利用电子散斑相移技术测量物体三维面形的方法

为了获得准确的面形测量,提出了一种相移电子散斑干涉技术测量物体面形的测量方法.利用电子散斑干涉产生载波条纹,该载波条纹受到物体表面高度的调制变得弯曲,引起载波条纹相位的变化,可运用相移技术提取物体的相位信息,最后根据高度和相位之间的关系得到物体的面形.介绍了该方法的原理,利用该方法对球冠物体进行了面形测量,证明该方法测量物体面形是可行性的.由于是采用散斑干涉的方法产生干涉条纹,因此该方法测量物体面形具有灵敏度高的优点.     

基于条纹等值线相关的散斑条纹图处理新方法

在数字散斑干涉术中,通常由物体变形前后得到的两幅原始散斑场用相减方法来得到条纹图,并由相移后的多幅(三幅以上)条纹图来求取相位场。介绍了一种基于条纹等值线相关的条纹图生成新方法,并在此基础上提出了基于单幅干涉条纹图的相位场提取新方法和基于条纹等值线相关的单步相移新方法。实验结果表明,该方法具有良好的结果和发展前景。     

Direct measurement of curvature and twist of plates using digital shearography

A method of determining the second-order derivatives of displacement using digital shearing speckle interferometry is presented in this paper. A phase-shifting technique is incorporated and demonstrated to yield good quality fringe patterns that depict either the second-order derivative separately or a combination of first- and second-order derivatives. The optical set-up of this method is similar to that of conventional phase-shifting shearography, thus enjoying a simple and practical configuration. Qualitative comparison shows acceptable agreement of the generated fringe patterns with theoretical results.     

One-wavelength in-plane rotation analysis in electronic speckle pattern interferometry

The analysis of in-plane rigid-body rotations requires phase-shifting methods to determine the direction of rotation in conventional electronic speckle pattern interferometry (ESPI). The phase-shifting procedure makes the real-time measurements impossible. A quasi-real-time method is published recently, where the usual symmetric illumination is combined with a wavelength change before the second exposure. The present paper proposes a device sparing an alternative to this. The symmetric illumination is retained but the wavelength change is replaced by simple illumination direction changes.     

A comparative study of phase-shifting algorithms in digital speckle pattern interferometry

Digital speckle pattern interferometry (DSPI) is a tool for making qualitative as well as quantitative measurements of deformation of objects. Phase-shifting algorithms in DSPI are useful for extracting quantitative deformation data from the system. Comparative studies of the different phase-shifting algorithms in DSPI for object deformation measurement are presented. Static and quasi-dynamic deformation of the object can be measured using these algorithms. Error compensating five-step phase-shifting method is used for the algorithms.     

Accurate measurement of composite laminates deflection using digital speckle pattern interferometry

The modern digital speckle pattern interferometry (DSPI) technique is applied for the accurate measurement of the full-field deflection distribution of a bent composite laminates. Two kinds of powerful phase-shifting methods, phase of differences method (PDM) and difference of phases method (DPM), are described briefly and employed in DSPI to quantitatively extract the phase information, respectively. A comparison of the deflection distributions measured by DPM and PDM indicates that the former has a better measurement accuracy than the latter in laminate's static test experiment.     

数字散斑干涉三维变形测量技术研究进展

三维变形可以转换为应力/应变分布,是材料性能测试和结构可靠性分析的关键参数。在众多三维变形测量技术中,数字散斑干涉技术可以高精度地测量三维变形信息,在航空航天、汽车、先进制造、土木工程和生物医学等行业发挥着十分重要的作用。从散斑干涉基本原理出发,详细介绍了几类三维变形散斑干涉测量技术,并分析比较各类方法的优缺点;同时介绍了散斑干涉三维变形测量技术的国内外研究进展和最新应用;最后展望了散斑干涉三维变形测量技术在动态同步测量、测量系统简化以及应用范围扩宽等方面的发展趋势。     

Feasibility study of a digital speckle pattern interferometry and bending test combined technique to investigate coating adhesion

This paper presents a feasibility study to assess whether digital speckle pattern interferometry could be used as a possible technique to investigate the adhesive performance of coatings. The approach is based on the measurement of the deflections produced by a pre-notched coated specimen subjected to a four-point bending test. When the bending load is increased, a delamination between the coating and the substrate is propagated with its length depending on the adhesion strength. Experiments carried out with specimens having simulated delaminations confirm that digital speckle pattern interferometry can be used to estimate the delamination length.     

Study and design of exponential and Butterworth low-pass filters used for digital speckle interference fringe filtering

This paper studies the exponential and Butterworth low-pass filtering methods and proposes improved exponential and Butterworth low-pass filters. The improved low-pass filters proposed in the paper can be used effectively for filtering processing of digital speckle interference fringes obtained in digital speckle pattern interferometry. Both theoretical analysis and experimental results are presented in the paper.     

Wavelet filtering applied to time-average digital speckle pattern interferometry fringes

In this paper we are presenting a filtering scheme using Symlet wavelet to remove the speckle noise from the time-averaged digital speckle pattern interferometry fringes. To demonstrate the potential of Symlet wavelet filtering, experiments are conducted to remove the speckle noise from the fringes recorded for the surface of computer hard disk. Experimental results demonstrate that this filtering removes the speckle noise to the large extent.     

Anisotropic partial differential equation noise-reduction algorithm based on fringe feature for ESPI

Noise reduction is one of the most exciting problems in electronic speckle pattern interferometry. We present a new anisotropic partial differential equation noise-reduction algorithm based on fringe orientation for interferometric fringe patterns. The proposed equation performs diffusion along the two directions of fringe gradient and isophote line, which are extracted accurately according to fringe feature. By restriction of diffusion in the gradient direction of fringe patterns, this method can provide optimal results in denoising but does not destroy fringe edges. The experimental results show that this technique is more capable of significantly improving the quality of the fringe patterns than the classical anisotropic diffusion equation proposed by Perona and Malik. Based on our filtered fringe patterns, the phase map obtained by phase-shifting technique can be extracted more accurately. It is an effective pre-processing method for electronic speckle pattern interferometry.     

Accuracy and sensitivity of a hole drilling and digital speckle pattern interferometry combined technique to measure residual stresses

This paper reports on the accuracy and sensitivity of digital speckle pattern interferometry (DSPI) when it is combined with the hole drilling technique for measuring residual stresses. The in-plane displacement field generated by the introduction of a small hole is determined using an automated data analysis approach. This method is based on the calculation of the optical phase distribution through a phase-shifting method and the application of a robust iterative phase unwrapping algorithm. It is experimentally demonstrated that residual stresses can be measured with a relative uncertainty of 7.5%. It is also shown that the minimum value of residual stress that can be determined with the DSPI and hole drilling combined technique is about 10% of the yield stress of the material.     

Digital phase stepping speckle interferometry

A variation of electronic speckle pattern interferometry (ESPI) is presented whereby phase fringes are produced in contrast to speckle correlation fringes. Digital phase stepping speckle interferometry uses a phase measurement technique developed for holographic interferometry, which involves phase shifting of the reference beam in a conventional speckle interferometer. Saw-tooth phase fringes are produced by subtracting the phases of the speckle fields before and after object deformation in a digital frame store. This enables the sign of the deformation to be distinguished. After application of a special low-pass digital filter, the phase fringes are of adequate quality to be counted automatically.     

Stroboscopic digital speckle pattern interferometry for vibration analysis of microsystem

In this paper, vibration measurement and analysis of microsystems, such as micro-electro-mechanical systems (MEMS) by using stroboscopic digital speckle pattern interferometry (DSPI) is presented. Because of the speckle interferometry, the technique is suited for samples which have a rough surface or whose surfaces can be sprayed into a scattering surface. A laser speckle microinterferometer incorporated with optoelectronic devices for a stroboscopic illumination and a synchronization of the signals between excitation and stroboscopic illumination is described and demonstrated. The system can measure both out-of-plane and in-plane displacement under either a static or dynamic loading. The fundamental is explained and some applications are demonstrated.     

Measurement of non-monotonous phase changes in temporal speckle pattern interferometry using a correlation method without a temporal carrier

Recently, a phase evaluation method was proposed to measure nanometric displacements by means of digital speckle pattern interferometry when the phase change introduced by the deformation is in the range [0,π) rad. This method is based on the evaluation of a correlation coefficient between two speckle interferograms generated by both deformation states of the object. In this paper, we present a novel technique to measure non-monotonous displacements in temporal speckle pattern interferometry using a correlation method without a temporal carrier. In this approach, the sign ambiguity is resolved automatically due to the introduction of a function that determines the correct sign of the displacement between two consecutive speckle interferograms. The rms phase errors introduced by the proposed method are determined using computer-simulated speckle interferograms. An application of the phase retrieval method to process experimental data is also presented.     

一种新的数字散斑振动定量分析系统

在数字散斑干涉(DSPI)测量方法中，数字散斑时间平均法测量振动时得到的是贝塞尔条纹，其定量分析比较困难。该文采用贝塞尔条纹准相移技术进行数字散斑振动定量分析，即在参考光路中引入和物体同频率的偏置参考振动,当参考振动的相位改变时,振动条纹会产生移动,这相当于静态余弦条纹的相移,可以采用相移算法对数字散斑振动测量的贝塞尔条纹进行定量分析。文中开发了一种新的数字散斑振动定量分析系统，研制了一种低压光学相移器和测量控制电路，给出了圆周固定圆片和四周固定方铜板的振动测量结果。实验结果表明：采用本系统可以方便地定量测出物体的振动模态。     

Speckle interferometry

Illumination of a rough surface by a coherent monochromatic wave creates a grainy structure in space termed a speckle pattern. It was considered a special kind of noise and was the bane of holographers. However, its information-carrying property was soon discovered and the phenomenon was used for metrological applications. The realization that a speckle pattern carried information led to a new measurement technique known as speckle interferometry (SI). Although the speckle phenomenon in itself is a consequence of interference among numerous randomly dephased waves, a reference wave is required in SI. Further, it employs an imaging geometry. Initially SI was performed mostly by using silver emulsions as the recording media. The double-exposure specklegram was filtered to extract the desired information. Since SI can be configured so as to be sensitive to the in-plane displacement component, the out-of-plane displacement component or their derivatives, the interferograms corresponding to these were extracted from the specklegram for further analysis. Since the speckle size can be controlled by the F number of the imaging lens, it was soon realized that SI could be performed with electronic detection, thereby increasing its accuracy and speed of measurement. Furthermore, a phase-shifting technique can also be incorporated. This technique came to be known as electronic speckle pattern interferometry (ESPI). It employed the same experimental configurations as SI. ESPI found many industrial applications as it supplements holographic interferometry. We present three examples covering diverse areas. In one application it has been used to measure residual stress in a blank recordable compact disk. In another application, microscopic ESPI has been used to study the influence of relative humidity on paint-coated figurines and also the effect of a conservation agent applied on top of this. The final application is to find the defects in pipes. These diverse applications demonstrate the power of this technique.     

Measurement of the local displacement field generated by a microindentation using digital speckle pattern interferometry and its application to investigate coating adhesion

This paper presents a technique to investigate the adhesion of thin coatings which combines digital speckle pattern interferometry and an indentation test. The proposed approach is based on the measurement of the local displacement field produced by a microindentation introduced on the coated surface of a specimen. It is experimentally demonstrated that the buckling of the coating generated by the microindentation depends on its adhesion to the substrate. Experiments carried out in specimens with different conditions in the coating–substrate interface show that digital speckle pattern interferometry can be used to determine the size of the buckled region and to give a measurement of the coating adhesion strength.     

Dynamic phase evaluation in sparse-sampled temporal speckle pattern sequence

The rapid progress of modern manufacturing technology has posed stringent requirements for inspecting techniques for vibration characterization and dynamic testing. Because of its simplicity, accuracy, and whole-field character, speckle interferometry has served as one of the major techniques for dynamic measurement, where normally a dense-sampled temporal speckle sequence is captured for phase retrieval using Fourier or wavelet transforms. In this Letter, a method is proposed for phase evaluation of sparse-sampled speckle patterns when the sampling rate is lower than two points per temporal cycle. Dynamic experiments using a high-speed camera demonstrated the effectiveness of the proposed method for complicated wrapped phase retrieval in electronic/digital speckle pattern interferometry.     

散斑干涉相位条纹图的频域滤波处理

为了解决在数字散斑干涉技术测量时,散斑干涉相位条纹图像中大量噪声对相位解包裹结果和精度产生严重影响的问题,介绍了一种条纹正余弦分解和频域低通滤波结合的方法,实现了散斑干涉相位条纹图的高精度滤波。该方法的基本思路是在对相位图像进行滤波处理前,先将相位图通过正余弦函数进行映射转换成两幅图,分别经过频域滤波,然后再合成为相位图。这种分解频域滤波方法可以在滤波的同时,有效保留相位跳变信息。实验结果表明：与传统的图像降噪方法相比,该方法能够在保留图像“尖峰”信息的基础上,较好地滤除图像中的散斑噪声,方法简单有效,有效解决了传统滤波方法应用在相位条纹图中,相图灰度信息丢失10%~40%的问题。