强耦合磁失措自旋冰系统Dy2Ti2O7单晶生长和基本磁性质测量

利用红外光源浮区法生长出大尺寸、高质量的磁失措自旋冰化合物Dy2Ti2O7单晶体.X射线衍射实验证实晶体具有面心立方结构,空间群为 Fd3m,晶胞参数a＝1.0112(2) nm,[111]和[400]方向X射线衍射摇摆曲线半高宽分别仅为0.07°和0.05°.直流磁化率与温度关系测量给出晶体的Van Vleck顺磁因子为2.46×10-5 m3/mol,有效磁矩μeff＝10.24(4)μB,Cure-Weiss温度ΘCW＝1.1 K,揭示Dy2Ti2O7具有弱的铁磁性.对磁性起源的综合分析表明,该自旋冰晶体磁性质主要来源于磁偶极相互作用,且相关最近邻长程偶极相互作用能量标度Dnn＝3.00 K.     

Bi2Ti2O7/Si薄膜的制备及C-V特性研究

采用化学溶液分解法(CSD)在Si衬底上制备了Bi₂Ti₂O₇薄膜.X射线双晶衍射和原子力显微镜检测表明,所制备的薄膜主要为Bi₂Ti₂O₇相的多晶材料.同时还研究了AuBi₂Ti₂O₇/n-Si(100)结构的电容电压(C-V)特性,结果表明,在Bi₂Ti₂O关键词： C-V特性 2Ti₂O₇薄膜')" href="#">Bi₂Ti₂O₇薄膜 电荷迁移     

Y2Ti2O7:Tm3+的制备及其发光性能研究

采用溶胶-凝胶法(Sol-gel)制备了不同烧结温度和Tm³⁺掺杂浓度的Y₂Ti₂O₇:xTm (x=0.005,0.01,0.03,0.05)荧光粉,分别采用X射线衍射分析仪(XRD)、透射电子显微镜(TEM)和荧光光谱仪对样品的晶型结构、形貌以及发光性能进行了表征。XRD结果表明,所得到的样品为单一立方相烧绿石结构。样品在361 nm紫外光激发下发射出 蓝光,其峰值波长为456 nm,对应于Tm³⁺的¹D₂→³F₄跃迁。1 000 ℃烧结的Y₂Ti₂O₇: 0.01Tm³⁺样品具有较好的发光性能。样品在456 nm处的相对发光强度随Tm³⁺掺杂浓度的增大先升高后降低,在Tm³⁺摩尔分数为1%时达到最大,即出现了浓度猝灭现象。     

Eu2－xPbxRu2O7中的金属-绝缘体相变和自旋玻璃态行为

通过对Eu_2-xPb_xRu₂O₇(x=0.0, 0.2, 0.4, 0.6, 0.8, 1.0和1.8)系列样品的结构、电阻和磁化率的观测，结果发现，随着Pb替代浓度x值的增加，样品的电阻率逐渐减小，系统在x=0.8附近发生了金属-绝缘体(M-I)相变；Ru⁴⁺的局域磁矩及其自旋玻璃冻结温度T_G也随之降低. 在该体系中，Pb²⁺对Eu³⁺的部分替代使样品中载流子浓度增加，Pb的6p能带与Ru 4d电子的T_2g能带混合，能带得以拓宽，Ru 4d电子的巡游性增强，导致该体系物性的系列变化. 关键词： 自旋几何受挫 2-xPb_xRu₂O₇体系')" href="#">Eu_2-xPb_xRu₂O₇体系 金属-绝缘体相变 自旋玻璃态     

YBa2Cu3O7－δ/SrNb0.01Ti0.99O3 p-n结的制备及其特性

采用脉冲激光沉积技术，在n型SrNb001Ti099O3(SNTO)单晶基片上生长p型YBa2Cu3O7-δ(YBCO)薄膜，制备出YBCO/SNTO p n结.YBCO薄膜是高度c轴织构的超导薄膜，且具有良好的超导电性.YBCO/SNTO p n结具有较好的整流特性和很好的温度与磁场稳定性. 关键词： YBa2Cu3O7-δ SrNb001Ti099O3 p n结     

Dy掺杂对Sr2Bi4Ti5O18铁电陶瓷性能的影响

用传统固相烧结法制备了Sr₂Bi_4-xDy_xTi₅ O₁₈(SBDT-x, x=0—0.20)陶瓷样品. x射线衍射分析表明, 微量的Dy掺杂没有影 响Sr₂Bi₄Ti₅O₁₈(SBTi) 原有的层状钙钛 矿结构. 通过研究样品的介电特性, 发现Dy掺杂减小了材料的损耗因子, 降低了样品铁电- 顺电相转变的居里温度. 铁电性能测量结果表明, 随Dy含量的增加, SBDT-x系列样品的剩余 极化先增大, 后减小. 当Dy掺杂量为0.01时, 剩余极化达到最大值, 约为20.1 μC·cm^-2. 掺杂引起剩余极化的变化, 与材料中缺陷浓度、内应力以及晶格畸变程度等因 素有关, 是多种作用机理相互竞争的结果. (Bi₂O₂)²⁺ 层通常被看作是绝缘层和空间电荷库, 对材料的铁电性能起关键作用. 掺杂离子进入(Bi2O₂)²⁺层会导致铁电性能变差. 关键词： 2Bi₄Ti₅O₁₈陶瓷')" href="#">Sr₂Bi₄Ti₅O₁₈陶瓷 Dy掺 杂 铁电性能 居里温度     

尖晶石结构自旋有序CaTi2O4单晶生长和磁化率特性研究

通过助溶剂熔融法并在氩气气氛炉中成功生长出高质量大尺寸的CaTi₂O₄的单晶.X射线衍射实验及能量损失谱EDS证实,制备的CaTi₂O₄单晶晶胞参数a=9.781?,b=9.966?,c=3.148?,所有样品均为单相,且符合化学计量比,样品高纯.通过直流磁化率的测量,首次给出了晶体的Van-Vleck顺磁因子为6.85×10^-5cm³/mol,Cure-Weiss温度为-0.44 K,呈弱反铁磁性.同时,通过单晶各向磁化率的测量,进一步确认了CaTi₂O₄晶体中一维有序Ti-Ti反铁磁dimer链的形成,并明确了其方向. 关键词： 2O₄')" href="#">CaTi₂O₄ 磁化率 各向异性 反铁磁二聚化     

自旋冰材料R2Ti2O7（R=Dy，Ho）的单晶生长和低温物性研究

本文首先对R2Ti2O7（R=Dy,Ho）单晶的生长条件进行了探索,经过多次尝试,得到了较理想的生长条件,并获得了高品质的单晶．磁化率和比热测量证实了这些单晶材料具有自旋冰基态．另外,通过对不同条件下退火的Dy2Ti2O7单晶低温热传导的深入研究,发现R2Ti2O7单晶具有较小的声子峰,并且退火条件的变化对峰值的影响很...     

SrBi2Ta2O9/Bi4Ti3O12复合铁电薄膜的制备与特性研究

采用溶胶凝胶工艺在p-Si衬底上制备了SrBi₂Ta₂O₉/Bi₄Ti₃O₁₂复合铁电薄膜. 研究了SrBi₂Ta₂O₉/Bi₄Ti₃O₁₂复合薄膜的微观结构与生长行为、铁电性能和疲劳特性. 研究表明: Si衬底Bi₄Ti< 关键词： 2Ta₂O₉')" href="#">SrBi₂Ta₂O₉ 4Ti₃O₁₂')" href="#">Bi₄Ti₃O₁₂ 复合铁电薄膜 溶胶凝胶工艺     

长余辉材料Sr2MgSi2O7：Eu2+,Dy3+中稀土离子的发光特性

利用同步辐射光源(德国HASYLAB实验室的SUPERLUMI实验站)和真空紫外激光(157.6nm)对新型蓝光发射长余辉材料Sr₂MgSi₂O₇:Eu²⁺(0.2%),Dy³⁺(8%)进行了光谱研究。在170nm同步辐射光源激发下,观察到对应Eu²⁺:5d-4f跃迁的477nm发射带和对应Dy³⁺:4f-4f跃迁的两组线谱发射,其中只有来自Eu²⁺的5d-4f发射对长余辉光谱有贡献。在157.6nm激光激发下,除了上述发射外,还明显观察到对应Eu³⁺的红色线谱(590,614,626nm)。结合这些光谱特性,对Sr₂MgSi₂O₇:Eu²⁺,Dy³⁺中稀土离子的发光特性以及长余辉发光机理进行了讨论,并提出了Eu²⁺充当空穴陷阱的可能性。     

Structural properties and electrical characteristics of high-k Tm2Ti2O7 gate dielectrics

In this article, the structural and electrical characteristics of high-k Tm₂Ti₂O₇ gate dielectrics deposited on Si (1 0 0) by means of reactive cosputtering were reported. The Tm₂Ti₂O₇ dielectrics annealed at 800 °C exhibited excellent electrical properties such as high capacitance value, small density of interface state, almost no hysteresis voltage, and low leakage current. This phenomenon is attributed to a rather well-crystallized Tm₂Ti₂O₇ structure and composition and a smooth surface observed by X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy, respectively. This film also shows almost negligible charge trapping under high constant voltage stress.     

Influence of postdeposition annealing on structural properties and electrical characteristics of thin Tm2O3 and Tm2Ti2O7 dielectrics

We describe the structural properties and electrical characteristics of thin thulium oxide (Tm₂O₃) and thulium titanium oxide (Tm₂Ti₂O₇) as gate dielectrics deposited on silicon substrates through reactive sputtering. The structural and morphological features of these films were explored by X-ray diffraction, X-ray photoelectron spectroscopy, secondary ion mass spectrometry, and atomic force microscopy, measurements. It is found that the Tm₂Ti₂O₇ film annealed at 800 °C exhibited a thinner capacitance equivalent thickness of 19.8 Å, a lower interface trap density of 8.37 × 10¹¹ eV⁻¹ cm⁻², and a smaller hysteresis voltage of ∼4 mV than the other conditions. We attribute this behavior to the Ti incorporated into the Tm₂O₃ film improving the interfacial layer and the surface roughness. This film also shows negligible degrees of charge trapping at high electric field stress.     

Theoretical investigation of optical spectra and covalent effect of Cr in Y2Ti2O7 and Y2Sn2O7

In this work, the complete matrix of optical spectral levels in trigonal symmetry of 3d² (3d⁸) ions are established on basis of strong field coupling mechanism by using two spin–orbit coupling parameters model. The contribution of the spin–orbit coupling of ligand to the optical spectra has been included in these formulas. As an application, the optical spectra of Cr⁴⁺ in Y₂Ti₂O₇ and Y₂Sn₂O₇ have been studied by the complete diagonalization (energy matrix) method. The covalent effect has been studied and the difficulty about Dq parameter in explanation of optical spectra of Cr-doped Y₂Ti₂O₇ and Y₂Sn₂O₇ is removed. The theoretical results are in good agreement with observed data.     

CaCu3Ti4O12陶瓷的微观结构和电学性能

利用传统的固相反应工艺，在不同的烧结温度下制备了一系列的CaCu₃Ti₄O₁₂陶瓷样品，考察了其微观结构以及介电和复阻抗方面的电学性质.研究发现这些样品在微观结构方面可分为三种类型，高介电性与微观结构有着密切的关联性.室温下，样品的低频介电常数随陶瓷晶粒尺寸的增大而提高.随着测试温度的升高，不同微观结构类型的样品呈现出不同的电学性质的变化，但其中也存在着一些相同的特征.高温下，介电频谱呈现出一个低频介电响应和两个类Debye型弛豫色散，复阻抗谱呈现出三个Cole-Cole半圆弧.将实验上观测到的电学性质的起因归于陶瓷多晶微结构中的晶畴、晶界和晶粒内的缺陷. 关键词： 3Ti₄O₁₂')" href="#">CaCu₃Ti₄O₁₂ 微观结构 电学性质     

Structural properties and electrical characteristics of high-k Dy2O3 gate dielectrics

This paper describes the structural properties and electrical characteristics of thin Dy₂O₃ dielectrics deposited on silicon substrates by means of reactive sputtering. The structural and morphological features of these films after postdeposition annealing were studied by X-ray diffraction and X-ray photoelectron spectroscopy. It is found that Dy₂O₃ dielectrics annealed at 700 °C exhibit a thinner capacitance equivalent thickness and better electrical properties, including the interface trap density and the hysteresis in the capacitance-voltage curves. Under constant current stress, the Weibull slope of the charge-to-breakdown of the 700 °C-annealed films is about 1.6. These results are attributed to the formation of well-crystallized Dy₂O₃ structure and the reduction of the interfacial SiO₂ layer.     

Synthesis of Gd2Ti2O7:Eu, V phosphors by sol-gel process and its luminescent properties

A red-emitting phosphor material, Gd₂Ti₂O₇:Eu³⁺, V⁴⁺, by added vanadium ions is synthesized using the sol-gel method. Phosphor characterization by high-resolution transmission electron microscopy shows that the phosphor possesses a good crystalline structure, while scanning electron microscopy reveals a uniform phosphor particle size in the range of 230-270 nm. X-ray photon electron spectrum analysis demonstrates that the V⁴⁺ ion promotes an electron dipole transition of Gd₂Ti₂O₇:Eu³⁺ phosphors, causing a new red-emitting phenomenon, and CIE value shifts to x=0.63, y=0.34 (a purer red region) from x=0.57, y=0.33 (CIE of Gd₂Ti₂O₇:Eu³⁺). The optimal composition of the novel red-emitting phosphor is about 26% of V⁴⁺ ions while the material is calcinated at 800  °C. The results of electroluminescent property of the material by field emission experiment by CNT-contained cathode agreed well with that of photoluminescent analysis.     

Theoretical calculations of the optical band positions and spin-Hamiltonian parameters for Cr ions in Y2Ti2O7 crystal

The optical band positions and spin-Hamiltonian parameters (g factors g_g_? and zero-field splitting D) for the trigonal Cr³⁺ centers in Y₂Ti₂O₇ crystal are calculated from the complete diagonalization (of energy matrix) method based on the two-spin-orbit-parameter model. In the calculations, the contributions to spectral data from both the spin-orbit parameter of central dⁿ ion and that of ligand ion are considered and the crystal field parameters used are estimated from the superposition model. The calculated results are in reasonable agreement with the experimental values. The defect structures of Cr³⁺ center is suggested.     

Mo掺杂SrBi4Ti4O15陶瓷的铁电介电性能

用传统的固相烧结工艺，制备了钼掺杂铁电陶瓷样品SrBi₄Ti₄O₁₅(SBTi)铁电陶瓷SrBi_4-2x/3Ti_4-xMo_xO₁₅(x=0.00，0.003，0.012，0.03，0.06，0.09).X射线衍射的结果表明，样品均为单一的层状钙钛矿结构相，Mo掺杂未改变SBTi的晶体结构.通过扫描电子显微镜观测发现，样品晶粒为片状，随掺杂量的增加，晶粒逐 关键词： 4Ti₄O₁₅')" href="#">SrBi₄Ti₄O₁₅ Mo掺杂 剩余极化 居里温度