Interface thickness of the incompatible polymer system PS/PnBMA as measured by neutron reflectometry and ellipsometry

The techniques of neutron reflectometry and spectroscopic ellipsometry are compared as methods to measure the interface width between immiscible polymers. The interface thickness of the incompatible polymer system of polystyrene (PS) and polyn-butyl methacrylate) (PnBMA) is determined by neutron reflectrometry to (6.4±0.2) nm and (8.6±0.2) nm at temperatures of 120 and 156°C, respectively. Some emphasis is put on the measurement of those values also by spectroscopic ellipsometry using the same materials. A special sample geometry is chosen for ellipsometric measurements to compensate for thickness changes of films during annealing, and the dispersions of PS and PnBMA films are determined. With respect to the determination of the interface widths, however, it turns out that in the available wavelength range of 280 to 700 nm spectroscopic ellipsometry is not sensitive enough to measure the thin interface width between PS and PnBMA films. Neutron reflectivity results obtained for PS/PnBMA are discussed with respect to the Flory-Huggins segment interaction parameter calculated within the approximations of meanfield theory.     

Study of the telomerization of ethylene and 1-hexene by butanal through comparative kinetics

The reaction of ethylene and 1-hexene with butanal was studied using tertiary butyl peroxide initiation at 140°C and a hydrostatic pressure in the range of 250–450 kg/cm². Based on calculated values of the rate constant ratios for the addition reaction of the n-C₃H₇O radical to ethylene (k₀ ^e) and 1-hexene (k₀ ^h), we obtained k₀ ^e/k₀ ^h=3.7 as the rate constant of the decarbonylation reaction of this radical (k_d). The partial chain transfer constants were calculated for the ethylene-butanal system as C_n: C₁=1.0±0.16; C₂=1.0±0.14; C₃=0.9±0.23. The results obtained indicate the nucleophilic character of the n-C₃H₇O radical in these reactions.Translated from Izvestiya Akademii Nauk SSSR, Seriya Khimicheskaya, No. 6, pp. 1356–1360, June, 1990.     

Comparative thickness measurements of SiO2/Si films for thicknesses less than 10 nm

We report on a comparative measurement of SiO₂/Si dielectric film thickness (t < 10 nm) using grazing‐incidence x‐ray photoelectron spectroscopy, neutron reflectometry and spectroscopic ellipsometry. Samples with nominal thicknesses of 3–7 nm were characterized by XPS with grazing‐incidence x‐rays at 1.8 keV, by cold neutron reflectometry (λ = 0.475 nm) and by spectroscopic ellipsometry over 1.5 eV < E < 6.0 eV. The results show good agreement between the ellipsometry and grazing‐incidence XPS, with slightly lower values for the neutron reflectometry. The role of surface contamination in each type of measurement is discussed. Published in 2004 by John Wiley & Sons, Ltd.     

Investigation of optical properties of amorphous Ge15Se85-xCux thin films using spectroscopic ellipsometry

Different compositions of amorphous Ge₁₅Se_85-xCu_x thin films were deposited onto glass substrates by the thermal evaporation technique. Their amorphous structural characteristics were studied by X-ray diffraction (XRD). The optical constants (n, k) of amorphous Ge₁₅Se_85-xCu_x thin films were obtained by fitting the ellipsometric parameters (ψ and Δ) data for the first time using three layers model system in the wavelength range 300–1100 nm. It was found that the refractive index, n, increases with the increase of Cu content. The possible optical transition in these films is found to be indirect transitions. The optical energy gap decreases linearly from 1.83 to 1.44 eV with increasing the Cu. The experimental transmittances spectrum can be simulated using the thickness and optical constants modeled by spectroscopic ellipsometry model.     

Electrochemical Proton Intercalation in Vanadium Pentoxide Thin Films and its Electrochromic Behavior in the near-IR Region

This work examines the proton intercalation in vanadium pentoxide (V₂O₅) thin films and its optical properties in the near-infrared (near-IR) region. Samples were prepared via direct current magnetron sputter deposition and cyclic voltammetry was used to characterize the insertion and extraction behavior of protons in V₂O₅ in a trifluoroacetic acid containing electrolyte. With the same setup chronopotentiometry was done to intercalate a well-defined number of protons in the H_xV₂O₅ system in the range of x=0 and x=1. These films were characterized with optical reflectometry in the near-IR region (between 700 and 1700 nm wavelength) and the refractive index n and extinction coefficient k were determined using Cauchy ’s dispersion model. The results show a clear correlation between proton concentration and n and k.     

Spectroellipsometric Characterization of Multilayer Sol-Gel Fe2O3 Films

Multilayer Fe₂O₃ films were deposited by the sol-gel method on glass substrates using three successive deposition procedures. The films were thermally treated for 1 h at 300°C.The optical and microstructural properties of these films were investigated by spectroscopic ellipsometry (SE) in the 500–1000 nm range. The optical gap was found by fitting the dispersion of the film refractive index (n) with the Wemple-DiDomenico (WDD) formula.The ellipsometric measurements showed also that the Fe₂O₃ films are anisotropic. The birefringence values (n) of the sol-gel films (0.05–0.08) are smaller than the large values of the Fe₂O₃ (which are around 0.28) but increase with the crystalization of the films. AFM mesurements showed that the films treated at 300°C start to crystallize.     

Dielectric and optical properties of BaTiO<Subscript>3</Subscript> thin films prepared by low-temperature process

Barium titanate (BaTiO₃) thin films have been prepared by low temperature processing on Pt/Ti/SiO₂/Si substrates using sol-gel-hydrothermal (SGHT) technique, which combined the conventional sol-gel process and hydrothermal method. X-ray diffraction analysis showed that the barium titanate thin films are polycrystalline. As-reacted barium titanate films grown on Pt(111)/Ti/SiO₂/Si(100) substrates had a dielectric constant (ε) and loss tangent (tanδ) of 80 and 0.05 at 1 MHz, respectively. The optical constants including refractive index n, extinction coefficient k, and absorption coefficient α of the barium titanate thin films in the wavelength range of 2.5–12.6 μm were obtained by infrared spectroscopic ellipsometry.     

Temperature dependence of optical and structural properties of ferroelectric B3.15Nd0.85Ti3O12 thin film derived by sol–gel process

We report the annealing temperature dependence of optical properties in ferroelectric B_3.15Nd_0.85Ti₃O₁₂ (BNdT) thin film for the first time. BNdT thin films are prepared by a sol–gel/spin coating method. Structural properties of BNdT thin films upon different thickness and annealing temperatures are characterized using the X-ray diffraction, scanning electron microscopy, atomic force microscopy, and transmission electron microscopy. The BNdT thin film annealed at 650 °C exhibits a well defined perovskite crystalline structure with high c-axis orientation, which leads to a saturated polarization–electric field (PE) hysteresis with a remanent polarization of 2P _r = 39.6 μC/cm² and coercive field of 85 kV/cm at 5 V. Little fatigue degradation (<5%) is demonstrated upon 1 × 10¹⁰ switching cycles indicating a good fatigue endurance. Additionally, a superior optical transparency T(λ) of >80% is observed for wavelengths from 250 to 2,000 nm. Fundamental optical parameters of BNdT material such as refractive index n, extinction coefficient k, and band gap energy E _g are extracted from an ellipsometry measurement. Microstructure and annealing temperature dependence of T(λ), n, k, and E _g variation are also investigated and explained in detail.     

Carbon nanotube—chalcogenide glass composite

This article describes the preparation of multi-walled carbon nanotube—chalcogenide glass composite by direct synthesis and the melt-quenching method. The carbon nanotubes—chalcogenide glass composite was characterized by high-resolution transmission electron microscopy (HRTEM), TEM/energy-dispersive X-ray spectroscopy, low energy electron excited X-ray spectroscopy, Raman spectroscopy, spectroscopic ellipsometry, microhardness, and impedance spectroscopy. CNTs-AgAsS₂ glass composite possess highly increased ionic conductivity, from σ_25 °C=4.38±0.0438×10⁻⁶ to σ_25 °C=6.57±0.0657×10⁻⁶ S cm⁻¹ and decreased refractive index from n=2.652 to 2.631 at the wavelength λ=1.55 μm.     

Review on the thickness measurement of ultrathin oxide films by mutual calibration method

Mutual calibration was suggested as a method to determine the absolute thickness of ultrathin oxide films. It was motivated from the large offset values in the reported thicknesses in the Consultative Committee for Amount of Substance (CCQM) pilot study P-38 for the thickness measurement of SiO₂ films on Si(100) and Si(111) substrates in 2004. Large offset values from 0.5 to 1.0 nm were reported in the thicknesses by ellipsometry, X-ray reflectometry (XRR), medium-energy ion scattering spectrometry (MEIS), Rutherford backscattering spectroscopy (RBS), nuclear reaction analysis (NRA), and transmission electron microscopy (TEM). However, the offset value for the thicknesses by X-ray photoelectron spectroscopy (XPS) was close to zero (−0.013 nm). From these results, the mutual calibration method was reported for the thickness measurement of SiO₂ films on Si(100) by combination of TEM and XPS. The mutual calibration method has been applied for the thickness measurements of hetero oxide films such as Al₂O₃ and HfO₂. Recently, the effect of surface contamination was reported to be critical to the thickness measurement of HfO₂ films by XPS. On the other hand, MEIS was proved to be a powerful zero offset method which is not affected by the surface contamination. As a result, the reference thicknesses in the CCQM pilot study P-190 for the thickness measurement of HfO₂ films on Si(100) substrate were determined by mutual calibration method from the average XRR data and MEIS analysis. Conclusively, the thicknesses of ultrathin oxide films can be traceably certified by mutual calibration method and most thickness measurement methods can be calibrated from the certified thicknesses.     

Structural and Optical Properties of Sol-Gel Deposited Proton Conducting Ta2O5 Films

Proton conducting tantalum oxide films were deposited on ITO (Indium Tin Oxide) coated glass, fused silica and soda-lime glass substrates by spin coating using a sol-gel process. The coating solutions were prepared using Ta(OC₂H₅)₅ as a precursor. X-ray diffraction studies determined that the sol-gel films, heat treated at temperatures below 400°C, were amorphous. Films heat treated at higher temperatures were crystalline with the hexagonal δ-Ta₂O₅ structure. The solar transmission values (T _s ) of tantala films on glass generally range from 0.8–0.9, depending on thickness. The refractive index and the extinction coefficient were evaluated from transmittance characteristics in the UV-VIS-NIR regions. The refractive index values calculated at λ=550 nm increased fromn=1.78 to 1.97 with increasing heat treatment from 150 to 450°C. The films heat treated at different temperatures showed low absorption, with extinction coefficients of smaller thank=1×10⁻³ in the visible range. Impedance spectroscopic investigations performed on Ta₂O₅ films revealed that these films have a protonic conductivity of 3.2×10⁻⁴S/m. The films are suitable for proton conducting layers in electrochromic (EC) devices.     

Probing interfacial interactions of nafion ionomer: Thermal expansion of nafion thin films on substrates of different hydrophilicity/hydrophobicity

Interfacial interactions of Nafion ionomer with superhydrophilic (Pt, Au), hydrophilic (SiO₂), and hydrophobic (graphene, octyltrichlorosilane [OTS]‐modified SiO₂) is investigated, using in situ thermal ellipsometry, by quantification of substrate‐ and thickness‐dependent thermal properties of the ultrathin Nafion films of nominal thickness ranging 25–135 nm. For sub‐50 nm thin Nafion films, the thermal expansion coefficient of films decreased in the order of most hydrophobic to most hydrophilic substrate: OTS > graphene > SiO₂ > Au > Pt, implying weaker interpolymer and polymer–substrate interactions for films on hydrophobic substrates. Expansion coefficient of films on SiO₂, graphene, and OTS‐modified SiO₂ decreased with thickness whereas that of films on Au and Pt substrates increased with thickness. Above ~100 nm of thickness, films on all substrates converged toward a common value representative of bulk Nafion. Thermal transition temperature was found to be higher for films on hydrophilic SiO₂ than that for films on hydrophobic graphene and OTS‐modified SiO₂ but was not discernible for films on Au and Pt substrates. © 2019 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2019 , 57, 343–352     

Reactivity studies of trans-[PtClMe(SMe2)2] towards anionic and neutral ligand substitution processes

Reaction of trans-[PtClMe(SMe₂)₂] with the mono anionic ligands azide, bromide, cyanide, iodide and thiocyanate result in substitution of the chloro ligand as the first step. In contrast the neutral ligands pyridine, 4-Me-pyridine and thiourea substitute a SMe₂ ligand in the first step as confirmed by ¹H NMR spectroscopy and the kinetic data. Detailed kinetic studies were performed in methanol as solvent by use of conventional stopped-flow spectrophotometry. All processes follow the usual two-term rate law for square-planar substitutions, k_obs = k₁ + k₂[Y] (where k₁ = k_MeOH[MeOH]), with k₁ = 0.088 ± 0.004 s⁻¹ and k₂ = 1.18 ± 0.13, 3.8 ± 0.3, 17.8 ± 1.3, 34.9 ± 1.4, 75.3 ± 1.1 mol⁻¹ dm³ s⁻¹ for Y⁻ = N₃, Br, CN, I and SCN respectively at 298 K. The reactions with the neutral ligands proceed without an appreciable intercept with k₂ = 5.1 ± 0.3, 15.3 ± 1.8 and 195 ± 3 mol⁻¹ dm³ s⁻¹ for Y = pyridine, 4-Me-pyridine and thiourea, respectively, at 298 K. Activation parameters for MeOH, , Br⁻, CN⁻, I⁻, SCN⁻, and Tu are ΔH^≠ = 47.1 ± 1.6, 49.8 ± 0.6, 39 ± 3, 32 ± 8, 39 ± 5, 34 ± 4 and 31 ± 3 kJ mol⁻¹ and ΔS^≠ = −107 ± 5, −77 ± 2, −104 ± 9,−113 ± 28, −85 ± 18, −94 ± 14 and −97 ± 10 J K⁻¹ mol⁻¹, respectively. Recalculation of k₁ to second-order units gives the following sequence of nucleophilicity: (1:13:42:57:170:200:390:840:2170) at 298 K. Variation of the leaving group in the reaction between trans-[PtXMe(SMe₂)₂] and SCN⁻ follows the same rate law as stated above with k₂ = 75.3 ± 1.1, 236 ± 4 and 442 ± 5 mol⁻¹ dm³ s⁻¹ for X⁻ = Cl, I and N₃, respectively, at 298 K. The corresponding activation parameters were determined as ΔH^≠ = 34 ± 4, 32 ± 2 and 39.3 ± 1.7 kJ mol⁻¹ and ΔS^≠ = −94 ± 14, −86 ± 8 and −68 ± 6 J K⁻¹ mol⁻¹. All the kinetic measurements indicate the usual associate mode of activation for square planar substitution reactions as supported by large negative entropies of activation, a significant dependence of the reaction rate on different entering nucleophiles and a linear free energy relationship.     

Influence of the linking chain length on the recombination kinetics of covalently bonded triplet radical pairs and magnetic field effects

Nanosecond laser flash photolysis technique is used to study the formation and decay kinetics of covalently linked triplet radical pairs (RP) formed after photoinduced electron transfer in the series of 21 zinc porphyrin—chain—viologen (Pph—Sp_n—Vi²⁺) dyads, where the number of atoms (n) in the chain increases from 2 to 138. In poorly viscous polar solvents (acetone, CHCl₃—CH₃OH (1 : 1) mixture), the dependence of the rate constant of RP formation on n can be described by the equation k _e = k _e ⁰ n ^–a at k _e ⁰ = 2.95·10⁸ s^–1 anda = 0.8. In the zero magnetic field, the RP recombination rate constant (k _r(B = 0)) is significantly lower than k _e and ranges from 0.7·10⁶ to 8·10⁶ s^–1. The dependence of k _r(B = 0) on n is extreme. The dependence k _r(B = 0) reaches a maximum at n = 20. In the strong magnetic field (B = 0.21 T), the significant retardation of triplet RP recombination is observed. The chain length has an insignificant effect on k _r(B = 0.21 T), which ranges from 0.3·10⁶ to 0.9·10⁶ s^–1. The regularities found are discussed in terms of the interplay of molecular and spin dynamics.     

Thin film absorbers for visible,near-infrared,and short-wavelength infrared spectra

In this study, the refractive indices were determined for Al₂O₃ films deposited with ALD, and amorphous Mo-Si-N films deposited with reactive sputtering. The measurements were made by spectroscopic reflectometry, ellipsometry, gonioreflectometry, and double-beam transfer standard spectrometry. Based on the results, two thin film absorbers were designed and manufactured: one for wavelengths of 350…1000 nm, the other for wavelengths of 1200…2000 nm. The manufactured absorbers showed high absorption over their whole working spectra varying from 93.4 % at the minimum to 99.9 % at the maximum. One of the absorbers was applied to a MEMS thermopile detector with successful process integration.     

Thermochemistry of intercalation of n-alkylmonoamines into lamellar hydrated barium phenylarsonate

Hydrated layered crystalline barium phenylarsonate, Ba(HO₃AsC₆H₅)₂·2H₂O was used as host for intercalation of n-alkylmonoamine molecules CH₃(CH₂)_n-NH₂ (n = 1-4) in aqueous solution. The amount intercalated (n_f) was followed batchwise at 298 ± 1 K and the variation of the original interlayer distance (d) for hydrated barium phenylarsonate (1245 ppm) was followed by X-ray powder diffraction. Linear correlations were obtained for both d and n_f as a function of the number of carbon atoms in the aliphatic chain (n_c): d = (2225 ± 32) + (111 ± 11)n_c and n_f = (2.28 ± 0.15) − (11.50 ± 0.03)n_c. The exothermic enthalpies of intercalation increased with n_c, which was derived from the monomolecular amine layer arrangements with the longitudinal axis inclined by 60° to the inorganic sheets. The intercalation was followed by titration with amine at the solid/liquid interface and gave the enthalpy/number of carbons correlation: ΔH = −(7.25 ± 0.40) − (1.67 ± 0.10)n_c. The negative Gibbs free energies and positive entropic values reflect the favorable host/guest intercalation processes for this system.     

Enthalpy change and mechanism of oxidation of o-phenylenediamine by hydrogen peroxide catalyzed by horseradish peroxidase

The hydrogen peroxide-oxidation of o-phenylenediamine (OPD) catalyzed by horseradish peroxidase (HRP) at 37 °C in 50 mM phosphate buffer (pH 7.0) was studied by calorimetry. The apparent molar reaction enthalpy with respect to OPD and hydrogen peroxide were −447 ± 8 kJ mol⁻¹ and −298 ± 9 kJ mol⁻¹, respectively. Oxidation of OPD by H₂O₂ catalyzed by HRP (1.25 nM) at pH 7.0 and 37 °C follows a ping-pong mechanism. The maximum rate V_max (0.91 ± 0.05 μM s⁻¹), Michaelis constant for OPD K_m,S (51 ± 3 μM), Michaelis constant for hydrogen peroxide Km,H₂O₂ (136 ± 8 μM), the catalytic constant k_cat (364 ± 18 s⁻¹) and the second-order rate constants k₊₁ = (2.7 ± 0.3) × 10⁶ M⁻¹ s⁻¹ and k₊₅ = (7.1 ± 0.8) × 10⁶ M⁻¹ s⁻¹ were obtained by the initial rate method.     

Photocalorimetric measurement of the heat flow during optically and thermally induced solid state reaction between Ag and As33S67 thin films

Thin films of amorphous chalcogenide with composition of As₃₃S₆₇ (thickness d = 300 nm) and silver film (thickness d = 30 nm) on top of chalcogenide film were deposited by vacuum thermal evaporation. Prepared bilayer Ag/As₃₃S₆₇ was illuminated and photo-induced dissolution and diffusion (OIDD) process of silver in chalcogenide film studied by means of photocalorimetry. The heat flow connected with OIDD process during light exposure as a function of light energy, light intensity and temperature has been studied by means of photocalorimetry. The enthalpies of OIDD process were obtained and attributed to the bond energies of the formed bonds.     

Nuclear data measurements for zirconium isotopes used for activation analysis and neutron metrology

In order to establish more accurate nuclear data for the zirconium isotopes⁹⁴Zr and⁹⁶Zr, joint experimental work has been conducted in three different reactor types. After carefully calibrating the neutron spectra in the irradiation channels used, nuclear constants k₀ and Q₀ were remeasured and found to be The relevant effective resonance energies have been recalculated using the latest BNL neutron resonance parameters yielding . The epithermal neutron shielding factor G_e has been experimentally determined as a function of foil thickness. The results gave G_e(⁹⁴Zr)=0.983 (±0.3%) and G_e(⁹⁶Zr)=0.973 (±0.4%) for the most frequently used 0.125 mm foil thickness. Finally the half life of the⁹⁷Zr isotope has also been remeasured to give T_1/2(⁹⁷Zr)=16.744±0.011 h with 1 limit.     

Free radical copolymerization of 1-vinyl naphthalene with styrene,methyl methacrylate,and acrylonitrile

Investigations on free radical copolymerization of 1-vinyl naphthalene (1-VNph, monomerM ₂) with styrene (St), methyl methacrylate (MMA) and acrylonitrile (AN) (monomersm ₁) in bulk at 60°C with AIBN as initiator are presented. Relative reactivity ratios were calculated by the Kelen-Tüdös method yielding:r _st=0.70 ±0.23 andr _1–VNph=2.02 ±0.40 for system St/1-VNph;r _MMA=0.32 ±0.10 andr _1–VNph=0.57 ±0.07 for system MMA/1-VNph andr _AN=0.11 ±0.03 andr _1–VNph=0.45 ±0.09 for system AN/1-VNph.Q, e values for 1-VNph according to Alfrey, Price scheme were calculated toQ _1–VNph=1.02,e ₁–VNph=–0.62.