在Si(111)-(7×7)表面自组织生长二维Ge团簇超晶格

利用超高真空扫描隧道显微镜研究了室温条件下亚单层Ge在Si(111)-(7×7)表面上的自组织生长.通过控制Ge的沉积量,在Si(111)-(7×7)表面上自组织生长成一种具有六重对称性的二维Ge团簇超晶格.构成超晶格的Ge团簇均位于(7×7)亚单胞的位置上,而且它们的形状和大小基本保持一致.文中对这种自组织结构的形成机理进行了讨论.     

在Si(111)-(7×7)表面自组织生长二维Ge团簇超晶格

利用超高真空扫描隧道显微镜研究了室温条件下亚单层Ge在Si(111)(7×7)表面上的自组织生长.通过控制Ge的沉积量,在Si(111)(7×7)表面上自组织生长成一种具有六重对称性的二维Ge团簇超晶格.构成超晶格的Ge团簇均位于(7×7)亚单胞的位置上,而且它们的形状和大小基本保持一致.文中对这种自组织结构的形成机理进行了讨论     

在Si（111）—（7×7）表面自组织生长二维Ge团簇超晶格

利用超高真空扫描隧道显微镜研究了室温条件下亚单层Ge在Si(111)-(7×7)表面上的自组织生长.通过控制Ge的沉积量,在Si(111)-(7×7)表面上自组织生长成一种具有六重对称性的二维Ge团簇超晶格.构成超晶格的Ge团簇均位于(7×7)亚单胞的位置上,而且它们的形状和大小基本保持一致.文中对这种自组织结构的形成机理进行了讨论.     

Si(111)-(7×7)表面上Ge量子点的自组织生长

用扫描隧道显微镜研究了Si(111)(7×7)表面上Ge量子点的自组织生长.室温下用固相外延法在硅基底上沉积亚单层的Ge,然后在适当的温度下退火可以聚集形成有序的Ge量子点.由于Ge在Si(111)(7×7)表面选择性的吸附而形成有序的Ge量子点. 关键词： 锗 硅 扫描隧道显微镜 自组织生长     

超高真空原子尺度Aux/Si(111)-(7×7)表面吸附的电荷分布测量

原子尺度表面吸附Au原子的物理化学性质对研究纳米器件的制备以及表面催化等起着非常重要的作用.利用调频开尔文探针力显微镜研究了室温下Au在Si(111)-(7×7)表面吸附的电荷分布的特性.首先,利用自制超高真空开尔文探针力显微镜成功得到了原子尺度Au在Si(111)-(7×7)不同吸附位的表面形貌与局域接触电势差(LCPD);其次,通过原子间力谱与电势差分析了Au/Si(111)-(7×7)特定原子位置的原子特性,实现了原子识别;并通过结合差分电荷密度计算解释了Au/Si(111)-(7×7)表面间电荷转移与Au的吸附特性.结果显示,Au原子吸附有单原子和团簇形式.其中,Au团簇以6个原子为一组呈六边形结构吸附于Si(111)-(7×7)的层错半单胞内的3个中心原子位;单个Au原子吸附于非层错半单胞的中心顶戴原子位;同时通过电势差测量得知单个Au原子和Au团簇失去电子呈正电特性.表面差分电荷密度结果显示金在吸附过程中发生电荷转移,失去部分电荷,使得吸附原子位置上的功函数局部减少.在短程力、局域接触势能差和差分电荷密度发生变化的距离范围内,获得了理论和实验之间的合理一致性.     

C60分子在Si（111）-7×7表面分子束外延生长的STM研究

在超高真空中采用分子束外延(molecular beam epitaxial)技术进行C₆₀分子在硅（111）-7×7表面的生长,并利用扫描隧道显微镜进行原位研究.室温下,相对于无层错半胞（unfaulted half unit cell）,C₆₀更易于吸附在有层错半胞（faulted half unit cell）.表面台阶处的电子悬挂键密度最高,通过控制温度和时间进行退火处理后,C₆₀分子会向着台阶的方向扩散并聚集.测量分子在不同吸附位 关键词： 60分子')" href="#">C₆₀分子 分子束外延 Si(111)-7×7 超高真空扫描隧道显微镜     

钴原子及其团簇在Rh(111)和Pd(111)表面的扫描隧道显微学研究

利用扫描隧道显微镜和扫描隧道谱(STM/STS)及单原子操纵,系统研究了单个钴原子(Co) 及其团簇在Rh (111)和Pd (111)两种表面的吸附和自旋电子输运性质. 发现单个Co原子在Rh (111)上有两种不同的稳定吸附位,分别对应于hcp和fcc空位, 他们的高度明显不同,在针尖的操纵下单个Co原子可以在两种吸附位之间相互转化. 在这两种吸附位的单个Co原子的STS谱的费米面附近都存在很显著的峰形结构, 经分析认为Rh (111)表面单个Co原子处于混价区,因此这一峰结构是d轨道共振 和近藤共振共同作用的结果.对于Rh (111)表面上的Co原子二聚体和三聚体, 其费米面附近没有观测到显著的峰,这可能是由于原子间磁交换相互作用 和原子间轨道杂化引起的体系态密度改变所共同导致.与Rh (111)表面不同, 在Pd (111)表面吸附的单个Co原子则表现出均一的高度.并且对于Pd (111)表面所有 单个Co原子及其二聚体和三聚体,在其STS谱的费米面附近均未探测到显著的电子结构, 表明Co原子吸附于Pd (111)表面具有与Rh (111)表面上不同的原子-衬底相互作用与自旋电子输运性质.     

Na原子在Si(111)-(7×7)表面的吸附:从二维原子气到纳米团簇阵列

作者利用扫描隧道显微镜 (STM)详细研究了室温下Na原子在Si(111) (7× 7)表面的吸附 .对STM图像及功函数变化的分析表明 ,当Na原子覆盖度小于临界覆盖度 (0 .0 8ML)时 ,Na原子具有类气态的性质并可以在一个吸附能阱中快速移动 .从STM图像可看出这种移动导致的对比度调制 .在临界覆盖度以上 ,Na原子自组装形成团簇阵列 .第一原理模拟计算的结果与作者的实验结论很好吻合 .     

扫描隧道显微镜分辨能力的研究:对Si(111)-(7×7)表面的观察

用超高真空扫描隧道显微镜首次同时清晰地分辨出Si(111) (7×7)表面每个元胞中的 12个顶戴原子和 6个静止原子,这 6个静止原子的亮度与无层错半元胞内中心顶戴原子的亮度基本相同. 第一性原理计算图像和STM实验结果完全符合,针尖的尺度小于 7 时,可以完全同时分辨出Si(111) (7×7)表面的静止原子.     

Si(111)-(7×7)衬底上合成有序的IV族金属铅团簇阵列

文章作者在Si(111)(7×7)衬底上合成出位于同一主族的Pb的全同纳米团簇有序阵列.有趣的是,当衬底温度相对于最佳的生长温度范围发生微小的偏离时,Pb纳米团簇很容易转变为其他结构的团簇.结合实验结果和第一性原理总能量计算,文章作者揭示了几种Pb团簇的原子结构.这些结构都是以表面Pb和Si原子互换导致的混合模型为中心的衍生结构.Pb/Si(111)体系的这种边缘性质为研究表面幻数团簇的合成、分解等动力学过程提供了重要信息.     

Destruction and appearance of surface metallization in the system K/Si(111) 7×37

Qualitative changes are observed in the character of the surface electronic structure accompanying the adsorption of potassium on a Si(111) 7×7 surface. The metallic conductivity of the Si(111)7×7 surface is destroyed at the very early stages of adsorption. A new band induced by the adsorption of potassium is observed below the Fermi level. It is found that the K/Si(111)7×7 interface is semiconducting right up to saturating coverage. A surface transition from an insulating into a metallic state, accompanied by pinning of the Fermi level, is observed in the region of saturating coverage. Metallic conductivity arises in the adsorbed potassium layer as a result of the development of an induced surface band at the Fermi level. Pis’ma Zh. éksp. Teor. Fiz. 66, No. 1, 27–30 (10 July 1997)     

Ge(111) 7 × 7 surface structure induced by Sn

When tin was deposited by 0.3–0.8 monolayer thick on Ge(111) clean surface at room temperature and annealed at 345°C, 7 × 7 superlattice structure appeared on the surface. Features of the diffraction pattern of the 7 × 7 structure are strikingly similar to those of the diffraction pattern of Si(111) 7 × 7 surface structure, which suggests that atomic arrangements in the two 7 × 7 structures resemble each other very well.     

Formation and local electronic structure of Ge clusters on Si（111）-7×7 surfaces

We report the formation and local electronic structure of Ge clusters on the Si(111)-7$\times $7 surface studied by using variable temperature scanning tunnelling microscopy (VT-STM) and low-temperature scanning tunnelling spectroscopy (STS). Atom-resolved STM images reveal that the Ge atoms are prone to forming clusters with 1.0~nm in diameter for coverage up to 0.12~ML. Such Ge clusters preferentially nucleate at the centre of the faulted-half unit cells, leading to the `dark sites' of Si centre adatoms from the surrounding three unfaulted-half unit cells in filled-state images. Bias-dependent STM images show the charge transfer from the neighbouring Si adatoms to Ge clusters. Low-temperature STS of the Ge clusters reveals that there is a band gap on the Ge cluster and the large voltage threshold is about 0.9~V.     

Stability and surface properties of GeSi alloy films on Si(111) substrate

Several GeSi alloy films with different surface properties were prepared from a 500 Å thick Ge film that had previously been grown on a Si(111)-7×7 substrate by molecular beam epitaxy. The films were prepared by combinations of sputtering, annealing and Ge deposition from an evaporator. The surface properties were studied by Auger electron spectroscopy (AES) and by low energy electron diffraction (LEED). A novel LEED system employing position-sensitive detection was used. The Ge film surface gave a superposition of 7×7 and c(2×8) LEED patterns. A 7×7 → 1×1 phase transition was observed at 425±10°C. An irreversible 7×7 → c(2×8) transition was observed when the sample was heated above 500°C. The Ge film melted at 750±30°C and formed a Ge_xSi_1−x (x = 0.85±0.05) alloy whose surface gave a 7×7 LEED pattern. A 7×7 → 1×1 phase transition was observed at 600±0.15°C. Prolonged sputtering and annealing resulted in a Ge_xSi_1−x (x = 0.53±0.05) alloy whose surface gave a 5×5 LEED pattern. An apparent 5×5 → 1×1 phase transition was observed at 870±10°C but at that temperature the film was converted irreversibly to one with a much lower Ge atom fraction (x = 0.025±0.005) whose surface gave a 7×7 LEED pattern. A surface with a 5×5 pattern identical to that for the x = 0.53 alloy was prepared by deposition or Ge on Si. A similar 5×5 surface was prepared by deposition of Ge on a facetted GeSi alloy surface originally showing a superposition of 5×5 and 7×7 patterns. The intensity distributions in all of the 7×7 LEED pattern were found to be similar to those for Si(111)-7×7 at nearly the same electron energies. The characteristics of the 7×7 → 1×1 phase transitions were discussed in direct comparison with those of the Si(111)7×7 → 1×1 and Ge(111)-c(2×8) → 1×1 transitions observed with the same LEED system.     

Direct evidence for Ge preferential growth at steps and out-of-phase boundaries of (7 × 7) domains on Si(111) in solid phase epitaxy

Ge solid phase epitaxy on a Si(111) surface has been directly observed by secondary electron surface microscopy which is based on scanning electron microscopy. Ge island formation initially occurs at steps and out-of-phase boundaries of (7 × 7) domains. These results confirm the origin of previously reported mesh patterns of Ge islands grown on Si(111).     

Structural analogy between GeSi(111)-5 × 5 and Si(111)-7 × 7 surfaces

Low energy electron diffraction (LEED) patterns for the GeSi(111)-5 × 5 surface are reported and compared to those for the Si(111)-7 × 7 surface. Parallels between the observed LEED patterns are explained by a structural analogy between GeSi(111)-5 × 5 and Si(111)-7 × 7 surfaces. Both the (5 × 5) and (7 × 7) patterns are shown to be consistent with structural models of the triangle-dimer type previously proposed for Si(111)-7 × 7 surface.     

Effect of surface reconstruction on the adsorption of Ge on clean Si(111)

The effect of ultrahigh vacuum deposition of Ge below and at monolayer (ML) coverage onto a 7 × 7 reconstructed clean Si(111) surface held at room temperature is studied by low energy electron diffraction (LEED), Auger electron spectroscopy (AES) and photoemission yield spectroscopy (PYS). The results are compared to those obtained on 2 × 1 reconstructed clean Si(111) : (i) the Si dangling bond states are replaced by Ge dangling bond states at submonolayer coverages in both cases; (ii) the 7 × 7 reconstruction persists below 1 ML, it is not replaced by a ? 3 × ? 3 R30° at 1/3ML as it was on the 2 × 1; and (iii) the coverage below 1 ML is not homogeneous on the 7 × 7 reconstruction. This behaviour can be explained by the influence of the inhomogeneties associated with the 7 × 7 reconstruction.     

Partially dissociative adsorption of water vapor on the Si(111) (7×7) surface

High-resolution vibrational electron energy-loss spectra have been measured of the Si(111) (7×7) surface exposed to water vapor at 300 K. Direct experimental evidence is given that water adsorption on the Si(111) (7×7) surface is partially dissociative.     

Structure of Si(111)−7 × 7

A model of the Si(111)?7 × 7 surface atomic arrangement is put forward on the basis of results already established for Si(111) and Si(100) surfaces. The unit mesh contains a triangular double-layer island with 21 first-layer atoms. The island is laterally expanded and is bounded by [1̄1̄2] steps with second-layer edge atoms forming asymmetric dimers. It is shown that salient features of low energy electron diffraction (LEED) patterns for Si(111)?7 × 7 can be explained by the model. The LEED patterns are interpreted qualitatively by a double-diffraction mechanism involving forward diffraction in the selvedge. It is shown that the patterns contain characteristic formations of fractional-order spots attributable to the dimers at the island boundaries. The best agreement with observed patterns is obtained with the following parameter values: dimer bond length 2.5 ± 0.2 Å, island lateral expansion 3 ± 2%. Some of the implications of the model for the chemical reactivity and electronic properties of the Si(111)?7 × 7 surface are discussed.     

Patterns in Ge cluster growth on clean and oxidized Si(111)-(7 × 7) surfaces

Ge atoms have been deposited on domain-patterned clean Si(111)-(7 × 7) and oxidized Si(111)-(7 × 7) surfaces. Clustering of Ge from the deposited Ge adatoms on these two kinds of surfaces shows contrasting patterns. On the clean Si surface, clustering predominantly occurs on domain boundaries, which include step edges on two sides. This leaves small domains denuded. Ge diffusion length has been estimated from the size of these denuded domains. For large domains, additional clustering is observed within the domains. For the oxidized Si surface, the pattern formation is in sharp contrast with that for the clean Si surface. In this case the domain boundaries remain relatively empty and there is strong clustering within the domains leading to the formation of dense Ge nanoislands within the domains. This contrasting pattern formation has been explained via a reaction diffusion model.