Time-of-flight secondary ion mass spectrometry (TOF-SIMS):--versatility in chemical and imaging surface analysis

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has emerged as one of the most important and versatile surface analytical techniques available for advanced materials research. This arises from its excellent mass resolution, sensitivity and high spatial resolution providing both chemical and distributional (laterally and depth) information for a wide variety of materials and applications. Understanding the various modes of operation and the information that each provides is crucial to the analyst in order to optimise the type of data that is obtained. New developments in primary ion sources and the application of multivariate analysis techniques, which can only extend the versatility and applicability of the technique, are also discussed.     

Image processing in secondary ion mass spectrometry

The application of image processing in secondary ion mass spectrometry is discussed. The Cameca 4f SIMS uses a single microchannel plate and a highly sensitive camera in combination with an image processor with real time capabilities (Kontron IBAS). An automation procedure with image integration, extended dynamic range image acquisition and retro depth profiling is presented and illustrated with practical applications.     

Estimation of useful yields for electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS)

Useful yield for electrospray droplet impact/secondary ion mass spectrometry was estimated. The mixtures of C₆₀/rhodamine B and C₆₀/Aerosol OT were used as the samples for the positive and negative mode of operations, respectively. By assuming that (i) the desorption efficiencies are about the same for C₆₀, rhodamine B and Aerosol OT, and (ii) desorption of ionic compounds directly gives the secondary ion signals, the useful yields (i.e. total ions generated divided by the total molecules desorbed) for C₆₀ were estimated to be ~0.1. This value should be regarded as the upper limit because the neutralization of positive and negative ions in the plume and desorption of ionic compounds as neutral species are not taken into account. Copyright © 2012 John Wiley & Sons, Ltd.     

Cationization of dendritic macromolecule adsorbates on metals studied by time‐of‐flight secondary ion mass spectrometry

Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) was utilized to study dendritic macromolecules with various architectures, such as dendrons, dendrimers and hyperbranched polyesters prepared from bis‐(hydroxymethyl)propionic acid (Bis‐MPA) and a series of hyperbranched polyethers based on 3‐ethyl‐3(hydroxymethyl)oxetane. The measurements were performed on spin‐coated thin films of the branched molecules (D) onto silicon, chemically etched copper foil and silver‐coated wafers. They showed weak signatures of molecular ions by proton capture (D + H)⁺ in the high mass range of the spectra (m/z > 400). On the contrary, cationization of the intact molecules with alkali or transition metal ions such as Na⁺, Cu⁺ or Ag⁺ was observed. High‐intensity quasi‐molecular ions (D + M)⁺ (with M = Na⁺, Cu⁺ or Ag⁺) allowed the studied polymers to be identified. The whole molecular species were observed for Bis‐MPA dendrons and dendrimers up to 3000 Da for hydroxyl or acetonide‐terminated derivatives. The success of the so‐called cationization experiments with metal substrates compared with analysis of molecular adsorbates on silicon is highlighted. The ToF‐SIMS sensitivity appeared useful to provide information about the molecular end‐groups or to highlight incomplete reaction occurring during some deprotection step of the synthesis. Only uncationized fragments of low masses were detected for the hyperbranched polyesters. This result suggested the effect of molecular asymmetry and/or flattening of the molecules on the substrates, which hampered the molecule lift‐off efficiency. Nevertheless, the hyperbranched polyethers were characterized based on the peak distribution of intensities, which allowed estimation of their molecular weight average. This work was intended to illustrate the capabilities of ToF‐SIMS to analyse dendritic polymers on surfaces. Copyright © 2003 John Wiley & Sons, Ltd.     

Application of pattern recognition methods in secondary ion mass spectrometry

Pattern recognition methods were applied to SIMS spectra of aluminum and manganese borides to test if proper feature selection and distinction between the various compounds on the basis of the evaluation of cluster ions is possible. It was found that the features selected on an empirical basis could be reduced for practical application from 13 and 11 to 2–3 and 5–8 for aluminum borides and manganese borides, respectively, and that identification of the different compounds is possible by evaluation of the fragmentation pattern. Furthermore, there is evidence that this approach does not only work for pure compounds but also for specimens, where the interesting species is only a minor fraction in the analysed volume.     

Time-of-flight secondary ion mass spectrometry analysis of hair from archaeological remains

Hair from four individuals excavated from burial sites in Pacatnamu, Peru from the Moche (450-800 AD) and Lambayeque (900-1100 AD) periods was sectioned longitudinally and analysed with time-of-flight secondary ion mass spectrometry (ToF-SIMS). An attempt was made to distinguish biogenic and diagenetic contributions to the elemental concentrations in the hair samples. Significant contamination was observed to have penetrated the hair samples from the burial environment. Results from the analyses indicate that the burial environment plays an important role in the postmortem variation in elemental content of hair samples. Various elements demonstrated an ability to permeate through the hair matrix over time. In addition, NaCl and what are believed to be aluminosilicates and mineral sulphates, were observed to have accumulated on the surface of the samples. Degradation of the samples was also suspected due to the presence of molecular fragments, possibly resulting from oxidation of the keratin proteins. The results should assist in the identification of reliable elemental signals in the analysis of ancient hair samples and promote caution when considering elements that are abundant in the burial environment.     

Classification of secondary ion mass spectrometry (SIMS) micrographs to characterize chemical phases

This work demonstrates the potential of multivariate image analysis methods in the extraction of useful, problem dependent information from SIMS images. Specific algorithms have been developed to classify SIMS micrographs manually as well as automatically. A feature selection has been achieved by means of principal component analysis with a subsequent image classification.As an application example for these improved digital image processing tools chemical phases within a soldered industrial metal sample have been identified. This is of highly practical value as it was assumed that during the soldering process inhomogeneities occur along the joint site which cause a cracking of the brazed material under mechanical strain conditions.     

Static secondary ion mass spectrometry (S-SIMS) for the characterization of surface components in mineral particulates

The feasibility of static secondary ion mass spectrometry (S-SIMS) for the detection of molecule specific information from complex materials, such as natural clay and soil samples, has been investigated. Ion trap (IT), as well as triple quadrupole (TQ) instruments, have been used for mass analysis. Secondary ion images have been acquired using time-of-flight (TOF) S-SIMS. The generation of molecular adduct ions from thin and thick layers on the mineral substrates has been investigated using KBr as a simple model system. Results show that molecular adducts of KBr can be indeed detected from the spiked materials. However, the concentrations of the spiking solutions have to be significantly larger than expected from the surface area measured by gas adsorption techniques. In addition imaging analysis has evidenced that the detection of adduct ions in the mass spectra directly relates to the presence of local micro-crystallites.     

Lipid imaging with cluster time-of-flight secondary ion mass spectrometry

This brief article provides an overview of the current state of the art in biological imaging mass spectrometry using cluster time-of-flight secondary ion mass spectrometry (TOF–SIMS). Recent and spectacular improvements in terms of sensitivity of TOF–SIMS imaging methods have allowed many biological applications to recently be successfully tested, such as mapping of lipid disorders in human muscles of a patient suffering from dystrophy, localization of surfactins after the swarming of bacteria on a surface, or lipid mapping over whole-body animal sections.     

Time-of-flight mass spectrometric analysis of ion formation in hypervelocity impact of organic polymer microspheres: comparison with secondary ion mass spectrometry, (252)Cf mass spectrometry and laser mass spectrometry

Unisized 1.6-microm polystyrene microspheres coated with PEDOT (polyethylene-dioxythiophene) were accelerated to speeds of 6-16 km/s and shot onto a silver target. Either positive or negative ions, both instantaneously formed by the impact process, have been analyzed by time-of-flight mass spectrometry (TOF). Apparently, the processes that control the formation of ions of either polarity depend on the impact velocity. Comparing the results with those of secondary ion mass spectrometry with primary ion energy in both the elastic and the inelastic ((252)Cf-MS) energy loss regimes, some reaction mechanisms of the polymer ions for different energy densities could be elucidated. Some aspects of ion formation are also related to those found in pulsed laser ion generation from these microspheres. This investigation was performed in order to further improve the method of analyzing the organic fraction of interstellar, interplanetary, and cometary dust particles impinging on the targets of the "CIDA" time-of-flight (TOF) mass spectrometers on-board the NASA comet missions "STARDUST" and "CONTOUR".     

Matrix-free high-resolution imaging mass spectrometry with high-energy ion projectiles

The importance of imaging mass spectrometry (MS) for visualizing the spatial distribution of molecular species in biological tissues and cells is growing. We have developed a new system for imaging MS using MeV ion beams, termed MeV-secondary ion mass spectrometry (MeV-SIMS) here, and demonstrated more than 1000-fold increase in molecular ion yield from a peptide sample (1154 Da), compared to keV ion irradiation. This significant enhancement of the molecular ion yield is attributed to electronic excitation induced in the near-surface region by the impact of high energy ions. In addition, the secondary ion efficiency for biologically important compounds (>1 kDa) increased to more than 10(10) cm(-2), demonstrating that the current technique could, in principle, achieve micrometer lateral resolution. In addition to MeV-SIMS, peptide compounds were also analyzed with cluster-SIMS and the results indicated that in the former method the molecular ion yields increased substantially compared to the latter. To assess the capability of MeV-SIMS to acquire heavy-ion images, we have prepared a micropatterned peptide surface and successfully obtained mass spectrometric imaging of the deprotonated peptides (m/z 1153) without any matrix enhancement. The results obtained in this study indicate that the MeV-SIMS technique can be a powerful tool for high-resolution imaging in the mass range from 100 to over 1000 Da.     

飞行时间二次离子质谱(TOF-SIMS)结合化学衍生法分析杂环新化合物的结构

飞行时间二次离子质谱(TOF-SIMS)分析了难挥发的杂环新化合物咪唑啉硫氰酸盐及其三种衍生物, 确认出很强的氢离化及银离化准分子离子峰, 通过对各种衍生物谱图的对照分析, 确认出较强的含有结构特征的碎片离子峰, 并对该化合物在离子轰击下的裂解规律作了分析, 支持了对该新化合物结构的鉴定。     

Degradation of poly(acrylates) under SF5+ primary ion bombardment studied using time‐of‐flight secondary ion mass spectrometry. 3. Poly(hydroxyethyl methacrylate) with chemical derivatization

Molecular depth profiling of polymers by secondary ion mass spectrometry (SIMS) has focused on the use of polyatomic primary ions due to their low penetration depth and high damage removal rates in some polymers. This study is the third in a series of systematic characterizations of the effect of polymer chemistry on degradation under polyatomic primary ion bombardment. In this study, time‐of‐flight SIMS (ToF‐SIMS) was used to assess 5 keV SF₅⁺‐induced damage of ～90 nm thick spin‐cast poly(2‐hydroxyethyl methacrylate) (PHEMA) and ～130 nm thick trifluoroacetic anhydride‐derivatized PHEMA (TFAA‐PHEMA) films. The degradation of these polymers under extended SF₅⁺ bombardment (～2 × 10¹⁴ ions cm^?2) was compared to determine the effect of the pendant group chemistry on their degradation. The sputter rate and ion‐induced damage accumulation rate of PHEMA were similar to a poly(n‐alkyl methacrylate) of similar pendant group length, suggesting that the addition of a terminal hydroxyl group to the alkyl pendant group does not markedly change the stability of poly(n‐alkyl methacrylates) under SF₅⁺ bombardment. The sputter rate and ion‐induced damage accumulation rate of TFAA‐PHEMA were much higher than a poly(n‐alkyl methacrylate) of similar pendant group length, suggesting that derivatization of the terminal hydroxyl group can significantly reduce degradation of the polymer under SF₅⁺ bombardment. This result is in good agreement with the literature on the thermal and radiation‐induced degradation of fluorinated poly(alkyl methacrylates), which suggests that the electron‐withdrawing fluorinated pendant group increases the probability of depolymerization. Copyright © 2004 John Wiley & Sons, Ltd.     

Lipid imaging in the zebra finch brain with secondary ion mass spectrometry

Lipids have diverse functions in the nervous system, but the study of their anatomical distributions in the intact brain is rather difficult using conventional methodologies. Here we demonstrate the application of high resolution time-of-flight (ToF) secondary ion mass spectrometry (SIMS) to image various lipid components and cholesterol across an entire brain section prepared from an adult zebra finch (Taeniopygia guttata), with a spatial resolution of 2.3 μm, resulting in the formation of 11.5 megapixel chemical images. The zebra finch is a songbird in which specific neural and developmental functions have been ascribed to discrete “song control nuclei” of the forebrain. We have observed a relative increase of palmitic acid C16:0 and oleic acid C18:1 in song control nuclei versus the surrounding tissue, while phosphate (PO₃⁻), representative of phospholipids, was lower in these regions. Cholesterol was present at a high level only in the white matter of the optic tectum. More diffuse distributions were observed for stearic, arachidonic, linolenic, and palmitoleic acids. The presented results illustrate that SIMS imaging is a useful approach for assessing changes in lipid content during song circuit development and song learning.     

Detection of peptides in high concentration of salts by electrospray droplet impact/secondary ion mass spectrometry

Electrospray droplet impact (EDI)/SIMS is a new desorption/ionization technique for mass spectrometry. EDI/SIMS utilizes large multiply charged water clusters produced by atmospheric pressure electrospray as primary projectiles. It was found to afford extremely soft desorption/ionization compared with conventional SIMS, and has been used for detection of peptides and proteins. In this study, EDI/SIMS was applied to the detection of peptide in a highly concentrated NaCl solution. The persistent appearance of peptide ions for 1 ppm peptides in NaCl is probably because of the segregation of peptides on the crystallized salts. The samples dried under vacuum gave better EDI/SIMS mass spectra than those under ambient atmospheric pressure. Copyright © 2011 John Wiley & Sons, Ltd.     

Degradation of poly(acrylates) under SF5+ primary ion bombardment studied using time‐of‐flight secondary ion mass spectrometry. 2. Poly(n‐alkyl methacrylates)

Polyatomic primary ions offer low penetration depth and high damage removal rates in some polymers, facilitating their use in the molecular depth profiling of these polymers by secondary ion mass spectrometry (SIMS). This study is the second in a series of systematic characterizations of the effect of polymer chemistry on degradation under polyatomic primary ion bombardment. In this study, time‐of‐flight SIMS (ToF‐SIMS) was used to measure the damage of ～90 nm thick spin‐cast poly(methyl methacrylate), poly(n‐butyl methacrylate), poly(n‐octyl methacrylate) and poly(n‐dodecyl methacrylate) films under extended (～2 × 10¹⁴ ions cm^?2) 5 keV SF₅⁺ bombardment. The degradation of the poly(n‐alkyl methacrylates) were compared to determine the effect of the length of the alkyl pendant group on their degradation under SF₅⁺ bombardment. The sputter rate and stability of the characteristic secondary ion intensities of these polymers decreased linearly with alkyl pendant group length, suggesting that lengthening the n‐alkyl pendant group resulted in increased loss of the alkyl pendant groups and intra‐ or intermolecular cross‐linking under SF₅⁺ bombardment. These results are partially at variance with the literature on the thermal degradation of these polymers, which suggested that these polymers degrade primarily via depolymerization with minimal intra‐ or intermolecular cross‐linking. Copyright © 2004 John Wiley & Sons, Ltd.     

Degradation of poly(acrylates) under SF5+ primary ion bombardment studied using time‐of‐flight secondary ion mass spectrometry. 1. Effect of main chain and pendant methyl groups

Polyatomic primary ions have been applied recently to the depth profiling of organic materials by secondary ion mass spectrometry (SIMS). Polyatomic primary ions offer low penetration depth and high damage removal rates in some polymers, but the relationship between polymer chemistry and degradation under polyatomic primary ion bombardment has not been studied systematically. In this study, positive and negative ion time‐of‐flight SIMS (ToF‐SIMS) was used to measure the damage of ～100 nm thick spin‐cast poly(methyl methacrylate) (PMMA), poly(methyl acrylate) (PMA) and poly(methacrylic acid) (PMAA), films under extended (～2 × 10¹⁴ ions cm^?2) 5 keV SF₅⁺ bombardment. These polymers were compared to determine the effect of the main chain and pendant methyl groups on their degradation under SF₅⁺ bombardment. The sputter rate of PMMA was approximately twice that of PMA or PMAA and the rate of damage accumulation was higher for PMA and PMAA than PMMA, suggesting that the main chain and pendant methyl groups played an important role in the degradation of these polymers under SF₅⁺ bombardment. These results are consistent with the literature on the thermal and radiation‐induced degradation of these polymers, which show that removal of the main chain or pendant methyl groups reduces the rate of depolymerization and increases the rate of intra‐ or intermolecular cross‐linking. Copyright © 2004 John Wiley & Sons, Ltd.     

Electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS) using NaF and AgF as cationization matrices

In our previous paper, it was suggested that metal fluorides may be useful as cationization matrices in Electrospray droplet impact/SIMS. In this work, NaF and AgF were used as the cationization matrices for cyclodextrin (CD), polyethylene glycol (PEG), polystyrene (PS), garlic juice, and sliced raw rice. EDI mass spectra were measured without and with the use of matrices. Enhancement of ion abundances of [M + Na]⁺ for CD and PEG with NaF matrix and that of [M + Ag]⁺ for PS with AgF matrix were observed. However, the addition of matrices was not effective for the cationization of garlic juice and sliced raw rice samples. This may be due to the Coulombic repulsion of the reagent ions of Na⁺ or Ag⁺ with the preformed K⁺ adducts of oligosaccharides already present in the samples. Copyright © 2015 John Wiley & Sons, Ltd.     

Detection of nisin and fibrinogen adsorption on poly(ethylene oxide) coated polyurethane surfaces by time-of-flight secondary ion mass spectrometry (TOF-SIMS)

Stable, pendant polyethylene oxide (PEO) layers were formed on medical-grade Pellethane? and Tygon? polyurethane surfaces, by adsorption and gamma-irradiation of PEO-polybutadiene-PEO triblock surfactants. Coated and uncoated polyurethanes were challenged individually or sequentially with nisin (a small polypeptide with antimicrobial activity) and/or fibrinogen, and then analyzed with time-of-flight secondary ion mass spectrometry (TOF-SIMS). Data reduction by robust principal components analysis (PCA) allowed detection of outliers, and distinguished adsorbed nisin and fibrinogen. Fibrinogen-contacted surfaces, with or without nisin, were very similar on uncoated polymer surfaces, consistent with nearly complete displacement or coverage of previously-adsorbed nisin by fibrinogen. In contrast, nisin-loaded PEO layers remained essentially unchanged upon challenge with fibrinogen, suggesting that the adsorbed nisin is stabilized within the pendant PEO layer, while the peptide-loaded PEO layer retains its ability to repel large proteins. Coatings of PEO loaded with therapeutic polypeptides on medical polymers have the potential to be used to produce anti-fouling and biofunctional surfaces for implantable or blood-contacting devices.