Effects of stirring on the bulk etch rate of CR-39 detector

It is well established that the bulk etch rates for solid state nuclear track detectors are affected by the concentration and the temperature of the etchant. Recently, we found that the bulk etch rate for the LR 115 detector to be affected by stirring during etching. In the present work, the effects of stirring on the bulk etch rate of the CR-39 detector is investigated. One set of sample was etched under continuous stirring by a magnetic stirrer at 70°C in a 6.25 N NaOH solution, while the other set of samples was etched without the magnetic stirrer. After etching, the bulk etch thickness was measured using Form Talysurf PGI (Taylor Hobson, Leicester, England). It was found that magnetic stirring did not affect the bulk etch of the CR-39 detector, which was in contrast to the results for the LR 115 detector.     

Measurement of bulk etch rate of LR115 detector with atomic force microscopy

Equations for calculating track parameters have been proposed, which invariably involve the track etch rate V_t and the bulk etch rate V_b. The present study measured V_b for the LR115 solid-state nuclear track detector using atomic force microscopy (AFM). The detectors were partially masked using rubber cement and then etched in 2.5 N NaOH solution at 60°C for time periods ranging from 5 to 40 min. The rubber cement was then peeled off and cross-sectional images of the LR115 detectors were obtained by AFM. V_b has been found to have different values below and beyond the etching time of about 13.5 min, with the values of 0.0555 and 0.0875 μm min⁻¹, respectively. The increase in V_b with the etching time can be explained by a diffusion-etch model, in which the additional damage of the detector material is due to those etchant ions diffused into the detector over time. Now that V_b has been determined, this can be combined with the track etch rate V_t to calculate track parameters.     

Micro-track structure analysis for 100 MeV Si ions in CR-39 by using atomic force microscopy

To analyze the micro-track structure of heavy ions in a polymer material,parameters including bulk etch rate,track etch rate,etch rate ratio,and track core size were measured.The pieces of CR-39 were exposed to 100 MeV Si ions with normal incidence and were etched in 6.25N NaOH solution at 70 C.Bulk etch rate was read out by a profilemeter after several hours of etching.The other parameters were obtained by using an atomic force microscope(AFM)after a short time of etching.We have measured the second etch pits and minute etch pits to obtain the track growth curve and three dimension track structures to track the core size and etch rate measurements.The local dose of the track core was calculated by theδ-ray theory.In our study,we figure out that the bulk etch rate Vb=(1.58±0.022)μm/h,the track etch rate Vt=(2.90±0.529)μm/h,the etch rate ratio V=1.84±0.031,and the track core radii r≈4.65 nm.In the meantime,we find that the micro-track development violates the traditional track-growth model.For this reason,a scenario is carried out to provide an explanation.     

A fast method to measure the thickness of removed layer from etching of SSNTD based on EDXRF

Solid state nuclear track detectors are commonly used for measurements of concentrations of radon gas and/or radon progeny. All these measurements depend critically on the thickness of the removed layer during etching. However, the thickness of removed layer calculated using the etching period does not necessarily provide a sufficiently accurate measure of the thickness. For example, the bulk etch rate depends on the strength of stirring during etching for the LR 115 detector. We propose here to measure the thickness of the removed layer by using energy-dispersive X-ray fluorescence spectrometry. In the present work, a reference silver nitrate pellet is placed beneath the LR 115 detector, and the fluorescence X-ray intensity for silver is then measured. We have found a linear relationship between the X-ray intensity and the thickness of the removed layer for LR 115 detector. This provides a fast method to measure the thickness of removed layer from etching of LR 115 detector. However, this method was found to be inapplicable for the CR-39 detector. Therefore, alternative methods have yet to be explored for the CR-39 detector.     

A comparative study of track registration response of makrofol-(KG, KL & N) polycarbonate to Ar ions

In the present work a comparative study of track registration response of ⁴⁰Ar ions in different types of Makrofol polycarbonates viz. Makrofol-KG, KL & N have been done. The etched track parameters viz. bulk etch rate, track etch rate, etch rate ratio, cone angle and etching efficiency were calculated. The variation of etching rates with temperature were found to be exponential and follow the Arrhenius equation. The values of activation energy for bulk and track etching were also calculated. Maximum etchable track length/range were also obtained and compared with the theoretical values obtained from computer program RANGE. From the results it is found that the polycarbonates having same chemical composition manufactured by different chemical processes have slightly different behavior.     

Measurement of the track etch rates along proton and alpha particle trajectories in CR-39 and calculation of the detection efficiency

Computation of the neutron response of CR-39 detectors needs to simulate the track formation by neutron induced charged particles taking into account the bulk etch rate and the track etch rate varying along the particle trajectories. The latter one was determined experimentally by track length measurement. The results allowed to derive the relationship between the track etch rate and the restricted energy loss of the charged particles. On this basis, the geometrical track parameters and track etch rates as well as the critical angle of particle incidence could be determined for protons and alpha particles in the energy range from 0.2 to 8.8 MeV. The energy dependence of the critical angle enabled to determine the detection efficiency for a charged particle of given energy and direction.     

On the response of LR-115 plastic track detector to 10 20 Ne-ion

The track etch rates of ₁₀ ²⁰ Ne-ion in cellulose nitrate (LR-115) have been measured for different temperatures and the activation energy is determined. The experimental results show that both the track etch rate and the normalized track etch rate depend on the energy loss as well as on etching temperature. The maximum etched track length of ₁₀ ²⁰ Ne-ion agrees with the theoretically computed range. The experimental results show that there is no sharp threshold, at least in CN(LR-115).     

Alpha track profile study and range determination in PADC plastic detectors

An extensive study of alpha particle track profile has been carried out in PADC plastic detectors. Track profile geometry and its parameters have been studied. Various values of alpha energies were used, and the etch rate ratio (V) was measured as a function of the residual range (RR) along the alpha particle track. A mathematical formula between V and RR was established. Also in this work, alpha particle ranges in plastic foils have been measured at various energies using two methods; namely the track profile technique (TPT) and the over etched track diameter method. A comparison between the measured ranges and calculated ones is presented, and a good agreement has been found.     

Simulation of the track growth and determining the track parameters

We have found the equation of the etch pit wall in solid state nuclear track detectors, as follows:

where: x is the distance along a track from the point where the particle entered the detector; V(x) is the ratio of the track etch rate to the bulk etch rate; C is the integration constant that can be determined from particle penetration depth, and y is the normal distance from the particle trajectory to the etch pit wall. The equation is derived assuming the increasing track etch rate V_t along the particle trajectory.

The above equation can be used for the simulation of the track growth and calculating the major and the minor axis of the etch pit opening. The corresponding computer program was set up. The input parameters of this program are: alpha particle energy, incidence angle and removed layer: the output are track parameters. The results obtained by this method are compared with another approach given by Somogyi and Szalay (1973) and reasonably good agreement is found.     

Track etch rates along the trajectories of nitrogen and oxygen ions in CR-39

Experimental studies on track etch rates in CR-39 performed with protons, deuterons and alpha particles as well as ⁷Li, ¹¹B and ¹²C ions were extended to ¹⁴N and ¹⁶O ions. The results are compatible with the general systematics found for the dependence on the kind of ion and its initial energy. Analysing the etch rate ratios as function of the restricted energy loss (REL), the non-existence of a unique relationship has been confirmed. However, assuming a dependence of the etch rate ratio not only on REL, but also on the depth within the detector where a given REL value occurs, all experimental data could be adjusted. The experiments with ¹⁴N and ¹⁶O ions allow extension of the REL range studied up to about 14 000 MeV/cm. The whole area relevant to neutron-induced charged particles generated within the CR-39 detectors is covered thereby. Having added the data for ¹⁴N and ¹⁶O ions, the array of curves for the etch rate ratio could be expanded up to 14 000 MeV/cm without inconsistencies, demonstrating the compatibility of the new data set also quantitatively.     

Calibration of different plastic track detectors using accelerated heavy ions

Measurements of the dependence of track etch rate on the energy-loss of different ions have been presented. In this method, ₁₈ ⁴⁰ Ar, ₁₀ ²² Ne, ₈ ¹⁶ O and ₆ ¹² C-ions of different energies are used as energetic heavy ions for track formation in the detectors. The bulk etch rate and track etch rate are measured for different temperatures and hence the activation energies are determined. The variation ofV =V _t /V _b along the trajectory of the track has been shown for different temperatures. The maximum etched track length is compared with the theoretical range as well as with the range reported earlier. The experimental results indicate the absence of a well-defined threshold in the plastics studied.     

Effects of low-LET radiations on CR-39 track detector

The effects of Co-60 gamma-rays and about 25-MeV pulsed electrons have been investigated on CR-39 plastic nuclear track detector. The bulk etch rate was measured as a function of the absorbed dose under three different irradiation conditions; gamma-ray exposure in air at the dose rate of 6 kGy/h, that in vacuum and electron shower in air at 126 kGy/h on average. It was found that the bulk etch rate (V) increased nearly exponentially with the dose (D); V=V₀exp(kD), and the characteristic parameter (k) was 35, 9 and 12 MGy⁻¹, respectively. It is considered that a lack of oxygen in damage formation processes could occur momentarily during a short electron pulse, just similarly to the vacuum effect of reduction in track etch rates in outgassed CR-39 plastic.     

Calibration of PM-355 nuclear track detectors; comparison of track diameter diagrams with track depth characteristics

The calibration diagrams, i.e. track diameters and track depths versus ion energy and etching time, as obtained for PM-355 track detector irradiated with He-ions are presented. The both detector characteristics are compared. The track etch rate is determined by two methods, as a function of the etch pit depth and the ion energy loss.     

The influence of initial polymer and composition parameters on the process of manufacture of nitrate cellulose track detectors

Investigation of dependence of registration characteristics of a nitrocellulose (NC) detector on parameters of polymers and manufacturing factors is one of the topical problems of physics and chemistry of track registration detectors. In the work we studied the influence of molecular-weight distribution MWD, composition of polymer, polydispersity coefficients on the most important in use registration characteristics of detectors: background, registration efficiency, shape of tracks, etch rate.     

Intercomparative study of the detection characteristics of the CR-39 SSNTD for light ions: Present status of the besancon-dresden approaches

For the last few years, the Besançon and Dresden teams have been working in a parallel way on light ion (protons and alphas) registration characteristics for the CR-39 SSNTD. Even if the two groups use different approaches, the main part of both investigations concerns the study of the track etch rate (V_T) and the consequences of the obtained results, which have provided us with greater understanding of detection limits.

After recalling the methods used to determine the V_T from both teams, will show how fundamental datal related to the registration properties of the CR-39 detector can be extracted. Indeed, the knowledge of an analytical relation for the V_T enables the relationship between this velocity and the primary deposited energy to the examined with respect to the same spatial variable (the instantaneous depth of penetration (x) of the incoming particle). According to experimental uncertainties, the Bragg peak of the primary ionization coincides within a very close range with the maximum of the V_T. Moreover, if increasing the etching parameters (C, T) increases the maximum V_T value, these changes do not affect its position with respect to the instantaneous depth of penetration.

Taking into account the reduced etch rate, the Dresden team found that both protons and alphas exhibit the same behavior when this rate is plotted versus the primary energy deposition rate. As a consequence, the corresponding reduced etch rate is always identical no matter what type of particle deposits a given amount of energy (e.g. proton or alpha). The Besançon team has corroborated the results obtained by the Dresden group for alphas and have extended the study to various etching conditions. From these results, the sensitivity of the CR-39 SSNTD is obtained in terms of critical LET and leads to a very low energy threshold for alpha particles. We will see throughout this paper that the lower threshold does not seem to depend on the etching parameters.     

Annealing of 54 132 Xe-ion tracks in Lexan and Makrofol plastic track detectors

Samples of Lexan and Makrofol-E polycarbonate plastic track detectors were exposed to 1·1 MeV/N ₅₄ ¹³² Xe-ions to investigate the thermal track fading properties of these plastics. The experimental results show that there is no effect of annealing on the bulk etch rate while the track etch rate decreases with annealing. The track diameter decreases with increase in annealing time and temperature. It is also observed that the track density is reduced as a result of annealing. The experiments reveal that the track lengths are, in general, decreased by the application of heat and that the oblique tracks are less stable than the vertical tracks. The decrease in diameter of ₅₄ ¹³² Xe-ion tracks in Makrofol-E due to heat treatment is faster than that of ₅₄ ¹³² Xe-ion tracks in Lexan.     

A comparative study of gamma radiation effects on track properties of different PADC detectors

Track properties of gamma-irradiated polyallyldiglycol carbonate (PADC) detectors (Homalite, Pershore and Trastrack) are studied in the dose range of 10¹–10⁶ Gy. Results show that the bulk and track etch rates of all three types of PADC detector increase at doses higher than 10⁴ Gy. This increase is more pronounced in post-gamma exposed detectors. The change in etch rate ratio (S) for post-gamma exposed PADC–Homalite detectors is more significant when compared with the other detectors. The critical angle for etching shows that etching at a low temperature of 60 °C is more effective, and the critical angle value is decreased to a significant extent for all three types of PADC detectors. Etching efficiency of post-gamma exposed samples is found to be much higher than the pre-gamma exposed sample at the highest dose of 10⁶ Gy. When compared, it was found that of the three PADC detectors, PADC–Homalite detectors seem to be more sensitive to gamma irradiation.     

Effect of high gamma dose on the PADC properties

The effect of the properties of PADC nuclear track detectors after exposure to high doses of gamma absorbed doses up to 5×10⁵ Gray (50 Mrad) were studied. The gamma source was a 9.03 PBq (244 KCi), Co-60 source. Results indicate that each of the bulk etch rate (V_b), the tracks etch rate (V_t) and the sensitivity (V) of the detectors increases with the high gamma absorbed dose, but there is a drop in these parameters at the low gamma absorbed dose. Signs of surface roughness were observed by increasing the gamma absorbed doses and changes in color observed for doses larger than 2×10⁵ Gray. The temperature of detectors during irradiation time reached 41°C. The fission fragment tracks (from Cf-252 source) disappeared quickly within the etching time (minutes) for total absorbed doses greater than 3×10⁵ Gray due to their high bulk etch rate.     

Dose-rate effects on the bulk etch-rate of CR-39 track detector exposed to low-let radiations

The effect of gamma-rays and pulsed electrons has been investigated on the bulk etch rate of CR-39 detector at doses up to 100 kGy under various dose-rate between 0.0044 and 35.0 Gy/s. The bulk etch rate increased exponentially with the dose at every examined dose-rates. It was reveled to be strongly depend on the dose-rate: the bulk etch rate was decreased with increasing dose-rate at the same total dose. A primitive model was proposed to explain the dose-rate effect in which oxygen dissolved was assumed to dominate the damage formation process.