On the response of LR-115 plastic track detector to 10 20 Ne-ion

The track etch rates of ₁₀ ²⁰ Ne-ion in cellulose nitrate (LR-115) have been measured for different temperatures and the activation energy is determined. The experimental results show that both the track etch rate and the normalized track etch rate depend on the energy loss as well as on etching temperature. The maximum etched track length of ₁₀ ²⁰ Ne-ion agrees with the theoretically computed range. The experimental results show that there is no sharp threshold, at least in CN(LR-115).     

Response of Makrofol polycarbonate plastic track detector to 1.1 MeV/N 54 132 Xe-ion

Makrofol polycarbonate plastic track detectors have been exposed to ₅₄ ¹³² Xe -ions of energy 1.1 MeV/N from the cyclotron beam. The bulk etch rate and track etch rate are measured for different temperatures and the activation energies are calculated. The maximum etched track length is compared with the theoretically computed range. The critical energy loss is (dE/dx) _c =5 MeV cm² mg⁻¹ for this detector material.     

Annealing of 54 132 Xe-ion tracks in Lexan and Makrofol plastic track detectors

Samples of Lexan and Makrofol-E polycarbonate plastic track detectors were exposed to 1·1 MeV/N ₅₄ ¹³² Xe-ions to investigate the thermal track fading properties of these plastics. The experimental results show that there is no effect of annealing on the bulk etch rate while the track etch rate decreases with annealing. The track diameter decreases with increase in annealing time and temperature. It is also observed that the track density is reduced as a result of annealing. The experiments reveal that the track lengths are, in general, decreased by the application of heat and that the oblique tracks are less stable than the vertical tracks. The decrease in diameter of ₅₄ ¹³² Xe-ion tracks in Makrofol-E due to heat treatment is faster than that of ₅₄ ¹³² Xe-ion tracks in Lexan.     

Study of 18 40 Ar ion tracks in cellulose nitrate

Sample of cellulose nitrate (Russian) is exposed to ₁₈ ⁴⁰ Ar ions. The bulk etch rate has been studied at different etching temperatures and the activation energy for bulk etch rate has been calculated. The etched track lengths are measured for different etching times. The energy loss rate and range of ₁₈ ⁴⁰ Ar ions in CN(R) is also calculated. The critical threshold value for etchable track in CN(R) is determined by comparing the theoretical and experimental values of track length. The response curve of CN(R) is also presented.     

A comparative study of track registration response of makrofol-(KG, KL & N) polycarbonate to Ar ions

In the present work a comparative study of track registration response of ⁴⁰Ar ions in different types of Makrofol polycarbonates viz. Makrofol-KG, KL & N have been done. The etched track parameters viz. bulk etch rate, track etch rate, etch rate ratio, cone angle and etching efficiency were calculated. The variation of etching rates with temperature were found to be exponential and follow the Arrhenius equation. The values of activation energy for bulk and track etching were also calculated. Maximum etchable track length/range were also obtained and compared with the theoretical values obtained from computer program RANGE. From the results it is found that the polycarbonates having same chemical composition manufactured by different chemical processes have slightly different behavior.     

Annealing of heavy ion tracks in cellulose nitrate plastic track detectors

The effect of heat treatment on the latent tracks in cellulose nitrate plastic track detectors has been studied. The bulk etch rate increases with annealing temperature while the track diameters of different ions in cellulose nitrate decrease with increase in annealing time and temperature. Experimental results show that for heavier ions higher temperatures are needed for their complete erasure. The track length and track etch rate are decreased by the application of heat. Experiments reveal that annealing reduces track density. The vertical tracks are more stable than the oblique tracks and require higher temperature for their complete erasure.     

Tracks of 18·56 MeV/u 40Ar ions in Lexan polycarbonate detector

Latent damage tracks of energetic⁴⁰Ar ions (18·56 MeV/u) have been recorded in Lexan polycarbonate detector. Bulk and track-etch parameters are evaluated under successive chemical etching. Our results show a linear correlation between the measured track-etch rate along the track and the corresponding total energy-loss rate and predict a threshold value of 5·0 MeV mg⁻¹ cm² for track registration. Maximum etchable track lengths of⁴⁰Ar ions as a function of energies have also been measured and compared with three different sets of theoretical ranges.     

Track recording properties of soda glass detector for accelerated heavy ions

The etch pit diameters of soda glass detector samples exposed to ₅₄ ¹³² Xe-ions of different energies are measured for different etching times after etching the detector in a ‘new etchant’ free of the adverse effect of the etch product layer. The dependence of track diameter on the energy and on the energy loss, dE/dx of ₅₄ ¹³² Xe-ion in soda glass has been presented. The energy resolution of soda glass and the critical angle for etching of fission fragment tracks in glass detectors have also been determined. The maximum etched track length of ₅₄ ¹³² Xe-ion in soda glass has been compared with the theoretical range. The effects of different annealing conditions on bulk etch rate of glass detector and on diameters of ₅₄ ¹³² Xe-ion tracks have been presented. Experimental results show that there is a decrease in track etch rate, etching efficiency and etchable range of ₅₄ ¹³² Xe-ions with annealing. The annealing of oblique tracks shows that the vertical tracks are more stable than the oblique tracks.     

The Bragg-peak studies in CR-39 SSNTD on the basis of many-hit model for track etch rates

Etching rates along tracks of protons and lithium ions with energies in the Bragg peak region were explored. The energy losses in this region, especially for protons of low energies, are of particular interest from the physical as well as biological points of view. The microscopic track etch rate, V_T, is studied using the many-hit model in its first approximation assuming that V_T is a function of the restricted energy loss (REL_ω). The ions multiple scattering and straggling effects on the average experimental V_T values are corrected by shifting the calculated REL_ω values along the track, until its maximum coincides with that of the V_T. The fitting of least square differences between calculated and experimental V_T values is used in order to determine the many-hit model registration parameters for the detector under investigation.     

Response of triafol-TN plastic track detectors to238U-ions

Triafol-TN plastic detector foils have been irradiated with²³⁸U ions of energy 16.34 MeV/u and the tracks produced have been observed using the chemical etching technique. The bulk etch rate and track etch rate are determined under successive chemical etching. In our case, the validity of Arrhenius’s law is confirmed by the fact that the same value ofE _a obtained for these different concentrations, within experimental errors. The results show a linear correlation between the measured track etch rate along the track and the corresponding total energy loss rate and a threshold value of ～ 5.0 MeV/(mg/cm²) for track registration was obtained. The maximum etched track length of²³⁸U-ion in triafol-TN has been compared with the theoretically computed range.     

Micro-track structure analysis for 100 MeV Si ions in CR-39 by using atomic force microscopy

To analyze the micro-track structure of heavy ions in a polymer material,parameters including bulk etch rate,track etch rate,etch rate ratio,and track core size were measured.The pieces of CR-39 were exposed to 100 MeV Si ions with normal incidence and were etched in 6.25N NaOH solution at 70 C.Bulk etch rate was read out by a profilemeter after several hours of etching.The other parameters were obtained by using an atomic force microscope(AFM)after a short time of etching.We have measured the second etch pits and minute etch pits to obtain the track growth curve and three dimension track structures to track the core size and etch rate measurements.The local dose of the track core was calculated by theδ-ray theory.In our study,we figure out that the bulk etch rate Vb=(1.58±0.022)μm/h,the track etch rate Vt=(2.90±0.529)μm/h,the etch rate ratio V=1.84±0.031,and the track core radii r≈4.65 nm.In the meantime,we find that the micro-track development violates the traditional track-growth model.For this reason,a scenario is carried out to provide an explanation.     

Alpha track profile study and range determination in PADC plastic detectors

An extensive study of alpha particle track profile has been carried out in PADC plastic detectors. Track profile geometry and its parameters have been studied. Various values of alpha energies were used, and the etch rate ratio (V) was measured as a function of the residual range (RR) along the alpha particle track. A mathematical formula between V and RR was established. Also in this work, alpha particle ranges in plastic foils have been measured at various energies using two methods; namely the track profile technique (TPT) and the over etched track diameter method. A comparison between the measured ranges and calculated ones is presented, and a good agreement has been found.     

Measurement of the track etch rates along proton and alpha particle trajectories in CR-39 and calculation of the detection efficiency

Computation of the neutron response of CR-39 detectors needs to simulate the track formation by neutron induced charged particles taking into account the bulk etch rate and the track etch rate varying along the particle trajectories. The latter one was determined experimentally by track length measurement. The results allowed to derive the relationship between the track etch rate and the restricted energy loss of the charged particles. On this basis, the geometrical track parameters and track etch rates as well as the critical angle of particle incidence could be determined for protons and alpha particles in the energy range from 0.2 to 8.8 MeV. The energy dependence of the critical angle enabled to determine the detection efficiency for a charged particle of given energy and direction.     

Computation of etched track profiles in CR-39 and comparison with experimental results for light ions of different kinds and energies

Computation of etched track profiles needs the knowledge of the variable track etch rates along the ion trajectories. Using the depth-dependent track etch rates experimentally determined for perpendicularly incident protons, deuterons and alpha particles as well as ⁷Li, ¹¹B, ¹²C, ¹⁴N and ¹⁶O ions of different energies simulations of the track development were performed. Two models of track etching were applied for that purpose recently published in literature. Although the models are based on the same physical fundamentals the results are slightly different. The reasons of the discrepancies were found by analysing the algorithms in detail. Comparison of the calculated track profiles with those determined experimentally from longitudinal sections of the etch pits showed good agreement for non-overetched as well as overetched tracks. The consistency of the whole experimental data set was checked by analysing the correlation of the track etch rates with geometric track parameters for all kinds of ions and etching times covered by the experiments.     

Measurement of bulk etch rate of LR115 detector with atomic force microscopy

Equations for calculating track parameters have been proposed, which invariably involve the track etch rate V_t and the bulk etch rate V_b. The present study measured V_b for the LR115 solid-state nuclear track detector using atomic force microscopy (AFM). The detectors were partially masked using rubber cement and then etched in 2.5 N NaOH solution at 60°C for time periods ranging from 5 to 40 min. The rubber cement was then peeled off and cross-sectional images of the LR115 detectors were obtained by AFM. V_b has been found to have different values below and beyond the etching time of about 13.5 min, with the values of 0.0555 and 0.0875 μm min⁻¹, respectively. The increase in V_b with the etching time can be explained by a diffusion-etch model, in which the additional damage of the detector material is due to those etchant ions diffused into the detector over time. Now that V_b has been determined, this can be combined with the track etch rate V_t to calculate track parameters.     

Studies on the variation of the track etch rate along alpha particle trajectories in CR-39

At the beginning of the etching process a constant track etch rate can be assumed. In deeper detector layers, however, the etch rate varies drastically along the particle trajectories. Consequently, the indirect determination of the track etch rate by measuring the etch pit diameters on the detector surface does not yield correct results. Therefore, a method for the direct measurement of the track etch rate as a function of the depth within the detector was developed. Applying this method, the relationship between the track etch rate and the energy loss in CR-39/PATRAS could be derived.     

Studies on the track formation mechanism of the heavy ions in CR-39

The bulk etch rate for two types of CR-39 detector was measured as a function of temperature and the activation energies of bulk etching was determined. Experimental values of track etch rate were derived directly from the function of the succesive measured track length vrs. etching time for ²⁰⁹Bi, ¹²⁹Xe and ²⁰Ne ions.

The maximum etchable length of 13 MeV/u ²⁰⁹Bi and 13.04 MeV/u ¹²⁹Xe ions have been measured at and below these energies. A comparison of the measured and calculated track length data is presented.     

High Energy Charged Particle Registration in CR-39 Polycarbonated Detector

Track etch rate characteristics of CR-39 plastic detector exposed to ²⁸Si ions of 670 MeV energy have been investigated. Experimental results were obtained in terms of frequency distribution of the track diameter, track density and bulk etching rate. A dependence of the mean track diameter on energy was found. The application of the radiation effect of heavy ions on CR-39 in the field of radiation detection and dosimetry are discussed. Results indicated that it is possible to produce etchable tracks of ²⁸Si in this energy range in CR-39. We also report the etching characteristics of these tracks in the CR-39 detector.     

Registration temperature effect in polymers: Physico-chemical aspects

Registration temperature effect in two different polymers - poly(ethylene terephthalate) (PET) and polypropylene (PP) films - is investigated. Temperature effects on track formation are considered in terms of molecular mobility and relaxation transitions. The track eth rate is measured as a function of irradiation temperature in the range of 77 to 373 K. The obtained results are compared with the radical yields, radiothermoluminescence curves and thermally stimulated currents measured with the aim of detecting changes in the mobility of macromolecules and radiolysis intermediates. It is found that the change of the track etch rate with changing registration temperature correlates with γ- and glass transitions in PP and with β-and glass transitions in PET.