A new generation of ultra-violet/visible gas lasers

The field of ultra-violet/visible gas lasers has undergone a rapid expansion in the past three years since the discovery of the first rare gas monohalide excimer laser. There are now many new high power ultra-violet and visible lasers available with demonstrated efficiencies exceeding 1%. This review of the field emphasises the common properties of these laser systems and indicates their potential impact on commercial photochemical processes.     

Ferromagnetism in Mn-doped GaN nanowires

Using density functional theory we show that the magnetic coupling of Mn atoms in the nanowires, unlike that in the thin film, is ferromagnetic. This ferromagnetic coupling, brought about due to the confinement of electrons in the radial direction and the curvature of the Mn-doped GaN nanowires' surface, is mediated by N as is evidenced from the overlap between Mn 3d and N 2p states. Calculations of the anisotropic energy further show that the magnetic moment orients preferably along the [1010] direction while the wire axis points along the [0001] direction.     

Abnormal blueshift of UV emission in single-crystalline ZnO nanowires

Single-crystalline ZnO nanowires (NWs) were synthesized by a facile vapor transport method. The good orientation and high crystal quality were characterized by X-ray diffraction (XRD), scanning electron microscope (SEM) and high-resolution transmission electron microscope (HRTEM) measurements. Excitation-power-dependence photoluminescence spectra of ZnO NWs show that the UV emission displayed an evident blueshift with increasing excitation power and the corresponding energy shift might be as large as 10 meV. This anomalous phenomenon correlates to the band bending level caused by the surface built-in electric field due to the existence of substantial oxygen vacancies. By increasing the excitation power, the enhanced neutralization effect near the surface will reduce the built-in electric field and lead to a reduction of band bending which triggers the blueshift of the UV emission.     

Optoelectronic properties of single-crystalline GaInAsSb quaternary alloy nanowires

Bandgap engineering of semiconductor nanomaterials is critical for their applications in nanoelectronics, optoelectronics, and photonics. Here we report, for the first time, the growth of single-crystalline quaternary alloyed Ga_(0.75)In_(0.25)As_(0.49)Sb_(0.51) nanowires via a chemical-vapor-deposition method. The synthesized nanowires have a uniform composition distribution along the growth direction, with a zinc-blende structure. In the photoluminescence investigation,these quaternary alloyed semiconductor nanowires show a strong band edge light emission at 1950 nm(0.636 e V). Photodetectors based on these alloy nanowires show a strong light response in the near-infrared region(980 nm) with the external quantum efficiency of 2.0 × 10~4% and the responsivity of 158 A/W. These novel near-infrared photodetectors may find promising applications in integrated infrared photodetection, information communication, and processing.     

Synthesis and red-shifted photoluminescence of single-crystalline ZnO nanowires

Local-oriented single-crystalline ZnO nanowires have been synthesized in large scale by a simple microemulsion method in the presence of sulfonate-polystyrene (S-PS) and dodecyl benzene sulfonic acid sodium salt (DBS). The as-prepared product is characterized by using X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), high-resolution TEM (HRTEM), infrared (IR) spectra and photoluminescence (PL) spectrum. The nanowires exhibit a local congregation and preferentially grow along the [0 0 2] facet. FT-IR spectrum indicates that S-PS is adsorbed on the surface of ZnO nanowires. The PL spectrum shows evidently red-shifted ultraviolet (UV) emission.     

Raman spectroscopic and photoluminescence study of single-crystalline SnO2 nanowires

Single-crystalline SnO₂ nanowires with sizes of 4-14 nm in diameter and 100-500 nm in length were produced in a molten salt approach by using hydrothermal synthesized precursor. Structural characters of the nanowires were examined by X-ray diffraction and high-resolution electron transmission microscopy. Raman, photoluminescence and X-ray photoelectron spectra of the samples were examined under heat treatments. Three new Raman modes at 691, 514 and 358 cm⁻¹ were recorded and assigned. The former two are attributed to activation of original Raman-forbidden A_2uLO mode and the third is attributed to defects in small-sized nanowires. A strong photoluminescence is observed at about 600 nm, the temperature effects is examined and the origin of the PL process is discussed via X-ray photoelectron spectra.     

Synthesis and characterization of GaN nanowires

In this work, GaN nanowires were fabricated on Si substrates coated with NiCl₂ thin films using chemical vapor deposition (CVD) method by evaporating Ga₂O₃ powder at 1100 °C in ammonia gas flow. X-ray diffraction (XRD), scanning electron microscopy (SEM), high-resolution transmission electron microscope (HRTEM) and photoluminescence (PL) spectrum are used to characterize the samples. The results demonstrate that the nanowires are single-crystal GaN with hexagonal wurtzite structure. The growth mechanism of GaN nanowires is also discussed.     

Raman-scattering spectrum of GaN straight nanowires

The Raman spectrum of GaN straight nanowires deposited on a LaAlO₃ crystal substrate was studied. The E₂ (high) phonon frequency at 560 cm^-1 shows a 9 cm^-1 shift compared with the calculated value. The low-energy shift and band broadening of the Raman modes result from the nanosize effect. The unique property of the low intensity ratio of I_E2/I_A1(LO) on the Raman spectrum from the GaN straight nanowires was observed. Received: 5 June 2000 / Accepted: 7 June 2000 / Published online: 2 August 2000     

Acoustic waves of GaN nitride nanowires

Acoustic waves of GaN nanowires are studied. The materials have a wurtzite structure and thus the elastic anisotropy is included. We use the xyz-algorithm originally employed in the analysis of resonant ultrasound spectroscopy results. We have considered hexagonal cross-section nanowires as those experimentally grown. We have studied also circular cross-section nanowires (nanotubes) for comparison. It was found that the lower frequency modes have a very similar dispersion relation both in shape and frequency value, but higher frequency modes exhibit more important differences. The nanowires are solid or hollow and the influence of the thickness on the dispersion relation and the elastic displacement pattern is considered. Nanowires with a zinc-blende structure have also been considered because of theoretical studies allowing for their existence. We have studied also the squared displacement vectors to see the spatial distribution of the different modes in the nanowires. It was found that there are many modes whose elastic displacement components concentrate around the borders of the nanowire and they do not penetrate almost in the inner part of the nanowire.     

Photoresponse study of visible blind GaN/AlGaN p-i-n ultraviolet photodetector

The spectral responsivity characteristics have been numerically studied for visible blind GaN/AlGaN p-i-n ultraviolet detector. The effects of the absorption layer and the n-layer thicknesses on the photoresponse have been investigated. It is shown that the absorption layer and n-layer thicknesses have notable impacts on the peak value of photoresponse and the rejection ratio of short-wavelength side, respectively. Finally, the effect of doping concentration of the absorption layer on photoresponse is discussed in detail. It is demonstrated that mobility degradation, Radiative and Auger recombinations are jointly responsible for the decrease of photoresponse with increasing doping concentration of the absorption layer.     

Synthesis of GaN nanowires by Tb catalysis

Rare earth metal seed Tb was employed as catalyst for the growth of GaN wires. GaN nanowires were synthesized successfully through ammoniating Ga₂O₃/Tb films sputtered on Si(1 1 1) substrates. The samples characterization by X-ray diffraction and Fourier transform infrared indicated that the nanowires are constituted of hexagonal wurtzite GaN. Scanning electron microscopy, transmission electron microscopy, and high-resolution transmission electron microscopy showed that the samples are single-crystal GaN nanowire structures. The growth mechanism of the GaN nanowires is discussed.     

Near UV photoluminescence of Hg-doped GaN nanowires

Mass Hg-doped GaN nanowires with an average diameter of about 25 nm and lengths up to hundreds of micrometers are fabricated by chemical vapor reaction. The as-synthesized products have a single crystal phase and grow along the 0 0 1 direction. The growth of Hg-doped GaN nanowires is suggested for quasi vapor–solid mechanism (QVSM). In particular, for as large-scale GaN nanowires like films, a novel strong near ultraviolet PL spectrum appears with a doping Hg where the Hg-doped GaN nanowires are found to be responsible for the different characteristics; the PL mechanism is explained in detail.     

Straight single-crystalline germanium nanowires and their patterns grown on sol-gel prepared gold/silica substrates

Straight single-crystalline Ge nanowires with a uniform diameter distribution of 50-80 nm and lengths up to tens of micrometers were grown in a high yield on sol-gel prepared gold/silica substrates by using Ge powder as the Ge source. Detailed electron microscopy analyses show that the nanowires grow through a vapor-liquid-solid growth mechanism with gold nanoparticles located at the nanowire tips. By using transmission electron microscope grids as the shadow mask, the sol-gel technique can be readily adapted to prepare patterned film-like gold/silica substrates, so that regular micropatterns of Ge nanowires were obtained, which could facilitate the integration of Ge nanowires for characterization and devices.     

Synthesis of single-crystalline wurtzite aluminum nitride nanowires by direct arc discharge

High-density hexagonal aluminum nitride (h-AlN) nanowires were synthesized through the direct reaction of Al with nitrogen gas without catalyst and template using a direct arc discharge method. The as-grown AlN nanowires were characterized by X-ray diffraction, scanning electron microscopy, transmission electron microscopy, and Raman spectroscopy. The h-AlN nanowires have a diameter in the range 20–70 nm and a length of several tens of micrometers. Vapor–solid growth mechanisms can be employed to explain the formation of the h-AlN nanowires. PACS 81.05.Ea; 81.10.Bk; 81.16.Dn; 68.65.-k; 81.16.-c     

Magnetic and microstructural characterizations of CoFe and CoFeB nanowires

Magnetic and microstructural characterizations of cobalt-rich CoFe and CoFeB nanowires fabricated in commercially available alumite templates were investigated. The modifications in magnetic and microstructural behaviors of crystalline CoFe and amorphous CoFeB nanowires were observed after magnetic field annealing and reannealing of the samples.     

Growth of single-crystalline GaN layers in a horizontal reactor by chloride epitaxy

Chloride epitaxy of GaN layers in a horizontal reactor is studied numerically. The steady 3D fluxes of the gas mixture in the reactor are simulated with allowance for heterogeneous reactions on the substrate (growth of epitaxial GaN layers) and on the reactor walls (growth of a polycrystalline GaN deposit). Experimental data on the growth rate distribution for polycrystalline and epitaxial GaN layers are explained. It is shown that, if the diameter of the reactor is not large enough, the growth of the deposit on the walls makes the GaN growth rate distribution over the substrate more nonuniform due to the parasitic diffusion of reagents from the gas phase to the reactor walls.     

Probing individual localization centers in an InGaN/GaN quantum well

Photoluminescence (PL) spectroscopy with subwavelength lateral resolution has been employed to probe individual localization centers in a thin InGaN/GaN quantum well. Spectrally narrow emission lines with a linewidth as small as 0.8 meV can be resolved, originating from the recombination of an electron-hole pair occupying a single localized state. Surprisingly, the individual emission lines show a pronounced blueshift when raising the temperature, while virtually no energy shift occurs for increasing excitation density. These findings are in remarkable contrast to the behavior usually found in macro-PL measurements and give a fundamental new insight into the recombination process in semiconductor nanostructures in the presence of localization and strong internal electric fields. We find clear indications for a biexciton state with a negative binding energy of about -5+/-0.7 meV.     

Low-temperature transport properties of individual SnO2 nanowires

Stannic oxide (SnO₂) nanowires have been prepared by Chemical vapor deposition (CVD). The low-temperature transport properties of a single SnO₂ nanowire have been studied. It is found that the transport of the electrons in the nanowires is dominated by the Efros-Shklovskii variable-range hopping (ES-VRH) process due to the enhanced Coulomb interaction in this semiconducting nanowire. The temperature dependence of the resistance follows the relation lnR∼T^−1/2. On the I-V and dI/dV curves of the nanowire a Coulomb gap-like structure at low temperatures appears.     

Low-frequency excess noise characterizations of laser-assisted de-bonded GaN films

Systematic characterization of flicker noise was conducted on GaN-based metal-semiconductor-metal (MSM) interdigitated devices. The devices were fabricated on both the regular GaN-on-sapphire (type A) and laser de-bonded films followed by layer transfer of hydride vapor phase epitaxy-grown GaN films to Si substrates (type B). Experimental results indicated no significant degradation in the I-V characteristics for Schottky MSM devices fabricated on type B films compared to those fabricated on type A films. However, substantial increase in the flicker noise level, particularly in the low-temperature regime, is observed among the ohmic MSM devices fabricated on type B films. The experimental data suggest that material degradation occurs at the vicinity of the GaN-sapphire interface, while in regions close to the GaN film surface there is practically no change in the film quality. This is supported by finite element simulation of the temperature of the film during laser irradiation. The results indicate that the temperature dropped from 1400 K at the GaN-sapphire interface to about 1000 K within 0.5 μm away from the interface stipulating that material degradation occurs only within 0.5 μm from the GaN-sapphire interface.