Change of bonding system in liquid SexTe1−1 alloys as shown by density measurements

Density measurements have been performed on melts in the binary chalcogenide system Se_xTe_1?x up to a temperature of 950°C. Anomalous behaviour of the density was observed. At higher temperatures the density increased on raising the temperature up to a maximum whose position shifts to lower temperatures with increasing concentration of tellurium. This anomalous density behaviour clearly shows an increase of the average coordination number of atoms in the melt. This increase of CN is caused by a change of the bonding system because of the tendency of Te to form pσ bondings. It was assumed that there exist two distinct structures in thermodynamical equilibrium at each temperature according to a law of mass action, for which cooperation effects have to be taken in account. At low temperatures Te atoms easily accept a loosely packed structure I with the aid of selenium. At high temperatures even Se atoms develop a more densely packed structure II with the aid of Te.     

Devitrification characteristics of GexSe1−x glasses

Amorphous Ge_xSe_1?x compounds have been prepared and carefully characterized in the range 0 ? x ? 0.43 (density and micro-hardness measurements and DTA experiments). By heating samples from the amorphous phase, the crystallization process has been investigated for 0.15 ? x ? 0.30. An immiscibility gap in the vitreous region is determined by optical microscopy, from phase-separation observations; moreover, a new metastable crystalline phase appearing as an intermediate step between phase separation and stable GeSe₂ is described.     

On the structure of amorphous GexTe1−x systems

Calculations have been made for the quadrupole splitting of a $\text{3}\text{2}$ spin state of Te¹²⁵ in an amorphous Ge_xTe_1?x system. The results favour the existence of a threefold coordinated black phosphorus structure with an excess of TeTe chains for x-values between o and 0.5; beyond 0.5, threefold coordinated GeTe and an excess of amorphous Ge coexist.     

Effect of annealing on an amorphous GexTe1−x matrix with Te cristallites

Annealing shows very different behaviour for Te crystallites in an amorphous Ge_xTe_1?x matrix as a function of x (x = 0.1 … 0.5). For x ? 0.2, annealing at increasing temperatures increases the number (size) of the Te crystallites with subsequent GeTe + Te crystallization. However for x ? 0.3 there is first a disappearance of Te crystallites, then an appearance of GeTe crystallites, and subsequently GeTe + Te crystallization. Crystallites of either Te or GeTe act as extrinsic defects which add to the intrinsic ones. Activatioon energy decreases (increases) and conductance increases (decreases) as the number of defects increases (decreases). In all cases the final metallic state is obtained only when both GeTe and Te crystallites are present.     

Composition dependence of the refractive index and its photo-induced variation in the binary glass systems: Ge1−xSex and As1−xSex

The composition dependence of the refractive index and its photo-induced variation have been calculated for the Ge_1?xSe_x and As_1?xSe_x binary glass systems, using the random network model. It is found that the refractive index has a minimum in Ge_1?xSe_x at x = 0.8, while it shows a monotomic increase with increasing As content in As_1?xSe_x glasses. The refractive index of the Ge_1?xSe_x system decreases with illumination and the variation Δn of GeSe₂ is ?0.0316, while the refractive index of the As_1?xSe_x system increases with illumination and the variation of As₂Se₃ is 0.01. These results are in agreement with the experimental results reported by several workers.     

A thermodynamic and kinetic investigation of amorphous (1−x)As2Se3 · xSb2Se3 alloys

The heats of formation of amorphous (1?x)As₂Se₃ · xSb₂Se₃ (x = 0 to 0.4) referred to crystalline As₂Se₃ and Sb₂Se₃ were measured by liquid metal solution calorimetry. The values of heats of formation of amorphous (1?x)As₂Se₃ · xSb₂Se₃ decreased from 1.39 ± 0.03 kcal · (g-at)^?1 at x = 0 to 1.27 ± 0.04 kcal · (g-at)^?1 at x = 0.4.The glass transition temperature and the temperatures of the maximum rates of crystallization and fusion were measured by differential scanning calorimetry. The glass transition temperature increased and the temperatures of the maximum rates of crystallization and fusion decreased with increasing Sb₂Se₃ content.The relaxation process in amorphous (1?x)As₂Se₃ · xSb₂Se (x = 0.3) was investigated by measuring changes in microhardness, small-angle X-ray scattering and heat capacity with time of annealing at several temperatures ranging from room temperature to 413 K. With increasing annealing time the microhardness, the height and the temperature of the glass transition peak increased whereas the intensity of small-angle X-ray scattering decreased. These changes reflect relaxation towards a more stable structure of smaller molecular mobility. The changes in the enthalpy with annealing time and the activation energy spectra for relaxation were derived from the heat capacity data. The effects of temperature and time of annealing on the various properties are explained in terms of structural changes and relaxation kinetics.     

X-ray investigation of the crystallization of chalcogenide glasses of the type (As2Se3)1−x:(Tl2Se)x

Amorphous and crystalline states of As₂Se₃, (As₂Se₃)₃ : Tl₂Se and As₂Se₃ : Tl₂Se have been studied using X-ray diffraction techniques. Structural changes arise during the process of annealing in the temperature range between their softening and melting points are reported and their rates investigated. The crystallization temperatures were found to be 105 ± 5 °C, 135 ± 5 °C and 180 ± 5 °C respectively. The unit cell parameters are identified for each of the three resulting crystalline phases, that for As₂Se₃ : Tl₂Se being orthorhombic while the other two are monoclinic.     

Investigation of microphase separation in (K2OP2O5)x − (WO3)1−x glasses by electron microscope studies of surface replicas

Microphase sn the glass system (K₂OP₂O₅)_x ? (WO₃)_1?x for x = 0.48 and 0.33 was investigated. In both systems evidence of phase separation on a scale of 100 Å to 200 Å was found. The samples stayed completely amorphous during the cooling process but the two separate phases present in the glasses could unfortunately not be identified. These results coupled with conductivity versus mole percent of WO₃ measurements suggest that the mechanism of phase separation is of the spinodal type.     

Infrared studies of Se-based polynary chalcogenide glasses (III): YxZxSxSe100−3x (Y = Ge,As; Z = As,Te)

The infrared (IR) absorption spectra for Y_xZ_xS_xSe_100?3x glasses (Y = Ge, As; Z = As, te), with x = 2.5 and 5.0, are measured in the wavenumber region 700-60 cm^?1 at room temperature. These IR spectra are qualitatively explained by comparing with the IR spectra of the binary and ternary glasses. In Ge_xAs_xS_xSe_100?3x glasses (x ? 5.0), the main spectral features are explained by both spectra of the two ternary glasses Ge_xS_xSe_100?2x and As_xS_xSe_100?2x. In Ge_xS_xTe_xSe_100?3x glasses (x ? 5.0), the main spectral features are well explained by both spectra of the two ternary glasses Ge_xS_xSe_100?2x and Ge_xTe_xSe_100?2x. On the other hand, main spectral features in As_xS_xTe_xSe_100?3x glasses (x ? 5.0) are well explained by both spectra of the ternary glasses As_xS_xSe_100?2x and the binary glasses Se_100?xTe_x. In these glasses with low concentrations (x ? 5.0) some chemical bonds are confirmed and some structural units estimated.     

Infrared studies of Se-based polynary chalcogenide glasses (II): YxZxSe100−2x (Y = Ge,As; Z = As,Te)

The infrared (IR) absorption spectra for Y_xZ_xSe_100?2x glasses (Y = Ge, As;Z = As, Te), x = 2.5 and 5.0 are measured in the wavenumber region 700-60 cm^?1 at room temperature. These IR spectra are explained by comparing with the IR spectra already reported for the binary glasses such as Ge–Se, As–Se and Se–Te. In Ge_xAs_xSe_100-2x glasses (x ? 5.0), the main spectral features as well explained by both the spectra of Ge_xSe_100?x and As_xSe_100?x glasses. Main structural units in these glasses are considered to be GeSe₄ tetrahedra and AsSe₃ pyramids, and Se₈ rings and Se_n chains which are the units in pure glassy Se. In Ge_xTe_xSe_100?2x glasses (x ? 5.0) and IR band which cannot be explained by either the spectra of Ge_xSe_100?x or Se_100?xTe_x glasses appears at 210 cm^?1. This band is considered to be due to Ge–Te bonds. The IR spectra of As_xTe_x Se_100?2x glasses (x ? 5.0) are well explained by both the spectra of As_xSe_100?x and Se_100?xTe_x glasses. It is concluded that As and Te atoms combine with Se atoms in the forms of AsE₃ pyramids and Se₅Te₃ mixed rings, respectively.     

Raman and infrared spectra of As2Sx chalcogenide glasses with x ⩽ 3

Raman laser and far infrared spectra of As₂S_x glasses with x ? 3 are given and discussed. The purpose of the work is to bring a vibrational spectroscopic contribution to the study of these glasses and to the hypothesis, still under discussion in the literature, that they might be constituted either by a homogeneous vitreous phase or by a mixture of As₂S₃ and As₄S₄.Our results confirm a phase separation, with formation of ß-As₄S₄, below a certain value of x, which depends not only on the preparation method of the samples but also on other factors such as melting time. Laser irradiation of ß-As₄S₄ modifies its Raman spectrum. Such a phenomenon is attributable to two principal factors, either a partial polymerization or formation of a species richer in arsenic. A structural and formation model of the As₂S_x glasses is given, starting from a more generalized structural model of vitreous As₂S₃ which is an accord with the vibrational results and those by the diffraction method in the literature.     

ac Conductivity of 4.5 TiO2−x · 2 P2O5

The ac conductivity of a member of the family of glasses 4.5 TiO_2?x · 2 P₂O₅ has been measured between 77 and 300 K, and up to 100 kHz. The dc conductivity was measured over only part of this temperature range. The measured ac conductivity can be represented by σ_ac = σ₀ + σ₁ω^s, with s < 1, and temperature dependent. A similar equation describes the ac dielectric constant, ?_ac = ?₀ + ?₁ω^s?1, where $\text{?}{}_1\text{= σ}{}_1\text{tan}\text{1}\text{2}\text{sπ}$. A simple proportionality of s to temperature holds at low temperature; at the higher temperatures, the T-dependence of s is no longer simple. The observed behaviour of the ac properties of this glass is in general accordance with a recently proposed model for systems where transport occurs by hopping. The over-all behaviour is comparable to other transition metal glasses.Using the model and treating the carriers as polarons yields an expression for s in terms of temperature. Values for the polaron radius and the effective dielectric constant are then extracted from the measurements. These values are in good agreement with values for similar systems obtained by other means.     

Investigation of recombination and trapping processes in 3As2Se32Sb2Se3 amorphous films by photoconductivity method

Photoconductivity experiment has been performed on high resistivity ($\text{π ? 10}{}^9\text{Ω-}\text{cm}$) 3As₂Se₃2Sb₂Se₃ amorphous films in the temperature range from 278°K to 308°K, as a function of light intensity, I₀. The results are that at intermediate light levels the photocurrent varies as I₀^0.7 and at high light levels the photocurrent is directly proportional to I₀. A simple recombination and trapping model is developed to interpret the observed photoconductivity data. From the temperature dependence of the photocurrent, an effective trap level located 0.3 eV below the band edge is deduced.     

Structural investigation of amorphous and liquid Ge0.175Te0.825 by neutron scattering

The angular distribution of intensities of 1.003 Å neutrons scattered by an alloy of Ge_0.175Te_0.825 both in the amorphous and in the liquid state have been measured. The bulk amorphous sample, prepared by water quenching of the melt, has been examined at room temperature and just above the crystallization temperature T_x. The liquid sample has been examined at 400, 600 and 800°C. The analysis of the structure factors obtained from the corrected and scaled intensities indicates that the structural features of the amorphous sample are similar to those which would be expected if it were possible to cool the alloy to room temperature, while maintaining it in the liquid state. The analysis of the radical distribution functions, from Fourier inversion of the structure factors, indicates that a change of the coordination number n₁ from 2.43 to 3.25 occurs in passing from the amorphous to the liquid state at 400°C. This result has been interpreted in terms of coordination models. In the liquid state, it has been found that a model with fourfold coordinated Ge and threefold coordinated Te is consistent with n₁=3.25. The internal consistency of this model for the liquid state allows us to make a reasonable choice between the possibility of a 3 or 4 fold coordination for Ge in the glass. We conclude that a model based on four-fold coordinated Ge and twofold coordinated Te seems an appropriate representation for the coordination of the amorphous material.     

Brillouin scattering measurements of attenuation and velocity of hypersounds in SiO2B2O3 glasses

Measurements of hypersound wave velocity and attenuation (20–30 GHz) were made at room temperature by Brillouin scattering in SiO₂O₂O₃ glasses. The attenuation shows a maximum with composition. An explanation of this maximum is given in relation to the glass structure. It is thought that this maximum may be due to a coupling effect of hypersounds with structural relaxational process involving SiSi and SiOB bonds.     

Effects of post-annealing temperature on structural,optical, and electrical properties of MgxZn1−xO films by RF magnetron sputtering

Mg_xZn_1?xO thin films were deposited on quartz substrates by RF magnetron sputtering. The effect of post-annealing temperature on structural, optical, and electrical properties was investigated with the annealing temperatures increasing from 450 to 750 °C. The crystallinity of Mg_xZn_1?xO film annealed at 650 °C was significantly improved while the film annealed at 750 °C showed little improvement. The electrical properties degraded with the increase of annealing temperature. The annealing temperature seemed to impact the E_g value of Mg_xZn_1?xO thin films because of the variation of carrier concentration.     

Effect of Cd1−xZnxS/ZnS core/shell quantum dot on the optical response and relaxation behaviour of ferroelectric liquid crystal

Dielectrics, polarizing optical microscopic and electro-optical measurements have been carried out on a core/shell quantum dot Cd_1?xZn_xS/ZnS dispersed ferroelectric liquid crystal (FLC). In the present study, quantum dots were dispersed into two different concentrations of 0.1 and 0.25 wt./wt.% in pure FLC. The electro-optical parameters of pure and QDs dispersed FLC were carried out as a function of applied voltage. A significant improvement in optical response time of QDs dispersed FLC system is one of the major finding of the present study which may be useful for fabrication of faster liquid crystal system.     

A study of the vacancy-defect distribution in a GaAs/AlxGa1−xAs multi-layer structure grown at low temperature

We have grown a multilayer structure of GaAs and Al_xGa_1−xAs (x=0.25) by molecular beam epitaxy at low substrate temperature (250°C) in order to investigate the effects of annealing on arsenic precipitation and vacancy-defect formation. The as-grown heterostructure contained ∼5×10¹⁷ cm⁻³ gallium vacancies, but information about the individual layers was lost because the layer width (∼45 nm) was smaller than the average positron diffusion length (∼70 nm). Annealing at 500 and 600°C showed increases in the S-parameter (above the bulk value) of ∼2.5% and ∼1.5%, respectively, smaller than for a single LT-GaAs layer (∼3–4%). We explain this phenomenon by suggesting that the excess arsenic which migrates from the material with the higher precipitate/matrix energy (LT-Al_xGa_1−xAs) reduces the gallium vacancy concentration in the LT-GaAs and hence the S-parameter. This hypothesis is supported by SIMS data which shows a build-up of As in the LT-GaAs layers, and TEM images which indicate that arsenic precipitation occurs to a greater extent in the LT-GaAs than in the LT-Al_xGa_1−xAs.