulated electron spectra for surface analysis of X‐ray photoelectron spectroscopy data. These results indicate HS‐LEIS is a valuable surface analytical method for the characterization of SAM functionalized nanomaterials. Copyright © 2013 John Wiley & Sons, Ltd.     

Angle resolved XPS characterization of cationic polyacrylamides

In many applications surfaces are modified using polymer films and the polymers used are often complex copolymers. In biomedical applications it is critical to determine the surface properties of a substrate as it is these that mediate the cellular interactions. The surface structure of copolymer films can only rarely be established from their bulk composition alone. In this study angle resolved XPS was used to build a model of the structure of copolymer films produced on glass substrates from a family of poly(acrylamide) copolymers containing cationic blocks. The thickness of the copolymer films was demonstrated to be dependent on the concentration of the polymer solution and the ratio of non‐cationic to cationic blocks in the copolymer. The data demonstrated that the cationic blocks of the copolymer preferentially segregated to the glass surface and the non‐cationic poly(acrylamide) blocks preferentially segregated to the air–vacuum interface. A low concentration of the cationic functional groups was present throughout the poly(acrylamide) layer and it was suggested that this resulted from a small fraction of the cationic blocks being pulled into the poly(acrylamide) layer at points along the polymer chain where the two blocks are connected. Evidence of a thin surface hydrocarbon contamination layer was also observed. Copyright © 2009 John Wiley & Sons, Ltd.     

Surface characterization of cellulose fibres by XPS and inverse gas chromatography

Inverse gas chromatography (IGC) was used to determine the dispersive component of the free energy as well as the acid-base properties of cellulose fibre surfaces, before and after modification by corona treatment. It was found that the corona treatment increases both the dispersive contribution to surface energy and its acidic character, whereas only a slight increase in its basicity was observed. It was also found that some chemical degradation of the surface occurs at high corona currents. The extent of modification of the surface properties, as revealed by IGC, was correlated to the surface chemical composition deduced from XPS analysis as well as with the electrical conductance and the pH of the water suspensions of the cellulose fibres.     

Angle‐resolved XPS of fluorinated and semi‐fluorinated side‐chain polymers

Angle‐resolved XPS data (elemental quantification and high‐energy‐resolution C 1s) are presented for ten polymers with side‐chains of the form ? OCO(CF₂)_yF, ? COO(CH₂)₂OCO(CF₂)_yF (y = 1, 2, 3) and ? COO(CH₂)_x(CF₂)_yF (x = 1, y = 1, 2, 3; x = 2, y = 8). Particular attention was paid to charge compensation and speed of data acquisition, with co‐addition from multiple fresh samples to give spectra with good energy resolution and good signal‐to‐noise ratio free from the effects of x‐ray‐induced degradation. Water contact angles for the polymers are also reported. The XPS data demonstrate preferential surface segregation of fluorine‐containing groups for all but the shortest side‐chain polymer, where the ? OCOCF₃ side‐chain either does not surface segregate or is too short for surface segregation to be detectable by angle‐resolved XPS. In the other polymers studied the relative positions of functional groups in the side‐chains correlate with the angle‐resolved behaviour of the corresponding C 1s components. This shows that the surface side‐chains are oriented towards the polymer surface. For the ? COO(CH₂)₂OCO(CF₂)_yF (y = 1) side‐chain, the angle‐resolved C 1s data suggest reduced ordering and linearity compared with y = 2 and 3. For any particular series of polymers, e.g. ? COO(CH₂)_x(CF₂)_yF, the water contact angles increase with y, consistent with burying of the hydrophilic ester groups as y increases. For any particular value of y the sequence of water contact angles is ? COO(CH₂)_x(CF₂)_yF > ? OCO(CF₂)_yF ～ ? COO(CH₂)₂OCO(CF₂)_yF, suggesting greater ordering and density of fluorocarbon species at the surface of the ? COO(CH₂)_x(CF₂)_yF side‐chain polymers compared with the other polymers studied. For the ? COO(CH₂)₂(CF₂)₈F polymer a water contact angle of 124° is measured, which is greater than that of poly(tetrafluoroethene). The ? COO(CH₂)₂OCO(CF₂)F polymer is unusual in that it shows a particularly low water contact angle (83° ), suggesting that the probe fluid is able to sense both ester groups, consistent with the reduced ordering of the side‐chain detected by angle‐resolved XPS. Copyright © 2004 John Wiley & Sons, Ltd.     

Effects of elastic scattering and analyzer‐acceptance angle on the analysis of angle‐resolved X‐ray photoelectron spectroscopy data

We have made calculations of N 1s, O 1s, Si(oxide) 2p, Hf 4f, and Si(substrate) 2p photoelectron intensities at selected emission angles for films of SiO_1.6N_0.4 and HfO_1.9N_0.1 of various thicknesses on silicon. These calculations were made with the National Institute of Standards and Technology (NIST) Database for Simulation of Electron Spectra for Surface Analysis (SESSA) to investigate effects of elastic scattering and analyzer‐acceptance angle that could be relevant in the analysis of angle‐resolved X‐ray photoelectron spectroscopy (ARXPS) experiments. The simulations were made for an XPS configuration with a fixed angle between the X‐ray source (i.e. for the sample‐tilting mode of ARXPS) and with Al and Cu Kα X‐ray sources. The no‐loss intensities changed appreciably as elastic scattering was switched ‘on’ and ‘off’, but changing the analyzer‐acceptance angle had a smaller effect. Ratios of intensities for each line from the overlayer film for the least realistic model condition (elastic scattering switched ‘off’, small analyzer‐acceptance angle) to those from the most realistic model condition (elastic scattering switched ‘on’, finite analyzer‐acceptance angle) changed relatively slowly with emission angle, but the corresponding intensity ratio for the Si(substrate) 2p line changed appreciably with emission angle. The latter changes, in particular, indicate that neglect of elastic‐scattering effects can lead to erroneous results in the analysis of measured ARXPS data. The elastic‐scattering effects were larger in HfO_1.9N_0.1 than in SiO_1.6N_0.4 (due to the larger average atomic number in the former compound) and were larger with the Al Kα X‐ray source than with the Cu Kα source because of the larger cross sections for elastic scattering at the lower photoelectron energies. Copyright © 2010 John Wiley & Sons, Ltd.     

Application of Cr Kα X‐ray photoelectron spectroscopy system to overlayer thickness determination

A laboratory hard X‐ray photoelectron spectroscopy (HXPS) system at 5.4‐keV excitation energy was used to measure the angle dependence of a silicon oxide overlayer on a Si(0 0 1) substrate with overlayer thickness ranging from 4 to 25 nm. The thickness values of the SiO₂ overlayers were determined by utilizing a focused monochromatized Cr Kα source and a high‐energy hemispherical analyzer with an angle‐resolved wide acceptance angle objective lens. The modulation of the photoemission intensity due to photoelectron diffraction, which deteriorates high‐precision thickness determination, was suppressed significantly by continuous sample rotation around the sample's normal during the measurements. The resultant thickness values very well agree with those determined by ellipsometry in the same sample set. To demonstrate merits of the large information depth measurements, profiling of a wedged SiO₂ layer buried in a gate stack model structure with Ir (8 nm) and HfO₂ (2 nm) overlayers was performed. Copyright © 2011 John Wiley & Sons, Ltd.     

Quantitative analysis of angle‐resolved XPS spectra recorded in parallel data acquisition mode

The effects of anisotropy of the photoionization cross‐section and elastic scattering of photoelectrons in solids are investigated for angle‐resolved XPS spectra (ARXPS) recorded from α–Al₂O₃ substrate in parallel data acquisition mode. It is shown that for quantitative analysis of ARXPS spectra recorded in parallel data acquisition mode it is essential to account for the anisotropies of the photoionization cross‐sections of the detected photoelectrons for the concerned elements in the solid due to variation of the angle between the incident x‐rays and the detected photoelectrons. Neglecting the effect of elastic scattering only leads to minor errors in quantitative analysis of the ARXPS spectra. By adopting experimentally determined values for the relative sensitivity factors of the concerned photoelectrons in the solid as a function of the detection angle, cumbersome corrections for the effects of anisotropy of the photoionization cross‐section and elastic scattering can be avoided. Copyright © 2004 John Wiley & Sons, Ltd.     

Surface and bulk properties of severely fluorinated carbon fibres

The development of ultra-inert composites using fluorinated carbon fibres as the reinforcement requires fluorinated carbon fibres with a durable surface composition. Here we report the effect of direct fluorination using an F₂/N₂ mixture at 653 K on the surface and bulk properties of two types of high strength carbon fibres. These were treated up to a surface fluorine content of ∼64 at.% and a bulk fluorine content of ∼15 mass%. A colour change was observed after fluorination caused by the changes in the graphitic band structure of the carbon fibres by the introduction of carbon sp³ hybridisation. The tensile strength and Young's modulus decrease after fluorination by up to 33 and 22%, respectively. XRD shows marginal changes in the interlayer distance but the crystallite size increases. Changes in the electrical conductivity of the fluorinated carbon fibres indicate that the modification is confined to the near surface volume. Predominantly covalent C-F bonds are formed as shown by X-ray photoelectron spectroscopy (XPS) and measured zeta (ζ)-potentials. Hence the fluorinated fibres are hydrophobic and have low surface tensions. This and the large increase in fibre surface area, as determined by nitrogen adsorption, is expected to facilitate interfacial interaction between fluorinated carbon fibres and fluoropolymers.     

Surface analysis of nitride layers formed on Fe‐based alloys through plasma nitride process

Nitriding phenomena that occur on the surfaces of pure Fe and Fe? Cr alloy (16 wt% Cr) samples were investigated. An Ar + N₂ mixture‐gas glow‐discharge plasma was used so that surface nitriding could occur on a clean surface etched by Ar⁺ ion sputtering. In addition, the metal substrates were kept at a low temperature to suppress the diffusion of nitrogen. These plasma‐nitriding conditions enabled us to characterize the surface reaction between nitrogen radicals and the metal substrates. The emission characteristics of the band heads of the nitrogen molecule ion (N₂⁺) and nitrogen molecule from the glow‐discharge plasma suggest that the active nitrogen molecule is probably the major nitriding reactant. AES and angle‐resolved XPS were used to characterize the thickness of the nitride layer and the concentration of elements and chemical species in the nitride layer. The thickness of the nitride layer did not depend on the metal substrate type. An oxide layer with a thickness of a few nanometers was formed on the top of the nitride layer during the nitriding process. The oxide layer consisted of several species of N_x‐Fe_y‐O, NO⁺, and NO₂^?. In the Fe? Cr alloy sample, these oxide species could be reduced because chromium is preferentially nitrided. Copyright © 2009 John Wiley & Sons, Ltd.     

Quantitative XPS analysis of hydrosilated 1‐alkene and 1‐alkyne at terraced,dihydrogen‐terminated, 1 × 1 (100) silicon

A quantitative angle‐resolved XPS analysis was carried out of the carbonaceous films resulting from the derivatization under mild thermal activation of nearly flat, terraced, dihydrogen‐terminated, 1 × 1 (100) Si with 1‐octene or 1‐octyne. The analysis of the C 1s signal gave evidence for the presence of carbon in carbide configuration (Si? C bonds) at the substrate–film interface, in addition to the alkanic carbon and adventitious oxidized carbon (C? O bonds) produced by the oxidizing impurities flawing the reaction. Assuming the surface as uniformly covered, the analysis showed that for both reactants the films were closely packed. Copyright © 2006 John Wiley & Sons, Ltd.     

Angular broadening in core‐electron spectroscopy

The role of angular broadening in quantitative core‐electron spectroscopy is investigated using an analytic approach. It is shown why, practically, this effect remains relatively small for a broad range of parameters. A correction factor is derived, suggesting that the replacement of inelastic mean free path by an effective attenuation‐length parameter is not necessarily an optimal choice. The derived expression further proposes useful insight on the contribution of leading experimental parameters and, in particular, on the sharp increase of elastic‐scattering corrections above a (depth dependent) critical angle. Copyright © 2015 John Wiley & Sons, Ltd.     

Report on the 47th IUVSTA Workshop ‘Angle‐Resolved XPS: the current status and future prospects for angle‐resolved XPS of nano and subnano films’

A summary of the workshop entitled ‘Angle‐Resolved XPS: The Current Status and Future Prospects for Angle‐resolved XPS of Nano and Subnano Films’ is given, which was held at the Riviera Maya, Mexico, 26–30 March 2007, under the main sponsorship of the International Union for Vacuum Science, Technique and Applications (IUVSTA). Angle‐resolved X‐ray photoelectron spectroscopy (ARXPS) can provide detailed chemical as well as depth profile information about the near‐surface composition of materials and thin films. This workshop was held to review the present status and level of understanding of Angle‐resolved XPS, and to stimulate discussions leading to a deeper understanding of current problems and new solutions. The main goal of the workshop was to find better ways to perform experiments and, very importantly, better ways to extract information from the experimental data. This report contains summaries of presentations and discussions that were held in sessions entitled ‘Basics and Present Limits of ARXPS’, the Analysis of ARXPS Data, Applications of ARXPS, Equipment for ARXPS, and Future Developments in ARXPS'. There were 33 participants at the workshop. Copyright © 2009 John Wiley & Sons, Ltd.     

嵌入(或载在)Y型分子筛上Pd粒子的XPS研究

1前言早在70年代末80年代初，就有文献报道在载体上的金属Pd的某些性能，并注意到将其作为催化剂在甲醇合成上有很高的活性和选择性[1~3]，然而并没有继续进行系统研究．80年代末，Sachtler等人开始在这一领域进行更广泛、更细致、更深入的研究[4~8]．他们不仅研究了载在分子筛上的Pd，也研究了Pd与其他过渡金属所形成的合金的性能．它们的催化性质研究包括对CO加氢、新戊烷和氢解和异构化以及甲基环戊烷的开环和扩环反应[4~9]．对Pd的其他性质的研究，还包括采用TPR、TPD、TPO和TPMS等技术，分析了Pd或其合金等金属原子在NaY分子…     

ARXPS investigation of diffusion as a limiting process in the incorporation of adatoms into polystyrene surfaces treated by nitrogen plasmas

Polystyrene films were exposed to nitrogen plasmas for periods up to 4 min. ARXPS measurements revealed the presence of oxygen and nitrogen in the surface because of the plasma treatment. The depth profiles of these adatoms were determined by fitting a Thomas–Windle model profile to the data. As found previously, the best‐fit depth profiles resembled a step function, consistent with case II diffusion. However, the depth of penetration of the adatom species into the polymer surface was not found to vary with plasma duration, which is inconsistent with Case II diffusion, and provides evidence that diffusion processes do not limit the loading of adatom species into the surface during nitrogen plasma treatment. A possible reason for the generation of erroneous step function depth profiles is discussed. Copyright © 2007 John Wiley & Sons, Ltd.     

Oxidation behavior of NiAl alloy at low temperatures

Oxidation behavior of NiAl alloy at low temperatures was studied. A NiAl plate was oxidized by exposure to ambient atmosphere at room temperature, heated at 473 K in air, and heated at 773 K in air. The oxide formed on the NiAl surface was investigated by angle‐resolved X‐ray photoelectron spectroscopy (AR‐XPS). Chemical composition and atomic concentration in the oxide layer were analyzed with factor analysis of XPS spectra. Exposure of the NiAl plate to the ambient atmosphere resulted in the formation of an Al₂O₃ layer along with a small amount of NiO. Oxidation of the NiAl plate at 473 K in air formed a film of double‐layered oxide; the top layer consisted of NiAl₂O₄ and a small amount of NiO, and the second layer was Al₂O₃. Successive oxidation at 773 K only changed the oxide‐layer thickness without changing the structure. Formation of oxide observed in the present study corresponds to the thermodynamic prediction for the oxidation behavior of NiAl at 1373 K. Copyright © 2007 John Wiley & Sons, Ltd.     

Surface characterization of pre‐formed alginate fibres incorporated with a protein by a novel entrapment process

A novel physical entrapment process has been explored as an approach to surface incorporation of proteins within pre‐formed alginate fibres under mild conditions. Entrapment of the protein of choice was achieved by exposing the alginate fibres to a Na⁺‐rich NaCl/CaCl₂ mixture solution, which caused the formation of a moderate dissociation layer into which the protein could diffuse. Subsequent addition of a large excess of multi‐valent cations led to the collapse of the surface and entrapment of the protein within the surface. Bovine serum albumin (BSA) was used as a model protein to investigate the effect of process parameters on the entrapment efficiency. Scanning electron microscopy revealed that there was an increase in the surface roughness and a slight increase in the average diameter of the fibres after protein entrapment. The presence of the protein at the surface of alginates after the entrapment process was confirmed by means of confocal laser‐scanning microscopy, X‐ray photoelectron spectroscopy (XPS) and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS). The ion exchanges at the surface were evident, as detected by XPS and ToF‐SIMS. It was found that under fixed pre‐swelling conditions, the entrapment efficiency increased with increasing treatment time and, particularly, with protein concentration in the exposure solution. Copyright © 2005 John Wiley & Sons, Ltd.     

Cryo‐XPS study of xanthate adsorption on pyrite

The adsorption of xanthate on pyrite has been extensively studied. However, the adsorption mechanisms remain a subject of controversy. Formation of both dixanthogen and metal‐xanthate complexes has been suggested. In this study, both room temperature X‐ray photoelectron spectroscopy (XPS) (RT‐XPS) and liquid nitrogen temperature XPS (Cryo‐XPS) were used to study interactions between pyrite and xanthate. While dixanthogen was not detected by RT‐XPS, it was successfully identified through C1s and S 2p peaks using Cryo‐XPS. The impact of pH and copper activation on adsorption of xanthate on pyrite was also investigated. It was found that at low pH, dixanthogen is the dominant species of xanthate adsorption on pyrite. At high pH, metal‐xanthate complexes were found to be prevalent on pyrite surfaces, which are responsible for the surface hydrophobicity. Copper activation showed a significant effect on xanthate adsorption on Cu‐activated pyrite, resulting in mostly the formation of Cu‐xanthate complexes rather than dixanthogen, mainly in the form of Cu(I)‐isopropyl xanthate complex (CuIPX). Copyright © 2012 John Wiley & Sons, Ltd.