Wetting-dewetting transition line in thin polymer films

Thin polymeric films are increasingly being utilized in diverse technological applications, and it is crucial to have a reliable method to characterize the stability of these films against dewetting. The parameter space that influences the dewetting of thin polymer films is wide (molecular mass, temperature, film thickness, substrate interaction) and a combinatorial method of investigation is suitable. We thus construct a combinatorial library of observations for polystyrene (PS) films cast on substrates having orthogonal temperature and surface energy gradients and perform a series of measurements for a range of molecular masses (1800 g/mol < M < 35 000 g/mol) and film thicknesses h (30 nm < h < 40 nm) to explore these primary parameter axes. We were able to obtain a near-universal scaling curve describing a wetting-dewetting transition line for polystyrene films of fixed thickness by introducing reduced temperature and surface energy variables dependent on M. Our observations also indicate that the apparent polymer surface tension gamma(p) becomes appreciably modified in thin polymer films from its bulk counterpart for films thinner than about 100-200 nm, so that bulk gamma(p) measurements cannot be used to estimate the stability of ultrathin films. Both of these observations are potentially fundamental for the control of thin film stability in applications where film dewetting can compromise film function.     

Reversibility of pH-induced dewetting of poly(vinyl pyridine) thin films on silicon oxide substrate

Thin PVP films deposited on a silicon oxide surface have been found to form a dewetting pattern when treated with basic solutions (pH > or = 10). We studied the dependence of pattern morphology on the polymer's molecular weight and thickness of the polymer layer, and observed the formation of three distinctive structures. The structure formed by large drops of polymer is characteristic of a polymer with low molecular weight and the thinnest polymer layer, whereas other samples form holes or a weblike pattern upon dewetting. These experiments have demonstrated for the first time the reversibility of the dewetting process in a liquid environment. The polymer layer has revealed reversible behavior toward flat film when exposed to a pH 4 buffer solution. More complex structures can be obtained by consecutive treatments with acidic (pH 4) and basic (pH 10) solutions. We used atomic force microscopy (AFM) to study both the morphology and elastic properties of polymers in media with different acidity, in order to determine the mechanism behind the dewetting process.     

Autophobic dewetting of Z-tetraol perfluoropolyether lubricant films on the amorphous nitrogenated carbon surface

The thermodynamic stability of thin films of the perfluoropolyether (PFPE) Z-Tetraol, as a function of molecular weight, on amorphous nitrogenated carbon, CNx, is investigated. An optical surface analyzer is used to image the autophobic dewetting of the Z-Tetraol films. Film dewetting results when the PFPE film thickness applied to the CNx surface exceeds a critical value. This critical dewetting thickness is identified as the monolayer thickness of the adsorbed PFPE film via measurements of the changes in the surface energy as a function of lubricant film thickness. The observed dewetting coincides with the film thickness at which the disjoining pressure goes to zero. The critical dewetting thickness is dependent on the PFPE molecular weight.     

Submicron films prepared from aqueous dispersions of nanoscale polymer crystals

Thin and ultrathin films of polyethylene of variable thickness are obtained from aqueous dispersions of prefabricated nanoscale crystals by spin‐coating. Continuous films with a thickness of only 15 nm, up to 220 nm, homogeneous over hundreds of μm, or assembled discontinuous monolayers of flat‐on lamella particles were prepared, depending on the solids content of the dispersion employed, as revealed by AFM and TEM. The morphology of melt‐recrystallized films was not affected by the surfactant present. Homogeneous continuous films without undesirable dewetting were retained upon melting and recrystallization of the films upon cooling, composed of polygonal spherulites for a thicker film (220 nm), randomly grown edge‐on lamella for a 40 nm film, and dominant flat‐on lamella for a 15 nm thick film. Annealing below T_m resulted in lamella thickening, without changes of crystal orientation or structure of the particle assemblies for discontinuous monolayers. Surfactant adsorbed to the nanocrystals in the aqueous dispersion desorbs at least partially during formation of the nascent films, and upon annealing below the melting point surfactant migrates to the film‐air interface to form aggregates, which can be removed by rinsing, during which the film stays intact and structurally unaltered as revealed, amongst others, by water contact angles. © 2009 Wiley Periodicals, Inc. J Polym Sci Part A: Polym Chem 47: 6420–6432, 2009     

Dewetting of polystyrene thin films on poly(ethylene glycol)-modified surfaces as a simple approach for patterning proteins

A simple technique for patterning proteins utilizing dewetted polystyrene (PS) droplets is demonstrated. A polystyrene thin film was spin coated on a poly(ethylene glycol) (PEG) silane-modified surface. As the PS film dewets from the surface, upon annealing, to form droplets, the PEG-silane-modified surface is exposed, which retains its capability to resist protein adsorption, and the PS droplets allow the selective adsorption of proteins. In contrast to the undewetted flat PS film, the droplet surface had a greater amount of adsorbed proteins. Atomic force microscopy scans reveal that the roughness of the droplet surface is higher, and a multilayer of proteins results on the droplet surface. Moreover, micro- and nanoscale droplet patterns can easily be achieved by tuning the thickness of PS thin films. Because dewetting approaches for generating ordered dewetting droplets have been successfully generated by others, those approaches could be easily combined with this technique to fabricate ordered protein patterns.     

The stability of ultra-thin perfluoropolyether mixture films on the amorphous nitrogenated carbon surface

The thermodynamic stability of boundary lubricant films based upon mixtures of liquid perfluoropolyethers (PFPEs) is reported. Mixtures of A20H-2000 with Zdols 2000, 2500, and 4000 and Zdol-TX 2200 on amorphous carbon nitride films are investigated. An optical surface analyzer is used to image the autophobic dewetting of the mixture PFPE films. The critical dewetting thickness coincides with the monolayer thickness of the adsorbed mixture PFPE films as determined by the changes in the surface energy as a function of lubricant film thickness. The critical dewetting thickness varies linearly with mixture concentration.     

Thickness dependence of thermally induced changes in surface and bulk properties of Nafion® nanofilms

Thermally induced changes in surface wettability, dewetting behavior, and proton transport of “self‐assembled” nanothin Nafion^® films (4–300 nm) on SiO₂ substrate is reported. Thermal annealing induces switching of the surface wettability of 55 nm and thinner films from hydrophilic to super‐hydrophobic. Thickness dependence of this behavior is observed with higher annealing temperature required for lower thickness films, indicating highly restrictive mobility of Nafion^® ionomer as film thickness decreases. Dewetting is only observed for 4‐nm thin film. Significant suppression in proton conductivity upon thermal annealing was noted. Similarly, two other bulk properties, water uptake and swelling, were found to decrease upon annealing. This work reports a systematic examination of the thickness dependence of thermally induced changes in both surface and bulk properties of ultra‐thin Nafion^®. © 2016 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2016 , 54, 1267–1277     

RUPTURING OF POLYMER FILMS WITH RUBBING-INDUCED SURFACE DEFECTS

It has been a long-standing question whether dewetting of polymer film from non-wettable substrate surfaceswherein the bicontinuous morphology never forms in the dewetting film is due to spinodal instability or heterogeneousnucleation. In this experiment, we use a simple method to make the distinction through introduction of topographical defectsof the films by rubbing the sample surface with a rayon cloth. Spinodal dewetting is identified for those films that dewet by acharateristic wavevector, q, independent of the density of rubbing-induced defects. Heterogeneous nucleation, on the otherhand, is identified for those with q increasing with increasing density of defects. Our result shows that PS films on oxidecoated silicon with thickness less than ≈ 13 nm are dominated by spinodal dewetting, but the thicker films are dominated bynucleation dewetting. We also confirm that spinodal dewetting does not necessarily lead to a bicontinuous morphology in thedewetting film, contrary to the classic theory of Cahn.     

Direct visualization of dewetting of molecularly thin liquid films on solid surfaces

The effect of the surface energy gamma, disjoining pressure, Pi, and roughness on the dewetting of molecularly thin liquid lubricant films on magnetic disks, which have sub-nanometer surface topography, has been investigated by visualizing the dewetting process directly using ellipsometric microscopy. The dewetting process of thin liquids on the rough surface is determined not only by the well-known instability of films, which is determined by the sign of dPi/dh, but also by the sign of Pi and the surface topography of the substrate even if its roughness is of the sub-nanometer order. The dewetting film formed small droplets, which were not along the surface topography of the substrate, when Pi < 0. On the other hand, it formed grooves along the surface topography with a sub-nanometer roughness when Pi > 0. Moreover, the sub-nanometer roughness initiated the dewetting of the metastable liquid thin films.     

Partial dewetting of polyethylene thin films on rough silicon dioxide surfaces

The effect of roughness on the dewetting behavior of polyethylene thin films on silicon dioxide substrates is presented. Smooth and rough silicon dioxide substrates of 0.3 and 3.2-3.9 nm root-mean-square roughness were prepared by thermal oxidation of silicon wafers and plasma-enhanced chemical vapor deposition on silicon wafers, respectively. Polymer thin films of approximately 80 nm thickness were deposited by spin-coating on these substrates. Subsequent dewetting and crystallization of the polyethylene were observed by hot-stage optical microscopy in reflection mode. During heating, the polymer films melt and dewet on both substrates. Further observations after cooling indicate that, whereas complete dewetting occurs on the smooth substrate surface, partial dewetting occurs for the polymer film on the rough surface. The average thickness of the residual film on the rough surface was determined by ellipsometry to be a few nanometers, and the spatial distribution of the polymer in the cavities of the rough surface could be obtained by X-ray reflectometry. The residual film originates from the impregnation of the porous surface by the polymer fluid, leading to the observed partial dewetting behavior. This new type of partial dewetting should have important practical consequences, as most real surfaces exhibit significant roughness.     

IN SITU OBSERVATION OF MELTING AND CRYSTALLIZATION BEHAVIORS OF POLY(ε-CAPROLACTONE) ULTRA-THIN FILMS BY AFM TECHNIQUE

The melting and crystallization behaviors of poly(ε-caprolactone) (PCL) ultra-thin films with thickness from 15 nm to 8 nm were studied by AFM technique equipped with a hot-stage in real-time. It was found that melting can erase the spherulitic structure for polymer film with high thickness. However, annealing above the melting point can not completely erase the tree-like structure for the thinner polymer film. Generally, the structure formation of thin polymer films of PCL is controlled not only by melting and crystallization but also by dewetting during thermal annealing procedures, and dewetting predominates in the structure formation of ultra-thin films. However, the presence of tree-like morphology at 75 °C may be due to the strong interaction between PCL and mica surface, which may stick the PCL chains onto the mica surface during thermal annealing process. Moreover, the growth of the dendrites was investigated and it was found that crystallization is followed from a dewetted sample, and the branches did not grow with the stems. The crystallization of polymer in the ultra-thin films is a diffusion-controlled process. Both melting and crystallization behaviors of PCL in thin films are influenced by film thickness.     

Dewetting induced by complete versus nonretarded van der Waals forces

Spontaneous rupture of some polymer films upon heating is commonplace. The very criterion for this instability is the system free energy, G(L), possessing a negative curvature. In films that are apolar with h < or = 100 nm van der Waals (vdW) interactions usually constitute a major contribution to G(L) for which the approximate form G(L) = -A/12piL(2) (where A is the Hamaker constant), ignoring retardation, has been widely used. In this work, we investigate the limits to this approximation by calculating the complete vdW interactions for popular polymer film systems in dewetting experiments including air-polystyrene-SiO2-Si, air-polystyrene-poly(methyl methacrylate)-Si, and air-poly(methyl methacrylate)-polystyrene-Si based on the theory of Dzyaloshinskii, Lifshitz, and Pitaevskii (DLP). We found that retardation effects could produce significant modifications to G(L) even when the thickness of the polymer and/or the interlayer is only 1-2 nm, contrary to conventional presumption.     

Multiscale Dewetting of Low‐Molecular‐Weight Block Copolymer Ultrathin Films

Ultrathin films of a low‐molecular‐weight block copolymer spontaneously dewet after several days at ambient temperature. Film rupture produces macroscopic holes and a residual pancake brush layer ≈ 2 nm thick with intermittent mounds measuring up to 25 nm in thickness. Multiscale dewetting likewise occurs when the films are heated and returned to ambient temperature. Regardless of the surface pattern that forms during heating, submicron mounds develop on the dewetted copolymer film, and fine holes emerge along the substrate surface, after cooling.     

On sub-T(g) dewetting of nanoconfined liquids and autophobic dewetting of crystallites

The glass transition temperature (T(g)) of thin films is reduced by nanoconfinement, but it is also influenced by the free surface and substrate interface. To gain more insights into their contributions, dewetting behaviors of n-pentane, 3-methylpentane, and toluene films are investigated on various substrates as functions of temperature and film thickness. It is found that monolayers of these molecules exhibit sub-T(g) dewetting on a perfluoro-alkyl modified Ni substrate, which is attributable to the evolution of a 2D liquid. The onset temperature of dewetting increases with film thickness because fluidity evolves via cooperative motion of many molecules; sub-T(g) dewetting is observed for films thinner than 5 monolayers. In contrast, monolayers wet substrates of graphite, silicon, and amorphous solid water until crystallization occurs. The crystallites exhibit autophobic dewetting on the substrate covered with a wetting monolayer. The presence of premelting layers is inferred from the fact that n-pentane crystallites disappear on amorphous solid water via intermixing. Thus, the properties of quasiliquid formed on the crystallite surface differ significantly from those of the 2D liquid formed before crystallization.     

Thin-Film Morphologies of Random Copolymers as Functions of Thermal History

Series polymers of butyl methacrylate with various contents of 3-(trimethoxysilyl)propyl methacrylate (MSMA) that introduces crosslinking networks among the macromolecules upon hydrolysis and self-condensation have been synthesized by free radical polymerization, and the influence of crosslinking density on the film properties has been examined. The polymer solutions were spin-cast over a layer of polystyrene brush to yield homogeneous polymer films. When the films of about 30 nm thick were exposed to moisture and then heated at 60 degrees C for hydrolysis and self-condensation of MSMA groups, the initially flat surfaces became slightly coarser but without apparent dewetting. Further annealing at 140 degrees C resulted in dewetting of the thin films, whose morphologies in thermodynamic equilibrium were related to the chemical compositions of the polymers. The polymers having higher contents of MSMA exhibited significantly reduced dewetting at the high temperature, due to the higher density of crosslinking networks that restricted the molecular mobility. In contrast to the thin films of about 30 nm thick, thicker films (about 100 nm) showed only a slight dewetting, even non-dewetting at the elevated temperature. Copyright 2001 Academic Press.     

Kinetics of photoinduced e to z isomerization of azobenzene in polystyrene films: thickness, molecular weight and temperature effects

E to Z (trans-->cis) photoisomerization of azobenzene (Az) chromophores tagged to polystyrene (PS) in thin films was studied as functions of thickness, PS molecular weight, and temperature, using the change in absorption at 336 nm arising from the Az E isomer remaining upon ultraviolet light irradiation at 350+/-5 nm. The photoisomerization in solid films exhibited fast and slow modes. The fractional amount of the fast mode (I1) started to increase with decreasing film thickness once the films were thinner than a threshold value. This was explained in terms of a surface layer in which the photoisomerization reaction proceeds quickly, the effect of which becomes more noticeable with decreasing thickness due to a larger surface to volume ratio. The thickness dependence of the I1 fraction was insensitive to the molecular weight of the PS used. The thickness of the surface layer, estimated through a layer model analysis, increased with rising temperature up to 298 K. Interestingly, the surface layer markedly thickened at temperatures at which the molecular motion of PS is on a relatively small scale, namely, at the gamma and beta relaxation temperatures.     

Dewetting of a sol-gel-derived thin film

We report on the dewetting of a thin film produced by the sol-gel method. In the early stages of dynamic morphological instability, the drying stress in the capillary wave model determines the linearly scaling behaviors of the characteristic wavelength with the initial film thickness and the square law dependence of the number density of the dewetted holes on the film thickness. These power law dependences are weaker than those observed in the case of the spinodal dewetting of a polymer thin film. The wavelength determined in the early stages also dominates the scaling behaviors of the average length of the sides and number density of the polygons and the diameter of the droplets of the dewetting pattern with the film thickness in the final stages of the dynamic instability. We also observed that further drying eventually induces wrinkles in the droplets, rim, and film, which have a characteristic wavelength that can be theoretically predicted.     

Initial formation of contact layers on Ni/SiC samples studied by XPS

This study deals with the quantitative assessment of the coverage and thickness of Ni silicide films formed during annealing of SiC substrates with sputtered thin films of Ni. The analytical approach involves the use of XPS and depth profiling by means of successive ion etchings and XPS analyses. For either 3 or 6 nm initial Ni film thickness, a 10 nm Ni₂Si product is formed. On top of this product, the C released is accumulated in a very thin (1–2 nm) film. In neither case, the Ni₂Si covers the whole surface, although the coverage is almost complete (～90%) in the latter case. For the greater initial Ni‐film thickness of 17 nm, the thickness of the Ni₂Si product corresponds well to the value of 25 nm expected from the Ni/Ni₂Si stoichiometric relationship. This thickness is significantly greater than a critical level and the film covers the whole surface. Carbon is similarly accumulated in a very thin layer on the top surface, although the major part of C (～70%) is found inside the main reaction product layer. Copyright © 2008 John Wiley & Sons, Ltd.     

Coupling of microphase separation and dewetting in weakly segregated diblock co-polymer ultrathin films

We have studied the coupling behavior of microphase separation and autophobic dewetting in weakly segregated poly(ε-caprolactone)-block-poly(L-lactide) (PCL-b-PLLA) diblock co-polymer ultrathin films on carbon-coated mica substrates. At temperatures higher than the melting point of the PLLA block, the co-polymer forms a lamellar structure in bulk with a long period of L ～ 20 nm, as determined using small-angle X-ray scattering. The relaxation procedure of ultrathin films with an initial film thickness of h = 10 nm during annealing has been followed by atomic force microscopy (AFM). In the experimental temperature range (100-140 °C), the co-polymer dewets to an ultrathin film of itself at about 5 nm because of the strong attraction of both blocks with the substrate. Moreover, the dewetting velocity increases with decreasing annealing temperatures. This novel dewetting kinetics can be explained by a competition effect of the composition fluctuation driven by the microphase separation with the dominated dewetting process during the early stage of the annealing process. While dewetting dominates the relaxation procedure and leads to the rupture of the ultrathin films, the composition fluctuation induced by the microphase separation attempts to stabilize them because of the matching of h to the long period (h ～ 1/2L). The temperature dependence of these two processes leads to this novel relaxation kinetics of co-polymer thin films.     

Reversible uptake of water on NaCl nanoparticles at relative humidity below deliquescence point observed by noncontact environmental atomic force microscopy

The behavior of NaCl nanoparticles as a function of relative humidity (RH) has been characterized using non-contact environmental atomic force microscopy (e-AFM) to measure the heights of particles deposited on a prepared hydrophobic surface. Cubic NaCl nanoparticles with sides of 35 and 80 nm were found to take up water reversibly with increasing RH well below the bulk deliquescence relative humidity (DRH) of 75% at 23(°)C, and to form a liquid-like surface layer of thickness 2 to 5 nm, with measurable uptake (>2 nm increase in particle height) beginning at 70% RH. The maximum thickness of the layer increased with increasing RH and increasing particle size over the range studied. The liquid-like behavior of the layer was indicated by a reversible rounding at the upper surface of the particles, fit to a parabolic cross-section, where the ratio of particle height to maximum radius of curvature increases from zero (flat top) at 68% RH to 0.7 ± 0.3 at 74% RH. These observations, which are consistent with a reorganization of mass on the solid NaCl nanocrystal at RH below the DRH, suggest that the deliquescence of NaCl nanoparticles is more complex than an abrupt first-order phase transition. The height measurements are consistent with a phenomenological model that assumes favorable contributions to the free energy of formation of a liquid layer on solid NaCl due both to van der Waals interactions, which depend partly upon the Hamaker constant, A(film), of the interaction between the thin liquid film and the solid NaCl, and to a longer-range electrostatic interaction over a characteristic length of persistence, ξ; the best fit to the data corresponded to A(film)= 1 kT and ξ = 2.33 nm.