共查询到18条相似文献,搜索用时 265 毫秒
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针对光学材料、光学元件的快速、高精度应力测试评估需求,提出了一种基于双弹光级联差频调制的应力双折射测量方案。应力双折射延迟量和快轴方位角信息被加载到差频弹光调制信号中,运用数字锁相技术同时提取弹光调制的差频信号和基频信号,进一步求解出应力双折射延迟量和快轴方位角。对该新方案的原理进行了分析,并搭建了实验系统,对系统初始偏移值进行了实验定标。采用Soleil-Babinet补偿器完成了测量精度和重复性测试,并完成了施加应力样品的应力双折射测试。实验结果表明,该系统的延迟量测量精度为2.3%,延迟量测量重复性为0.032 nm,双折射测量重复性为0.17 nm/cm。此外,单数据点测量时间不超过200 ms。 相似文献
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为解决在光学玻璃应力双折射测量中遇到的双折射叠加问题,利用光学等效原理,使用一个线性双折射模型和一个旋转器来代替叠加模型。对叠加的情况做了分析和计算,得到了叠加后的特征延迟、主应力方向和旋转角随两个应力模型主应力方向夹角变化的曲线。理论分析表明,应力双折射叠加不是应力双折射的简单相加,而是与叠加模型各自的应力双折射值和主应力方向的夹角有关。实验结果与理论计算相吻合。应力双折射叠加对实际光学玻璃测试造成不良影响,使测量精度降低,特别是有透光支撑机构或折射液容器的情况下,应力双折射叠加的影响不可忽略。 相似文献
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基于偏光干涉理论,提出一种宽光谱范围内测量波片相位延迟量和厚度的方法。利用矩阵光学方法分析了光谱透射率曲线与中值透射率直线交点波长之间的关系,给出待测波片的相位延迟量、波片厚度等多个物理量的计算公式并进行了误差分析。误差分析表明本方法相位延迟量测量最大误差为3.38°,厚度测量最大误差为0.66μm。实验上利用分光光度计验证了本方法的有效性。本方法能够实现波片多物理量的同时测量,且调节过程对于起偏器、检偏器透光轴方向及待测波片快轴方向无严苛要求,测量过程对波片也无损伤和污染,在波片加工、使用前质量评估等方面都具有一定的应用价值。 相似文献
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激光遥感偏振成像系统光学元件调整及误差分析 总被引:6,自引:3,他引:3
改进了利用双旋转波片方法进行偏振成像的实验装置,提出了通过一次测量获得目标偏振度和强度编码图像的方法.运用光强法对激光遥感偏振成像装置的光学元件进行调整,通过斯托克斯和穆勒矩阵在偏振光学元件中的应用,给出了相应光学元件的调整原理、方法及过程.分析了激光器中心波长变动、偏振片的角度误差和波片的相位延迟及角度误差对整个系统的影响.结果表明,由偏振片角度和波片角度误差造成的出射光斯托克斯误差较小,不超过0.001,可以忽略;由波片相位延迟不精确造成的误差在0.02左右,所以应采用延迟精度较高的波片;激光器中心波长变化的影响最大,不能忽略,必须加滤光片使接收光的中心波长控制在808nm;镀有铝膜望远镜对接收到的散射光偏振度影响较小,适于激光遥感偏振成像系统的应用. 相似文献
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光学元件在红外波段的应力-光学常数是众多光学系统关心的问题之一.本文提出一种基于1556.16 nm掺铒光纤激光频率分裂效应的光学玻璃内应力致双折射测量方法.选择平面介质膜腔镜和光纤光栅(FBG)构成线形半开放式谐振腔,并分析了光纤自身弯曲引入谐振腔内的双折射.将待测光学玻璃附带力传感结构放置在谐振腔内,结合Jones矩阵传递方程得到了外载荷所致双折射与空腔双折射的叠加模型.对光学玻璃的载荷从0逐级递加到20 N,内腔的频率分裂量增加,根据双折射叠加模型和频率分裂原理解出应力与频率分裂量的对应关系,且该结果可溯源到基本物理量—波长.实验结果表明,系统灵敏度为22060 Pa/nm,线性度为99.44%,可广泛应用于红外波段的光学元件双折射精确测量. 相似文献
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利用锗酸铋(BGO)晶体的弹光双折射与电光双折射可以相互补偿的特性,设计并研究了一种新型光学应力传感器。折射率椭球分析结果表明,在垂直于BGO晶体的(111)晶面方向上同时施加应力和电场,晶体的弹光双折射能够被电光双折射所补偿,因而可以实现应力的闭环光学测量。光学传感单元主要包括两个棱镜偏振器和一块平行四边形的BGO晶体,该晶体自身能够通过对光波的两次全反射产生0.5π的光学相位偏置,因而不需要附加四分之一波片。实验测量了30kPa以内的压缩应力,被测压缩应力与补偿电压之间具有较好的线性关系,且每1kPa压缩应力所需要的补偿电压约为4.26V。 相似文献
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为了实现对不同构型光学样品进行应力双折射分布测量,在使用双弹光调制方法的基础上,设计了一种应用于双折射分布测量的多构型扫描系统。该系统在保证测量的高分辨率的同时,通过保持激光器静止,同时使样品进行快速移动,提高了测量精度与广度。在样品测量方面,采用633 nm(1/4)玻片测试,测试相对误差的范围为0.79%~0.95%,波动范围为0.12 nm,标准差为0.035 2;采用BK7玻璃样品测试,波动范围为0.25 nm,标准差为0.038 9。在扫描精度方面,连续扫描精度误差不超过0.05 mm,连续寸动扫描精度误差不超过0.009 mm。对比实验结果可得出,该多构型扫描系统可有效解决对样品任一区域实现高精度应力双折射测量的问题。 相似文献
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A precise method for measurement of two-dimensional birefringence distribution is described and discussed. This method can determine the relative retardation and the azimuthal angle of the fast axis in an optical component. In order to detect relative retardation with high resolution, a local-sampling phase shifting technique is proposed. This method can measure 256 × 256 values of the birefringent phase difference and azimuthal angle in a short time with ± 0.02 deg (0.03 nm) of retardation accuracy. 相似文献
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Stress-induced birefringence impacts the performance of many optical devices. Techniques are needed to measure accurately stress profiles in optical fibers. The two-waveplate-compensator (TWC) method allows the accurate measurement of small retardations. The full-field TWC method is applied here to measure the two-dimensional retardation distribution of single-mode fibers with a spatial resolution of 0.45 μm and a sensitivity of 0.07 nm. Axial stress profiles are hence determined along the axis of the fiber. The stress profiles determined with the TWC method are in good agreement with profiles previously reported in the literature while containing less noise and resolving more details. 相似文献
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衍射光学元件衍射效率的测量 总被引:2,自引:0,他引:2
根据衍射光学元件衍射效率的测量原理,建立衍射光学元件衍射效率测量的双光路装置,简要介绍了双光路测量的优点。针对衍射光学元件衍射效率的测量装置,讨论了影响衍射效率测量精度的因素,合理地选择测量装置中的针孔光阑,即可以让主衍射级次的光全部通过被探测器接收,又可以滤掉次级衍射光,保证测量结果的准确度。针对所设计研制的一个折衍射混合成像光学系统,测量了可见光波段3个激光波长的衍射效率,并对测量结果进行了模拟和分析。在473~632.8nm波段范围内任意一个波长处,衍射效率的测量结果同理论值的偏差均小于5.0%。实验证明,双光路测量装置可以用于测量衍射光学元件的衍射效率。 相似文献
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《中国光学快报(英文版)》2020,(6)
Polarization aberration caused by material birefringence can be partially compensated by lens clocking. In this Letter, we propose a fast and efficient clocking optimization method. First, the material birefringence distribution is fitted by the orientation Zernike polynomials. On this basis, the birefringence sensitivity matrix of each lens element can be calculated. Then we derive the rotation matrix of the orientation Zernike polynomials and establish a mathematical model for clocking optimization. Finally, an optimization example is given to illustrate the efficiency of the new method. The result shows that the maximum RMS of retardation is reduced by 64% using only 48.99 s. 相似文献
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The main difficulties connected with the application of integrated photoelasticity are as follows: (1) in general (when rotation of the principal axes is present) one has to measure three characteristic parameters for each ray (instead of two in two-dimensional photoelasticity and in the frozen stress method); (2) the characteristics parameters are connected with the stress distribution in a very complicated manner: to determine the stress distribution from their basis is difficult.If the birefringence is weak, then measurements can be simplified. In the latter case a usual plane polariscope may be used for measurements, and simple approximate integral relationships between the experimental data and the distribution of birefringence on the ray are valid, if rotation of the principal axes is moderate. The paper attempts to establish the domain where application of these relationships is justified. By the aid of numerical experiments it is shown that simple integral relationships can be applied if optical retardation is less than a quarter of a wavelength and rotation of the principal axes is less than π/6. In the latter case by investigating a three-dimensional model the parameter of isoclinic and the optical phase retardation are measured exactly in the same way as by investigating a two-dimensional model. 相似文献
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We describe a polarization-maintaining fiber-based polarization-sensitive optical low-coherence reflectometer for measurement of depth-resolved birefringence. Unlike for other fiber-based polarization-sensitive optical low-coherence reflectometers, here the linear birefringence of a sample can be measured from data recorded in a single A scan. Simultaneous measurement of retardation and orientation of birefringent axes with mica wave plates is demonstrated. The measured retardation is insensitive to sample rotation in the plane perpendicular to ranging. 相似文献