Cleaning and hydrophilization of atomic force microscopy silicon probes

The silicon surface of commercial atomic force microscopy (AFM) probes loses its hydrophilicity by adsorption of airborne and package-released hydrophobic organic contaminants. Cleaning of the probes by acid piranha solution or discharge plasma removes the contaminants and renders very hydrophilic probe surfaces. Time-of-flight secondary-ion mass spectroscopy and X-ray photoelectron spectroscopy investigations showed that the native silicon oxide films on the AFM probe surfaces are completely covered by organic contaminants for the as-received AFM probes, while the cleaning methods effectively remove much of the hydrocarbons and silicon oils to reveal the underlying oxidized silicon of the probes. Cleaning procedures drastically affect the results of adhesive force measurements in water and air. Thus, cleaning of silicon surfaces of the AFM probe and sample cancelled the adhesive force in deionized water. The significant adhesive force values observed before cleaning can be attributed to formation of a bridge of hydrophobic material at the AFM tip-sample contact in water. On the other hand, cleaning of the AFM tip and sample surfaces results in a significant increase of the adhesive force in air. The presence of water soluble contaminants at the tip-sample contact lowers the capillary pressure in the water bridge formed by capillary condensation at the AFM tip-sample contact, and this consequently lowers the adhesive force.     

Analytical methods to derive the elastic modulus of soft and adhesive materials from atomic force microcopy force measurements

We present new DMT‐based and JKR‐based methods to derive the elastic modulus of sample surfaces from an atomic force microscope force‐distance curve (DMT: Derjaguin‐Muller‐Toporov, JKR: Johnson–Kendall–Roberts). Application of the methods to the Maugis–Dugdale curves revealed that the JKR‐based method determines very accurate moduli for Maugis' transitional parameter λ > 0.3; however, the DMT‐based method generally estimates much less accurate moduli. The new JKR‐based method has advantages over the two‐point method, which has been often used for the JKR analysis, in capabilities to select the fitting range and to involve more than two points in curve fitting. Utilizing the advantages, for example, one can limit the fitting range to the attractive force zone to reduce the contact area of soft and adhesive materials. The method consists of algebraical calculation and optionally linear fitting; hence, the computational cost is low enough to be applicable to a real‐time JKR analysis method of fast force mapping. The detailed procedure of the method is explained using a force‐distance curve on a poly(dimethylsiloxane) surface. The advantages of the method are demonstrated using a force mapping data on a vulcanized rubber blend. © 2019 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2019 , 57, 1279–1286     

The quest for the best nonpolarizable water model from the adaptive force matching method

The recently introduced adaptive force matching (AFM) method is used to develop a significantly improved pair‐wise nonpolarizable potential for water. A rigid version of the potential is also presented to enable larger time steps for biological simulations. In this work, it is demonstrated that the AFM method can be used to systematically assess the importance of each functional term during the construction of a force field. For a water potential, it is established that a single off‐atom charge center (M) in the plane of water outperforms two out‐of‐plane charge sites for reproducing intermolecular forces. The four‐site pair‐wise nonpolarizable force field developed in this work rivals some of the most sophisticated polarizable models in terms of reproducing accurate ab initio forces. The force fields are parameterized to perform best in the temperature range from 0 to 40°C. Equilibrium and dynamical properties calculated with the flexible and rigid force fields are in good agreement with experimental results. For the flexible model, the agreement improves when path integral simulation is performed. These force fields provide high‐quality results at a very low computational cost and are thus well suited to atomistic scale biological simulations. The AFM method provides a mechanism for selecting important terms in force field expressions and is a very promising tool for producing accurate force fields in condensed phases. © 2010 Wiley Periodicals, Inc. J Comput Chem, 2011     

Atomic force microscopy and transmission electron microscopy of cellulose from Micrasterias denticulata; evidence for a chiral helical microfibril twist

Atomic force microscopy (AFM), tapping mode atomic force microscopy (TM-AFM) and transmission electron microscopy (TEM) have been used to image the cell wall, ultrathin sections of whole cells and cellulose microfibrils prepared from the green alga Micrasterias denticulata. Measurements of the microfibril dimensions are in agreement with earlier observations carried out by electron microscopy. Images at the molecular level of the surface of the microfibrils were obtained with AFM and show regular periodicities along the microfibril axis that correspond to the fibre and glucose repeat distances of cellulose. Twisted regions visible at intervals along the microfibrils dried down onto substrates were noted to be right-handed in over 100 observations by TEM, AFM and TM-AFM. This revised version was published online in August 2006 with corrections to the Cover Date.     

Characterization of elastomeric blends by atomic force microscopy

The bulk mechanical properties of a blend of elastomers are found to depend on the micro and nano scale morphology of the phases of the materials in the blend. In this study, we examine the phase morphology of blends of incompatible elastomers using Atomic Force Microscopy (AFM). Specifically, nanoindentation and Tapping Mode AFM (TMAFM) imaging techniques are used as experimental tools for mapping the composition of unfilled elastomeric blends. Depending on the composition of the blend, either co‐continuous or discontinuous domain/matrix morphology is observed. To identify the different components in bromobutyl (BIIR)/natural rubber (NR) blends, nanoscale indentation measurements were made on the observed phase‐separated regions. Results from force mode AFM and mechanical measurements of bulk NR and BIIR are used to assist in the interpretation of the TMAFM results for the BIIR/NR blends. © 2005 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 44: 492–503, 2006     

Determination of solid surface tension from particle-substrate pull-off forces measured with the atomic force microscope

Atomic force microscopy (AFM) is capable of solid surface characterization at the microscopic and submicroscopic scales. It can also be used for the determination of surface tension of solids (gamma) from pull-off force (F) measurements, followed by analysis of the measured F values using contact mechanics theoretical models. Although a majority of the literature gamma results was obtained using either Johnson-Kendall-Roberts (JKR) or Derjaguin-Muller-Toporov (DMT) models, re-analysis of the published experimental data presented in this paper indicates that these models are regularly misused. Additional complication in determination of gamma values using the AFM technique is that the measured pull-off forces have poor reproducibility. Reproducible and meaningful F values can be obtained with strict control over AFM experimental conditions during the pull-off force measurements (low humidity level, controlled and known loads) for high quality substrates and probes (surfaces should be free of heterogeneity, roughness, and contamination). Any probe or substrate imperfections complicate the interpretation of experimental results and often reduce the quality of the generated data. In this review, surface imperfection in terms of roughness and heterogeneity that influence the pull-off force are analyzed based upon the contact mechanics models. Simple correlations are proposed that could guide in selection and preparation of AFM probes and substrates for gamma determination and selection of loading conditions during the pull-off force measurements. Finally, the possibility of AFM measurements of solid surface tension using materials with rough surfaces is discussed.     

Influence of attractive force on imaging micro‐droplets of water by atomic force microscope

The shape of micro‐droplets of water on a pure copper surface was investigated using the a.c. non‐contact mode of an atomic force microscope (AFM) by applying different attractive forces between the cantilever tip and the liquid surface. The forces largely influenced the observed radii of micro‐droplets; the influence can be reduced significantly by reducing the force. The same attractive force between the cantilever tip and the micro‐droplets is necessary when comparing the contact angles of micro‐droplets on different surfaces. Furthermore, the values of the contact angles of the micro‐droplets should be the average of those on at least four sides of the droplets. Copyright © 2005 John Wiley & Sons, Ltd.     

Shear banding in strained semicrystalline polyamide 6 films as revealed by atomic force microscopy: Role of the amorphous phase

Atomic force microscopy (AFM) has been used to visualize the plastic deformation mechanisms that are responsible for the yielding of semicrystalline polymers of low degree of crystallinity (<50%). Indeed, AFM, if operated in suitable conditions, is able to image both the amorphous and the crystalline phases. Polyamide 6 films have been drawn at temperatures T < 160 °C. Postmortem AFM observations show that, at yield, shear bands nucleate and propagate in the amorphous phase. They cross the crystalline lamellae and run over the whole surface of the sample. By crossing the lamellae, they form nanoblocks of uniform size. Neither the size of the nanoblocks nor the angle between the tensile axis and the shear bands can be explained in terms of crystal plasticity. © 2004 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 42: 687–701, 2004     

Comparative characterisation by atomic force microscopy and ellipsometry of soft and solid thin films

Ellipsometry and atomic force microscopy (AFM) were used to study the film thickness and the surface roughness of both ‘soft’ and solid thin films. ‘Soft’ polymer thin films of polystyrene and poly(styrene–ethylene/butylene–styrene) block copolymer were prepared by spin‐coating onto planar silicon wafers. Ellipsometric parameters were fitted by the Cauchy approach using a two‐layer model with planar boundaries between the layers. The smooth surfaces of the prepared polymer films were confirmed by AFM. There is good agreement between AFM and ellipsometry in the 80–130 nm thickness range. Semiconductor surfaces (Si) obtained by anisotropic chemical etching were investigated as an example of a randomly rough surface. To define roughness parameters by ellipsometry, the top rough layers were treated as thin films according to the Bruggeman effective medium approximation (BEMA). Surface roughness values measured by AFM and ellipsometry show the same tendency of increasing roughness with increased etching time, although AFM results depend on the used window size. The combined use of both methods appears to offer the most comprehensive route to quantitative surface roughness characterisation of solid films. Copyright © 2007 John Wiley & Sons, Ltd.     

Localisation and quantification of potential binding sites for compatibilisers on soft‐ and hardwood in wood–plastic composite systems

Chemical force microscopy (CFM) was used to characterise the surface of pine and beefwood with atomic force microscopy (AFM) tips coated with different compatibilisers. With the resulting force images, potential binding sites for compatibilisers, used in wood–plastic composites (WPC) to enhance adhesion between two relatively incompatible phases, were localised and quantified. Tips were coated with two commercially available polymers namely ethylene vinyl alcohol (EVOH) and polyethylene‐grafted maleic anhydride (PE‐g‐MA). It could be observed that the interaction forces between the EVOH coated tip and the wood surface was highly species sensitive, whereas adhesive forces measured between the PE‐g‐MA coated tip and the wood surface were comparable for both wood species. The force maps show that wood species differ in the distribution of functional groups, and the force histograms show that the frequency distribution of the adhesive forces varied for the two wood species. The adhesive force maps clearly show a difference between wood/compatibiliser systems, and the differences can be related to the chemical composition of the wood species. The results confirm that not all compatibilisers are equally suitable for all wood species and these results were confirmed by mechanical tensile tests of WPC systems in a related study. Copyright © 2016 John Wiley & Sons, Ltd.     

Effect of cooperativity on the O-H stretching force constant in associated water species

CNDO/force calculations have been employed to calculate the O-H stretching force constants for various structures of associated water species such as water-dimethylether, water-acetonitrile, water-lithium fluoride, linear and cyclic water polymers. The variation in the O-H stretching force constant in A_m… O-H… D_n species where A_m and D_n represent, respectively,m number of electron-acceptor andn number of electron-donor molecules, is explained on the basis of the cooperativity effect. With increasing electron-acceptor power of A and electron-donor power of D, the hydrogen-bonded O-H stretching force constant is significantly reduced. The results obtained in these studies are in general agreement with experimental observations reported earlier.     

Facile measurement of polymer film thickness ranging from nanometer to micrometer scale using atomic force microscopy

As many properties of polymer thin films critically depend on their thickness, a convenient and cost‐effective method for precise measurement of film thickness in a wide range is highly desirable. Here, we present a method which enables polymer film thickness, ranging from nanometer to micrometer scale, to be facilely determined by measuring the height of an artificially created film step on smooth substrates with atomic force microscopy (AFM). Three polymeric films (polystyrene, poly(methyl methacrylate) and poly(styrene–ethylene/butylene–styrene) films), spin‐coated on either mica or quartz substrate with thickness ranging from 5.7 nm to 4.4 µm, were employed to demonstrate the procedure and feasibility of our method. The proposed method is particularly suitable for thicker polymer films, thus complementing the traditional AFM ‘tip‐scratch’ method which is generally limited to polymer films of no more than 100 nm thickness. Copyright © 2010 John Wiley & Sons, Ltd.     

Measurement of the flexibility of wet cellulose fibres using atomic force microscopy

Flexibility and modulus of elasticity data for two types of wet cellulose fibres using a direct force–displacement method by means of AFM are reported for never dried wet fibres immersed in water. The flexibilities for the bleached softwood kraft pulp (BSW) fibres are in the range of 4–38 × 10¹² N^?1 m^?2 while the flexibilities for the thermomechanical pulp (TMP) fibres are about one order of magnitude lower. For BSW the modulus of elasticity ranges from 1 to 12 MPa and for TMP between 15–190 MPa. These data are lower than most other available pulp fibre data and comparable to a soft rubber band. Reasons for the difference can be that our measurements with a direct method were performed using never dried fibres immersed in water while other groups have employed indirect methods using pulp with different treatments.     

Direct visualization of the nanoscopic three‐phase structure and stiffness of NBR/PVC blends by AFM nanomechanical mapping

The PeakForce Quantitative Nanomechanical Mapping based on atomic force microscope (AFM) is employed to first visualize and then quantify the elastic properties of a model nitrile rubber/poly(vinyl chloride) (NBR/PVC) blend at the nanoscale. This method allows us to consistently observe the changes in mechanical properties of each phase in polymer blends. Beyond measuring and discriminating elastic modulus and adhesion forces of each phase, we tune the AFM tips and the peak force parameters in order to reliably image samples. In view of viscoelastic difference in each phase, a three‐phase coexistence of an unmixed NBR phase, the mixed phase, and PVC microcrystallites is directly visualized in NBR/PVC blends. The nanomechanical investigation is also capable of recognizing the crosslinked rubber phase in cured rubber. The contribution of the mixed phase was quantified and it was found that the mechanical properties of blends are mainly determined by the homogeneity and stiffness of the mixed phase. This study furthers our understanding the structure–mechanical property relationship of thermoplastic elastomers, which is important for their potential design and applications. © 2019 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2019 , 57, 662–669     

Probing the modifications of polystyrene surface properties after incubation with the Shewanella putrefaciens bacteria at two pH values (4, 10) by atomic force microscopy

The local surface properties of polystyrene (PS) dishes incubated for 14 h with gram‐negative cells (Shewanella putrefaciens) were investigated by atomic force microscopy (AFM) in aqueous solutions at two pH values (4 and 10). The AFM images and force curves revealed the presence of a polymeric layer adsorbed onto the PS surfaces in acid media. In contrast, no evolution was observed in the case of basic media. Copyright © 2007 John Wiley & Sons, Ltd.     

Bulk phase separation study by atomic force microscope friction imaging of natural rubber/poly(methyl methacrylate) film

The first observation of bulk phase separation in immiscible natural rubber (NR)/poly(methyl methacrylate) (PMMA) film using atomic force microscopy (AFM) is reported. Three different forms of AFM measurements: topographic, friction force imaging, and nanoindentation have been effectively used to investigate combined morphological and compositional mapping of the NR/PMMA system. The fracture temperature during sample microtoming and material physical properties could be responsible for the observed topographic contrast. The stronger contrast of friction imaging, relative to topographic imaging, is ascribed to local variations in mechanical properties of the phase-separated domains. Friction force imaging associated with nanoindentation response, performed under AFM force mode, highlights the AFM's ability for probing local friction, adhesion, and elastic properties, and for compositional mapping of heterogeneous polymer film. The resulting friction force imaging along with the response of the nanoindentation are in good agreement, indicating that PMMA exists mainly near the modified NR surface.     

Stretched polymer surfaces: Atomic force microscopy measurement of the surface deformation and surface elastic properties of stretched polyethylene

The surface structure and surface mechanical properties of low‐ and high‐density polyethylene were characterized by atomic force microscopy (AFM) as the polymers were stretched. The surfaces of both materials roughened as they were stretched. The roughening effect is attributed to deformation of nodular structures, related to bulk spherulites, at the surface. The surface‐roughening effect is completely reversible at tensile strains in the elastic regime and partially reversible at tensile strains in the plastic regime until the polymers are irreversibly drawn into fibers. AFM force versus distance interaction curves, used to measure changes in the stiffness of the surface and the surface elastic modulus as a function of elongation, show that the surfaces become softer as the polymers are drawn into fibers at high strains. At low elastic strains, however, the surface elastic modulus of HDPE increases—attributed to elastic energy stored by the amorphous regions. © 2001 John Wiley & Sons, Inc. J Polym Sci Part B: Polym Phys 39: 2263–2274, 2001     

An atomic force microscopy study of asphaltenes on mica surfaces. Influence of added resins and demulsifiers

 Monolayers of asphaltene and resins on the water surface have been transferred at a surface pressure of 10 mN/m onto mica substrates using the Langmuir–Blodgett technique. Atomic force microscopy (AFM) has been used to examine the topography of these layers. Monolayers consisting of pure asphaltene fractions provide a rigid film with a close-packed structure, while the resins build up a continuous open network. Mixed films of these two fractions show that a gradual increase in resin concentration leads to an opening of the rigid asphaltene structure towards a more resin like configuration. Increased aggregation when the two heavy functions are present in one film is seen as larger individual units in the AFM pictures. Addition of high-molecular-weight demulsifiers/inhibitors results in the same kind of influence on the asphaltene film as seen with the resins. Received: 30 April 1999 Accepted: 29 November 1999     

Use of atomic force microscopy and fractal geometry to characterize the roughness of nano-, micro-, and ultrafiltration membranes

Membrane surface roughness alters the surface area accessible to foulants and may influence macroscopic properties, such as zeta potential. It is usually quantified by atomic force microscopy (AFM) at a single scan size. This would be appropriate if roughness is independent of scale. This study shows that the root-mean-square roughness, R_RMS, is scale (or scan size, L × L) dependent through the power law R_RMS = AL^3−D. The coefficient, A, is the roughness at a scan size of 1² μm². D is the fractal dimension that relates the increase in roughness to the increase in scan size. Values for A and D were determined for a range of micro- and ultrafiltration membranes using an AFM scan series covering at least three orders of magnitude in L. They were also determined for nanofiltration membranes by re-analysis of data in the literature. The results suggest that using the power law expression allows potentially greater discrimination among membrane types and provides a way to quantify membrane roughness over a range of scales. It was further observed that the coefficients A and D of PVDF membranes showed positive and negative correlations, respectively, with the molecular weight cut-off. Additionally, zeta potentials of PVDF membranes measured by the tangential streaming potential method became more negative with increasing A and more positive with increasing D, suggesting possible significant influence of roughness on hydrodynamic transport of ions.     

Physical characteristics of Saccharomyces cerevisiae

We examined the physical properties of the surrounding yeast cell walls by using atomic force microscopy (AFM). The yeast cells were prepared on a cleaned glass substrate for confocal microscopy (CM) observation and were mechanically trapped into a porous membrane for AFM measurement. The confocal image of the yeast cells was measured in air, meanwhile the AFM topography images of the cells were measured in both deionized (DI) water (pH = 6.9) and phosphate‐buffered saline (PBS) solution (pH = 7.4). No significant differences between the AFM topography images of the yeast cells measured in DI water and in PBS solution could be inferred. In order to get the quantitative information on the sample elasticity, the force curves between an AFM tip and the yeast cell have been measured. These curves were measured in both DI water and in PBS solution on the same yeast cell using the same AFM cantilever to get the reliable result. The contact region of the force curve in approach mode was then converted into force versus indentation curve, which would be fitted with Hertz–Sneddon model for the calculation of the elasticity. Analysis of the curves indicates that there is a difference of the Young's modulus values of the yeast cell in various environments. These data show that the salt buffer solution increases the rigidity of the biological system. Copyright © 2008 John Wiley & Sons, Ltd.