State-of-the art and prospects of AIIIBV science and technology

Following a short historical retrospective, a survey of A^IIIB^v materials research is presented. Potentiality of the main techniques (VPE, LPE and MBE) and material systems (AIGaAs, InGaAs) is assessed with respect to requirements posed by device manufacture. Major emphasis is placed upon the discussion of modern trends in heterostructure devices for optoelectronics, such as injection lasers, light-emitting diodes, solar cells, detectors etc. Other topics, such as Gunn diodes, avalanche-drift diodes and HF transistors, are also covered.     

Electrical Measurement Techniques in Atomic Force Microscopy

A conductive tip in an atomic force microscope (AFM) has extended the capability from conventional topographic imaging to electrical surface characterization. The conductive tip acts as a voltage electrode to provide stimuli and monitor electrical surface properties. In this review article, we have organized the AFM electrical techniques based on whether the electrical properties are monitored at the cantilever tip or across the sample. Furthermore, the techniques are organized based on probe detection signal. A number of acronyms are used in the literature, and the more commonly used ones are identified. The principle of each technique is described, and representative applications are presented. A better understanding of the spectrum of techniques should serve as the driver to expand the application of electrical techniques to study interdisciplinary phenomena at the nanoscale.     

First principle study on interfacial interaction of black phosphorus and CsBr vdW heterostructure

Two dimensional crystalline materials have attracted much attentions due to the establishment of heterostructure that can adjust their electrical and optical properties, and have potential applications in lasers, light-emitting diodes, solar cells and high mobility transistors. And the interface engineering is an effective route to tune structural and electrical properties in semiconductor heterostructures. In this study, the electronic structure, charge transport and optical properties of monolayer caesium bromide and black phosphorus (CsBr/BP) heterostructure are calculated by the first principle based on density functional theory (DFT). It was found that the characteristics of electronic band structures of the monolayer CsBr and BP remain in the heterostructure, and the effective mass and carrier mobility are highly anisotropic. When the heterostructure is uniaxially stretched, the mobility of electron is greater than that of the hole, while the biaxial stretching is just the opposite, the mobility of hole is greater than that of the electron. In addition, compared with the CsBr monolayer, the light absorption of the heterostructure is significantly enhanced, especially in the infrared, indicating that the CsBr/BP heterostructure can be well applied to photovoltaic devices in the future.     

Nanometer Scale Electrical Characterization of Artificial Mesostructures

In this article, we review advances in experimental techniques for the electrical characterization of artificial mesostructures from nanometer to micrometer size. As the scale of electronic devices is rapidly approaching the 100-nm benchmark, new tools are becoming necessary to study and characterize them. We are also at a point where new tools to fabricate these devices are becoming increasingly relevant. We discuss the various characterization techniques applicable to objects of this scale, with particular emphasis on scanned probe methods.     

Direct probing of Schottky barriers in Si nanowire Schottky barrier field effect transistors

This work elucidates the role of the Schottky junction in the electronic transport of nanometer-scale transistors. In the example of Schottky barrier silicon nanowire field effect transistors, an electrical scanning probe technique is applied to examine the charge transport effects of a nanometer-scale local top gate during operation. The results prove experimentally that Schottky barriers control the charge carrier transport in these devices. In addition, a proof of concept for a reprogrammable nonvolatile memory device based on band bending at the Schottky barriers will be shown.     

Fiber optics in japan

Abstract

This paper describes the recent progress in research and development of fiber optics in Japan. A review is presented of recent developments in fiber manufacturing, cabling, and fiber splicing. Experimental results are given for an optical communication system with optoelectronic components. Theoretical analysis and fundamental experiments are not included, nor are research activities in such devices as lasers or in such applications as those in medical fields. Transmission characteristics of optical fibers—in particular loss and pulse spreading—are assessed from the viewpoint of their structures. Various methods of fiber strengthening and structuring cables are described from the viewpoint of mechanical strength. Coupling efficiencies of detachable connectors and methods of permanent fiber splicing are described. Experimental results on optical fiber communication systems are presented and coupling techniques between a light source and an optical fiber are described.     

Direct observation of the potential distribution within organic light emitting diodes under operation

We show the first direct measurement of the potential distribution within organic light emitting diodes (OLEDs) under operation and hereby confirm existing hypotheses about charge transport and accumulation in the layer stack. Using a focused ion beam to mill holes in the diodes we gain access to the cross section of the devices and explore the spatially resolved potential distribution in situ by scanning Kelvin probe microscopy under different bias conditions. In bilayer OLEDs consisting of tris(hydroxyquinolinato) aluminum (Alq₃)/N, N ′‐bis(naphthalene‐1‐yl)‐N,N ′‐bis(phenyl) benzidine (NPB) the potential exclusively drops across the Alq₃ layer for applied bias between onset voltage and a given transition voltage. These findings are consistent with previously performed capacitance–voltage measurements. The behavior can be attributed to charge accumulation at the interface between the different organic materials. Furthermore, we show the potential distribution of devices with different cathode structures and degraded devices to identify the cathode interface as main culprit for decreased performance. (© 2015 WILEY‐VCH Verlag GmbH &Co. KGaA, Weinheim)     

PIEZOELECTRIC Pb(Zr, Ti)O3 MICRO-DEVICES FOR SCANNING FORCE MICROSCOPY AND ULTRA-DENSITY DATA STORAGE

In this paper we report two types of micro devices based on Pb(Zr, Ti)O₃ (PZT) thin films for improving the throughput of scanning force microscopy (SFM) or data storage using SFM. One is a piezoelectric cantilever array integrated with force sensor as well as z-actuator on each cantilever for parallel operation. The 125-μm-long PZT micro cantilever with a natural resonant frequency of 189 kHz has a high actuation sensitivity of 75 nm/V. Independent parallel images using two cantilevers of the array were obtained. The other is a novel micro-SFM device that is expected to replace the cantilever, the deflection detection unit, and the macro-fabricated scanner which is the bottle neck limiting the single probe acquisition rate. The bridge-structured device has shown a microscopy sensitivity of 0.32 nA/nm in vertical direction and actuation abilities of 70-80nm/±V in the lateral direction.     

半导体量子器件物理讲座：第五讲 弹道输运器和量子干涉器件

当器件的尺度小型与电子的平均自由程相当时,电子的输运可以看作弹道输运。文章介绍了隧穿热电子晶体管输运放大器和电子能谱仪两种工作模式下的工作原理以及用共振隧穿热电子晶体管做成的记忆器,如果器件的尺寸进一步减小,电子的波动特性也必须考虑,文章介绍了研究这种器件中的输运特性的方法及量子干涉晶体管和量子反射晶体管的工作原理。     

Operational and design considerations for broad area graded barrier quantum well heterostructure lasers grown by metalorganic chemical vapor deposition for high power applications

Graded barrier quantum well heterostructure (GBQWH) broad area lasers have been shown to be capable of high power pulsed and cw operation. In this article, we consider several operational characteristics and design issues associated with broad area graded barrier quantum well heterostructure lasers grown by metalorganic chemical vapor deposition. In particular, the effect of junction heating on emission wavelength for cw device operation and the effects of various buffer layer structures on the material properties and device characteristics of GBQWH structures are addressed. Typical results for high power operation of uncoated broad area laser diodes are also outlined.     

Operational and design considerations for broad area graded barrier quantum well heterostructure lasers grown by metalorganic chemical vapor deposition for high power applications

Graded barrier quantum well heterostructure (GBQWH) broad area lasers have been shown to be capable of high power pulsed and cw operation. In this article, we consider several operational characteristics and design issues associated with broad area graded barrier quantum well heterostructure lasers grown by metalorganic chemical vapor deposition. In particular, the effect of junction heating on emission wavelength for cw device operation and the effects of various buffer layer structures on the material properties and device characteristics of GBQWH structures are addressed. Typical results for high power operation of uncoated broad area laser diodes are also outlined.     

单分子物理与化学的新进展

本文对新兴边缘学科-单分子物理与化学的一些研究进展进行简要综述。在对单分子科学中几类基本实验技术如扫描隧道显微术和光镊技术等作了简要介绍之后,重点评述了单分子实验技术和研究方法在物理、化学、生物和分子电子学等学科领域的应用和影响。基于扫描隧道显微术和电子结构计算,列举了最近几个关于单分子高分辨表征、单分子器件和单分子量子调控等方面的研究实例。最后对单分子物理与化学的发展前景进行了展望。     

忆阻器单阻态下的记忆电容行为及多态特性

采用供体-受体类型的共聚物构建了Al/共聚物/ITO结构的有机记忆器件,并对其电流-电压(I-V)和电容-电压(C-V)特性进行了研究.结果表明:器件不仅表现出明显的记忆电阻特征,而且在单个电阻状态下还存在记忆电容行为,使器件呈现出两种电阻状态和与之对应的四种电容状态,具有电阻和电容的双参量记忆能力.在此基础上对器件的电容开关行为进行了电压幅值的调制,使器件出现了更多的电容状态,为多级存储的实现提供了一条有效途径.最后通过引入分子内部极化算符,建立了记忆电阻和记忆电容的关联性,给出了描述器件双参量多状态特征的矩阵模型.     

Nanoscopically resolved dynamic charge‐carrier distribution in operating interband cascade lasers

Dynamic charge carriers play a vital role in active photonic quantum/nanodevices, such as electrically pumped semiconductor lasers. Here we present a systematic experimental study of gain‐providing charge‐carrier distribution in a lasing interband cascade laser. The unique charge‐carrier distribution profile in the quantum‐well active region is quantitatively measured at nanometer scales by using a noninvasive scanning voltage microscopy technique. Experimental results clearly confirm the accumulation and spatial segregation of holes and electrons in the beating heart of the device. The measurement also shows that the charge‐carrier density is essentially clamped in the presence of stimulated emission at low temperatures. The threshold charge‐carrier density exhibits a linear but fairly weak temperature dependence, in contrast to the exponential temperature dependence of the threshold current. The experimental approach will lead to a deeper understanding of fundamental processes that govern the operation and performance of nanoelectronic devices, quantum devices and optoelectronic devices.

     

Dopant profiling in silicon nanowires measured by scanning capacitance microscopy

Silicon nanowires (SiNWs) with axial doping junctions were synthesized via the Au‐catalyzed vapor–liquid–solid growth method with the use of HCl. In this work, dopant profiling from three axially doped SiNWs with p–i, p–n and n–i–p junctions were investigated using both scanning electron microscopy (SEM) and scanning capacitance microscopy (SCM). It turns out that observed doping contrasts in SEM are also affected by the surface roughness and sample charging. In contrast, SCM allows us to delineate with sub‐10 nm resolution the electrical junctions and provides a relative value of the doping concentration in each segment of the NW. SCM clearly evidences the expected doping regions within these SiNWs thanks to the addition of HCl during the growth that strongly prevents shell overgrowth. (© 2014 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

MEH-PPV/PEG聚合物电双稳器件的研究

将PEG(聚乙二醇)引入到ITO/MEH-PPV(聚(2-甲氧基,5(2'-乙基己氧基)-1,4-苯撑乙烯撑)/Al三明治器件中,实现了很好的电双稳性能。通过改变PEG的分子量、浓度以及退火温度等条件,对器件性能进行了优化。通过电流-电压(I-V)测试研究了不同器件的性能,结果表明,分子量为4 000的PEG,在30 mg/mL的浓度下,通过120℃退火制备的薄膜,其器件性能最优,电流开关比可以达到10~3以上。利用SEM测试研究了活性层的膜形貌,并结合电流-电压(I-V)曲线的线性拟合,分析了电荷在器件中的传输过程。研究发现,相分离产生的陷阱对电荷的俘获是该器件产生电双稳特性的主要原因。     

基于拉曼热测量技术的铜基复合物法兰GaN基晶体管的热阻分析

采用拉曼热测量技术结合有限元热仿真模型,分析比较新型铜/石墨复合物法兰封装与传统铜钼法兰封装的GaN器件的结温与热阻,发现前者的整体热阻比铜钼法兰器件的整体热阻低18.7%,器件内部各层材料的温度分布显示铜/石墨复合物法兰在器件中的热阻占比相比铜钼法兰在器件中的热阻占比低13%,这证明使用高热导率铜/石墨复合物法兰封装提高GaN器件热扩散性能的有效性.通过对两种GaN器件热阻占比的测量与分析,发现除了封装法兰以外,热阻占比最高的是GaN外延与衬底材料之间的界面热阻,降低界面热阻是进一步提高器件热性能的关键.同时,详细阐述了使用拉曼光热技术测量GaN器件结温和热阻的原理和过程,展示了拉曼光热技术作为一种GaN器件热特性表征方法的有效性.     

Finite Element Analysis of Thermal Characteristics in Continuous Wave Long Wavelength Surface Emitting Lasers (II): Semiconductor Distributed Bragg Reflectors

We have numerically analyzed some thermal characteristics of cw long wavelength surface emitting lasers with epitaxially grown semiconductor distributed Bragg reflectors (DBRs). It was shown that the device thermal resistance for GaAs/AlAs DBRs epitaxially fused to GalnAsP/InP emitting layers is 1/3 of that for GalnAsP/InP DBRs and almost comparable to that for the optimum dielectric cavity. The threshold current lower than 10 mA and the electrical resistance lower than 100 Ω are necessary to obtain the cw operation beyond room temperature     

Highly uniform sheet resistance of the double-channel AlInN/GaN heterostructure

A high uniformity of sheet resistance was achieved in the double-channel (DC) Al_0.82In_0.18N/GaN heterostructure by lowering the interface roughness scattering effect. The variation of the AlInN/GaN interface roughness as a key factor influenced the uniformity of the sheet resistance. In the DC heterostructure, the distribution of the two dimension electron gas (2DEG) was modified to reduce interface roughness scattering effect. As a result, the uniformity of the sheet resistance was enhanced, and the nonuniformity of the sheet resistance in the DC Al_0.82In_0.18N/GaN could be reduced to 0.7% after structure optimization.     

Kelvin probe force microscopy and its application

Kelvin probe force microscopy (KPFM) is a tool that enables nanometer-scale imaging of the surface potential on a broad range of materials. KPFM measurements require an understanding of both the details of the instruments and the physics of the measurements to obtain optimal results. The first part of this review will introduce the principles of KPFM and compare KPFM to other surface work function and potential measurement tools, including the Kelvin probe (KP), photoemission spectroscopy (PES), and scanning electron microscopy (SEM) with an electron beam induced current (EBIC) measurement system. The concept of local contact potential difference (LCPD), important for understanding atomic resolution KPFM, is discussed. The second part of this review explores three applications of KPFM: metallic nanostructures, semiconductor materials, and electrical devices.