Study of the end‐group contribution to ToF‐SIMS and G‐SIMS spectra of poly (lactic acid) using deuterium labelling

In this study, polymeric (MW 50 000) and oligomeric (MW 2000) poly (lactic acid) (PLA), both with and without end‐group deuterium exchange, were analysed using static secondary ion mass spectrometry (SSIMS) to investigate the contribution of end‐group‐derived secondary ions to the SSIMS spectra. By monitoring the SSIMS intensities between the non‐deuterated and deuterated PLA, it is evident that the only significant end‐group‐derived secondary ions are [nM + H]⁺ (n > 1) and C₄H₉O₂⁺. The gentle‐SIMS (G‐SIMS) methodology was employed to establish that deuterated fragments were produced through low energy processes and were not the result of substantial rearrangements. It was noted that end‐group‐derived secondary ions had higher G‐SIMS intensities for oligomeric PLA than polymeric PLA, showing that these secondary ions are simple fragment products that are not the result of rearrangement or degraded product ions. Copyright © 2007 John Wiley & Sons, Ltd.     

Extracting information on the surface monomer unit distribution of PLGA by ToF‐SIMS

The surface chemistry of a range of random poly l‐lactide‐co‐glycolide (PLGA) materials has been investigated using XPS, static secondary ion mass spectrometry (SSIMS) and gentle secondary ion mass spectrometry (G‐SIMS). The estimated mole fraction of lactide units provided by SSIMS was in good agreement with bulk composition and appeared not to have been affected by contamination. Conversely, XPS assessment of lactide compositions was unreliable due to hydrocarbon contamination contributions. In this study, we propose a novel model to demonstrate that by using SSIMS it is possible to infer the degree of trans‐esterification for PLGA co‐polymers synthesised from a mixture of lactide and glycolide homo‐dimers. This was determined by introducing two independent parameters, the ratio of trans‐esterified bonds to the total number of ester bonds, P_T, and the lactide composition. The model has indicated that, for this set of polymers, P_T was approximately 0.25. Furthermore, we have demonstrated that G‐SIMS successfully identified the structurally important key fragments leading to direct identification. Analysis by G‐SIMS showed that the glycolic acid units from all PLGA compositions are emitted in a lower energy‐fragmentation process than lactic acid units. Copyright © 2008 John Wiley & Sons, Ltd.     

ToF‐SIMS for the characterization of hyperbranched aliphatic polyesters: probing their molecular weight on surfaces based on principal component analysis (PCA)

A series of 2,2‐bis(hydroxymethyl)propionic acid (Bis‐MPA) hyperbranched aliphatic polyesters with different molecular weights (generations) is analysed for the first time by time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS). The main negative and positive low‐mass fragments are identified in the fingerprint part of the spectra (m/z < 400) and are principally assigned to fragmentation of the Bis‐MPA repeating units. In addition, it is shown that the fragmentation pattern is highly affected by the functional end‐groups. This is illustrated for a phthalic acid end‐capped hyperbranched polymer and for an acetonide‐terminated dendrimer analog. Also, typical fragments assigned to the ethoxylated pentaerythritol core molecule are detected. These ions show decreasing intensities with increasing molecular weight. This intensity dependency on the generation is used to calibrate the molecular weight of hyperbranched polyesters on the surface. To obtain quantitative information, a principal component analysis (PCA) multivariate statistical method is applied to the ToF‐SIMS data. The influence of different normalization procedures prior to PCA calculation is tested, e.g. normalization to the total intensity, to the intensities of ions assigned to the Bis‐MPA repeating unit or to intensities of fragments due to the core molecule. It is shown that only one principal component (PC1) is needed to describe most of the variance between the samples. In addition, PC1 takes into account the generation effect. However, different relationships between the PC1 scores and the hyperbranched mass average molecular weights are observed depending on the normalization procedure used. Normalization of data set ion intensities by ion intensities from the core molecule allows linearization of the SIMS intensities versus the molecular weight and allows the hyperbranched polymers to be discriminated up to the highest generations. In addition, PCA applied to ToF‐SIMS data provides an extended interpretation of the spectra leading to further identification of the correlated mass peaks, such as those of the Bis‐MPA repeating unit (terminal, dendritic and linear) and those of the core molecule. Finally, the work presented demonstrates the extreme potential of the static ToF‐SIMS and PCA techniques in the analysis of dendritic molecules on solid surfaces. Copyright © 2003 John Wiley & Sons, Ltd.     

Static TOF‐SIMS — a VAMAS interlaboratory study. Part I. Repeatability and reproducibility of spectra

An interlaboratory study involving 32 Time‐of‐Flight Static SIMS instruments from 12 countries has been conducted. Analysts were supplied, by NPL, with a protocol for analysis together with three reference materials; a thin layer of polycarbonate (PC) on a silicon wafer, a thin layer of polystyrene (PS) oligomers on etched silver and poly(tetrafluoroethylene) (PTFE). The study involved static SIMS analysis of each reference material for both positive and negative polarity secondary ions. The option to test instrument suitability for G‐SIMS was also provided. The results of this study show that over 84% of instruments have excellent repeatabilities of better than 1.9%. Repeatabilities can be as good as 0.4%. A relative instrument spectral response (RISR) is calculated for each instrument for each reference material and ion polarity. The RISR is used to evaluate variations in spectral response between different generic types of SIMS instruments. Use of the RISR allows the identification of contamination, charge stabilisation problems and incorrectly functioning ion detectors. The high quality of the data presented here allows the RISR to reveal differences in individual operation of each instrument such as the use of apertures to remove metastables from the spectra and the use of different post‐acceleration voltages for ion detection. Spectral reproducibility can be measured, here, by the equivalence of RISRs between materials and ion polarities. It is found that reproducibilities are on average 10% but can be as good as 4% for the best instruments. This figure shows the consistency between instruments in measuring spectra from different samples. This study sets out the basic framework to develop static secondary ion mass spectrometry (SSIMS) as a reliable measurement method. © Crown Copyright 2005. Reproduced with the permission of Her Majestry's Stationery Office. Published by John Wiley & Sons, Ltd.     

Static TOF‐SIMS. A VAMAS interlaboratory study. Part II — accuracy of the mass scale and G‐SIMS compatibility

An interlaboratory study involving 32 time‐of‐flight static SIMS instruments from 13 countries has been conducted. In Part I of the analysis of data, we showed that 84% of instruments have excellent repeatabilities of better than 1.9% and that a relative instrument spectral response (RISR) can be used to evaluate variations between different generic types of instrument. Use of the RISR improves comparability between instruments by a factor of 33. Here, in Part II, we study the accuracy of the mass scale calibration in TOF‐SIMS and evaluate instrument compatibility with G‐SIMS. We show that the accuracy of calibration of the mass scale is much poorer than generally expected (?60 ppm for peaks <200 u and ?150 ppm for a large molecular peak at 647 u). This is a major issue for analysts. Elsewhere, we have developed a detailed study of the factors affecting the mass calibration and have developed a generic protocol that improves accuracy by a factor of 5. Here, this framework of understanding is used to interpret the results presented. Furthermore, we show that eight out of the ten participants submitting data for G‐SIMS could use operating conditions that generated G‐SIMS spectra of the PC reference material. This demonstrates that G‐SIMS may be conducted with a wide variety of instrument designs. © Crown Copyright 2007. Reproduced by permission of the Controller of HMSO. Published by John Wiley & Sons, Ltd.     

Quantitative analysis of styrene‐pentafluorostyrene random copolymers by ToF‐SIMS and XPS

Poly(styrene) (PS), poly(2,3,4,5,6‐pentafluorostyrene) (5FPS) and their random copolymers were prepared by bulk radical polymerization. The spin‐cast polymer films of these polymers were analyzed using X‐ray photoelectron spectroscopy (XPS) and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS). The surface and bulk compositions of these copolymers were found to be same, implying that surface segregation did not occur. The detailed analysis of ToF‐SIMS spectra indicated that the ion fragmentation mechanism is similar for both PS and 5FPS. ToF‐SIMS quantitative analysis using absolute peak intensity showed that the SIMS intensities of positive styrene fragments, particularly C₇H₇⁺, in the copolymers are higher than the intensities expected from a linear combination of PS and 5FPS, while the SIMS intensities of positive pentafluorostyrene fragments are smaller than expected. These results indicated the presence of matrix effects in ion formation process. However, the quantitative approach using relative peak intensity showed that ion intensity ratios are linearly proportional to the copolymer mole ratio when the characteristic ions of PS and 5FPS are selected. This suggests that quantitative analysis is still possible in this copolymer system. Copyright © 2005 John Wiley & Sons, Ltd.     

Evaluation and comparison of layered titanate nanosheets using TOF‐SIMS and g‐ogram analysis

The evaluation of nanostructure is important to develop the highly controlled nanomaterials. In this study, two kinds of layered titanate nanosheets, which were produced by using hexylamine and laurylamine, respectively, as surfactants were investigated by Gentle Secondary Ion Mass Spectrometry Gentle‐SIMS (G‐SIMS) and g‐ogram, which is the latest Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS) data analysis method for detecting more intact ions and obtaining the information on original chemical structures of samples precisely from complicated TOF‐SIMS spectra. As a result, molecular related ions of the surfactants were detected from each sample, and the structural information of samples was obtained. From both samples, surfactant molecular ions connected with hydrocarbon were detected as more intact ions rather than molecular ions of themselves. It was suggested that hydrophobic domains of their lamellar mesostructure are formed robustly by more than two surfactant molecules connected with each other linearly. After all, important information on the chemical structure of the layered titanate nanosheets, which would be difficult to be found by using typical structural analysis methods such as X‐ray diffraction and transmission electron microscopy, were obtained using G‐SIMS and g‐ogram. Therefore, it was shown that g‐ogram and G‐SIMS are helpful to evaluate the nanostructured materials. And it was also shown that g‐ogram is applicable to organic–inorganic materials which contain long hydrocarbon structures. Copyright © 2015 John Wiley & Sons, Ltd.     

Multivariate analysis of ToF‐SIMS data using mass segmented peak lists

Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) provides detailed molecular insight into the surface chemistry of a diverse range of material types. Extracting useful and specific information from the mass spectra and reducing the dimensionality of very large datasets are a challenge that has not been fully resolved. Multivariate analysis has been widely deployed to assist in the interpretation of ToF‐SIMS data. Principal component analysis is a popular approach that requires the generation of peak lists for every spectrum. Peak list sizes and the resulting data matrices are growing, complicating manual peak selection and analysis. Here we report the generation of very large ToF‐SIMS peak lists using up‐binning, the mass segmentation of spectral data in the range 0 to 300 m/z in 0.01 m/z intervals. Time‐of‐flight secondary ion mass spectrometry data acquired from a set of 4 standard polymers (polyethylene terephthalate, polytetrafluoroethylene, poly(methyl methacrylate), and low‐density polyethylene) are used to demonstrate the efficacy of this approach. The polymer types are discriminated to a moderate extent by principal component analysis but are easily skewed with saturated species or contaminants present in ToF‐SIMS data. Artificial neural networks, in the form of self‐organising maps, are introduced and provide a non‐linear approach to classifying data and focussing on similarities between samples. The classification outcome achieved is excellent for different polymer types and for spectra from a single polymer type generated by using different primary ions. This method offers great promise for the investigation of more complex systems including polymer classes and blends and mixtures of biological materials.     

Surface studies of halloysite nanotubes by XPS and ToF‐SIMS

This report provides detailed experimental results of thermal and surface characterization on untreated and surface‐treated halloysite nanotubes (HNTs) obtained from two geographic areas. Surface characterization techniques, including XPS and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) were used. ToF‐SIMS surface analysis experiments were performed with both atomic and cluster ion beams. Higher ion yields and more high‐mass ions were obtained with the cluster ion beams. Static ToF‐SIMS spectra were analyzed with principal component analysis (PCA). Morphological diversities were observed in the samples although they mainly contained tubular structures. Thermogravimetric data indicated that aqueous hydrogen peroxide solution could remove inorganic salt impurities, such as alkali metal salts. The amount of grafting of benzalkonium chloride of HNT surface was determined by thermogravimetic analysis. PCA of ToF‐SIMS spectra could distinguish the samples mined from different geographical locations as well as among surface‐treated and untreated samples. Copyright © 2010 John Wiley & Sons, Ltd.     

Multivariate statistical analysis of non‐mass‐selected ToF‐SIMS data

Cluster LMIGs are now regarded as the standard primary ion guns on time‐of‐flight secondary ion mass spectrometers (ToF‐SIMS). The ToF‐SIMS analyst typically selects a bombarding species (cluster size and charge) to be used for material analysis. Using standard data collection protocols where the analyst uses only a single primary bombarding species, only a fraction of the ion‐beam current generated by the LMIG is used. In this work, we demonstrate for the first time that it is possible to perform ToF‐SIMS analysis when all of the primary ion intensity (clusters) are used; we refer to this new data analysis mode as non‐mass‐selected (NMS) analysis. Since each of the bombarding species has a different mass‐to‐charge ratio, they strike the sample at different times, and as a result, each of the bombarding species generates a spectrum. The resulting NMS ToF‐SIMS spectrum contains contributions from each of the bombarding species that are shifted in time. NMS spectra are incredibly complicated and would be difficult, if not impossible, to analyze using univariate methodology. We will demonstrate that automated multivariate statistical analysis (MVSA) tools are capable of rapidly converting the complicated NMS data sets into a handful of chemical components (represented by both spectra and images) that are easier to interpret since each component spectrum represents a unique and simpler chemistry. Copyright © 2008 John Wiley & Sons, Ltd.     

Quantification issues in ToF‐SSIMS and AFM co‐analysis in two‐phase systems,exampled by a polymer blend

This study concerns the measurement of the surface properties of sensitive materials, exampled by a polymer blend of polyvinyl chloride (PVC) and polycarbonate (PC), by static secondary ion mass spectrometry (SSIMS) and atomic force microscopy (AFM) operated in force modulation microscopy mode. It is shown that SSIMS, although damaging the surface little, causes significant subsurface damage. This changes the material behaviour in the irradiated region and leads to changes in the AFM measurements of both the topography and nanomechanical parameters such as the elastic moduli. Alternatively, if AFM is conducted first, contact with the tip may lead to modification of the surface. In order to minimize damage, soft cantilevers (spring constant ～0.1 N m^?1) are used. It is recommended that analyses be conducted on identifiably equivalent or partially overlapping regions, where any damage effects may be separated. Because, in SSIMS, a flood gun neutralizer must be used that irradiates the whole sample, it is recommended that AFM analysis is conducted prior to SSIMS even if different areas of the same sample are to be studied. The fractional areas identified by atomic species in SSIMS and separately by AFM are both the same and give the consistent ratio PVC/PC = 44 : 56. Both of these analyses are characteristic of the substrate below the top monolayer. The fractional areas determined using molecular species in SSIMS and by G‐SIMS both give PVC/PC = 20 : 80, which is interpreted to show that more than half of the PVC surface is covered by a monolayer of PC. Copyright © 2003 John Wiley & Sons, Ltd.     

Analysis of the surface chemistry of oxidized polyethylene: comparison of XPS and ToF‐SIMS

A series of low‐density polyethylene (LDPE) surfaces, chemically modified using a number of oxidative techniques employed for adhesion enhancement (pretreatments), have been studied by time‐of‐flight (ToF) SIMS and XPS. The methods consisted of corona discharge, flame, electrochemical, chromic acid, acid dichromate and acid permanganate treatment. All except flame treatment were performed under mild and fairly severe conditions to yield a range of surface chemistries. The XPS analysis, using high energy resolution and a refined approach to C 1s curve‐fitting, provided some new insights into the quantitative assessment of the type and concentration of functional groups. Both positive and negative ion ToF‐SIMS spectra were obtained at high mass resolution. The oxygen‐containing fragments were identified by accurate mass analysis and subjected to a detailed comparison with the XPS results. No convincing relative intensity correlations could be identified that would allow particular secondary ion fragments to be associated strongly with particular functional groups (in this multi‐functional surface situation). Inorganic residues resulting from wet chemical treatments were also investigated and here the two techniques were found to be more complementary. Copyright © 2003 John Wiley & Sons, Ltd.     

Cationisation of oligomeric alkylethoxylate surfactants in ToF‐SIMS analysis

Variable cationisation of the alkylethoxylate surfactant Synperonic A7^? has been observed during a ToF‐SIMS study of its interaction with a leaf surface, either by itself or as a component in a simple herbicide formulation. Depending on the conditions, cationisation predominantly by K⁺, Na⁺ and H⁺ was found. By deliberate surfactant solution doping with alkali bromides, the cationisation channel could be manipulated. Comparison of the apparent molecular weight dependence, derived from the ToF‐SIMS spectra, with that measured by HPLC‐MS, showed a further dependence on the cationising species, with Na⁺ giving the best match. An understanding of these effects is critical to the correct interpretation of the spectra from this surfactant. Copyright © 2007 John Wiley & Sons, Ltd.     

Retracted: Mass analysis by Ar‐GCIB‐dynamic SIMS for organic materials

Generally, dynamic secondary ion mass spectrometry (SIMS) has been mainly used as one of the most powerful tools for inorganic mass analysis. On the other hand, an Ar gas cluster ion beam (GCIB) has been developed and spread as a processing tool for surface flattening and also a projectile for time‐of‐flight (ToF) SIMS. In this study, we newly introduced an Ar‐GCIB as a primary ion source to a commercially available dynamic SIMS apparatus, and investigated mass spectra of amino acid films (such as Arginine and Glycine) and polymer films (Polyethylene: PE and Polypropylene: PP) as organic model samples. As a result, each characteristic fragment peak indicating the original molecular organic structure was observed in the acquired mass spectra. In addition, their own molecular ions of the amino acids were also clearly observed. Mass spectra of PE/PP blended‐polymer films acquired using Ar‐GCIB‐dynamic SIMS could be identified between pure PE and PE:PP = 1:3 mixture by applying principal component analysis (PCA).     

Static SIMS studies of the oxides and hydroxides of aluminium

The degree of hydroxylation or hydration of aluminium surfaces has been examined by static secondary ion mass spectroscopy (SSIMS). The SSIMS spectra of a series of aluminium oxide, oxyhydroxide and hydroxide surfaces have been obtained using instruments in three configurations. Similarities were observed in both negative and positive secondary ions spectra. Even though a direct comparison of the relative intensities cannot be made from one instrument to the other, a similar ranking of the various aluminium hydroxylation states was observed. Several ranking methods are discussed, as well as the similarities and differences observed while using the three instruments. Similar secondary ions were detected whatever the degree of hydroxylation of the aluminium oxide. This argues in favour of the formation of fragments by the combination of individually sputtered atoms or clusters to form the more stable secondaries, rather than the kick-off of 'structure-related' clusters originating directly from the upper surface layer.     

Reduction of matrix effects in TOF‐SIMS analysis by metal‐assisted SIMS (MetA‐SIMS)

We investigated reduction of the matrix effect in time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) analysis by the deposition of a small amount of metal on the sample surfaces (metal‐assisted SIMS or MetA‐SIMS). The metal used was silver, and the substrates used were silicon wafers as electroconductive substrates and polypropylene (PP) plates as nonelectroconductive substrates. Irganox 1010 and silicone oil on these substrates were analyzed by TOF‐SIMS before and after silver deposition. Before silver deposition, the secondary ion yields from the substances on the silicon wafer and PP plate were quite different due to the matrix effect from each substrate. After silver deposition, however, both ion yields were enhanced, particularly the sample on the PP plate, and little difference was seen between the two substrates. It was therefore found that the deposition of a small amount of metal on the sample surface is useful for reduction of the matrix effect. By reducing the matrix effect using this technique, it is possible to evaluate from the ion intensities the order of magnitude of the quantities of organic materials on different substrates. In addition, this reduction technique has clear utility for the imaging of organic materials on nonuniform substrates such as metals and polymers. MetA‐SIMS is thus a useful analysis tool for solving problems with real‐world samples. Copyright © 2005 John Wiley & Sons, Ltd.     

ToF‐SIMS characterisation of methane‐ and hydrogen‐plasma‐modified graphite using principal component analysis

Time of flight secondary ion mass spectrometry (ToF‐SIMS) has been used to determine the extent of surface modification of highly ordered pyrolytic graphite (HOPG) samples that were exposed to radio‐frequency methane and hydrogen plasmas. The ToF‐SIMS measurements were examined with the multivariate method of principal component analysis (PCA), to maximise the amount of spectral information retained in the analysis. This revealed that the plasma (methane or hydrogen plasma) modified HOPG exhibited greater hydrogen content than the pristine HOPG. The hydrogen content trends observed from the ToF‐SIMS studies were also observed in elastic recoil detection analysis measurements. The application of the ToF‐SIMS PCA method also showed that small hydrocarbon fragments were sputtered from the hydrogen‐plasma‐treated sample, characteristic of the formation of a plasma‐damaged surface, whereas the methane‐plasma‐treated surface sputtered larger hydrocarbon fragments, which implies the growth of a polymer‐like coating. Scanning tunnelling microscopy measurements of the modified surfaces showed surface features that are attributable to either etching or film growth after exposure to the hydrogen or methane plasma. Copyright © 2009 John Wiley & Sons, Ltd.     

Investigation of Asian lacquer films using ToF‐SIMS and complementary analytical techniques

Lacquer has been used in Asian countries for thousands of years as a natural coating material owing to its durable, adhesive, decorative, and protective properties. Protection and restoration of lacquer‐coated cultural remains has become an important subject, and identification of the lacquer types in old lacquer‐wares has also become very important for conservation and restoration research. This paper provides identification of several molecular species of vegetal‐source Asian lacquers with the aim of providing a methodology for application in the field of cultural heritage. Several chemical markers of the vegetal species in Asian lacquers were identified using a methodology consistent with the sampling restrictions required for cultural‐heritage objects. Surface analytical methods such as time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS), X‐ray photoelectron spectroscopy, and Fourier transform infrared spectroscopy were used to characterize Korean, Chinese, and Vietnamese lacquers; avoiding time‐consuming and destructive extraction processes. These ToF‐SIMS results provided the structural characterization of a series of catechol derivatives. The ToF‐SIMS spectra of Rhus vernicifera from Korea and China, and Rhus succedanea from Vietnam indicated a series of urushiol and laccol repeat units, respectively, in the mass range of m/z 0–1800. Because of its sensitivity, specificity, and speed of analysis, the ToF‐SIMS technique can be used to investigate cultural lacquer‐coated treasures as well as to discriminate among different Asian lacquer coatings or binding mediums for the conservation or restoration of lacquer‐ware. Copyright © 2016 John Wiley & Sons, Ltd.     

A ToF‐SIMS investigation of a buried polymer/polymer interface exposed by ultra‐low‐angle microtomy

The interfacial region of a model multilayer coating system on an aluminium substrate has been investigated by high‐resolution time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS). Employing ultra‐low‐angle microtomy (ULAM), the interface between a poly(vinylidene difluoride) (PVdF)‐based topcoat and a poly(urethane) (PU)‐based primer ‘buried’ >20 µm below the PVdF topcoat's air/coating surface was exposed. Imaging ToF‐SIMS and subsequent post‐processing extraction of mass spectra of the ULAM‐exposed interface region and of the PVdF topcoat and PU primer bulks indicates that the material composition of the polymer/polymer interface region is substantially different to that of the bulk PVdF and PU coatings. Analysis of the negative ion mass spectra obtained from the PVdF/PU interface reveals the presence of a methacrylate‐based component or additive at the interface region. Reviewing the topcoat and primer coating formulations reveals that the PVdF topcoat formulation contains methyl methacrylate (MMA)–ethyl acrylate (EA) acrylic co‐polymer components. Negative ion ToF‐SIMS analysis of an acrylic co‐polymer confirms that it is these components that are observed at the PVdF/PU interface. Post‐processing extraction of ToF‐SIMS images based on the major ions of the MMA–EA co‐polymers reveals that these components are observed in high concentration at the extremities of the PVdF coating, i.e. at the polymer/polymer interface, but are also observed to be distributed evenly throughout the bulk of the PVdF topcoat. These findings confirm that a fraction of the MMA–EA acrylic co‐polymers in the formulation segregate to the topcoat/primer interface where they enhance the adhesive properties exhibited by the PVdF topcoat towards the underlying PU primer substrate. Copyright © 2004 John Wiley & Sons, Ltd.     

Adsorption of genetically engineered proteins studied by time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS). Part B: hierarchical cluster analysis (HCA)

In Part A, we adopted principal component analysis (PCA) for the analysis of TOF‐SIMS data to assess the binding specificity of GBP‐1 to metallic Au, Ag and Pd. Within a given set of data, PCA aids in the interpretation of the TOF‐SIMS spectra by capitalizing on the differences from one spectrum to another. In Part B, we introduce another multivariate statistical method called ‘hierarchical cluster analysis (HCA)’, where visualization of the similarity and difference in data is readily observed, from which a variety of adsorption conditions of GBP‐1 were characterized. Copyright © 2007 John Wiley & Sons, Ltd.