折射率介质在制栅和云纹干涉法中的应用

利用光在折射率介质中传播可以减小光波波长的性质，提出用折射率介质法制作高频全息光栅技术，使光栅频率突破理论极限２／λ；并将折射率介质应用于云纹干涉法中，当试件栅频率为６００１／ｍｍ时，虚栅频率可达到６０００１／ｍｍ，利用其±５级衍射光进行干涉，测量灵敏度由０．８３μｍ提高到０．１６μｍ。     

全息、散班、云纹干涉法的Moiré几何原理

本文阐述了全息、散斑、云纹干涉法与Moiré几何理论的相似规律,用Moiré几何理论统一解释,比拟全息、散斑、云纹干涉法并给出相应的表达式。一、引言全息、     

激光辐照靶材的温升模拟及变形的云纹干涉测试

 采用0.15-2.5kA的大电流输出装置,对LY12铝板试件加热,可获得约27～7430℃/s的理论温升率;用高速相机连续实时记录高温动态云纹干涉条纹,获得了1000幅/s的拍摄频率,将这两种技术结合,模拟连续波激光辐照金属靶材产生的温升效应,并对变形过程进行测试,为激光结构破坏机理基础性研究提供了新方法,表明云纹干涉法用于高温动态变形测试完全可行。     

全息检测中的焦散线现象与干涉条纹的关系

在实时全息干涉计量实验中，当试件负荷甚大时，干涉条纹中会出现一些阴影区，它们在试件破裂过程中起重要作用。当负荷接近试件断裂强度时，可清晰看到并记录下阴影区的延伸、分叉、扩展直至试件破裂的过程。这些阴影区实际上就是几何光学中的焦散线现象。应用此现象可以计算应力强度因子。介绍了在寻找全息干涉条纹与应力强度因子之间关系所作的研究，导出了干涉条纹最大值与应力强度因子之间的定量关系式。从而，为使用全息法与焦散线法相结合的检测方法提供了定量计算的基础。     

高温全息光栅的制作工艺研究

本文提出了应用双镀层光刻法制作高温全息光栅的新工艺。此工艺范围广,制栅对象可选择陶瓷、石英等耐高温的非金属材料,也可选择耐高温合金等金属材料。高温实验结果表明.双镀层高温全息光栅具有较好的抗氧化能力,可作为高温变形测量的基本元件使用。     

云纹干涉法在线复制变形光栅技术研究

介绍了一种云纹干涉法现场转移高密度光栅的新工艺，将现场转移光栅与实验室测量有机结合起来，同时得到物体变形的面内U、V位移场。从理论上分析讨论该方法的可行性及误差。通过实验验证该方法与传统云纹干涉法具有相同的灵敏度和量程，使云纹干涉法应用范围更加广泛。     

Study on the measurement of in-plane displacement of solid surfaces by laser Doppler velocimetry

Theoretical analysis and experiments prove that there is a random phase error in the measurement of the in-plane displacement of solid surfaces by laser Doppler velocimetry. This error will impede the accuracy of the measurement from being further improved to, for example, the region of several fractions of one order. In addition, the reason for the random signal dropout in the measurement is also studied and a method of extending the range in which the signal is maintained continuous is also given.     

The optical measurement station for complex testing of microelements

The paper presents a concept of optical measurement station for complex testing of microelements including MEMS, MOEMS and electronic components and assemblies. The wide selection of examples proves that the specific measurement requirements are fulfilled by alternative usage of combined conventional and grating interferometers CI/GI (reflective surfaces), in-plane and out-of-plane ESPI (scattering surfaces) and digital holographic interferometry DHI (mixed surfaces) supported by thermovision. All these methods are realized by integrated microinterferometer (IWaM) based on a glass waveguide or air cavity waveguide arrangements. The air cavity IWaM allows to form a thermal output for combined thermovision CI/GI or ESPI measurements.IWaM has a compact design insensitive to mechanical vibrations and may be easily rearranged to work with the selected measurement techniques. It is also fully integrated with an optical microscope and it is designed to work both in laboratories and in production environments.     

Speckle interferometry methods for displacement and strain measurements using photorefractive crystal

Photorefractive crystals offer several attractive features such as high resolution and in situ processing. As the images are erasable, these crystals are suitable for read–write applications and hence find potential use in speckle photography, image processing and holography. The barium titanate (BaTiO₃) crystal as recording medium has been extensively used as a novelty filter for real-time in-plane displacement measurements employing two-beam coupling configuration. This paper presents new optical configurations in speckle shear photography to measure in-plan displacement and the strain in real time using BaTiO₃ crystal as recording medium. Speckle photography studies are made using a simple two-beam coupling configuration. In speckle shear photography, a diffused object illuminated with two parallel narrow laser beams is imaged inside the crystal, and a pump beam is added at this plane. The speckle patterns due to each beam and the pump beam produce index gratings. When the object is deformed, the speckle patterns shift consequently. We now have four speckle fields: two generated from the interaction of pump beam with the index gratings and two pertaining to deformed states directly transmitted through the crystal. Thus, the fields from respective points on the object interfere after passage through the crystal and produce the Young's fringe patterns. Due to strain, the fringes in each pattern are of different width and orientation, resulting in the generation of a Moiré pattern. The strain is obtained from the width and orientation of the fringes in the Moiré pattern. The experiments are conducted on a specimen with a notch, which is subjected to tensile loading. The in-plane displacement is measured separately in another experiment. The above studies are carried out at Nd–Yag laser.     

Application of the holographic carrier fringe and FFT technique for deformation measurement

This paper describes a holographic system based on the use of fibre optics and automatic spatial carrier fringe pattern analysis. Carrier fringes are generated by simply translating the object beam between two exposures. Single-mode optical fibres are used to transfer both the object and reference beams. The fast Fourier transform method is used to process the interferograms: it extracts phase from fringe patterns resulting from the interference of tilted wavefronts. The method is illustrated by measuring the deformation of an arbitrarily clamped, uniformly loaded circular plate. The results are given for the perspective plot of the out-of-plane deformation field, the maps of wrapped and unwrapped phase, and a contour map of the unwrapped phase.     

Volume-grating phase-shifting digital speckle pattern interferometry used for measurement of out-of-plane displacement field

A new digital speckle pattern interferometry, called volume-grating phase-shifting digital speckle pattern interferometry, is discussed in this paper. The out-of-plane displacement field of a bent plate can be quantitatively measured using volume-grating phase-shifting digital speckle pattern interferometry proposed in this paper. Theoretical and experimental results, as well as absolute errors, are given.     

Minute displacement and strain analysis using lensless Fourier transformed holographic interferometry

An optical system for lensless Fourier transformed holographic interferometry is constructed to enable the measurement of minute displacements from nanometers to micrometers scale and to obtain corresponding strain distributions using a CCD camera with poor spatial resolution. Since a Fourier spectrum of an object beam is recorded on a hologram in this technique, the image reconstruction is easily performed with a single pass of 2-D fast Fourier transformation. Then, the map of the phase difference over the whole field is obtained by comparing two images before and after deformation. A suitable and effective unwrapping process is, however, inevitably required since the phase difference distribution is wrapped from −π to π in this technique. For phase unwrapping, the maximum spanning tree method is adopted here, which seeks a spanning tree that maximizes overall edge weights given by the cross amplitude. In-plane and out-of-plane displacements are obtained separately from the phase difference distributions at one's request. Moreover, in-plain strain is easily calculated from the in-plane displacement distribution.     

Detection of direction of motion and zero order fringe identification in holographic displacement measurement

Two methods have been suggested to detect the direction (forward or backward) of uniform velocity motion along with identification of no motion positions with other intensity maxima positions in the reconstruction. The first method requires two continuous exposures while the other is a combination of one static and one continuous recording.     

Digital holographic cameras and data processing for remote monitoring and measurements of mechanical parts

Fast growing technology and requirements for testing of different types of materials and devices require new methods and systems for investigation of their parameters. Among the quantities of high interest are shape, deformation, roughness, local materials constants, displacement, and strain fields of elements under load. In the paper, we present novel solutions for digital holographic cameras, which allow for remote monitoring and measurement of the above mentioned quantities at small mechanical objects or at restricted areas of interest at big structures. The systems have compact design, “black box” measurement approach, and allows for fast and accurate measurements performed directly at the element and often in outdoor environment. The principles of digital and optoelectronic reconstruction and phase manipulation are described together with the exemplary measurement results obtained by means of the cameras presented.     

双波长拍波干涉测长中拍波干涉条纹尾数的测量方法

描述在拍波干涉测长中使用的几种拍波干涉条纹尾数测量方法,提出一种拍波锁相型对准原理,介绍和比较拍波干涉仪的三个原理方案,讨论测量方法和测量精度等问题.     

New multiplexed system for synchronous measurement of out-of-plane deformation and two orthogonal slopes

We propose a novel system for synchronous measurement of out-of-plane deformation and two orthogonal slopes using a single camera. The linearly polarized reference beam introduced by an optical fiber interferes with the unpolarized object beam to measure the out-of-plane deformation. A modified Mach—Zehnder interferometer is used to measure the two orthogonal slopes of the out-of-plane deformation. One of the object beams of the Mach—Zehnder interferometer is an unpolarized beam, and the other object beam is split into two orthogonal linearly polarized object beams by a polarizing prism. The two beams are orthogonally polarized. Hence, they will not interfere with each other. The two polarized beams respectively interfere with the unpolarized beam to simultaneously measure the two orthogonal slopes of the out-of-plane deformation. In addition, the imaging lens and apertures are respectively placed in three optical paths to independently control the carrier frequencies and shearing amounts. The effectiveness of this method can be proved by measuring two pressure-loaded circular plates.     

Characterisation of light emitting diodes (LEDs) for application in digital holographic microscopy for inspection of micro and nanostructured surfaces

Partial coherent light sources open up prospects for phase noise reduction in digital holographically reconstructed phase distributions by suppressing multiple reflections in the experimental setup. Thus, light emitting diodes (LEDs) are investigated for application in digital holographic microscopy. First, the spectral properties and the resulting coherence length of an LED are characterised. In addition, an analysis of dispersion effects and their influence on the hologram formation is carried out. The coherence length of LEDs in the range of a few micrometers restricts the maximum interference fringe number in off-axis holography for spatial phase shifting. Thus, the application of temporal phase-shifting-based digital holographic reconstruction techniques is compared to spatial phase-shifting-based methods. It is demonstrated that LEDs are applicable for digital holographic microscopy in connection with both spatial and temporal phase-shifting-based techniques for reduction of noise in comparison to a laser-light-based experimental setup.     

Influence of in-plane displacement and strain components on slope fringe distributions in double-aperture speckle wedge-shearing interferometry

The influence of in-plane displacement and strain components on slope (first-order derivative of out-of-plane displacement component) fringe distributions in double-aperture speckle wedge-shearing interferometry is discussed in detail. The research results show that only the in-plane displacement component parallel to the centre line of double apertures has an influence on the slope fringe distributions. It is also shown that the in-plane strain components have no influence on the slope fringe distributions when utilising normal illumination and an axisymmetric system. A theoretical analysis and an experimental demonstration are given. The experimental results are in good agreement with the quantitative analysis.     

Comparison of fractal and profilometric methods for surface topography characterization

In this study microstructural and roughness characterization of surface of aluminium foils used in lithographic printing process was performed by contact and non-contact profilometric methods and fractal analysis. Significant differences in roughness parameters values inferred from stylus method in respect to those inferred from the non-contact measurements were observed. The investigation of correlation between various fractal dimensions obtained from gray-scale SEM micrographs and binary images resulting from median filtering of the original SEM micrographs as well as selected relevant roughness parameters shows that there is a strong correlation between certain roughness parameters and particular fractal dimensions. This correlations permit better physical understanding of fractal characteristics and interpretation of the dynamics of surface roughness change through processing. Generally these correlations are more suitable for parameters obtained by stylus method than those inferred from the laser-based measurements.