Taking snapshots of photoexcited molecules in disordered media by using pulsed synchrotron X-rays

Photoexcited molecules are quintessential reactants in photochemistry. Structures of these photoexcited molecules in disordered media in which a majority of photochemical reactions take place remained elusive for decades owing to a lack of suitable X-ray sources, despite their importance in understanding fundamental aspects in photochemistry. As new pulsed X-ray sources become available, short-lived excited-state molecular structures in disordered media can now be captured by using laser-pulse pump, X-ray pulse-probe techniques of third-generation synchrotron sources with time resolutions of 30-100 ps, as demonstrated by examples in this review. These studies provide unprecedented information on structural origins of molecular properties in the excited states. By using other ultrafast X-ray facilities that will be completed in the near future, time-resolution for the excited-state structure measurements should reach the femtosecond time scales, which will make "molecular movies" of bond breaking or formation, and vibrational relaxation, a reality.     

Time‐Resolved Synchrotron Radiation Excited Optical Luminescence: Light‐Emission Properties of Silicon‐Based Nanostructures

The recent advances in the study of light emission from matter induced by synchrotron radiation: X‐ray excited optical luminescence (XEOL) in the energy domain and time‐resolved X‐ray excited optical luminescence (TRXEOL) are described. The development of these element (absorption edge) selective, synchrotron X‐ray photons in, optical photons out techniques with time gating coincide with advances in third‐generation, insertion device based, synchrotron light sources. Electron bunches circulating in a storage ring emit very bright, widely energy tunable, short light pulses (<100 ps), which are used as the excitation source for investigation of light‐emitting materials. Luminescence from silicon nanostructures (porous silicon, silicon nanowires, and Si–CdSe heterostructures) is used to illustrate the applicability of these techniques and their great potential in future applications.     

Characterization of trace embedded impurities in thin multilayer structures using synchrotron X‐ray standing waves

X‐ray standing wave (XSW) field generated under Bragg reflection condition in a periodic Mo/Si multilayer structure has been used to determine the concentration and location of various trace element contaminants embedded in different layers of that multilayer structure. We have used intense synchrotron X rays for XSW analysis. It is observed that various trace element impurities such as Cr, Fe, Ni and W get embedded unintentionally in the multilayer structure during the deposition process. Consequences of such impurity incorporation on the optical properties of the multilayer structure are discussed in hard and soft X‐ray regions. Present measurements are important in order to optimize the deposition methods on one hand and to better correlate the measured optical properties of a multilayer structure with theoretical models on the other. Copyright © 2010 John Wiley & Sons, Ltd.     

XPS与UPS测量几种材料功函数的比较

为比较X射线光电子能谱(XPS)与紫外光电子能谱(UPS)测量材料功函数结果间的差异,依次对经氩离子清洁表面吸附层的Au、Ag薄膜样品和单晶硅片,以及未进行表面清洁的Au、Ag、MoO_3薄膜样品,单晶硅片及ITO导电玻璃的功函数进行测量。给出了XPS和UPS测量功函数的计算方法,并探讨了影响材料功函数测量结果不确定性的因素。研究发现XPS及UPS在测量表面清洁的金属样品时,测量结果基本一致,具有较高的准确度,表面清洁的Au、Ag样品一经暴露空气后其表面覆盖一层吸附层,功函数很快发生变化。利用UPS或XPS测量金属和半导体的功函数时应避免暴露空气,若金属样品在空气中暴露时建议使用氩离子清洁表面。研究结果对科研人员按实际测试需求合理选择测量方法具有一定的指导意义。     

The investigation of NbO2 and Nb2O5 electronic structure by XPS,UPS and first principles methods

In this paper, the electronic structures of NbO₂ and Nb₂O₅ are theoretically and experimentally analyzed. The oxides in the samples are mainly consisted of NbO₂ and NbO, whereas the outmost layer of the samples is NbO₂. After exposure to air, the outermost layer on all niobium samples is Nb₂O₅. The photoelectrons from the first 2–4 Å contribute to the spectra, so the valence band structure of NbO₂ and Nb₂O₅ can be confirmed from ultraviolet photoelectron spectroscopy (UPS). By comparing the UPS with density of state results, the electronic structure of NbO₂ and Nb₂O₅ can be distinguished from each other, and then the electronic structure was deconvoluted into several electronic states. The agreement between experimental result and theory is, in the best case, satisfactory. Copyright © 2013 John Wiley & Sons, Ltd.     

Interlaboratory study comparing analyses of simulated angle‐resolved X‐ray photoelectron spectroscopy data

An interlaboratory study has been conducted to determine the following: (i) the similarities and differences of film thicknesses and composition profiles obtained from analyses of simulated angle‐resolved X‐ray photoelectron spectroscopy (ARXPS) data by different analysts using different algorithms for data analysis, and (ii) the effects of two assumptions commonly made in data‐analysis algorithms for ARXPS on derived film thicknesses and composition profiles. The analyzed data were generated by the National Institute of Standards and Technology Database for the Simulation of Electron Spectra for Surface Analysis, (SESSA) which provides a simple way to study the influence of the aforementioned effects on compositional depth profile reconstruction. Sets of simulated ARXPS data were produced for thin films of SiO₂, SiON, HfO₂, and HfON of varying thicknesses on a Si substrate. For some HfON films, the N concentration varied with depth. Eleven groups participated in the round robin study. The majority (eight) employed a commercial ARXPS instrument in which the angular distribution is measured for a fixed sample geometry, in contrast to conventional ARXPS in which the sample is tilted for angular variation. The average deviations between the reported average depth, film thickness, and amount of material typically varied between 20% and 30% but were considerably larger, between 30% and 80%, for some cases. The average errors were generally larger for simulations that included elastic scattering and the finite analyzer‐acceptance angle (realistic conditions) than those for simulations that neglected elastic scattering and the finite analyzer‐acceptance angle (simplified conditions). The retrieved N depth profiles were quantitatively different from the true depth profiles and showed substantial variability among the group of members who used the same instrument and analysis software. Copyright © 2014 John Wiley & Sons, Ltd.     

高分辨脉冲场致电离光电子谱

本文介绍高分辨光电子谱的发展概况, 简要说明阈值光电子谱和脉冲场致电离光电子谱的工作原理及研究进展, 着重阐述了用同步辐射光源获得高分辨光电子谱的最新研究结果。     

Structure and growth of oxides on polycrystalline nickel surfaces

The oxidation of polycrystalline nickel (Ni) metal surfaces after exposure to oxygen gas (O₂) at 25 and 300 °C and pressures near 130 Pa, was studied using X‐ray photoelectron spectroscopy (XPS). Oxide structures involving both divalent (Ni²⁺) and trivalent (Ni³⁺) species could be distinguished using Ni 2p spectra, while surface adsorbed O₂ and atomic oxygen (O) species could be differentiated from bulk oxide (O^2?) using O 1s spectra. Oxide thicknesses and distributions were determined using QUASES^?, and the average oxide thickness was verified using the Strohmeier formula. The reaction kinetics for oxide films grown at 300 °C followed a parabolic mechanism, with an oxide thickness of greater than 4 nm having formed after 60 min. Exposure at 25 °C followed a direct logarithmic mechanism with an oxide growth rate about four to five times slower than at 300 °C. Reaction of a Ni (100) single crystal under comparable conditions showed much slower reaction rates compared to polycrystalline specimens. The higher reaction rate of the polycrystalline materials is attributed to grain boundary transport of Ni cations. Oxide thickness was measured on a microscopic scale for polycrystalline Ni exposed to large doses of O₂ at 25 and 300 °C. The thickness of oxide was not strongly localized on this scale. However, the QUASES^? analysis suggests that there is localized growth on a nanometric scale—the result of island formation. Copyright © 2007 John Wiley & Sons, Ltd.     

XPS characterisation of carbon‐coated alumina support

Hybrid carbon–alumina supports, synthesised by pyrolysis of grafted 4,4′‐methylenebis‐(phenylisocyanate) moiety on the alumina surface, were characterised by X‐ray photoelectron spectroscopy. The recorded Al 2p and C 1s envelopes showed asymmetry that decreased with an increase in carbon loading. In all experimental Al 2p envelopes, the high‐energy individual components at 75.3–75.9 eV were present along with the low‐energy component at 74.0 eV typical for Al₂O₃. In the case of the C 1s envelope, the component around 284.3–284.4 eV and three high‐energy individual components at 285.9–286.0, 288.0–288.3 and 290.1–290.6 eV were observed. The presence of the high‐energy Al 2p components can be explained considering the occurrence of a steady‐state charging of the different parts of insulating alumina supports. The component around 284.3–284.4 eV in C 1s envelopes can be attributed to carbon, which constitutes the coating and, hence, ensures surface conductivity. The component around 285.9–286.0 eV is connected with carbon in carbonaceous surface species, which do not form the conducting layer on the alumina support. Carbonaceous surface species associated with C? O, C?O and O?C? O groups in carbon coating can be also identified due to the presence of corresponding components in XPS spectra at 285.9–286.0, 288.0–288.3 and 290.1–290.6 eV. Copyright © 2006 John Wiley & Sons, Ltd.     

Towards a Molecular Understanding of Cation–Anion Interactions—Probing the Electronic Structure of Imidazolium Ionic Liquids by NMR Spectroscopy,X‐ray Photoelectron Spectroscopy and Theoretical Calculations

Ten [C₈C₁Im]⁺ (1‐methyl‐3‐octylimidazolium)‐based ionic liquids with anions Cl^?, Br^?, I^?, [NO₃]^?, [BF₄]^?, [TfO]^?, [PF₆]^?, [Tf₂N]^?, [Pf₂N]^?, and [FAP]^? (TfO=trifluoromethylsulfonate, Tf₂N=bis(trifluoromethylsulfonyl)imide, Pf₂N=bis(pentafluoroethylsulfonyl)imide, FAP=tris(pentafluoroethyl)trifluorophosphate) and two [C₈C₁C₁Im]⁺ (1,2‐dimethyl‐3‐octylimidazolium)‐based ionic liquids with anions Br^? and [Tf₂N]^? were investigated by using X‐ray photoelectron spectroscopy (XPS), NMR spectroscopy and theoretical calculations. While ¹H NMR spectroscopy is found to probe very specifically the strongest hydrogen‐bond interaction between the hydrogen attached to the C² position and the anion, a comparative XPS study provides first direct experimental evidence for cation–anion charge‐transfer phenomena in ionic liquids as a function of the ionic liquid’s anion. These charge‐transfer effects are found to be surprisingly similar for [C₈C₁Im]⁺ and [C₈C₁C₁Im]⁺ salts of the same anion, which in combination with theoretical calculations leads to the conclusion that hydrogen bonding and charge transfer occur independently from each other, but are both more pronounced for small and more strongly coordinating anions, and are greatly reduced in the case of large and weakly coordinating anions.     

XPS and resistive studies on thin films of a copper(II)‐based coordination polymer deposited on functionalized interdigital electrodes

A symmetrical 2‐thiopyrimidine based molecule with an expanded π‐electron system is synthesized and used to form a self‐assembled monolayer (SAM) on gold surfaces. Utilizing chemical vapor deposition a monolayer of (3‐mercaptopropyl)triethoxysilane is formed on silicon dioxide substrates. Both of these SAM coated substrates are characterized by X‐ray photoelectron spectroscopy and the growth of a coordination polymer built up from 5,5′‐(ethyne‐1,2‐diyl)bis(2‐hydroxyacetophenone) and copper(II) on dual SAM coated transducers is studied. After the deposition procedure on interdigital electrodes the electrical properties of the polymer are investigated performing resistive measurements. A significant change of the resistance, which depends on the surrounding atmosphere, proves the sensing behavior of the synthesized coordination polymer. © 2014 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2015 , 53, 335–344     

Differentiating calcium carbonate polymorphs by surface analysis techniques—an XPS and TOF‐SIMS study

Calcium carbonate has evoked interest owing to its use as a biomaterial, and for its potential in biomineralization. Three polymorphs of calcium carbonate, i.e. calcite, aragonite, and vaterite were synthesized. Three conventional bulk analysis techniques, Fourier transform infrared (FTIR), X‐ray diffraction (XRD), and SEM, were used to confirm the crystal phase of each polymorphic calcium carbonate. Two surface analysis techniques, X‐ray photoelectron spectroscopy (XPS) and time‐of‐flight secondary ion mass spectroscopy (TOF‐SIMS), were used to differentiate the surfaces of these three polymorphs of calcium carbonate. XPS results clearly demonstrate that the surfaces of these three polymorphs are different as seen in the Ca(2p) and O(1s) core‐level spectra. The different atomic arrangement in the crystal lattice, which provides for a different chemical environment, can explain this surface difference. Principal component analysis (PCA) was used to analyze the TOF‐SIMS data. Three polymorphs of calcium carbonate cluster into three different groups by PCA scores. This suggests that surface analysis techniques are as powerful as conventional bulk analysis to discriminate calcium carbonate polymorphs. Copyright © 2008 John Wiley & Sons, Ltd.     

Soft X‐ray emission electron microscopy: chemical state microscopy from interface and bulk

Scanning electron microscopy (SEM) has long been a workhorse of materials science and provides information on morphology, structure and elemental composition. However, information as to the chemical state of the elements is only available for deep lying core levels of the heavy elements and not the light elements. Whilst considerable advances have been made in high‐resolution wavelength dispersive spectroscopy (WDS) and energy dispersive spectroscopy (EDS), electron microscopy in the soft X‐ray region of ≈ 50–1500 eV is lacking. We present first results for a combined instrument of a soft X‐ray emission (SXE) spectrometer together with a spatially resolving (<100 nm) electron gun. Copyright © 2008 John Wiley & Sons, Ltd.     

Characterization of chromate conversion film on tinplate substrate by XPS and electrochemistry methods

The chromate conversion coating formed on commercial tinplate via a cathode electrolytic dichromate treatment has been studied by X‐ray photoelectron spectroscopy (XPS) and electrochemistry methods. Through the analysis of the XPS, it was shown that there existed Cr, O, and Sn in the chromate coating and the chromate film consisted mainly of Cr(OH)₃, Cr₂O₃, Sn, and SnO_x. The current density decreased with increasing of the electric charge. The corrosion resistance for tinplate is relative with the content of chromium in the passivation film. Copyright © 2009 John Wiley & Sons, Ltd.     

Summary of ISO/TC 201 standard: XVIII,ISO 19318:2004—surface chemical analysis—X‐ray photoelectron spectroscopy—Reporting of methods used for charge control and charge correction

International Standard ISO 19318 specifies the minimum amount of information describing the methods of charge control and charge correction in measurements of core‐level binding energies for insulating specimens by x‐ray photoelectron spectroscopy, which is to be reported with the analytical results. Information is also provided on methods that have been found useful for charge control and charge correction in the measurement of binding energies. Copyright © 2005 John Wiley & Sons, Ltd.     

XPS investigations of ink‐jet printed paper

Different ink‐jet printed paper materials were investigated using X‐ray photoelectron spectroscopy (XPS) yielding the elemental composition of the near‐surface region of the papers. We found significant differences with respect to the detected elements and their atomic concentrations in the different inks studied here. Two different groups of inks could be identified by means of a lower ratio of the O and C atomic concentrations and lower concentrations in specific trace elements like Mg, Na and Si. High‐resolution spectra of C 1s and O 1s core levels allowed a detailed determination of the chemical state of the respective elements. On the basis of a detailed deconvolution of these XPS signals, significant differences between all the investigated ink‐jet printed papers were found, thereby allowing their discrimination. The applicability of the measurements and, more generally, the XPS technique for forensic investigations of paper are discussed. Copyright © 2007 John Wiley & Sons, Ltd.     

CO and methanol adsorption on (2 × 1)Pt(110) and ion‐eroded Pt(111) model catalysts

Methanol adsorption on ion‐sputtered Pt(111) surface exhibiting high concentration of vacancy islands and on (2 × 1)Pt(110) single crystal were investigated by means of photoelectron spectroscopy (PES) and thermal desorption spectroscopy. The measurements showed that methanol adsorbed at low temperature on sputtered Pt(111) and on (2 × 1)Pt(110) surfaces decomposed upon heating. The PES data of methanol adsorption were compared to the data of CO adsorbed on the same Pt single crystal surfaces. In the case of the sputtered Pt(111) surface, the dehydrogenation of H_xCO intermediates is followed by the CO bond breakage. On the (2 × 1)Pt(110) surface, carbon monoxide, as product of methanol decomposition, desorbed molecularly without appearance of any traces of atomic carbon. By comparing both platinum surfaces we conclude that methanol decomposition occurs at higher temperature on sputtered Pt(111) than on (2 × 1)Pt(110). Copyright © 2010 John Wiley & Sons, Ltd.