经验系数法X射线荧光光谱测定硅酸盐中微量元素

利用粉末样品直接压片,以峰背(包括X光管靶线的康普顿散射线)比法校正基体效应,X射线荧光光谱测定硅酸盐中微量元素,方法简便快速,检出限通常可达到数个ppm。然而,若单纯采用峰背比法校正基体效应,硅酸盐样品中主元素铁的含量在较大范围内变化时,会造成较大的测定误差。本文在峰背比法的基础上,同时采用经验系数法校正由铁含量变化造成的基体及背景的影响,提高了方法的准确度。     

X射线荧光光谱法分析矿石样品时工作曲线的精确调整

应用X射线荧光光谱法分析了矿石样品。将粉碎至粒径为0.088mm的矿样用模压法在32MPa压力条件下加压40s,压制成直径为40mm,厚度为3mm的片样。试验从生产线上选取15个各组分元素含量呈梯度分布的样品以抵消其基体效应,并选用一组已知样品制作工作曲线。以MXF-2400型X射线荧光光谱仪所附带的PC-MXF-E软件中的校正公式,通过化学计量学处理,包括拟合评估、遗传算法及收敛条件的满足等,达到了X射线荧光光谱法分析矿石样品时工作曲线的精确调整。应用此方法分析了3组地质样品,所测定的铜、铅、锌3种元素的含量与化学法所测得的结果完全一致,又用同一样片对其中的5项组分进行6次测定,所得测定值的相对标准偏差均小于1%。     

直接进样X射线荧光光谱法测定汽油中痕量锰和铁

将样品直接注入液体杯,用X射线荧光光谱法测定汽油中痕量锰和铁含量,锰、铁的检出限为0.2mg·L-1。采用康普顿散射线作内标,部分地校正了样品间的基体差异。     

粉末压片-X射线荧光光谱法测定高钛型高炉渣中化学成分

应用粉末压片制样-X射线荧光光谱法测定了高钛高炉渣中SiO2、CaO、TiO2等8项化学组成。取过0.125mm筛孔的网筛样品,在25MPa压力下保持30s的条件下制成样片,供X射线荧光光谱分析。分析中选择工作电压为50kV,工作电流为40mA,解决了高含量组分(Si、Ca、Ti)所造成的信号与噪声不易有效分离的问题。按所提出方法分析了高、中、低不同含量的炉渣样品,所测得结果表明方法具有较好的精密度和准确性。与熔融制样-X射线荧光光谱法所测得结果相比,相对误差均在允许范围内。     

用于X射线荧光光谱法测定聚丙烯材料中有害元素的标准样品的制备北大核心CSCD

制备了一套适用于X射线荧光光谱法测定聚丙烯(PP)材料中5种有害元素(铅、镉、铬、汞和溴)的标准样品。首先,制备聚丙烯材料目标元素高含量母粒,然后通过逐级稀释的方法制备目标元素含量梯度的样品原料,最后制得符合X射线荧光光谱分析使用要求的标准样品。采用电感耦合等离子体原子发射光谱法和离子色谱法测定所制得标准样品中各元素的含量。所制备的用于X射线荧光光谱分析的PP标准样品通过F检验和t检验,得到统计量F相似文献   

能量色散X射线荧光光谱法探针线扫描分析"长沙窑"彩绘工艺

应用能量色散X射线荧光光谱（EDXRF）探针及线扫描技术对我国唐代和宋代的5块“长沙窑”彩瓷样品的彩绘工艺进行了研究。根据所测得的从釉到胎中着色元素铜或铁的含量变化可以看出,此5块样品的彩绘工艺均不完全属于典型的釉下彩工艺,而是属于高温釉上彩工艺。     

X射线荧光光谱法测定耐指纹板有机涂层中二氧化硅

应用X射线荧光光谱法测定了耐指纹板有机涂层中二氧化硅的含量。在所用的校准样品和测试样品的基板成分相同和所用的有机涂层属同类的前提下,可采用经验系数法进行校正。应用此方法对已知二氧化硅含量的耐指纹板样品(二氧化硅量为76.65 mg.m-2)进行12次测定,测得二氧化硅含量的平均值为76.66 mg.m-2,其相对标准偏差为0.087%。     

粉末压片X射线荧光光谱法与红外吸收光谱法联合测定萤石中各组分

采用粉末直接压片法,用X-射线荧光光谱法[1]测得萤石中Ca总量,Fe2O3,P,SiO2,K2O的含量,再用红外吸收光谱法测得样品中碳含量,换算得到CaCO3中的钙含量,进一步求得萤石中CaF2含量。此方法简便、准确。用9个标准物质制定了工作曲线,并进行了自测,另用该系列中5号样品(GBW07254)进行准确度和精密度测试,结果令人满意。     

铑靶康普顿散射校正XRF测定铝用碳素材料中的微量元素

通过对常用粘结剂中杂质元素含量的测定,选择硬脂酸做粘结剂,研磨压片制备样品,用X射线荧光光谱仪(XRF)测定铝用炭素阳极材料中硫、钒、钠、钙、硅、铁、镍、钛、铝、镁、磷、铅、锌、铬、锰含量的元素含量。通过实验确定了最佳的样品和粘结剂比例为12 g炭素试样加入2 g硬脂酸,研磨时间为20 s。测定铅元素时,选择一点法扣除背景,通过谱线强度数据确定使用PbLβ1做分析线。用铝用炭素阳极材料系列标准样品制作校准曲线,用铑靶康普顿散射内标校正铁、镍、铅、锌、铬、锰等元素,其余元素用经验系数法校正。样品精密度试验表明,样品中各元素测定结果的相对标准偏差(RSD,n=11)一般在8%以下,最高的钠元素和钛元素也在10%左右,未知样品的检测结果与标准结果没有显著性差异。     

X射线吸收分析法简介

近十余年来,X射线化学分析法已被广泛采用。利用X射线进行化学分析,有三类不同方法:衍射分析法,发射光谱分析法和吸收分析法。衍射分析法常称物相分析,它是根据晶态物质的X射线衍射花样的特征和衍射线的强度来进行定性与定量分析的。分析结果直接给出样品中所含晶体的种类、数目及其相对含量。非晶态物质沒有一定的衍射花样,故不能用此法分析。发射光谱分析法(包括初级发射光谱法及熒光X光谱分析法)的原理与通常的光学光谱分析法相同,是根据各种元素所固有的特征X射线的波长及强度来进行定性定量分析的,分析结果给出样品中所含元素的种类及含量。上述二法本刊已先后作过介绍,本文之目的是要对吸收分析法的原理、设备及应用作一简要介绍。     

Small-angle x-ray scattering by crystalline polymer fibers 2. Investigation of the linear paracrystalline model using various materials

The linear position-sensitive detector is well-suited to measure quantitatively the distribution parallel to the fibre axis of the intensity of small-angle x-ray scattering (SAXS) by polymer fibres, except that in the case of four-point patterns their width is greater than that of the detector window. A method is described which overcomes this problem, and which has high angular resolution. Using this method, the variation of scattered intensity with angles from 0.3° to 2.5° has been measured for fibres of poly(ethylene terephthalate), nylon, and low density poly(ethylene) (LDPE), and compared with that predicted by the linear paracrystalline model. In all cases except LDPE, when the distribution of phase lengths was given by the Reinhold function, there was no significant disagreement between the measured and predicted scattering except for a very small range of angles on the low angle side of the peak intensity. With LDPE small but significant discrepancies were found at other angles as well, and these were worse if the symmetrical Gaussian distribution function was used. The method enabled quantitative parameters describing the morphology to be obtained. It is concluded that the morphology of the linear paracrystalline stack is consistent with the SAXS intensity distribution, and that the Reinhold function is a reasonable approximation to the distribution of phase lengths. A small modification so that this decays more rapidly at long lengths might be necessary to explain the scattering for all materials over the entire angular range and other small changes might be needed with LDPE, although the asymmetrical nature of the distribution must be retained.On leave from Department of Physics, University of Technology Malaysia, 81300 Sekudai, Malaysia.     

同多钨酸-阿米卡星相互作用的共振瑞利散射光谱及其分析应用

在pH 0.65~1.10的HCl-NaAc缓冲溶液中,当同多钨酸(IPT)与阿米卡星(AMK)形成离子缔合物,能引起共振瑞利散射 (RRS)显著增强,并产生新的RRS光谱,其最大散射峰位于340 nm,AMK浓度在0.001~0.08 µg•mL-1范围内与散射增强程度呈线性关系,据此建立测定AMK的RRS新方法。方法具有较高的灵敏度,检出限(3σ)为0.4 ng•mL-1。考察了体系的RRS和吸收光谱特征,优化了适宜的反应条件,试验了常见共存物质的影响,表明方法具有良好的选择性。方法用于人血清中AMK的测定,结果满意。文中对离子缔合反应机理和RRS增强的原因进行了讨论。     

Optimization of the depth resolution for profiling SiO2/SiC interfaces by dual-beam TOF-SIMS combined with etching

To examine precise depth profiles at the interface of SiO₂/SiC, a high resolution that can detect slight discrepancies in the distribution is needed. In this study, an experimental method to achieve a high resolution of less than 1 nm was developed by using dual-beam time-of-flight secondary ion mass spectrometry (TOF-SIMS). The analysis was preceded by the following three steps: (1) determination of the optimal analytical conditions of the analysis beam (Bi⁺) and sputtering beam (Cs⁺), (2) verification of the etching methods to thin the SiO₂ layer, and (3) confirmation of the benefits of the low-energy sputtering beam directed toward SiO₂/SiC samples. By using the secondary ion intensity peak-to-valley ratio of BN⁻ and BO⁻ of a sample with delta-doped boron multilayers, the appropriate Bi⁺/Cs⁺ condition for a high depth resolution was determined for each energy level of the sputtering beam. Upon verification of the etching methods to thin the SiO₂ layer, slight discrepancies were found between samples that were obtained with different etching methods. The difference in the roughness values of the etched surfaces was proactively utilized for the performance confirmation of the low-energy sputtering beam by means of precise observation of the profiles at the SiO₂/SiC interface. The use of a Cs beam with a low energy between 0.25 and 0.5 keV enabled the detection of slight discrepancies in the roughness of less than 1 nm between samples. The aforementioned method has the potential to accurately detect discrepancies in the intrinsic distribution at the SiO₂/SiC interface among samples.     

藏红T共振瑞利散射光谱法测定保健食品中的透明质酸钠

建立藏红T共振瑞利散射光谱法测定保健食品中透明质酸钠的含量。在p H 5.00的Britton–Robinson缓冲介质中,藏红T与透明质酸钠反应形成化合物,使溶液共振瑞利散射急剧增强并产生相应的散射光谱,其最大散射峰位于335 nm,5.0×10~(–4) mol/L藏红T溶液用量为0.70 m L,反应时间为15 min。透明质酸钠的质量浓度在0.06~3.0mg/L范围内与共振瑞利散射增强程度成良好的线性关系,线性相关系数为0.999 2。方法检出限为19.8μg/L,测定结果的相对标准偏差为3.36%~4.52%(n=6),加标回收率为92.4%~103.0%。该方法灵敏度高、选择性好、操作简便,适用于保健食品中透明质酸钠的测定。     

Lamellar morphology and equilibrium melting temperature of syndiotactic polystyrene in β‐crystalline form

Lamellar morphology and thickness of syndiotactic polystyrene (sPS) samples melt‐crystallized at various temperatures were probed using transmission electron microscopy (TEM) and small‐angle X‐ray scattering (SAXS). In addition, the melting temperature and enthalpy of the crystallized samples were characterized with differential scanning calorimetry. Under appropriate thermal treatments, all the samples investigated in this study were crystallized into β′ crystal modification, as revealed by wide‐angle X‐ray diffraction. From the SAXS intensity profiles, a scattering peak (or shoulder) associated with lamellar features as well as the presence of anomalous scattering at the zero‐scattering vector were evidently observed. The peculiar zero‐angle scattering was successfully described by the Debye–Bueche model, and subtraction of its contribution from the raw intensity profiles was carried out to deduce the intensity profile merely associated with the lamellar feature. The lamellar thickness obtained from Lorentz‐corrected intensity profiles in this manner agrees with that measured from the TEM images, provided that the two‐phase model is applied. On the basis of the Gibbs–Thomson equation, the modest estimations of equilibrium melting temperature and the surface free energy of the fold lamellar surface are 292.7 ± 2.7 °C and 20.2 ± 2.6 erg/cm², respectively, when lamellar thicknesses measured by TEM are applied. © 2002 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 40: 1626–1636, 2002     

A study on photochemical behavior of lysozyme-bromophenol blue complex and its analytical application

It was found that macromolecular complexes were formed between lysozyme and bromophenol blue (BPB) with the electrostatic attraction in acetate medium (pH 6.5). The binding constant and the number of binding site for lysozyme-BPB complex were obtained, and the thermodynamic parameters were given. In addition, a remarkable enhancement of resonance light scattering (RLS) intensity for the macromolecular complex was observed with a scattering peak at 336 nm. And the increment of RLS intensity was proportional to the concentration of lysozyme in the range of 5 ng ml(-1) to 10.0 microg ml(-1). The influence of experimental conditions including pH, BPB concentration, and ionic strength on RLS system were tested, especially the effect of temperature was examined in detail. The proposed method was successfully applied to determine lysozyme in human saliva and tear samples without any special pretreatment. Compared with other methods the proposed method is of higher sensitivity and wider linear range.     

Utilising spatial frequency filtering to extract nanoscale layer structure information from isotropic small-angle X-ray scattering data

 A separation method by spatial frequency filtering of the diffuse background of small-angle X-ray scattering (SAXS) is transferred to the case of isotropically scattering samples of polymer materials. Analysis of the residual discrete SAXS is demonstrated. Evaluations of model scattering curves from lamellar two-phase systems show that this technique, in general, results in a good separation. If samples with pure particle scattering or such with rough domain surfaces are investigated, the separation of a suitable background is possible, but is prone to some uncertainty which is estimated. In the case of particle scattering from lamellae the problem is solved by fitting a model function considering polydispersity to the Lorentz-corrected scattering intensity. After background correction the residual information on the distorted nanostructure is collected in an interface distribution function, from which topological parameters can be recovered with high accuracy. These parameters comprise average layer thicknesses and parameters of particle polydispersity. Parameter recovery is achieved by nonlinear regression with model functions describing stacking statistics. Automated versions of the technique are suited to process and analyse series of polymers collected in time-resolved synchrotron radiation experiments. Received: 24 July 2001 Accepted: 12 September 2001     

Screen anticancer drug in vitro using resonance light scattering technique

An in vitro screening model using resonance light scattering (RLS) technique with 3-(4,5-dimethylthiazol-2-yl)-2,5-diphenyl tetrazolium bromide (MTT) reagent as the reactive probe to target cancer cell was firstly developed. In this model, MTT was reduced by viable cancer cells to produce a purple formazan. Cell viability was proportional to the number of formazan induced strong light scattering signal. The inhibition rate of anticancer drug was found to vary inversely with the H₂₂-MTT system RLS intensity. So it was intuitive to see the sequence of the tumor suppressive activity of six anticancer drugs without data processing by RLS/MTT screening spectra. Compared with the traditional MTT method, this method has high sensitivity, low detection limit and quite intuitive screening results which were identical to those obtained from the MTT colorimetric assay.     

Eu(DBM)3纳米微晶的低频喇曼光谱

The fractal property and low frequency Raman scattering of Eu(DBM)3 nanosized microcrystals were investigated. The influence of the fractal structure of Eu(DBM)3 non-crystalline solids on low frequency scattering was studied. It was found that vibrational excitations on the fractal are localized and can be described in terms of fractions. It was shown that reduced Raman scattering intensity is of a power law dependence of the vibrational frequencies for all samples. The fractal and spectral dimension were also determined, we found that our experimental value was in fair agreement with the theoretical one.     

Eu（DBM）3纳米微晶的低频喇曼光谱

低频喇曼（LFR）光谱技术广泛应用于无序体系的结构性质研究，它能提供有关微粒的非弹性振动、量子尺寸效应以及分形体的光散射性质等方面的信息［‘一句.尤其是通过LFR光谱的研究，可以确定分形体振动（频率为叫激发的光谱线数已用于描述分形结构的局域振动量子一分形子的态密度：N（川。0‘’‘，又称之为分形干线教，是联系“几何结构”与“动力学行为”的重要参数.对它进行深入而广泛地研究，将有可能为更深入地认识无序材料的物理、化学性质带来重大的突破，因而引起人们的极大兴趣.其研究工作主要集中于非晶态的硅溶胶和玻璃体系［…