Description of force surfaces in atomic force microscopy with allowance for the mobility of the lattice atoms

The surfaces of constant force and the profiles of the horizontal component of the force during scanning of the tip of an atomic force microscope above the surface of a close-packed lattice in the contact mode are calculated taking account of the mobility of the lattice atoms. It is shown that when the mobility is taken into account, the previously observed discontinuities on the surface of constant force arise at smaller scanning forces on the tip above the surface than in the immobile-atom approximation. The force surfaces arising when scanning above vacancies are obtained. The possibility of using atomic force microscopy data for diagnostics of point defects on a solid surface is discussed.     

Using an atomic force microscope in the surface modification regime to determine the migration energy of surface defects

The lines of constant force and the profiles of the horizontal force component are calculated for the scanning of the tip of an atomic force microscope over a surface vacancy in a closepacked lattice with allowance for atomic displacements. The character of the lines of force is studied in all three scanning regimes that arise for different values of the force: without modification of the surface by the tip, migration of a single vacancy by a single interatomic distance in the direction opposite to the motion of the tip, and “dragging” of a vacancy by the tip. It is shown that the profiles of the horizontal force component can be used to calculate the activation energy for surface migration of a vacancy. An estimate is made of the scanning force for which these effects may be observed experimentally. Zh. Tekh. Fiz. 69, 104–110 (August 1999)     

Imaging benzene on nickel and copper {110} surfaces with low temperature STM:: the adsorption site

Single benzene molecules have been imaged on the {110} surfaces of both copper and nickel with an Eigler-type low temperature scanning tunnelling microscope. Conditions were chosen such that the molecule and the lattice atoms could be resolved at the same time within one image frame. On Ni{110} benzene was found to adsorb in the hollow site between the close-packed rows. For the more weakly bound molecule on Cu{110} the imaging conditions had to be changed since, for the tunnelling conditions under which the lattice atoms are resolved, a strong interaction between the tip and the benzene takes place. This results in the molecule being “dragged” along the surface. By changing the tunnelling conditions within one image frame, however, it is possible via extrapolation of the substrate lattice to show that the molecule adsorbs in the long-bridge site. The shapes of the images of individual molecules are discussed.     

Impact of atomic relaxation on the breaks of constant force surfaces in AFM

A calculation model for determination of the shapes of the constant force surfaces and profiles of lateral forces for the case of the AFM tip scanning the closely packed lattice in contact mode is proposed. Atomic relaxation is taken into account in this model. The existence of breaks on constant force surfaces, which was predicted earlier in an approximation of the fixed lattice, is confirmed. It is shown that due to non-zero atomic mobility, breaks appear for smaller scanning forces than assumed earlier. The shapes of the continuous constant force surfaces and profiles of lateral force components are computed. These results may be used for diagnostics of point defects on the surface.     

Three-dimensional scanning force/tunneling spectroscopy at room temperature

We simultaneously measured the force and tunneling current in three-dimensional (3D) space on the Si(111)-(7 × 7) surface using scanning force/tunneling microscopy at room temperature. The observables, the frequency shift and the time-averaged tunneling current were converted to the physical quantities of interest, i.e. the interaction force and the instantaneous tunneling current. Using the same tip, the local density of states (LDOS) was mapped on the same surface area at constant height by measuring the time-averaged tunneling current as a function of the bias voltage at every lateral position. LDOS images at negative sample voltages indicate that the tip apex is covered with Si atoms, which is consistent with the Si-Si covalent bonding mechanism for AFM imaging. A measurement technique for 3D force/current mapping and LDOS imaging on the equivalent surface area using the same tip was thus demonstrated.     

Lipid membrane: inelastic deformation of surface structure by an atomic force microscope

The stability of the 1,2-Dioleoyl-sn-Glycero-3-[phospho-rac-1-Glycerol-Na] liposome in the liquid crystalline state have been investigated using an atomic force microscope (AFM). We have observed the inelastic deformation of the sample surface. The AFM tip causes persistent deformation of the surface of the lipid membrane, in which some of the lipid molecules are eventually pushed or dragged by the AFM tip. The experiment shows how the surface structure of the lipid membrane can be created by the interaction between the AFM tip and lipid membrane. When the operating force exceeds 10^-8 N, it leads to large deformations of the surface. A square region of about 1×1μm² is created by the scanning probe on the surface. When the operating force is between 10^-11N and 10^-8N, it can image the topography of the surface of the lipid membrane. The stability of the sample is related to the concentration of the medium in which the sample is prepared.     

Scanning tunneling microscopy/spectroscopy,etching and modification of surfaces of YbBa2Cu3O7-δ single crystals using an STM

The surface of YbBa₂Cu₃O_7-δ single crystals was investigated using a scanning tunneling microscope at room temperature in air. Growth steps with step heights equal to the lattice parameter c as well as steps with step heights of multiples of 1.35 c were obtained. On smooth surfaces atoms arranged in a 3.8 Å square lattice could be resolved. We observed a tunneling-induced etching effect leading to an etch pit on the surface. Furthermore, by applying voltage pulses with amplitude > 5.0 V and duration > 100 μs holes with diameters of ～? 150 nm could be produced. Scanning tunneling spectroscopic measurements were performed yielding I-V and ln I-s characteristics. The extremely small effective barrier height of ? = 0.3 eV inferred from d ln I/ds may be caused by dirt between the surface and the tip.     

Local surface cleaning and cluster assembly using contact mode atomic force microscopy

Conventional contact mode atomic force microscopy (AFM) has been used for local surface cleaning and cluster alignment. By using the AFM tip to sweep and push in contact mode, we have demonstrated that Cu clusters, prepared by vacuum evaporation onto Dow Cyclotene 3022 polymer and subsequent exposure to atmosphere, can easily be moved by the AFM tip, and assembled at the outer edge of the scanned region to form a line of clusters. We have found that the force applied by the tip plays an important role in the ease of cluster motion. Cyclotene surface treatment that enhances cluster adhesion hinders this ability, and may be used as a method of nanofabrication.     

Closed-form solutions for the frequency shift of V-shaped probes scanning an inclined surface

The analytical method to determine the frequency shift of an AFM V-shaped probe scanning the relative inclined surface in non-contact mode is proposed. If the tip is not perpendicular to the surface plane, the lateral force to the tip will occurs. Consequently, there exists a moment to the end of probe. The closed-form solution of the partial differential equation with a nonlinear boundary condition is derived. The error of transforming the distributed-masses system into lumped-masses one in the force gradient method or the perturbation method is eliminated. The dimensionless parameters are introduced for reducing the numerical transaction error. The limiting case such as a uniform or tapered beam can be obtained easily from the general system. The assessments of the force gradient method, the perturbation method and the propose method determining the frequency shift of a V-shaped probe are made. It is discovered that increasing the absolute inclined angle θ decreases the frequency shift especially for a small tip-surface distance.     

原子力显微镜探针耦合变形下的微观扫描力研究

原子力显微镜(AFM)的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态.采用数值模拟方法探究恒力模式下探针耦合变形对微观扫描力信号、微观形貌信号的影响.研究表明，AFM的恒力模式扫描中，法向扫描力并不是恒定大小，与轴向扫描力存在耦合作用，在粗糙峰峰值增加阶段，二力均增加；在粗糙峰峰值减小阶段，二力均减小；该耦合作用随形貌坡度、针尖长度等增加而加强.微观形貌的测试信号和横向扫描侧向力信号受探针耦合变形影响较小，但侧向力与形貌斜率密切相关，且其极值点与形貌极值点存在位置偏差，这些结果均与原子力 关键词： 原子力显微镜 探针悬臂梁 耦合变形 扫描力     

LOCAL ELECTROCHEMICAL DEPOSITION OF METAL ISLANDS MECHANICALLY INDUCED WITH THE TIP OF AN ATOMIC FORCE MICROSCOPE

The investigation of electrochemical processes on the nanometer scale is of great scientific as well as technological interest. Here we study the electrodeposition of copper on a polycrystalline gold surface, and demonstrate that copper deposition can be locally induced by mechanical activation with the tip of an atomic force microscope (AFM). Whereas at higher values of the deposition voltage (>100mV), a solid copper film can grow on the gold surface without tip activation, at lower voltages (approx. 30-60mV), copper deposition only occurs at the position where the surface is activated by the AFM tip due to scanning in mechanical contact with the sample. With this mechano-electrochemical "writing" process, which can be performed at ambient conditions, the controlled local deposition of metallic islands is possible, at applied force loads of the order of 10nN. Both the size-dependence of the locally induced structures on the deposition time and the reversibility of the local deposition process are studied. Depending on the deposition parameters, individual copper islands between 50nm and 200nm in size were deposited at predefined locations on the gold surface. The investigations open perspectives for the controlled mechano-electrochemical writing of more complex nanostructures with the AFM tip.     

True atomic resolution under ambient conditions obtained by atomic force microscopy in the contact mode

2 ) has been investigated by contact-mode atomic force microscopy (AFM) in air. Both the terraces and the monolayer step itself were reproducibly imaged at atomic resolution in the repulsive-force regime at forces between tip apex and sample of the order of 10^-9 N. Several kinks were also imaged at atomic resolution. Details of the atomic registry of subsequent Se-Nb-Se sandwich layers as well as the arrangement of the individual atoms at the kink sites were resolved. The results are in perfect quantitative agreement with the lattice structure known from X-ray analysis and indicate that true atom-by-atom lateral resolution of microscopic defects is feasible by AFM in the contact mode and under ambient conditions. Published online: 10 February 1999     

Lattice-resolution imaging of the sapphire (0 0 0 1) surface in air by AFM

Lattice-resolution images of single-crystal α-alumina (sapphire) (0 0 0 1) surfaces have been obtained using contact-mode AFM under ambient conditions. It was found that the hexagonal surface lattice has a periodicity of 0.47 ± 0.11 nm, which is identical to that reported previously when the same surface was imaged in water. Large lattice corrugations (as high as 1 nm) were observed, but were concluded to be imaging artifacts because of the strong friction which causes additional deflection of the cantilever. The additional deflection of the cantilever is registered by the detector of the optical beam-deflection AFM resulting in an overestimation of the height at each lattice point. Abrupt changes were also resolved in the topography including honeycomb patterns and a transition from 2D lattices to 1D parallel stripes, with scanning direction. These phenomena can be explained by the commensurate sliding between the tip and sapphire surface due to the strong contact force.     

Interpretation of scanning tunneling microscopy and atomic force microscopy images of 1T-TiS2

The surface of 1T-TiS₂ was examined by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). The STM and AFM images of this compound were interpreted on the basis of the partial electron density ρ(r,E_F) and total electron density ρ(r) of a slab which consists of six (001) 1T-TiS₂ layers. Electronic structure calculations were performed using the ab-initio Hartree–Fock program crystal. It was found that the bright spots in experimental STM images correspond to sulfur atoms at both positive and negative bias voltages. The AFM image showed a periodicity which can be explained by the atomic corrugation at the surface. Structural defects on the surface were also investigated, and their interpretation constitutes experimental proof that only sulfur atoms were detected by scanning probe microscopies.     

Atom-by-atom extraction using the scanning tunneling microscope tip-cluster interaction

We investigate the atomistic details of a single atom-extraction process realized by using the scanning tunneling microscope tip-cluster interaction on a Ag(111) surface at 6 K. Single atoms are extracted from a silver cluster one atom at a time using small tunneling biases less than 35 mV. Combined total energy calculations and molecular dynamics simulations show a lowering of the atom-extraction barrier upon approaching the tip to the cluster. Thus, a mere tuning of the proximity between the tip and the cluster governs the extraction process. The atomic precision and reproducibility of this procedure are demonstrated by repeatedly extracting single atoms from a silver cluster on an atom-by-atom basis.     

Assessing the structure and function of single biomolecules with scanning transmission electron and atomic force microscopes

The scanning transmission electron microscope (STEM) and the atomic force microscope (AFM) have provided a wealth of useful information on a wide variety of biological structures. These instruments have in common that they raster-scan a probe over a sample and are able to address single molecules. In the STEM the probe is a focused electron beam that is deflected by the scan-coils. Detectors collecting the scattered electrons provide quantitative information for each sub-nanometer sized sample volume irradiated. These electron scattering data can be reconstituted to images of single macromolecules or can be integrated to provide the mass of the macromolecules. Samples need to be dehydrated for such quantitative STEM imaging. In contrast, the AFM raster-scans a sharp tip over a sample surface submerged in a buffer solution to acquire information on the sample's surface topography at sub-nanometer resolution. Direct observation of function-related structural changes induced by variation of temperature, pH, ionic strength, and applied force provides insight into the structure-function relationship of macromolecules. Further, the AFM allows single molecules to be addressed and quantitatively unfolded using the tip as nano-tweezers. The performance of these two scanning probe approaches is illustrated by several examples including the chaperonin GroEL, bacterial surface layers, protein crystals, and bacterial appendices.     

Hard disk magnetic domain nano-spatial resolution imaging by using a near-field scanning microwave microscope with an AFM probe tip

A near-field scanning microwave microscope (NSMM) incorporating an atomic force microscope (AFM) probe tip was used for the direct imaging of magnetic domains of a hard disk under an external magnetic field. We directly imaged the magnetic domain changes by measuring the change of reflection coefficient S₁₁ of the NSMM at an operating frequency near 4.4 GHz. Comparison was made to the magnetic force microscope (MFM) image. Using the AFM probe tip coupled to the tuning fork distance control system enabled nano-spatial resolution. The NSMM incorporating an AFM tip offers a reliable means for quantitative measurement of magnetic domains with nano-scale resolution and high sensitivity.     

The influence of a probe on topographical images in atomic force microscopy

Examples of the errors that arose under the studies of metric characteristics of micro- and nanoobjects with atomic force microscopy (AFM) are presented. Degradation of the tip of the probe both under successive scanning of the same part of a sample surface and in the course of a single scan is revealed. AFM images acquired with the probe having twin apexes located at different levels are demonstrated.     

Improving the resolution and the uniformity of AFM tip induced oxide patterns with pulsed voltages

Oxide line patterns were fabricated on the surface of titanium (Ti) film using atomic force microscopy (AFM) tip induced local oxidation technique. The growth behavior of the oxide under static voltages was studied. It was found the lateral growth of the oxide experienced two stages and the growth rate at the initial stage was very high. Pulsed voltages were employed and their effects on the controlling of the oxidation dynamics were examined. The results indicated that the high lateral and vertical growth rates of oxide at the initial stage could be suppressed with pulsed voltages. A minimum line width of 8 nm and highly uniform patterns were obtained with optimized voltage pulses. These results indicated that applying pulsed voltage is an effective method for improving both the resolution and the uniformity of the fabricated structures with scanning probe microscopy (SPM) tip induced local oxidation technique.