Role of non-stoichiometry in the cracking of oxide crystals

The cracking and stoichiometric deviations frequently observed in crystals of mixed oxides have generally been perceived to be unrelated phenomena. The present study pertains to the cracking in Czochralski grown crystals of three different materials, viz. CdWO₄, PbWO₄ and ZnWO₄. The results obtained on the single-crystal growth as well as on the thermal stability of melts of these materials and of their constituent oxides demonstrate, for the first time, that stoichiometric deviations manifest as cracks in the crystals. An important outcome of this investigation is that materials exhibiting a small degree of super-cooling with stable melting and solidification temperatures should be less prone to cracking.     

Gel growth of α and γ glycine and their characterization

The microbial free single crystals of α and γ glycine were grown from gel at room temperature in a new chemical route. These crystals showed a superior quality than the solution grown crystals. The metastable α-form and the stable γ-form of glycine were crystallized in silica gel by solubility reduction method. The form of crystallization is confirmed by single crystal and powder X-ray diffraction analyses. The crystals of α and γ glycine were found to crystallize in monoclinic and hexagonal crystal systems, respectively. For analyzing the functional group and thermal stability of α and γ glycine crystals, spectroscopic and thermal analyses have been carried out. The dielectric studies were performed to find the dielectric constant of the grown crystals and the results are discussed. Second harmonic generation efficiency of the crystal was measured by Kurtz’s powder method using Nd:YAG laser and it was found to be 2.68 times that of potassium dihydrogen phosphate crystals.     

Control of multi-zone resistive heater in low temperature gradient BGO Czochralski growth with a weighing feedback,based on the global dynamic heat transfer model

The global heat transfer in a crystallization setup has been optimized to develop a strategy of control over a three-zone heater in the BGO Czochralski process, in order to provide invariable thermal conditions near the solid–liquid interface in the stage of a constant-diameter crystal growth. The functional related to the exactness of the heat balance condition at the crystallization front, i.e., the Stefan problem, was chosen as the target function. The optimization yielded unexpected results. The temperature of the lower heater should be lowered, relative to that of the middle heater, with increasing crystal length, whereas the temperature of the upper heater is to be raised. These recommendations were incorporated into a dynamic model of the oxide Czochralski process with a weighing control and into the control loop of the temperature regulators of a crystallization setup. A comparison of results of the time-dependent simulation with the real growth process confirmed that the new control strategy minimizes the deviation of the solid–liquid interface from the prescribed one, significantly decreases variations of interface shape during the process, and enables growth of high-quality crystals.     

Growth of SiGe bulk crystals with uniform composition by utilizing feedback control system of the crystal–melt interface position for precise control of the growth temperature

We developed an automatic feedback control system of the crystal–melt interface position to keep the temperature at the interface constant during growth, and demonstrate its successful application to grow Ge-rich SiGe bulk crystals with uniform composition. In this system, the position of the crystal–melt interface was automatically detected by analyzing the images captured using in situ monitoring system based on charge-coupled-devices camera, and the pulling rate of the crucible was corrected at every 1 min. The system was found to be effective to keep the crystal–melt interface position during growth even when the variation of the growth rate is quite large. Especially, the interface position was kept for 470 h during growth of Ge-rich SiGe bulk crystal when we started with a long growth melt of 80 mm. As a result, a 23 mm-long Si_0.22Ge_0.78 bulk crystal with uniform composition was obtained thanks to the constancy of the growth temperature during growth through the control of the interface position. Our technique opens a possibility to put multicomponent bulk crystal in a practical use.     

High-velocity banding structure in the laser-resolidified hypoperitectic Ti47Al53 alloy

Stability analysis of a growing solid/liquid interface is the fundamental concept of modern solidification theory. Here, serial laser rapid solidification experiments were performed on a hypoperitectic Ti₄₇Al₅₃ alloy to explore the dendritic growth behavior near the limit of high-velocity absolute stability. SEM and TEM techniques were carried out to investigate the microstructure and identify the phase composition. By adopting an improved sampling method of TEM, the growth morphology evolution of the laser-resolidified layer was observed directly and high-velocity banding structure was firstly detected in Ti–Al peritectic alloys. The high-velocity banding structures are parallel to the solid/liquid interface (normal to the growth direction) and made of the oscillation structures grown alternatively in modes of cell and plane morphologies. In light bands with cellular growth mode, all dislocation assembles are parallel to the growth direction and forms the cell boundaries, while all dislocation distributes randomly in dark bands. The determined growth velocity range for the appearance of high-velocity banding structures is about 0.51.1 m s⁻¹ according to the rapid solidification experiments, and the origin of the banding agrees well with the prediction of the CGZK phenomenological model (Acta Metal. Mater. 40 (1992) 983).     

Growth and characterization of CdSe single crystals by modified vertical vapor phase method

Good quality, large single crystals of CdSe were grown by the modified growth method (i.e., vertical unseeded vapor phase growth with multi-step purification of the starting material in the same quartz ampoule without any manual transfer between the steps). Lower temperature gradients (8–9°C/cm) at the growth interface were used for the crystal growth. As-grown CdSe crystals was characterized by X-ray diffraction, scanning electron microscopy, energy dispersive analyzer of X-rays, high-resistance instrument measurement, and etch-pit observation. It is found that there are two cleavage faces of (1 0 0) and (1 1 0) orientations on the crystal, the resistivity is about 10⁸ Ω cm, and the density of etch pits is about 10^3–4/cm². The crystal was cut into wafers and was fabricated into detectors. The detectors were tested using an ²⁴¹Am radiation source. γ-ray spectra at 59.5 keV were obtained. The results demonstrated that the quality of the as-grown crystals was good. The crystals were useful for fabrication of room-temperature-operating nuclear radiation detectors. Therefore, the modified growth technique is a promising, convenient, new method for the growth of high-quality CdSe single crystals.     

The influences of supersaturation on LPE growth of GaN single crystals using the Na flux method

The dependency of LPE growth rate and dislocation density on supersaturation in the growth of GaN single crystals in the Na flux was investigated. When the growth rate was low during the growth of GaN at a small value of supersaturation, the dislocation density was much lower compared with that of a substrate grown by the Metal Organic Chemical Vapor Deposition method (MOCVD). In contrast, when the growth rate of GaN was high at a large value of supersaturation, the crystal was hopper including a large number of dislocations. The relationship between the growth conditions and the crystal color in GaN single crystals grown in Na flux was also investigated. When at 800 °C the nitrogen concentration in Na–Ga melt was low, the grown crystals were always tinted black. When the nitrogen concentration at 850 °C was high, transparent crystals could be grown.     

Growths of bubble/pore sizes in solid during solidification—an in situ measurement and analysis

The sizes of a bubble trapped in solid after nucleation on the solidification front during an upward freezing of water containing a dissolved oxygen or carbon dioxide gas are experimentally measured and quantitatively predicted in this work. The sizes of the bubble include the height, radius and contact angle of the cap on the solidification front and the length of the bubble in the solid. From in situ measurements of bubble shapes in solid at cold temperatures of −25° and −15°C, it quantitatively shows that pore formation can be divided into five regimes: (1) nucleation on the solidification front, (2) spherical growth, (3) solidification rate-controlled elongation, (4) disappearance of the bubbles, and (5) formation of the pores in solid. To interpret experimental results, equations incorporated with the growth rate of a spherical bubble and solidification rate to predict bubble shapes in the solid during the spherical growth and solidification rate-controlled elongation are successfully proposed. It is found that the time to reach the regime of solidification rate-controlled elongation corresponding to the maximum radius of the bubble is increased by decreasing solidification rate and increasing spherical growth rate of the bubble. Experimental data show the effects of initial gas concentration and solidification rate on geometries of the bubble in solid. Valuable database for more systematical studies of pore formation in solids are provided.     

Numerical simulation of a new SiC growth system by the dual-directional sublimation method

A new SiC growth system using the dual-directional sublimation method was investigated in this study. Induction heating and thermal conditions were computed and analyzed by using a global simulation model, and then the values of growth rate and shear stress in a growing crystal were calculated and compared with those in a conventional system. The results showed that the growth rate of SiC single crystals can be increased by twofold by using the dual-directional sublimation method with little increase in electrical power consumption and that thermal stresses can be reduced due to no constraint of the crucible lid and low temperature gradient in crystals.     

The growth of mixed alkaline-earth fluorides for laser host applications

A comprehensive analysis is implemented concerning the growth, properties, and applications of doped-co-doped single and mixed alkali earth fluoride systems. Calcium-strontium fluoride solid solutions with a Sr content proportion varying widely between 0.007 and 0.675 mol.% are obtained as a batch of axis-symmetrical boules grown by a Bridgman-Stockbarger (BS) method. The crystallization front (CF) can be controlled to retain a convex CF-shape that is favourable for normal growth of single crystals. This achieved using a broad adiabatic furnace zone (AdZ) independently of the boules’ composition. The influence of the thermal field distribution on the CF and the real crystallization rate (CR), which are both critically decisive in controlling crystal quality, were originally assessed using empirically derived formulas. The optical characteristics of the grown boules were monitored by measuring the external transmittance t and calculating the total losses following light irradiation of optical windows that were prepared from sections of the boules that had been cut parallel to one another. The t-measurements were performed by two different techniques and the comparative analysis of the results reliably indicates any inhomogeneity in the grown boules. A simple supercooling criterion proved to closely relate the morphological stability of the CF enabling one to set up the optimum growth conditions. Thus the normal growth criterion outlines the concentration bounds where the isotropic growth mechanism is replaced by cellular anisotropic growth. A procedure has been established for provisioning researchers with optical quality calcium-strontium fluoride crystals with widely varying composition grown under practically identical conditions. As a consequence one can explore possible reasons that can affect the growth mechanism for this or any other systems with a fluoride structure and so provide scope aimed at the future improvement of the crystal quality thereby enlarging the field of mixed fluoride systems’ applications.     

Growth of (CH3)2NH2CuCl3 single crystals using evaporation method with different temperatures and solvents

The bulk single crystals of low-dimensional magnet (CH₃)₂NH₂CuCl₃ (DMACuCl₃ or MCCL) are grown by a slow evaporation method with different kinds of solvents, different degrees of super-saturation of solution and different temperatures of solution, respectively. Among three kinds of solvent, methanol, alcohol and water, alcohol is found to be the best one for growing MCCL crystals because of its structural similarity to the raw materials and suitable evaporation rate. The best growth temperature is in the vicinity of 35 °C. The problem of the crystals deliquescing in air has been solved through recrystallization process. The crystals are characterized by means of X-ray diffraction, specific heat and magnetic susceptibility.     

Estimation of growth rate in unidirectionally solidified multicrystalline silicon by the growth-induced striation method

Multicrystalline silicon was grown by unidirectional solidification method using the accelerated crucible rotation technique. The application of the accelerated crucible rotation technique in unidirectional solidification method induced growth striations across the axial direction of the grown crystal. This striation pattern was observed from carbon concentration distribution, obtained by using Fourier transform infrared spectroscopy. The generated striation pattern was found to be weak and discontinuous. Some striations were absent, probably due to back melting, caused during each crucible rotation. From the growth striations and applied time period in crucible rotation, the growth rate was estimated by using Fourier transformation analysis.     

Ammonothermal epitaxy of wurtzite GaN using an NH4I mineralizer

Purely wurtzite phase needle crystals and epitaxial layers of GaN were grown by the ammonothermal method using an NH₄I mineralizer. The inclusion of zincblende phase GaN was effectively eliminated by increasing the growth temperature higher than 500 °C. Accordingly, an approximately 20-μm-thick GaN epitaxial layer was achieved on the Ga-polar face of a c-plane GaN seed wafer at 520 °C. Although the characteristic deep state emission band dominated the room temperature photoluminescence spectrum, the near-band-edge emission of GaN was observed for both the needle crystals and the epitaxial layers. These results encourage one to grow better quality GaN crystals at a high growth rate under high-temperature growth conditions.     

Structural, thermal and dielectric studies on a new solution grown 4-dimethylaminopyridinium dihydrogen phosphate crystal

Single crystals of 4-dimethylaminopyridinium dihydrogen phosphate (DMAPDP) (C₇H₁₃N₂PO₄) were grown by the solvent evaporation method. The three-dimensional structure was solved by the single-crystal X-ray diffraction method which belongs to triclinic crystal system and the molecular arrangements in the crystal were studied. The thermal behaviour was investigated using differential scanning calorimetry (DSC) and no phase transition was identified in the temperature region −150 to 230 °C. The thermal parameters—thermal diffusivity (), thermal effusivity (e), thermal conductivity (K) and heat capacity (C_p) of DMAPDP were measured by an improved photopyroelectric technique at room temperature. Dielectric constant and dielectric loss of the grown crystal were evaluated for the frequency range 1–200 KHz in the temperature region 28–135 °C. The Vicker's hardness was measured as 42.2 for a load of 98.07 mN. The laser induced surface damage threshold of DMAPDP crystal was found to be 4.8 GW/cm² with nanosecond Nd:YAG laser.     

Growth and properties of Pb[(Zn1/3Nb2/3)0.91Ti0.09]O3 single crystals directly from melt

Pb[(Zn_1/3Nb_2/3)_0.91Ti_0.09]O₃ (PZNT91/9) single crystals were grown by a modified Bridgman method directly from melt using an allomeric Pb[(Mg_1/3Nb_2/3)_0.69Ti_0.31]O₃ (PMNT69/31) single crystal as a seed. X-ray diffraction (XRD) measurement confirmed that the as-grown PZNT91/9 single crystals are of pure perovskite structure. Electrical properties and thermal stabilization of PZNT91/9 crystals grown directly from melt exhibit different characters from those of PZNT91/9 crystals grown from flux, although segregation and the variation of chemical composition are not seriously confirmed by X-ray fluorescence analysis (XPS). The [0 0 1]-oriented PZNT91/9 crystals cut from the middle part of the as-grown crystal boules exhibit broad dielectric-response peaks at around 105 °C, accompanied by apparent frequency dispersion. The values of piezoelectric constant d₃₃, remnant polarization P_r, and induced strain are about 1800–2200 pC/N, 38.8 μC/cm², and 0.3%, respectively, indicating that the quality of PZNT crystals grown directly from melt can be comparable to those of PZNT91/9 single crystals grown from flux. However, further work deserves attention to improve the dielectric properties of PZNT crystals grown directly from melt. Such unusual characterizations of dielectric properties of PZNT crystals grown directly from melt are considered as correlating with defects, microinhomogeneities, and polar regions.     

Solid mechanics and material strength studies on the melt growth of bulk single crystals

Microdefects such as dislocations and macrocracking should be controlled during the crystal growth process to obtain high-quality bulk single crystals. Solid mechanics and material strength studies on the single crystals are of importance to solve the problems related to the generation and multiplication of dislocations and the cracking of single crystals. The present paper reviews such research activities that comprise the thermal stress analysis during crystal growth process, the dislocation density estimation during crystal growth process, and the cracking of single crystal due to thermal stress.     

Homogeneous SiGe crystals grown by using the traveling liquidus-zone method

It is indispensable to estimate a diffusion coefficient in a solution zone in order to grow a homogeneous crystal by using the traveling liquidus-zone (TLZ) method. To estimate the diffusion coefficient of Ge in the SiGe solution zone, result of a two-dimensional numerical simulation is compared with an experimental result. From the comparison, the diffusion coefficient is estimated to be 9.5×10⁻⁵ cm²/s. By using this coefficient, a sample translation rate for obtaining a homogeneous SiGe crystal is determined. By translating samples with appropriate rates, homogeneous Si_0.5Ge_0.5 crystals are successfully grown. The typical Ge composition is 0.496±0.006 for more than 13 mm long. The experimental result shows the homogeneity of ±1.2% in the mole fraction. This deviation corresponds to the variation of less than ±0.03% in the lattice constant. Since this variation is negligibly small, the homogeneity is excellent. Thus it is found that the TLZ method is the universal growth technique, which is applicable to the crystal growth of not only the III–V compounds but also the IV–IV compounds.     

Three-dimensional global analysis of thermal stress and dislocations in a silicon ingot during a unidirectional solidification process with a square crucible

A three-dimensional global model was used to obtain the solution of a thermal field within the entire furnace during a unidirectional solidification process of multicrystalline silicon with a square crucible. Then the thermal stress distribution in the silicon ingot was solved. Based on the solution of thermal stress, relaxation of stress and multiplication of dislocations were performed by using the Haasen–Alexander–Sumino model (HAS model). The influence of crucible constraint on stress levels and dislocations was investigated. It was found that the crucible constraint had significant influence on the thermal stresses and dislocations in the ingot. The results indicated that it is important to reduce the crucible constraint in order to relax thermal stresses and reduce dislocations in a silicon ingot during the solidification process.     

Flux growth and characterizations of NdPO4 single crystals

Neodymium phosphate single crystals, NdPO₄, have been grown by a flux growth method using Li₂CO₃-2MoO₃ as a flux. The as-grown crystals were characterized by X-ray powder diffraction(XRPD), differential thermal analysis (DTA) and thermogravimetric analysis (TG) techniques. The results show that the as-grown crystals were well crystallized. The crystal was stable over the temperature range from 26 to 1200 °C in N₂. The specific heat of NdPO₄ crystal at room temperature was 0.41 J/g °C. The absorption and the fluorescence spectra of NdPO₄ crystal were also measured at room temperature.     

Resistivity distribution of silicon single crystals using codoping

Numerous studies including continuous Czochralski method and double crucible technique have been reported on the control of macroscopic axial resistivity distribution in bulk crystal growth. The simple codoping method for improving the productivity of silicon single-crystal growth by controlling axial specific resistivity distribution was proposed by Wang [Jpn. J. Appl. Phys. 43 (2004) 4079]. Wang [J. Crystal Growth 275 (2005) e73] demonstrated using numerical analysis and by experimental results that the axial specific resistivity distribution can be modified in melt growth of silicon crystals and relatively uniform profile is possible by B–P codoping method. In this work, the basic characteristic of 8 in silicon single crystal grown using codoping method is studied and whether proposed method has advantage for the silicon crystal growth is discussed.