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1.
Co掺杂对ZnO薄膜结构和性能的影响   总被引:9,自引:0,他引:9       下载免费PDF全文
采用PVA溶胶-凝胶方法,在玻璃衬底上制备了Zn1-xCoxO薄膜,利用X射线衍射仪(XRD)研究了不同Co含量对其微结构的影响.采用振动样品磁强计(VSM)测量了Zn0.88Co0.12O样品室温下的磁性.采用荧光光谱仪研究了Zn1-xCoxO样品室温下的发光特性,分析掺杂含量对其发光性能的影响,发现随着掺杂含量的增加,蓝光发光峰有一定的红移现象. 关键词: PVA方法 ZnO 掺杂  相似文献   

2.
In this paper, we report on the pulsed laser deposition of epitaxial (0002) oriented Zn1−x Mg x O thin films onto (0001) sapphire substrate in O2 ambient at different deposition temperatures. Pulsed laser deposited Zn1−x Mg x O films showed (0002) oriented hexagonal wurtzite structure up to 34% of Mg concentration. The bandgap of Zn1−x Mg x O thin films is successfully tuned from 3.3 to 4.2 eV by adjusting the Mg concentration x=0.0 to x=0.34. Pulsed laser deposited Zn1−x Mg x O thin films were characterized by XRD, AFM, SEM, PL and UV–VIS spectrometer. We have also studied the effect of deposition temperature on to the structure, surface morphology and optical properties of Zn1−x Mg x O thin films.  相似文献   

3.
Zn1−xCoxO films were grown on glass by sol–gel spin coating process. The Zn1−xCoxO thin films with 10 at.% Co were highly c-axis oriented. The electrical resistivity of the films at 10 at.% Co had the lowest value due to the highest c-axis orientation. XPS and AGM analyses indicated that Co metal clusters weren’t formed, and the ferromagnetism was appeared at room temperature. The characteristics of the electrical resistivity and room temperature ferromagnetism of sol–gel derived Zn1−xCoxO films suggest a potential application to dilute magnetic semiconductor devices.  相似文献   

4.
Transparent p-type thin films, containing zinc oxide phases, have been fabricated from the oxidation of n-type zinc nitride films. The zinc nitride thin films were deposited by rf-magnetron sputtering from a zinc nitride target in pure N2 and pure Ar plasma. Films deposited in Ar plasma were conductive (resistivity 4.7×10−2 Ω cm and carrier concentrations around 1020 cm−3) Zn-rich ZnxNy films of low transmittance, whereas ZnxNy films deposited in N2 plasma showed high transmittance (>80%), but five orders of magnitude lower conductivity. Thermal oxidation up to 550 C converted all films into p-type materials, exhibiting high resistivity, 102–103 Ω cm, and carrier concentration around 1013 cm−3. However, upon oxidation, the ZnxNy films did not show the zinc oxide phase, whereas Zn-rich ZnxNy films were converted into films containing ZnO and ZnO2 phases. All films exhibited transmittance >85% with a characteristic excitonic dip in the transmittance curve at 365 nm. Low temperature photoluminescence revealed the existence of exciton emissions at 3.36 and 3.305 eV for the p-type zinc oxide film.  相似文献   

5.
《X射线光谱测定》2006,35(3):165-168
Cd1?xZnxO thin films were prepared by spray pyrolysis in air atmosphere on a glass substrate at 250 °C. The Zn content in Cd1?xZnxO films was varied from x = 0 to 0.60. Structural, electrical and optical properties of Cd1?xZnxO films were investigated by x‐ray diffraction, electrical resistivity and optical transmittance spectra, respectively. As the Zn content in Cd1?xZnxO thin films increased, the preferred orientation of the films did not change, only the peak intensity of the planes decreased. In addition to the peaks of CdO, peaks of ZnO were observed in the film with x = 0.6. The resistivity of Cd1?xZnxO thin films increased with increasing Zn content. Transmittance spectra studies of films were carried out in the 190‐1100 nm wavelength range and the results showed that the bandgap energy range varied from 2.42 to 3.25 eV. In addition, alloying effect on the Kβ/Kα intensity ratio in Cd1?xZnxO semiconductor thin films was studied. It was found that the Kβ/Kα intensity ratio is changed by alloying effects in Cd1?xZnxO semiconductor thin films for different composition of x. The results were compared with the theoretical values. Copyright © 2006 John Wiley & Sons, Ltd.  相似文献   

6.
Thin films of Zn1−x Cd x S (0.1 ≤ x ≤ 0.5) were prepared by using pulsed laser ablation technique on corning glass substrates. Phase transition from cubic to hexagonal in Zn1−x Cd x S films is determined by X-ray diffraction analysis. We observed a lowering in the phase transition temperature with increase in the cadmium concentration. Transmission electron microscopy suggests the crystalline nature of thin films with average particle size of 15 nm. The grown Zn1−x Cd x S samples show the high peak intensity ratio of the near band edge emission to the defect center luminescence even at room temperature, which indicates the small concentration of complex defects in the samples. Photoluminescence measurement show stoichiometric dependence of the energy band gap and is found to have quadratic dependence on x.  相似文献   

7.
利用X射线吸收精细结构、X射线衍射和磁性测量等技术研究脉冲激光气相沉积法制备的Zn1-xCoxO (x=0.01,0.02)稀磁半导体薄膜的结构和磁性.磁性测量结果表明Zn1-xCoxO样品都具有室温铁磁性.X射线衍射结果显示其薄膜样品具有结晶良好的纤锌矿结构.荧光X射线吸收精细结构测试结果表明,脉冲激光气相沉积法制备的样品中的Co离子全部进入ZnO晶格中替代了部分Zn的格点位置,生成单一相的Zn1-xCoxO 稀磁半导体.通过对X射线吸收近边结构谱的分析,确定Zn1-xCoxO薄膜中存在O空位,表明Co离子与O空位的相互作用是诱导Zn1-xCoxO产生室温铁磁性的主要原因. 关键词: 1-xCoxO稀磁半导体')" href="#">Zn1-xCoxO稀磁半导体 X射线吸收精细结构谱 脉冲激光气相沉积法  相似文献   

8.
Phase pure Zn1?x Co x O thin films grown by pulsed laser deposition have transmittance greater than 75 % in the visible region. Raman studies confirm the crystalline nature of Zn1?x Co x O thin films. Zn0.95Co0.05O thin films show room temperature ferromagnetism with saturation magnetization of 0.4μ B /Co atom. The possible origin of paramagnetism at higher Co doping concentrations can be attributed to the increased nearest-neighbor antiferromagnetic interactions between Co2+ ions in ZnO matrix. XPS confirms the substitution of Co2+ ions into the ZnO host lattice.  相似文献   

9.
A novel high-performance thermistor material based on Co-doped ZnO thin films is presented. The films were deposited by the pulsed laser deposition technique on Si (111) single-crystal substrates. The structural and electronic transport properties were correlated as a function of parameters such as substrate temperature and Co-doped content for Zn1?x Co x O (x=0.005,0.05,0.10 and 0.15) to prepare these films. The Zn1?x Co x O films were deposited at various substrate temperatures between 20 and 280 °C. A value of 20 %/K for the negative temperature coefficient of resistance (TCR) with a wide range near room temperature was obtained. It was found that both TCR vs. temperature behavior and TCR value were strongly affected by cobalt doping level and substrate temperature. In addition, a maximal TCR value of over 20 %?K?1 having a resistivity value of 3.6 Ω?cm was observed in a Zn0.9Co0.1O film near 260 °C, which was deposited at 120 °C and shown to be amorphous by X-ray diffraction. The result proved that the optimal Co concentration could help us to achieve giant TCR in Co-doped ZnO films. Meanwhile, the resistivities of the films ranged from 0.4 to 270 Ω?cm. A Co-doped ZnO/Si film is a strong candidate of thermometric materials for non-cooling and high-performance bolometric applications.  相似文献   

10.
采用脉冲激光沉积(PLD)方法在单晶Si(100)衬底上沿c轴方向生长单晶Zn1-xMgxO薄膜,通过X射线衍射(XRD)、原子力显微镜(AFM)、扫描电镜(SEM)和荧光光谱(PL)研究了膜厚、Mg含量、退火温度及氧气氛等制备工艺对Zn1-xMgxO薄膜的结构、形貌和光学性质的影响.实验结果表明,Mg含量x≤0.15时, Zn关键词: 1-xMgxO薄膜')" href="#">Zn1-xMgxO薄膜 制备工艺 结构 光学性质  相似文献   

11.
In the present paper, the preliminary investigations of a series of ZnO thin films co-doped with indium and cobalt with an objective to elucidate the correlation, if any, between the carrier concentration and the induced room temperature ferromagnetism (RTFM), are presented. The single-phasic (Zn99.5In0.5)1−xCoxO thin films are deposited by spray pyrolysis. The substitution of Zn2+ by Co2+ has been established by optical transmission analysis of these films. The films are ferromagnetic at room temperature; and the magnetization has higher value for indium and cobalt co-doped thin film as compared with Zn090Co0.1O thin film (having no indium).  相似文献   

12.
Cu对Zn1-xFexO稀磁半导体磁性的影响   总被引:3,自引:0,他引:3       下载免费PDF全文
采用水热法,在温度430 ℃,填充度35%,矿化剂为3 mol·L-1KOH,前驱物为添加适量的FeCl2·6H2O的Zn(OH)2,反应时间24h,合成了Zn1-xFexO和Zn1-xFexO:Cu稀磁半导体晶体.当在Zn(OH)2中添加一定量的FeCl2·6H2O为前驱物,水热反应产物为掺杂Fe的Zn1-xFexO多种形态晶体混合物,其个体较大的晶体中的Fe原子百分比含量为0.49%—0.52%.采用超导量子干涉磁强计测量了材料的磁性,晶体的磁化强度随温度下降而减小.在前驱物中同时加入适量比例的Cu化合物,合成了共掺杂Cu的Zn1-xFexO:Cu,和Zn1-xFexO相比,其室温下的磁化强度有明显的提高,且在室温下具有铁磁性. 关键词: 氧化锌 水热 稀磁半导体 晶体  相似文献   

13.
Thin films of Mg x Zn1−x O and Mg x Zn1−x O doped with nitrogen were deposited by Radio Frequency plasma beam assisted Pulsed Laser Deposition (RF-PLD) in oxygen or oxygen-nitrogen discharge with different nitrogen/oxygen ratios. A Nd:YAG laser working at a wavelength of 266 nm, having a 10 Hz repetition rate was used for the depositions. The energy density of the incident beam was 3 J/cm2 and the RF power was set to 100 W for all the samples. X-ray Diffraction (XRD) and Spectroscopic Ellipsometry (SE) were employed to investigate the samples. The degree of crystallinity is fount to decrease with increasing the Mg concentration, while the solubility of Mg in ZnO increases by 30% in the N-doped Mg x Zn1−x O thin films grown by RF-PLD. Segregation of MgO phase at a Mg concentration of 30% for Mg x Zn1−x O thin film is detected both by XRD and SE. The band gap of the samples increases from 3.37 up to 3.57 eV with increasing the Mg concentration and the nitrogen/oxygen ratio for each Mg concentration. A dependence of the dielectric function (refractive index) on both stoichiometry and degree of crystalinity is also found, the refractive index having values between 1.7 and 2 in visible spectral range.  相似文献   

14.
Zn1−x B x O (0≤x≤0.04) thin films were deposited by the liquid source misted chemical vapor deposition (LSMCD) method. The thin films were polycrystalline with grain sizes of 16 nm to 22 nm. The structural, optical, and electrical properties were investigated by X-ray diffraction, UV-visible spectrophotometry, Raman spectroscopy, and Hall effect measurement. Also scanning electron (SEM) and atomic force microscopy (AFM) techniques were used in order to determine the morphological and topological characteristics of the films. The optimal result of Zn1−x B x O films was obtained at x=0.02, with a low resistivity of ≈10−2 Ω cm, and a high transmittancy of 85% in the visible light spectrum (300 nm ∼ 800 nm).  相似文献   

15.
Thin films of Zn1−xMnxO (x=0.01) diluted magnetic semiconductor were prepared on Si (1 0 0) substrates by the sol-gel method. The influence of annealing temperature on the structural, optical and magnetic properties was studied by X-ray diffraction (XRD), atom force microscopy (AFM), photoluminescence (PL) and SQUID magnetometer (MPMS, Quantum Design). The XRD spectrum shows that all the films are single crystalline with (0 0 2) preferential orientation along c-axis, indicating there are not any secondary phases. The atomic force microscopy images show the surfaces morphologies change greatly with an increase in annealing temperature. PL spectra reveal that the films marginally shift the near band-edge (NBE) position due to stress. The magnetic measurements of the films using SQUID clearly indicate the room temperature ferromagnetic behavior, and the Curie temperature of the samples is above room temperature. X-ray photoelectron spectroscopy (XPS) patterns suggest that Mn2+ ions were successfully incorporated into the lattice position of Zn2+ ions in ZnO host. It is also found that the post-annealing treatment can affect the ferromagnetic behavior of the films effectively.  相似文献   

16.
采用溶胶-凝胶工艺在玻璃衬底上制备了Zn1-xMgxO(x=0.1,0.2,0.3, 0.4,0.5,0.6,0.7)薄膜.X射线衍射谱(XRD)测试结果发现,在 0.1<x<0.3 范围内,薄膜仍然保持氧化锌六角纤锌矿结构,(002)面衍射峰位向大角度方向移动,超过0.3时出现氧化镁立方相.对镁含量为0.1,0.2,0.3薄膜的光致发光谱研究表明:紫外发光峰随镁含量的增加向短波方向移动.对于Zn0.9Mg0.1O薄膜,在5,5.5和6℃/min的升温速率下,升温速率越快结晶程度越好.在相同升温速率下,随着退火温度从500 ℃升高到560 ℃,样品的结晶程度变好,当退火温度达到590 ℃时,结晶质量下降. 关键词: 氧化锌 结构 禁带宽度 光致发光谱  相似文献   

17.
Zn1−xNixO (x = 0.02, 0.03, 0.04, 0.05, 0.07) films were prepared using magnetron sputtering. X-ray diffraction indicates that all samples have a wurtzite structure with c-axis orientation. X-ray photoelectron spectroscopy results reveal that the Ni ion is in a +2 charge state in these films. Magnetization measurements indicate that all samples have room temperature ferromagnetism. In order to elucidate the origin of the ferromagnetism, Zn0.97Ni0.03O films were grown under different atmospheric ratios of argon to oxygen. The results show that as the fraction of oxygen in the atmosphere decreases, both the saturation magnetization and the number of oxygen vacancies increase, confirming that the ferromagnetism is correlated with the oxygen vacancy level.  相似文献   

18.
Nanocrystalline Mn‐doped zinc oxides Zn1−xMnxO (x = 0–0.10) were synthesized by the sol–gel technique at low temperature. The calcination temperature of the as‐prepared powder was found at 350 °C using differential thermal analysis. A thermogravimetric analysis showed that there is a mass loss in the as‐prepared powder till 350 °C and an almost constant mass till 800 °C. The X‐ray diffraction patterns of investigated nanopowders calcined at 350 °C correspond to the hexagonal ZnO structure without any foreign impurities. The average grain size of the nanocrystal that was observed around ∼25–40 nm from transmission electron microscopy matched well with the crystallite size calculated from the line shape of X‐ray diffraction. The chemical bonding structure in Zn1−xMnxO nanopowders was examined using X‐ray photoelectron spectroscopy techniques, which indicate substitution of Mn2+ ions into Zn2+ sites in ZnO lattice. Micro Raman spectroscopy confirmed the insertion of Mn ions in the ZnO host matrix, and similar wurtzite structure of Zn1−xMnxO (x < 10%) nanocrystals. Temperature‐dependent Raman spectra of the nanocrystals displayed suppression of luminescence and enhancement in full width at half maximum in pure ZnO nanocrystals with increase in temperature, which suggests an enhancement in particle size at elevated temperature. Copyright © 2009 John Wiley & Sons, Ltd.  相似文献   

19.
We report on the analysis of optical transmittance spectra and the resulting ferromagnetic characteristics of sputtered Zn1−xCoxO films. Zn1−xCoxO films were prepared on (0001)-oriented Al2O3 substrates by the radio-frequency (rf) magnetron co-sputtering method. The XRD results showed that the crystallinity of films was properly maintained up to x=0.30 and no second phase peaks were detected up to x=0.40. The transmittance spectra showed both the increase of the absorption band intensity and the red shift of the absorption peak as well as the band edge with increasing x. We have proved experimentally that these changes depend on Co concentration. These optical properties suggest that sp-d exchange interactions and typical d-d transitions become activated with increasing x, which leads to the enhancement of ferromagnetic properties in Zn1−xCoxO films as shown in the AGM results. Therefore, it is concluded that the ferromagnetism derives from the substitution of Co2+ for Zn2+ without changing the wurtzite structure.  相似文献   

20.
鲍善永  董武军  徐兴  栾田宝  李杰  张庆瑜 《物理学报》2011,60(3):36804-036804
利用脉冲激光沉积技术,通过改变沉积过程中的氧气压力,在蓝宝石(0001)基片上制备了一系列ZnMgO合金.通过X射线衍射、反射和透射光谱以及室温和变温荧光光谱,对薄膜的结构和光学性能进行了系统地表征,分析了工作气压对ZnMgO合金薄膜的结晶质量及光学特性的影响.研究结果表明:随着沉积环境中氧气压力的增大,ZnMgO薄膜的结晶质量下降,富氧环境下,与蓝宝石晶格平行的ZnO晶粒的出现是导致薄膜结晶质量下降的主要原因;相对于本征ZnO,不同氧气环境下沉积的ZnMgO薄膜的紫外荧光峰均出现了不同程度的蓝移.随着工 关键词: ZnO Mg掺杂 脉冲激光沉积 薄膜生长 光学特性  相似文献   

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