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1.
We propose a new method for measuring electron beam profiles using parametric X-ray radiation. In this method, a pinhole is placed between the source of parametric X-ray radiation and a two-dimensional X-ray detector, and the beam profile can be reconstructed on the detector, i.e., based on the principle of a pinhole camera. The profiles are in good agreement with the results obtained using a standard method with optical transition radiation. This method may prove useful to measure profiles of electron beams with short bunch lengths in recent advanced linear accelerators. 相似文献
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介绍了13.9 nm马赫贞德干涉仪用软X射线分束镜的设计、制备与性能检测。基于分束镜反射率和透过率乘积最大的评价标准,设计了13.9 nm软X射线激光干涉实验用多层膜分束镜。采用磁控溅射方法在有效面积为10 mm×10 mm、厚度为100 nm的Si3N4基底上镀制了Mo/Si多层膜,制成了多层膜分束镜。利用X射线掠入射衍射的方法测量了Mo/Si多层膜的周期。用扩束He-Ne激光束进行的投影成像方法定性分析了分束镜的面形精度,利用光学轮廓仪完成了分束镜面形精确测量。利用北京同步辐射装置测量了分束镜反射率和透射率,在13.9 nm处,分束镜反射率和透过率乘积达4%。使用多层膜分束镜构建了软X射线马赫贞德干涉仪,并应用于13.9 nm软X射线激光干涉实验中,获得了清晰的含有C8H8等离子体电子密度信息的动态干涉条纹。 相似文献
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《Physics letters. A》2020,384(16):126321
We have studied the possibilities of using diffracted transition radiation excited by a relativistic electron beam in a single-crystal target to determine the beam divergence. For this purpose, we investigated the expressions we had previously derived that describe the angular density of diffracted transition radiation excited by a relativistic electron beam crossing a thin single-crystal plate. In our calculations, we used the two-parameter model distribution function to represent the angular distribution of ultra-relativistic electrons in the beam. For determining the beam divergence parameters, the methods of two-dimensional objective function minimization were used. The model calculations we performed confirm the efficiency of the above-mentioned methods for determining the divergence of a relativistic electron beam. 相似文献
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利用已经建成的4 MeV LIA注入器,结合时间分辨测量系统研究了三种测量技术:发射度测量法、无场准直器和磁场准直器测量法。介绍了强流束亮度定义和典型方法理论分析及测量技术的物理概念,提出了用于猝发多脉冲电子束发射度测量装置的设计与调试,通过对时间分辨测量系统的分幅相机记录的光强度分布信息处理,得到电子束束斑均方根半径和发射角,分析某一时刻数据,即可得到电子束某一时刻发射度,从而获得多脉冲电子束时间分辨发射度。在4 MeV LIA注入器上对多脉冲电子束流的发射度进行测量,得到电子束归一化均方根发射度约为114 mmmrad、双脉冲456 mmmrad的归一化发射度。最后结合电子束的高斯分布初步分析并给出均方根发射度、实测发射度和边发射度的关系。 相似文献
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光学渡越辐射测量中能量分辨精度分析 总被引:4,自引:4,他引:0
基于光学渡越辐射原理的用于高能强流电子束束流参数在线测量及诊断系统,具有时间响应快、分辨率高等特点,可以测量电子束的束剖面、发散角、能量等多个参数。分析了测量系统的结构参数(包括了透镜的焦距、成像面位置、CCD像元尺寸)对电子束能量测量精度的影响,并在理论上模拟了电子束的发散角的影响。还根据系统数据的特点,阐述了数据噪声对能量测量结果精度的影响,指出了光学渡越辐射测量中电子束能量分辨精度受到多种因素的影响,需要在数据处理时考虑修正。 相似文献
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X射线TICT在复合材料工件检测中的射束硬化拟合校正研究 总被引:1,自引:1,他引:0
X射线TICT中,X射线透射物质时,发生了能谱硬化现象。使图像重建时出现伪影。因此必须进行修正。文中对X射线硬化现象进行了分析,探讨了X射线TICT在检测复合材料工件中, X射线射束和与透射厚度的关系, 并根据Beer定律和X射线与物质作用的特点, 通过获取X射线射束和数据,首先拟合出射束和与透射厚度的关系式, 然后推导出X射线射束和校正为单色射线射束和的等效厚度与透射厚度的关系及其等效方法, 最终得出X射线TICT在检测复合材料工件中X射线等效单色射线的衰减系数的射束硬化拟合值, 再对此衰减系数拟合值进行卷积反投影重构, 即可有效消除X射线TICT在检测复合材料工件中射束硬化造成的影响。 相似文献
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《Physics letters. A》2014,378(30-31):2171-2175
In this Letter, I report on a novel scheme for beam stacking without any beam emittance dilution using a barrier rf system in synchrotrons. The general principle of the scheme called longitudinal phase-space coating, validation of the concept via multi-particle beam dynamics simulations applied to the Fermilab Recycler, and its experimental demonstration are presented. In addition, it has been shown and illustrated that the rf gymnastics involved in this scheme can be used in measuring the incoherent synchrotron tune spectrum of the beam in barrier buckets and in producing a clean hollow beam in longitudinal phase space. The method of beam stacking in synchrotrons presented here is the first of its kind. 相似文献
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A Real-time System For Measuring Spot Size of High Energy Accelerator Using Thick Pinhole Imaging
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In order to easily measure the beam spot size of high energy electron accelerators with internal target enclosed,a real–time system, based on thick pinhole imaging technique, is employed. The experimental result on a 15MeV electron linear accelerator is also presented. In this paper the principle of thick pinhole imaging and the processing of data are introduced. The usual "sandwich" method needs to develop X-ray films, while debugging the accelerator parameters it will take a lot of time. On the contrary, X–ray pinhole imaging method can make a real–time measuring: as the accelerator parameters change, we can observe the beam profile's variation on the computer screen. Then when debugging we can have a definite object in view, and adjust the accelerator parameters more efficiently. 相似文献
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A. I. Harris 《International Journal of Infrared and Millimeter Waves》1988,9(3):231-247
Submillimeter receivers which operate in the highest frequency atmospheric windows must still be mounted on large infrared and optical telescopes. Finding the optimum submillimeter wave illumination for these large telescopes is simplified by their effectively perfect optical surfaces and long focal lengths, but is complicated by telescope optics which have been optimized for non-tapered beams. In order to determine the effects of changing illumination edge taper, we calculated idealized aperture and beam efficiencies for telescopes which are used for submillimeter astronomical observations. The optimum illumination edge taper for the large infrared telescopes is near 10 dB, somewhat less than for classical radio telescopes, and is not very critical as long as it is between 10 and 13 dB.We also present an accurate method for measuring the sizes of, and deviations from, Gaussian beam pattern distributions by using astronomical sources which have sizes comparable with the beam. 相似文献
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G. I. Fat’yanova 《Bulletin of the Russian Academy of Sciences: Physics》2007,71(10):1461-1462
A complex method of local microanalysis of samples, in which the analysis conditions depend on the orientation of the boundaries of heterogeneous objects, has been considered. X-ray and electron spectroscopy methods are simultaneously used. Application of special instrumental methods for recording X-ray and electron spectra makes it possible to determine the elemental composition of samples in cuts and near interphase boundaries with a high accuracy. Such a possibility is realized due to the development of a method and equipment providing simultaneous recording secondary radiations in two mutually opposite directions with a change in the azimuthal direction with respect to the point of analysis, without loss of the beam positioning point, through application of microtomography. 相似文献
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With the dramatic improvement in the spatial resolution of scanning transmission electron microscopes over the past few decades, the tolerance of a specimen to the high-energy electron beam becomes the limiting factor for the quality of images and spectra obtained. Therefore, a deep understanding of the beam irradiation processes is crucial to extend the applications of electron microscopy. In this paper, we report the structural evolution of a selected oxide, MgAl2O4, under an 80 keV focused electron probe so that the beam irradiation process is not dominated by the knock-on mechanism. The formation of peroxyl bonds and the assisted atomic migration were studied using imaging and electron energy-loss spectroscopic techniques. 相似文献
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A new type of rotating anticathode X-ray generator, where an electron beam of up to 60 keV irradiates the inner surface of a U-shaped Cu anticathode, has achieved a beam brilliance of 130 kW mm(-2) (at 2.3 kW). A higher-flux electron beam is expected from simulation by optimizing the geometry of a combined-function-type magnet instead of the fringing field of the bending magnet. In order to minimize the size of the X-ray source the electron beam has been focused over a short distance by a new combined-function bending magnet, whose geometrical shape was determined by simulation using the Opera-3D, General Particle Tracer and CST-STUDIO codes. The result of the simulation clearly shows that the role of combined functions in both the bending and the steering magnets is important for focusing the beam to a small size. FWHM sizes of the beam are predicted by simulation to be 0.45 mm (horizontal) and 0.05 mm (vertical) for a 120 keV/75 mA beam, of which the effective brilliance is about 500 kW mm(-2) on the supposition of a two-dimensional Gaussian distribution. High-power tests have begun using a high-voltage 120 kV/75 mA power supply for the X-ray generator instead of 60 kV/100 mA. The beam focus size on the target will be verified in the experiments. 相似文献
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T. W. Ang G. T. Reed A. G. R. Evans P. R. Routley M. R. Josey 《Fiber and Integrated Optics》2000,19(1):25-29
To our knowledge, no blazed grating has been fabricated in silicon (Si) at a pitch of less than half a micron. In this article, we report the fabrication of Si-blazed gratings at the period of 400 nm, using electron beam lithography and ion beam etching techniques. The blazed grating is extremely useful as a grating coupler in integrated optics, operating at the telecommunication wavelength of 1.3 mum, because very high output efficiency of the grating coupler is expected. This will allow coupling to thin film devices in silicon, previously not regarded as promising because coupling to them was very inefficient. 相似文献
18.
介绍了13.9 nm马赫贞德干涉仪用软X射线分束镜的设计、制备与性能检测。基于分束镜反射率和透过率乘积最大的评价标准,设计了13.9 nm软X射线激光干涉实验用多层膜分束镜。采用磁控溅射方法在有效面积为10 mm×10 mm、厚度为100 nm的Si3N4基底上镀制了Mo/Si多层膜,制成了多层膜分束镜。利用X射线掠入射衍射的方法测量了Mo/Si多层膜的周期。用扩束He-Ne激光束进行的投影成像方法定性分析了分束镜的面形精度,利用光学轮廓仪完成了分束镜面形精确测量。利用北京同步辐射装置测量了分束镜反射率和透射率,在13.9 nm处,分束镜反射率和透过率乘积达4%。使用多层膜分束镜构建了软X射线马赫贞德干涉仪,并应用于13.9 nm软X射线激光干涉实验中,获得了清晰的含有C8H8等离子体电子密度信息的动态干涉条纹。 相似文献
19.
T. W. Ang G. T. Reed A. G. R. Evans P. R. Routley M. R. Josey 《Fiber and Integrated Optics》2013,32(1):25-29
To our knowledge, no blazed grating has been fabricated in silicon (Si) at a pitch of less than half a micron. In this article, we report the fabrication of Si-blazed gratings at the period of 400 nm, using electron beam lithography and ion beam etching techniques. The blazed grating is extremely useful as a grating coupler in integrated optics, operating at the telecommunication wavelength of 1.3 mum, because very high output efficiency of the grating coupler is expected. This will allow coupling to thin film devices in silicon, previously not regarded as promising because coupling to them was very inefficient. 相似文献
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M. S. Mathur 《光谱学快报》2013,46(4):295-302
This paper presents a simple and effective method for obtaining the beam density, that is the number of atoms per unit volume of the beam, by measuring the change in the electrical resistance of a uniform strip of iron which is placed in the beam. 相似文献