Hysteretic effects in the dc current-voltage characteristic of normal Nb/Pb tunnel junctions

High resistance normal Nb/Pb tunnel junctions have been studied. Both at 300 K and 77 K an hysteresis in the I–V characteristic has been measured: the presence of negative or positive bias voltages changes the tunneling probability. At every fixed bias current value, a voltage drift with time appears. The drift velocity increases as the voltage or the temperature increases. Moreover at 77 K anomalous low frequency oscillations arise in the junction when some positive or negative threshold voltages are exceeded.     

Double threshold behaviour of I－V characteristics of CoSi2/Si Schottky contacts

The forward current－voltage (I－V) characteristics of polycrystalline CoSi₂/n-Si(100) Schottky contacts have been measured in a wide temperature range. At low temperatures (≤200K), a plateau-like section is observed in the I－V characteristics around 10^-4A·cm^-2. The current in the small bias region significantly exceeds that expected by the model based on thermionic emission (TE) and a Gaussian distribution of Schottky barrier height (SBH). Such a double threshold behaviour can be explained by the barrier height inhomogeneity, i.e. at low temperatures the current through some patches with low SBH dominates at small bias region. With increasing bias voltage, the Ohmic effect becomes important and the current through the whole junction area exceeds the patch current, thus resulting in a plateau-like section in the I－V curves at moderate bias. For the polycrystalline CoSi₂/Si contacts studied in this paper, the apparent ideality factor of the patch current is much larger than that calculated from the TE model taking the pinch-off effect into account. This suggests that the current flowing through these patches is of the tunnelling type, rather than the thermionic emission type. The experimental I－V characteristics can be fitted reasonably well in the whole temperature region using the model based on tunnelling and pinch-off.     

Fabrication and electrical characterization of thermally deposited amorphous Se0.82In0.18 on n-Si (100)

Amorphous (a-) Se_0.82In_0.18 thin films have been deposited onto n-type silicon (n-Si) single crystal, using the three-temperature technique, in the fabricated configuration of Au/a-Se_0.82In_0.18/n-Si/Al. The current density-voltage (J–V) characteristics have been measured at different isotherms in the range of 198–313 K, thus inspecting the conduction mechanisms comparing with Au/a-Se/n-Si/Al heterojunctions. The analysis proved that the forward bias is characterized by two parts: current increasing exponentially with the applied voltage (low voltage bias region, V<0.2 V), and non-exponentially in the higher voltage region (V>0.2 V). At the low bias region, the current was dominated by a multi-tunneling capture-emission process with a rather temperature-independent effect in the temperature range investigated. However, at the high voltage region, the effect of temperature becomes more pronounced with an ohmic character in the range of 198 to 273 K. For temperatures higher than 273 K, and below the glass transition temperature of a-Se_0.82In_0.18 (T _g～330 K), the high voltage region could be subdivided into two parts: an ohmic conduction range that limited at bias voltage of 0.20 V<V<0.46 V, and a space charge limited current region for bias voltage of V>0.46 V. The reverse J–V characteristics showed a deviation from that of the ideal diode behavior, analogous to that of pure a-Se/n-Si heterojunctions.     

Electrical and photoresponse characteristics of 8-(1H-indol-3-ylazo)-naphthalene-2-sulfonic acid/n-Si photodiode

In this paper, of primary interest is to synthesis 8-(1H-indol-3-ylazo)-naphthalene-2-sulfonic acid (INSA) and to evaluate the main parameters of Au/INSA/n-Si/Al diode in dark and under illumination. Different techniques are used for interpreting the proposed INSA chemical structure. The dark current-voltage measurements were achieved in the temperature range of 293?413 K. It is noticed that INSA films modify the interfacial barrier height of classical Au/n-Si junction. At low applied voltages, the I–V relation shows exponential behavior. The values ideality factor, n, and the barrier height, φ, are improved by heating. The abnormal trend of n and φ is discussed, and a homogenous barrier height of 1.45 eV is evaluated. The series resistance is also calculated using Norde's function and it changes inversely with temperature. The space charge limited current ruled with exponential trap distribution dominates at relatively high potentials, trap concentration and carriers mobility are extracted. The reverse current of the diode has illumination intensity dependence with a good photosensitivity indicating that the device is promising for photodiode applications.     

Intrinsic tunnelling effects in self-doped La0.89MnO3 single crystals

Transport properties of self-doped La_0.89MnO₃ single crystals with Néel temperature of T_N ≈139 K have been investigated in wide temperature range 10–300 K. Data suggests that current at low temperature is conducted through a strongly temperature-dependent, but almost bias independent channel operating in parallel with a bias controlled but temperature independent channel. The first channel is associated with transport across an insulating antiferromagnetic matrix while the latter one represents tunnel conductivity through intrinsic tunnel junctions appearing due to interruption of conducting percolating paths by phase separated insulating inclusions. Tunnel character of the conductivity manifests itself in nonlinear current-voltage characteristics and appearance of a zero-bias anomaly in the form of a prominent conductance peak in the vicinity of zero bias. Zero bias anomaly and V-shaped characteristics of the differential conductance at high voltages are ascribed to the formation of local magnetic states in the insulating region of the tunneling junction.     

Electronic transport and magnetoresistance of a heterojunction composed of La0.7Ce0.3MnO3 and 1 wt% Nb-doped SrTiO3

We experimentally studied the transport properties and magnetoresistance behavior of a La_0.7Ce_0.3MnO₃/SrTiO₃ (doped by 1 wt% Nb) junction. Based on the analyses of the current-voltage relations and the depletion width, we conclude that the dominant transport mechanism of the junction is tunneling. The magnetoresistance of the junction is negative throughout the whole bias voltage range (from −1 V to 0.4 V) and the whole temperature range (below 300 K). It is believed that the magnetic field depresses the junction resistance by reducing the depletion width of the junction.     

Current transport in ZnO/Si heterostructure grown by laser molecular beam epitaxy

The n-ZnO/p-Si heterojunction was fabricated by depositing high quality single crystalline aluminium-doped n-type ZnO film on p-type Si using the laser molecular beam epitaxy technique. The heterojunction exhibited a good rectifying behavior. The electrical properties of the heterojunction were investigated by means of temperature dependence current density-voltage measurements. The mechanism of the current transport was proposed based on the band structure of the heterojunction. When the applied bias V is lower than 0.15 V, the current follows the Ohmic behavior. When 0.15V 0.6 V), the space charge limited effect becomes the main transport mechanism. The current-voltage characteristic under illumination was also investigated. The photovoltage and the short circuit current density of the heterojunction aproached 270 mV and 2.10 mA/cm 2 , respectively.     

Thermionic current in a metal-superconducting semiconductor junction

The transition of a semiconductor to a superconducting state leads to a decrease in the thermionic current in the metal-superconducting semiconductor junction in the range of voltages close to the potential barrier height. Changes in the current-voltage characteristic are determined by the temperature and the energy gap parameter of the superconductor.     

CuO薄膜的制备及其光伏特性

通过反应磁控溅射在n型硅和玻璃衬底上制备了p型CuO薄膜.使用X射线衍射仪和紫外-可见光-近红外光度计研究了p型CuO薄膜的结构和光学特性,得出其平均晶粒尺寸和光学带隙分别为8 nm和1.36 eV.通过研究其电压-电流关系确定了在p型CuO薄膜和n型硅衬底之间形成了p-n结.在AM 1.5光照条件下p-CuO/n-Si电池的开路电压为0.33 V,短路电流密度为6.27 mA/cm², 填充因数和能量转化效率分别为0.2和0.41%.     

Properties of Mott contacts with an ultralow metal-semiconductor barrier

The current-voltage and capacitance characteristics of Mott contacts with an ultralow metal-semiconductor barrier are investigated. The analysis is based on the analytical solution of the Poisson equation for the space charge of carriers in the “metal-i-layer-n ⁺-substrate” structure without regard for bulk doping of the i layer. For contacts with ultralow metal-semiconductor barriers (comparable in magnitude to the thermal energy of charge carries), it is demonstrated that the reverse current becomes greater than the forward current, the sign of rectification is reversed, and the capacitance of the contact acquires a strong dependence on the voltage. This means that the mechanism of nonlinearity of the structure changes and the nonlinearity governed by charge carriers injected into the i layer becomes dominant. In a specific range of bias voltages close to zero, the differential resistance and the capacitance of the structure exponentially increase with increasing voltage. The observed behavior is not typical of conventional metal-semiconductor contacts. The obtained dependences of the electric current and capacitance on the voltage determine the characteristics of new advanced instruments, in particular, highly sensitive microwave detectors operating without a bias voltage.     

Characteristics of p-ZnO/n-GaN heterojunction photodetector

Thin film heterojuction of the type p-ZnO/n-GaN was prepared by spray pyrolysis and electron beam evaporation technique, respectively. Hall measurements demonstrate the firm p-type conductivity of the p-doped ZnO film. The structural and electrical properties of the p-ZnO/n-GaN heterojunction are investigated by X-ray diffraction (XRD) and current-voltage (I-V) measurements. The XRD shows that the p-ZnO/n-GaN heterojunction is highly crystalline in nature with preferred orientation along the [0001] direction. The current-voltage curve of the heterojunction demonstrates obvious rectifying diode behavior in the dark and under illumination conditions. The ideality factor of the detector was determined in case of forward bias at low voltages and it was found to be 13.35. The turn-on voltage appears at about 1V under forward-biased voltage, and the reverse breakdown voltage is about 4V. It was found that the current of the illumination increases with the increase of bias voltages.     

Electron tunneling through superconducting A1/monolayer/Pb junctions

The current-voltage characteristic of Al/adsorbed monolayer/Pb junctions was measured at 77, 4.2 and 1.8K at applied voltages from 1 to 3 mV. At 77K the current changes linearly with voltage whereas at 4.2 and 1.8 K the relationship becomes nonlinear. From the results at 1.8 K we obtain an approximate band gap for Pb equal to 2.6 meV. The observation of a nonlinear current-voltage characteristic at temperatures where Pb becomes superconducting is strong evidence that the observed current through the insulator is a tunneling current.     

Electrical and photovoltaic characteristics of sodium copper chlorophyllin/n-type silicon heterojunctions

Heterojunctions of p-type sodium copper chlorophyllin (p-SCC)/n-type silicon (n-Si) were prepared by deposition of p-SCC film on n-Si wafers using spray-pyrolysis technique. Current-voltage and capacitance-voltage measurements of Au/p-SCC/n-Si/In heterojunctions were performed to discuss the electrical properties of these heterostructures. Rectifying characteristics were observed, which are definitely of the diode type. The current-voltage measurements suggest that the forward current in these junctions involves tunnelling and the results showed that the forward current can be explained by a multi-tunnelling capture-emission model in which the electron emission process dominates the carrier transport mechanism. On the other hand, the reverse current is probably limited by the same conduction process. The capacitance-voltage behavior indicates an abrupt heterojunction model is valid for Au/p-SCC/n-Si/In heterojunctions and the junction parameters such as, built-in potential, V_D, carrier concentration, N, the width of depletion layer, W, were obtained. The temperature and frequency dependence of the measured capacitance were also studied. The loaded I-V characteristics under white illumination provided by tungsten lamp (80 mW/cm²) give values of 400 mV, 0.9 mA, 0.38 and 1.7% for the open-circuit voltage, V_oc, the short-circuit current, I_sc, the fill factor, FF, and conversion efficiency, η, respectively.     

Field Effect in the Linear and Nonlinear Conductivity of the Layered Quasi-One-Dimensional Semiconductor TiS3

Field-effect transistor structures based on whiskers of layered quasi-one-dimensional semiconductor TiS₃ have been fabricated. The dependences of the conductivity σ on the gate voltage V_g, as well as the current-voltage characteristics of whiskers (“source-drain”) at different V_g values, have been measured in the temperature range of 4.2-300 K. As the temperature decreases, the sensitivity of the conductivity to the gate voltage, α ≡ 1/σdσ/dV_g, increases in the range from 300 to 80 K and decreases sharply below 80 K, where the nonlinear conductivity begins to depend on V_g. The results can be explained by the formation of an electronic crystal at low temperatures.

     

Temperature-dependent characteristics of 4Hben SiC junction barrier Schottky diodes

The current-voltage characteristics of 4H-SiC junction barrier Schottky (JBS) diodes terminated by an offset field plate have been measured in the temperature range of 25-300 ℃. An experimental barrier height value of about 0.5 eV is obtained for the Ti/4H-SiC JBS diodes at room temperature. A decrease in the experimental barrier height and an increase in the ideality factor with decreasing temperature are shown. Reverse recovery testing also shows the temperature dependence of the peak recovery current density and the reverse recovery time. Finally, a discussion of reducing the reverse recovery time is presented.     

Temperature-dependent characteristics of 4H-SiC junction barrier Schottky diodes

The current-voltage characteristics of 4H-SiC junction barrier Schottky(JBS) diodes terminated by an offset field plate have been measured in the temperature range of 25-300 C.An experimental barrier height value of about 0.5 eV is obtained for the Ti/4H-SiC JBS diodes at room temperature.A decrease in the experimental barrier height and an increase in the ideality factor with decreasing temperature are shown.Reverse recovery testing also shows the temperature dependence of the peak recovery current density and the reverse recovery time.Finally,a discussion of reducing the reverse recovery time is presented.     

Pr0.5Ca0.5MnO3/Si异质结输运特性和整流特性研究

利用固相反应法制备Pr_0.5Ca_0.5MnO₃(PCMO)靶材,并采用脉冲激光沉积法(PLD)在n型Si(111)基片上沉积PCMO外延薄膜,研究了薄膜的输运特性及薄膜与Si衬底形成异质结的整流特性.结果表明:在80—300 K温度范围内,PCMO薄膜的阻温关系符合变程跳跃模型,随着温度的升高表现出从一维到二维再到三维的转变,分析认为可能源于轨道自由度对电子输运特性的影响.PCMO/Si异质结在磁场作用下整流特性得到改善,且在正向电流方向出 关键词： 0.5Ca_0.5MnO₃')" href="#">Pr_0.5Ca_0.5MnO₃ Si 整流 正磁电阻     

Fluctuation dominated Josephson tunneling with a scanning tunneling microscope

We demonstrate Josephson tunneling in vacuum tunnel junctions formed between a superconducting scanning tunneling microscope tip and a Pb film, for junction resistances in the range 50-300 k Omega. We show that the superconducting phase dynamics is dominated by thermal fluctuations, and that the Josephson current appears as a peak centered at small finite voltage. In the presence of microwave fields ( f = 15.0 GHz) the peak decreases in magnitude and shifts to higher voltages with increasing rf power, in agreement with theory.     

Inhomogeneities in 130 MeV Au ion irradiated Au/n-Si (1 0 0) Schottky structure

The electrical characteristics of Au/n-Si (1 0 0) Schottky rectifier have been studied in a wide irradiation fluence range using conventional current-voltage (I-V) and capacitance-voltage (C-V) measurements. The I-V characteristics showed an abnormal increase in forward current at low voltage. The device shows a bend in forward I-V and reverses bias C-V characteristics due to extra current, suggesting that there are two independent contributions to thermionic current, corresponding to two levels of the Schottky barrier. It is shown that the excess current at low voltage can be explained by taking into account the role of heavy ion irradiation induced defects at the metal semiconductor interface.     

Temperature independent leakage current in Au/TbMnO3/Y Ba2Cu3O7−x capacitors

Au/TbMnO₃/Y Ba₂Cu₃O_7?x capacitors were fabricated on LaAlO₃ substrates and electrical characteristics were studied in the temperature range from 300 to 25 K. When temperature is higher than 225 K, Ohmic conduction is observed in the capacitors. Non-linear current–voltage characteristics are exhibited at low temperatures. Moreover, temperature-independent leakage currents are found at temperatures lower than 150 K. These electrical characteristics can be explained in terms of conduction transition originated from a thermal activation between 225 and 150 K, and the temperature-independent leakage currents are governed by the Poole–Frenkel emission and minor trap ionization energies.