The Hydrogen Bond of Water from the Perspective of Soft X‐Ray Spectroscopy

Its importance for life and its unusual properties keep water within the focus of ongoing research; this focus especially applies to water in the liquid phase. Scientists agree that the hydrogen‐bond network, which is formed by interactions between the water molecules, is key for understanding the anomalies of water. However, a better understanding of the structure of this network, as well as its dynamics, must yet be established. Soft X‐ray spectroscopy allows the investigation of the local electronic structure of water by probing the occupied and unoccupied valence molecular orbitals. In this Focus Review, we present soft‐X‐ray‐based techniques, their development in terms of liquid spectroscopy, and recent studies on the hydrogen‐bond network of liquid water.     

Characterization of trace embedded impurities in thin multilayer structures using synchrotron X‐ray standing waves

X‐ray standing wave (XSW) field generated under Bragg reflection condition in a periodic Mo/Si multilayer structure has been used to determine the concentration and location of various trace element contaminants embedded in different layers of that multilayer structure. We have used intense synchrotron X rays for XSW analysis. It is observed that various trace element impurities such as Cr, Fe, Ni and W get embedded unintentionally in the multilayer structure during the deposition process. Consequences of such impurity incorporation on the optical properties of the multilayer structure are discussed in hard and soft X‐ray regions. Present measurements are important in order to optimize the deposition methods on one hand and to better correlate the measured optical properties of a multilayer structure with theoretical models on the other. Copyright © 2010 John Wiley & Sons, Ltd.     

Uncertainty quantification in theoretical spectroscopy: The structural sensitivity of X‐ray emission spectra

We present a methodology for analyzing the dependence of molecular spectra calculated with quantum‐chemical methods on the underlying molecular structure. This analysis is applied to investigate the structural sensitivity of calculated valence‐to‐core X‐ray emission (VtC‐XES) spectra for the test case of three iron carbonyl complexes, Fe(CO)₅, [FeCp(CO)₂(THF)]⁺ (Cp = cyclopentadienyl, THF = tetrahydrofuran), and Fe(CO)₃(cod) (cod = cyclooctadienyl). Based on this analysis, we discuss how the VtC‐XES spectra depend on changes of metal–ligand bond distances and bond angles as well as on the structure of the ligands. The benefits of such an analysis of the structural sensitivity are discussed. Our methodology can serve as a first step toward quantifying and accounting for uncertainties due to the underlying model structure in theoretical spectroscopy.     

X‐ray photoelectron spectroscopic chemical state quantification of mixed nickel metal,oxide and hydroxide systems

Quantitative chemical state X‐ray photoelectron spectroscopic analysis of mixed nickel metal, oxide, hydroxide and oxyhydroxide systems is challenging due to the complexity of the Ni 2p peak shapes resulting from multiplet splitting, shake‐up and plasmon loss structures. Quantification of mixed nickel chemical states and the qualitative determination of low concentrations of Ni(III) species are demonstrated via an approach based on standard spectra from quality reference samples (Ni, NiO, Ni(OH)₂, NiOOH), subtraction of these spectra, and data analysis that integrates information from the Ni 2p spectrum and the O 1s spectra. Quantification of a commercial nickel powder and a thin nickel oxide film grown at 1‐Torr O₂ and 300 °C for 20 min is demonstrated. The effect of uncertain relative sensitivity factors (e.g. Ni 2.67 ± 0.54) is discussed, as is the depth of measurement for thin film analysis based on calculated inelastic mean free paths. Copyright © 2009 John Wiley & Sons, Ltd.     

Microsecond X‐ray Absorption Spectroscopy Identification of CoI Intermediates in Cobaloxime‐Catalyzed Hydrogen Evolution

Rational development of efficient photocatalytic systems for hydrogen production requires understanding the catalytic mechanism and detailed information about the structure of intermediates in the catalytic cycle. We demonstrate how time‐resolved X‐ray absorption spectroscopy in the microsecond time range can be used to identify such intermediates and to determine their local geometric structure. This method was used to obtain the solution structure of the Co^I intermediate of cobaloxime, which is a non‐noble metal catalyst for solar hydrogen production from water. Distances between cobalt and the nearest ligands including two solvent molecules and displacement of the cobalt atom out of plane formed by the planar ligands have been determined. Combining in situ X‐ray absorption and UV/Vis data, we demonstrate how slight modification of the catalyst structure can lead to the formation of a catalytically inactive Co^I state under similar conditions. Possible deactivation mechanisms are discussed.     

Interlaboratory study comparing analyses of simulated angle‐resolved X‐ray photoelectron spectroscopy data

An interlaboratory study has been conducted to determine the following: (i) the similarities and differences of film thicknesses and composition profiles obtained from analyses of simulated angle‐resolved X‐ray photoelectron spectroscopy (ARXPS) data by different analysts using different algorithms for data analysis, and (ii) the effects of two assumptions commonly made in data‐analysis algorithms for ARXPS on derived film thicknesses and composition profiles. The analyzed data were generated by the National Institute of Standards and Technology Database for the Simulation of Electron Spectra for Surface Analysis, (SESSA) which provides a simple way to study the influence of the aforementioned effects on compositional depth profile reconstruction. Sets of simulated ARXPS data were produced for thin films of SiO₂, SiON, HfO₂, and HfON of varying thicknesses on a Si substrate. For some HfON films, the N concentration varied with depth. Eleven groups participated in the round robin study. The majority (eight) employed a commercial ARXPS instrument in which the angular distribution is measured for a fixed sample geometry, in contrast to conventional ARXPS in which the sample is tilted for angular variation. The average deviations between the reported average depth, film thickness, and amount of material typically varied between 20% and 30% but were considerably larger, between 30% and 80%, for some cases. The average errors were generally larger for simulations that included elastic scattering and the finite analyzer‐acceptance angle (realistic conditions) than those for simulations that neglected elastic scattering and the finite analyzer‐acceptance angle (simplified conditions). The retrieved N depth profiles were quantitatively different from the true depth profiles and showed substantial variability among the group of members who used the same instrument and analysis software. Copyright © 2014 John Wiley & Sons, Ltd.     

Structural developments in synthetic rubbers during uniaxial deformation by in situ synchrotron X‐ray diffraction

The molecular orientation and strain‐induced crystallization of synthetic rubbers—polyisoprene rubber, polybutadiene rubber, and butyl rubber [poly(isobutylene isoprene)]—during uniaxial deformation were studied with in situ synchrotron wide‐angle X‐ray diffraction. The high intensity of the synchrotron X‐rays and the new data analysis method made it possible to estimate the mass fractions of the strain‐induced crystals and amorphous chain segments in both the oriented and unoriented states. Contrary to the conventional concept, the majority of the molecules (50–75%) remained in an unoriented amorphous state at high strains. Each synthetic rubber showed a different behavior of strain‐induced crystallization and molecular orientation during extension and retraction. Our results confirmed the occurence of strain‐induced networks in the synthetic rubbers due to the inhomogeneity of the crosslink distribution. The strain‐induced networks containing microfibrillar crystals and oriented amorphous tie chains were responsible for the ultimate mechanical properties. © 2004 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 42: 956–964, 2004     

Structural investigations of carrageenan–surfactant systems by synchrotron X‐ray scattering

Small‐angle X‐ray scattering by means of synchrotron radiation was used to study the interaction of κ‐ and ι‐carrageenan of different molar mass in the presence of the gel‐inducing ions, K⁺, with the ionic surfactants cetylpyridinium chloride (CPC) and dodecylpyridinium chloride (DPC). This interaction resulted in a more or less complete shrinking of the gel and in the formation of ordered periodic structures of the surfactant in conjunction with the carrageenan molecules. The influence of the polymer concentration for a given surfactant concentration, the content of surfactant for the same concentration of the polysaccharide, the molar mass, and the linear charge density of the polymer were all investigated. Decreasing the length of the alkyl chain of the surfactant, increasing the charge density of the polymer chain, and increasing the polymer concentration for the samples explored improved the ordering in the carrageenan–surfactant complexes. The structures of the κ‐carrageenan–CPC complexes were investigated as a function of temperature during reversible heating–cooling cycles, and it was shown that the addition of the surfactant lead to a more pronounced temperature stability of polymer network. © 2000 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 38: 2851–2859, 2000     

Time‐resolved crystallization study of absorbable polymers by synchrotron small‐angle X‐ray scattering

Changes in the lamellar morphology that occurred during the quiescent isothermal crystallization of absorbable poly(p‐dioxanone) (PDS) and PDS/poly(glycolide) block copolymer were studied by synchrotron small‐angle X‐ray scattering. Important morphological parameters such as the lamellar long period, the thicknesses of the crystal and amorphous phases, and the scattering invariant were estimated as a function of time, and trends observed over a wide range of experimental conditions are discussed. Thicker but more perfect lamellae were detected at higher crystallization temperatures. The breadth of the normalized semilog Lorentz‐corrected intensity peak systematically decreased with increasing temperature. In addition, the values of the crystallization half‐time and the Avrami exponent (n = 2.5), determined from the real‐time changes in the lamellar development, showed superb agreement with the bulk crystallinity data generated from other experimental techniques, such as calorimetry and dielectric relaxation spectroscopy. © 2000 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 39: 153–167, 2001     

Efficiency of visual peak detection in X‐ray photoelectron spectra

We report initial results of a VAMAS/TWA2 project to evaluate procedures for automated peak detection in X‐ray photoelectron spectra. As a reference for investigations of the efficiency of automated peak‐detection software, we report the efficiency of visual peak detection in three test spectra. It was found that (i) characteristics of analysts are grouped into four categories using principal component analysis (PCA); the first participant group to detect large numbers of peaks for the three test spectra, the second one to detect small numbers of peaks for them, the third one to detect similar numbers of peaks, and the fourth one to detect a relatively large number of peaks for one of them and small numbers for two of them, (ii) scattering of detected peak numbers seems to depend on detection of medium‐intensity peaks because of participants' subjectivity or ambivalence for judgment of intensity, and (iii) the peaks that are detected by the analysts with a detectability more than 75% almost correspond to the peak signal‐to‐noise(S/N) ratio of more than 10 in logarithmic expression. Copyright © 2008 John Wiley & Sons, Ltd.     

Characterization of high‐aspect‐ratio periodic structures by X‐ray photoelectron spectroscopy

X‐ray photoelectron spectroscopy (XPS) is a powerful surface characterization technique often relied on for quantification of surface species and coverages. Investigation of silicon microrods, considered a model for high‐aspect‐ratio structures, at different angles with respect to substrate normal was determined to have a significant impact on the relative sensitivity of surface‐bound species on rods relative to the base substrate. Comparison between planar silicon and microrod arrays demonstrates that the angular dependence is complicated and that careful studies must optimize conditions to differentiate between surfaces. In addition, the use of reverse angle resolved XPS, where the substrate is turned away from the X‐ray source, is shown to assist in simplifying the spectrum by removing underlying signal from the substrate near the base. Copyright © 2016 John Wiley & Sons, Ltd.     

TiO2 distribution in aged and injected isotactic polypropylene parts by synchrotron radiation X‐ray microfluorescence

We studied the TiO₂ pigment distribution along cross sections of injected isotactic polypropylene samples after they were aged by light exposure for 515 and 3000 h in accelerated test equipment. The TiO₂ pigment distribution was studied so that we could understand the whitening process occurring in this type of plastic. For these studies, we used a 20‐μm X‐ray microbeam from a synchrotron light source. We observed that the aged and nonaged samples had almost homogeneous distributions of Ti in the cross sections; therefore, pigment migration could not have been responsible for the surface whitening process. There were maxima of Ti intensities that were not in the same region for all samples. This behavior could be explained by the heterogeneity of the extrusion and injection‐molding processes. © 2002 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 40: 657–662, 2002; DOI 10.1002/polb.10127     

Structure determination of a new cocrystal of carbamazepine and dl‐tartaric acid by synchrotron powder X‐ray diffraction

The crystal structure of a new cocrystal of carbamazepine (systematic name: 5H‐dibenzo[b,f]azepine‐5‐carboxamide, C₁₅H₁₂N₂O) and dl ‐tartaric acid (C₄H₆O₆), obtained by liquid‐assisted grinding, was solved by powder X‐ray diffraction (PXRD). The high‐resolution PXRD pattern of this new phase was recorded at room temperature thanks to synchrotron experiments at the European Synchrotron Radiation Facility (Grenoble, France). The starting structural model was generated by a Monte‐Carlo simulated annealing method. The final structure was obtained through Rietveld refinement and an energy minimization simulation was used to estimate the H‐atom positions. The stability of the proposed structure as a function of temperature was also assessed from molecular dynamics simulations. The symmetry is monoclinic (space group P2₁/c) and contains eight molecules per unit cell, namely, four dl ‐tartaric acid and four carbamazepine molecules.     

X‐ray Photoelectron Spectroscopy of Pyridinium‐Based Ionic Liquids: Comparison to Imidazolium‐ and Pyrrolidinium‐Based Analogues

We investigate eight 1‐alkylpyridinium‐based ionic liquids of the form [C_nPy][A] by using X‐ray photoelectron spectroscopy (XPS). The electronic environment of each element of the ionic liquids is analyzed. In particular, a reliable fitting model is developed for the C 1s region that applies to each of the ionic liquids. This model allows the accurate charge correction of binding energies and the determination of reliable and reproducible binding energies for each ionic liquid. Shake‐up/off phenomena are determinedfor both C 1s and N 1s spectra. The electronic interaction between cations and anions is investigated for both simple ionic liquids and an example of an ionic‐liquid mixture; the effect of the anion on the electronic environment of the cation is also explored. Throughout the study, a detailed comparison is made between [C₈Py][A] and analogues including 1‐octyl‐1‐methylpyrrolidinium‐ ([C₈C₁Pyrr][A]), and 1‐octyl‐3‐methylimidazolium‐ ([C₈C₁Im][A]) based samples, where X is common to all ionic liquids.     

X‐ray photoelectron analysis of surface functional groups on diamond‐like carbon films by gas‐phase chemical derivatization method

Oxygen‐related surface functional groups on diamond‐like carbon (DLC) films were derivatized with fluorine‐ and nitrogen‐related groups by the gas‐phase chemical derivatization (GCD) method, and the groups were analyzed quantitatively by X‐ray photoelectron spectroscopy (XPS). It is desirable that a derivatization reaction is unique to the target group; however, it usually causes undesirable side reactions which affect other groups. This diversity of the reactions has complicated the analysis. In this report, we have overcome the problem by applying a mathematical treatment which takes the side reactions into account. This improved analysis shows that it is no longer necessary to have derivatization reactions unique to the target groups. As a result, it is demonstrated that the carbonyl (C?O) group is the dominant surface functional group on both the DLC and its wet‐oxidized films, the carboxyl (COOH) group plays a minor role, and the presence of the hydroxyl (OH) group is logically denied. Considering the oxidation steps of these oxygen‐related surface functional groups, it is suggested that the C?O group on the DLC films requires the cleavage of the carbon–carbon bond with a relatively high activation energy barrier to change into the COOH group. Copyright © 2010 John Wiley & Sons, Ltd.     

Tetrahedral Oligothiophenes; Synthesis,X‐ray Analysis,and Optoelectronic Properties of Highly Symmetrical, 3D‐Branched Oligothiophenes

Tetrakis(bithienyl)methane and tetrakis(terthienyl)methane have been synthesized from tetrakis(2‐thienyl)methane by use of Suzuki–Miyaura coupling as a key reaction. Their trimethylsilyl (TMS) derivatives are also synthesized. X‐ray analysis reveals that each oligothiophene moiety tends to adopt anti‐conformations and show relatively small torsion angles between the adjacent thiophene rings. While the longest absorption maxima of these tetrakis(oligothienyl)methanes exhibit only a slight bathochromic shift compared to the corresponding linear oligothiophene derivative, tetrakis(bithienyl)methane and its TMS derivative exhibit an appreciable red‐shift in their fluorescence spectra. The intramolecular interaction between thienyl groups of tetrakis(2‐thienyl)methane is supported by DFT calculation.