Friction coefficient mapping using the atomic force microscope

A friction coefficient map of the surface of an immiscible polymer blend has been constructed using data obtained with the atomic force microscope. Spatially resolved friction coefficients, obtained from gradients of linear plots of frictional force versus applied load, were used to construct the map, with corresponding frictional forces being derived from lateral force data and the lateral spring constant. Values of the friction coefficient were confirmed using an Si₃N₄/Si₃N₄ couple, for which literature values were available. Excellent agreement with the literature was observed through the use of this method. Copyright © 2004 John Wiley & Sons, Ltd.     

Direct observation of uncoated spectrin with atomic force microscope

Spectrin molecules extracted from human blood ceil membrane have been examined by atomic force microscopy (AFM) without using shadowing or staining procedures. A drop of the solution containing spectrin molecules was deposited on the freshly deaved mica substrate. After about 1 min, the residual solution was removed with a piece of filter paper. Afterwards the sample was imaged with a home-made atomic force microscope (AFM) in air in a constant force mode. The obtained AFM images revealed that the spectrin molecules prepared from the above procedures exhibit several kinds of structures as follows: (i) the compact rod-like spectrin heterodimers with a length of around 100 nm; (ii) bent or curved linear tetramers with a length of around 200 nm; (iii) somewhat curved spectrin hexamers, octomers or decamers with lengths of about 300, 400, or 500 nm; and (iv) high oligomers with a length above 1 000 nm.     

Local surface charge dissipation studied using force spectroscopy method of atomic force microscopy

We propose herein a method to study local surface charge dissipation in dielectric films using force spectroscopy technique of atomic force microscopy. By using a normalization procedure and considering an analytical expression of the tip‐sample interaction force, we could estimate the characteristic time decay of the dissipation process. This approach is completely independent of the atomic force microscopy tip geometry and considerably reduces the amount of experimental data needed for the calculation compared with other techniques. The feasibility of the method was demonstrated in a freshly cleaved mica surface, in which the local charge dissipation after cleavage followed approximately a first‐order exponential law with the characteristic time decay of approximately 7–8 min at 30% relative humidity (RH) and 2–3.5 min at 48% RH. Copyright © 2015 John Wiley & Sons, Ltd.     

Correlating polymer structure,dynamics, and function with atomic force microscopy

Since its development, atomic force microscopy (AFM) has become an indispensable tool for investigating fundamental and technological applications of polymer materials. The versatility of AFM imaging modes and operating conditions allows for nanoscale characterization of a range of dynamic processes, such as crystallization, phase separation, self assembly, and electronic transport. Advances in AFM technology, particularly high-speed and high-resolution imaging, enable investigation of polymer structure, function, and dynamics in real world conditions and across a range of relevant spatial and temporal scales. In this perspective, we highlight a collection of recent polymer studies that utilize AFM to correlate the function and structure of polymer films, with focus on its multiparametric imaging capabilities. As the complexity of polymer materials and morphologies continues to increase, AFM is well poised to meet the accompanying demand for nanoscale imaging and characterization.     

Intermolecular forces between acetylcholine and acetylcholinesterases studied with atomic force microscopy

With the aid of atomic force microscopy, the intermolecular forces between acetyleholinesterases (AChE) and its natural substrate acetylcholine (ACh) have been studied. Through force spectrum measurement based on imaging of AChE molecules it was found that the attraction force between individual molecule pairs of ACh and AChE was (10±1) pN just before the quaternary ammonium head of ACh got into contact with the negative end of AChE and the decaying distance of attraction was (4±1) nm from the surface of ACHE. The adhesion force between individual ACh and AChE molecule pairs was (25±2) pN, which had a decaying feature of fast-slow-fast (FSF). The attraction forces between AChE and choline (Ch), the quaternary ammonium moiety and hydrolysate of ACh molecule, were similar to those between AChE and ACh. The adhesion forces between AChE and Ch were (20±2) pN, a little weaker than that between ACh and ACHE. These results indicated that AChE had a steering role for the diffusion of ACh toward it and had r     

Influence of attractive force on imaging micro‐droplets of water by atomic force microscope

The shape of micro‐droplets of water on a pure copper surface was investigated using the a.c. non‐contact mode of an atomic force microscope (AFM) by applying different attractive forces between the cantilever tip and the liquid surface. The forces largely influenced the observed radii of micro‐droplets; the influence can be reduced significantly by reducing the force. The same attractive force between the cantilever tip and the micro‐droplets is necessary when comparing the contact angles of micro‐droplets on different surfaces. Furthermore, the values of the contact angles of the micro‐droplets should be the average of those on at least four sides of the droplets. Copyright © 2005 John Wiley & Sons, Ltd.     

Facile measurement of polymer film thickness ranging from nanometer to micrometer scale using atomic force microscopy

As many properties of polymer thin films critically depend on their thickness, a convenient and cost‐effective method for precise measurement of film thickness in a wide range is highly desirable. Here, we present a method which enables polymer film thickness, ranging from nanometer to micrometer scale, to be facilely determined by measuring the height of an artificially created film step on smooth substrates with atomic force microscopy (AFM). Three polymeric films (polystyrene, poly(methyl methacrylate) and poly(styrene–ethylene/butylene–styrene) films), spin‐coated on either mica or quartz substrate with thickness ranging from 5.7 nm to 4.4 µm, were employed to demonstrate the procedure and feasibility of our method. The proposed method is particularly suitable for thicker polymer films, thus complementing the traditional AFM ‘tip‐scratch’ method which is generally limited to polymer films of no more than 100 nm thickness. Copyright © 2010 John Wiley & Sons, Ltd.     

Kinetics of latex formation of PBMA latex in the presence of alkali soluble resin using atomic force microscopy

 The effect of alkali-soluble resin (ASR), poly(ethylene-co-acrylic acid), EAA, postadded to emulsifier-free monodisperse poly(butyl methacrylate) (PBMA) latexes on the kinetics of film formation was investigated using atomic force microscopy (AFM). Corrugation height of latex particles in films was monitored at various annealing temperatures as a function of annealing time. Enhanced polymer diffusion was found in a latex film containing ASR regardless of anneal-ing temperature. With increasing annealing temperature, a much higher rate of polymer diffusion was found in latex films containing ASR. These results can be interpreted that the low molecular weight and low Tg EAA resin adsorbed at the particle surface is more susceptible to diffusion than that of the PBMA in the film formation stage, thus it enhances the mobility of PBMA polymer. Received: 30 October 1997 Accepted: 20 March 1998     

Influence of single-wall carbon nanotubes on Langmuir–Blodgett films of ferroelectric liquid crystals as studied by atomic force microscopy

Langmuir–Blodgett films of ferroelectric liquid crystal (LC) doped with low concentration of single-wall carbon nanotubes have been prepared and characterised. Pressure–area isotherms show that the films are stable and have good spreading properties. The interaction between nanotubes and LC molecules in the monolayer was increased during barrier compression, resulting in increased surface pressure. We observed phase change with increasing nanotube concentration in ferroelectric LC matrix. Atomic force microscopy profiles indicate uniform deposition of material on single crystal silicon wafer.     

Melting behavior of lamellae of isotactic polypropylene studied using hot-stage atomic force microscopy

The α- and β-form lamellae of isotactic polypropylene were developed at different temperatures. The melting behaviors of the lamellae were observed in real time at elevated temperatures using a hot-stage atomic force microscopy. The melting behavior of the α-form lamellae was determined by the lamellar defects. For the α-form lamellae developed at different undercoolings, the larger the undercoolings, the relatively higher amount of defect in the lamellae was observed. The lamellae with defects were melted into lamellar segments, and recrystallization took place during the heating process. The β-form lamellae had lower thermal stability, and they melted firstly and separately from that of α-form.     

Study on the nanoscale current of ZnO film by photoassisted peak force tunnel atomic force: A novel technique for UV detection

ZnO film-based ultraviolet (UV) detector was fabricated by photoassisted peak force tunnel atomic force (PFTUNA) on fluorine tin oxide (FTO) substrate. The PFTUNA current in dark and in UV light was ~0.1 and 2.0 nA, respectively. The UV sensitivity (photocurrent/dark current) is more than 20. The response time and the recovery time are ~0.12 and 0.32 s, respectively. The UV sensing mechanism is that the holes will transport to the ZnO surface to capture the adsorbed oxygen ions to weaken the depletion layer under UV illumination. The PFTUNA current between the tip and the ZnO film is consistent with the Richardson–Schottky (RS) thermionic emission model.     

Selective solvent annealing induced phase separation and dewetting in PMMA/SAN blend ultrathin films

Phase behaviors induced by solvent annealing in poly(methyl methacrylate) (PMMA) and poly(styrene‐ran‐acrylonitrile) (SAN) blend ultrathin films have been investigated by atomic force microscopy and grazing incidence small‐angle X‐ray scattering. Our results indicate that both the phase separation within the blend and the dewetting of the film induced by composition fluctuation take place upon the selective solvent annealing, producing complex structures containing upper droplets (of one phase) and mimic‐films (of the other rich‐phase). The use of acetic acid (the selective solvent for PMMA) generates PMMA mimic‐film and SAN droplets, while the introduction of DMF (exhibiting better solubility for SAN) vapor results in the formation of SAN mimic‐film and PMMA droplets. Essentially, the interaction at polymer/substrate interface, resultant wettability of selected component, solubility of PMMA and SAN in adopted solvent dominate not only the phase separation and the dewetting of the whole film but also the synergism of them. © 2014 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2014 , 52, 1243–1251     

Atomic force microscopy observations of the structural development during the uniaxial stretching of crosslinked low-density polyethylene in partial and fully molten states

The effect of uniaxial deformation in partially and fully molten states on the morphology of crosslinked low-density polyethylene has been investigated. At low temperatures, the morphology is predominantly fibrillar, with little kebabs appearing on the fibril surfaces. As the deformation temperature is increased into the melting range, the shish density decreases, and overgrowths of kebabs on the fibrils concurrently increase in length. This gives rise to added twisting of the kebabs reflected in the orientation factor analysis. This shish/twisted lamellar kebab texture is observed only in a partially molten state. Studies in a substantially molten state indicate the absence of shish, althugh short lamellae are observed that are oriented in the transverse direction. This morphology indicates a high chain orientation factor as a result of short lamellae that exhibit small twisting similar to Matsumura's rod model. The absence of shishes in the final films stretched isothermally in a substantially molten stage agrees with Schultz's model, in which imperfectly formed shishes dissolve if they are not stabilized by rapid cooling, as is the case in these studies. © 2004 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 42: 2228–2237, 2004     

Determination of solid surface tension from particle-substrate pull-off forces measured with the atomic force microscope

Atomic force microscopy (AFM) is capable of solid surface characterization at the microscopic and submicroscopic scales. It can also be used for the determination of surface tension of solids (gamma) from pull-off force (F) measurements, followed by analysis of the measured F values using contact mechanics theoretical models. Although a majority of the literature gamma results was obtained using either Johnson-Kendall-Roberts (JKR) or Derjaguin-Muller-Toporov (DMT) models, re-analysis of the published experimental data presented in this paper indicates that these models are regularly misused. Additional complication in determination of gamma values using the AFM technique is that the measured pull-off forces have poor reproducibility. Reproducible and meaningful F values can be obtained with strict control over AFM experimental conditions during the pull-off force measurements (low humidity level, controlled and known loads) for high quality substrates and probes (surfaces should be free of heterogeneity, roughness, and contamination). Any probe or substrate imperfections complicate the interpretation of experimental results and often reduce the quality of the generated data. In this review, surface imperfection in terms of roughness and heterogeneity that influence the pull-off force are analyzed based upon the contact mechanics models. Simple correlations are proposed that could guide in selection and preparation of AFM probes and substrates for gamma determination and selection of loading conditions during the pull-off force measurements. Finally, the possibility of AFM measurements of solid surface tension using materials with rough surfaces is discussed.     

Ru(TAP)3]2+-photosensitized DNA cleavage studied by atomic force microscopy and gel electrophoresis: a comparative study

Topological modifications of plasmid DNA adsorbed on a variety of surfaces were investigated by using atomic force microscopy (AFM). On mica modified with 3-aminopropyltriethoxysilane (APS) or poly-L-lysine, the interaction between the plasmid DNA and the surface "freezes" the plasmid DNA conformation deposited from solution, and the AFM images resemble the projection of the three-dimensional conformation of the plasmid DNA in solution. Modified mica with low concentrations of Mg(2+) leads to a decrease in the interaction strength between plasmid DNA and the substrate, and the AFM images reflect the relaxed or equilibrium conformation of the adsorbed plasmid DNA. Under these optimized deposition conditions, topological modifications of plasmid DNA were produced under irradiation in the presence of [Ru(TAP)(3)](2+) (TAP = 1,4,5,8-tetraazaphenanthrene), which is a non-intercalating complex, and were followed as a function of illumination time. The observed structural changes correlate well with the conversion of the supercoiled covalently closed circular form (ccc form) into the open circular form (oc form), induced by a single-strand photocleavage. The AFM results obtained after fine-tuning of the plasmid DNA-substrate interaction compare well with those observed from gel electrophoresis, indicating that under the appropriate deposition conditions, AFM is a reliable technique to investigate irradiation-induced topological changes in plasmid DNA.     

Observation of adhesive force and energy of adsorbents on rubber substrates by atomic force microscopy

We observed the surface morphology and adhesive interaction of adsorbents on rubber substrates by atomic force microscopy (AFM). The detachment of adsorbents from rubber substrates is an important issue for various machines like home appliances and laundry machine. Since a clean surface of the functioning parts is required, a frequent cleaning process must be developed. In particular, dust and lint have a tendency to bind to the rubber surface of a laundry machine. Several practical methods have been attempted to remove these particles from the surface. Pure water, detergent, sodium hypochlorite (65 °C), and cold water (18 °C) are treated onto artificial dust and lint mixtures on rubber with water fluid by rapid rpm. The dust‐and‐lint adsorbents are investigated by AFM after the treatment, and topographic images and force–distance (F–D) curves were generated for the samples. The roughness, measured as the root mean square, is a key factor to judge the cleaning quality. From the F–D curves, we are able to obtain adhesive energy in addition to adhesive force which will yield qualitative measures of the interactions between the remaining adsorbents and the rubber surface. Considering the values that were measured, hot water with water fluid by rapid rpm offers the best performance when cleaning the surface. The chemical like sodium hypochlorite is good for thinning the materials, but it solidifies them, which is eventually detrimental to proper functioning. Copyright © 2014 John Wiley & Sons, Ltd.     

Interaction Forces Between Graphitic Carbon Black Surfaces Coated with Polymers Using Atomic Force Microscopy

Carbon black dispersions are stabilized using polymeric dispersants. The stabilization is provided by adsorbed polymer layers around surfaces through interaction forces. Therefore, it is valuable to measure the interaction forces between bare and polymer-coated surfaces using atomic force microscopy to predict the behavior of dispersions. Three polymeric dispersants (Hypermer LP1, Hypermer B246, and OLOA 11000) are used in the present work to disperse the graphitic carbon black particles in an organic solvent, decaline. Hypermer B246 and OLOA 11000 produced repulsive interactions and, hence, are effective stabilizers for carbon black surfaces. Hypermer LP1 produced attractive interactions, making it an ineffective stabilizer for carbon black. Attractive interactions were also observed in blank dispersions. The experimentally determined interaction curves are compared with theoretical curves, the Derjaguin approximation. The repulsive steric interactions are also analyzed quantitatively based on the Alexander and de Gennes scaling law.     

Shear banding in strained semicrystalline polyamide 6 films as revealed by atomic force microscopy: Role of the amorphous phase

Atomic force microscopy (AFM) has been used to visualize the plastic deformation mechanisms that are responsible for the yielding of semicrystalline polymers of low degree of crystallinity (<50%). Indeed, AFM, if operated in suitable conditions, is able to image both the amorphous and the crystalline phases. Polyamide 6 films have been drawn at temperatures T < 160 °C. Postmortem AFM observations show that, at yield, shear bands nucleate and propagate in the amorphous phase. They cross the crystalline lamellae and run over the whole surface of the sample. By crossing the lamellae, they form nanoblocks of uniform size. Neither the size of the nanoblocks nor the angle between the tensile axis and the shear bands can be explained in terms of crystal plasticity. © 2004 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 42: 687–701, 2004     

Dissolution of the barite (001) surface by the chelating agent DTPA as studied with non-contact atomic force microscopy

DTPA (diethylenetriaminepentaacetic acid) is a chelating agent widely used for removal of barium sulfate (barite) scale in the petroleum industry. In this paper we report ex-situ investigations of barite dissolution in deionized water and in 0.18 M DTPA aqueous solutions. Non-contact atomic force microscopy (NC-AFM) was used to observe dissolution on the BaSO₄ (001) cleavage surface. Dissolution was carried out at room temperature in a 10 ml reactor. Each sample was first etched in solution and dried before examination by NC-AFM. Dissolution on the BaSO₄ (001) surface took place via development of etch pits. In deionized water, triangular etch pits were observed on the (001) terraces at room temperature. And, zigzag shaped etch pits were found at the edges of steps. In DTPA solutions, etch pits on the (001) terraces were observed and these became deeper and longer with increasing time. The geometry of these etch pits was trapezoidal, and/or trapezohedral. To explain this characteristic morphology caused by dissolution we suggest that the active sites of one DTPA molecule bind to two or three Ba²⁺ cations exposed on the (001) surface.