室温下Pr0.7Ca0.3MnO3薄膜的瞬态光响应特性

在室温下利用波长532 nm,脉冲宽度7 ns的纳秒脉冲激光研究了不同电压和激光能量密度作用下Pr0.7Ca0.3MnO3薄膜的瞬态光响应特性.在激光能量密度为275.16 mJ/cm2时,其最大电阻变化率达到92.3%,响应时间约36 ns.室温下电压变化对薄膜的光响应特性影响不大,而诱导光能量密度的影响则很明显,能量密度越大,电阻变化越大,响应时间越短,并且电阻变化和响应时间均与激光能量密度呈非线性关系.这种光响应来源于薄膜中的光致非稳态绝缘体-金属相变,有望在新型光电器件上获得应用.     

A位Eu掺杂对La0.7Ca0.3MnO3电输运的影响

采用传统的固相反应法制备出了高质量的La_(0.7)Ca_(0.3)MnO_3(其中x=0.00,0.05,0.10,0.15,0.20)系列样品,并对其进行了XRD,电阻-温度测量.实验结果表明,随着Eu掺杂量的增加,样品的金属-绝缘体转变温度朝低温附近移动,峰值电阻增加.通过对A位平均离子半径和尺寸无序度的计算,我们发现,由Eu掺杂导致A位平均离子半径〈rA〉减小,尺寸无序度σ2增大,使晶格畸变加剧,从而削弱了eg巡游电子在Mn3 和Mn4 之间的跃迁,同时促进了自旋极化子的形成.我们还对样品电阻-温度曲线的高温部分进行了拟合,对于x=0.00的样品,曲线可以用非绝热近似下的小极化子模型拟合;当掺杂量为x=0.05,0.10,样品的导电机理符合变程跳跃模型;进一步加大掺杂量,当x=0.15,0.20时,样品的电输运行为可以用晶格极化子与自旋极化子共存来解释.     

点接触金属/Pr0.7Ca0.3MnO3/Pt结构稳定的低电流电阻开关特性

利用自主开发的导电原子力显微镜控制Pt,W探针构成点接触金属/Pr0.7Ca0.3MnO3(PCMO)/Pt三明治结构,对其电流-电压(I-V)及脉冲诱导电阻开关(EPIR)特性进行了研究.研究发现,在10 nA限流下两种电极对应结构的I-V都表现出相当稳定的双极性电阻开关特性,以及大于100的电阻开关比.进一步测试发现,点接触W/PCMO/Pt器件具有在10 nA限流下稳定的EPIR特性以及100 pA限流下重复的双极性电阻开关特性.此电流比已报道的电流低3个数量级,表明此结构在低功耗存储器件方面的潜在应用.通过对比样品不同位置、不同限流、不同接触面积点接触Pt/PCMO/Pt的I-V回滞特性,把点接触器件在低电流下稳定、显著的电阻开关效应归结于小的器件面积导致强的局域电场加强了O离子迁移效应.     

Pr0.7Ca0.3MnO3陶瓷晶界势垒的交流特性

采用固相烧结方法制备了Pr1-xCaxMnO3(x=0.3)钙态矿结构锰氧化物陶瓷样品,对其在磁场和电场下的直、交流输运性质做了系统研究.通过测量加磁场和零场下的Ⅰ-Ⅴ曲线,得到其居里温度为150K,与VSM测试结果一致.通过测量加磁场与零场下交流的阻抗频谱,发现加磁场后样品的晶界电阻明显减小,而晶粒电阻几乎保持不变,表明Pr1-xCaxMnO3陶瓷多晶样品的CMR效应源于样品的晶界.为确定晶界处的势垒高度,测量了样品在不同频率下的阻抗温谱,根据Arrhenius定律拟合得出势垒高度为117 meV,与用直流R-T数据拟合得出的激活能一致.     

La0.7Ca0.3MnO3/MgAl2O4复合样品的电输运特性

我们用传统的固相反应法制备了(La0.7Ca0.3MnO3)1-x(MgAl2O4)x复合样品.通过XRD分析发现在此系列复合样品中La0.7Ca0.3MnO3和MgAl2O4两相共存;电阻率温度关系分析表明MgAl2O4的引入没有改变母体相在温度TP1处本征的金属-绝缘体转变峰,但使复合样品在较低温度TP2处出现另外一个电阻率峰值.有趣的是,随着MgAl2O4掺量的增加,在低掺量时,TP2向低温偏移很快;但在高掺量时,TP2向低温偏移较慢.     

La0.7Ca0.3 MnO3和CeO2混合块状样品电输运性质及使用分形迭代电阻网络模型的计算模拟

固相反应方法制得的La0.7Ca0.3MnO3(LCMO)粉末与CeO2粉末均匀混合后压块烧结,对其进行了电阻率随温度变化的测量.观察到样品电阻率存在绝缘体-金属转变.研究了烧结工艺、CeO2的混合比例与样品的电阻率、结构和表面形貌的关系.结果表明,制备工艺对材料性能有相当大的影响,其中较低温度的烧结主要影响小晶粒及其晶粒间界,而高温长时间烧结将影响大晶粒的形成.利用三维随机电阻网络(RRN)模型和蒙特卡罗方法对这种混合块状样品的输运性质进行了模拟,模拟中使用了一种新的RRN平均方法.该模型得到的数值模拟结果与实验结果在定性上是一致的.这说明以RRN模型来理解LCMO(x)-CeO2(1-x)复合体系的导电状况是合理的,提出的随机电阻网络平均方法是合适的.     

La2/3(Ca1-xMgx)1/3MnO3(0≤x≤60%)系统中不寻常的超大磁电阻

用溶胶-凝胶法并经过1450℃后处理而制备出名义组分为La2/3(Ca1-xMgx)1/3MnO3 (0≤x≤60%)多晶样品.磁化测量表明,除磁转变温度因Mg掺杂而稍有降低外,磁性质整体上和不含Mg样品无本质上的差别.未加磁场下阻温关系测量表明,即使Mg含量高达60%,实验上仍观察到绝缘体到金属的转变.特别有意义的结果是,适当的Mg掺杂可明显提高转变温度附近的磁电阻效应,例如,在Mg掺杂量为30～40%的样品中,1T磁场下观察到的磁电阻甚至比不含Mg样品在5T磁场下得到的值还要大.     

Switching Behavior Induced by Electric and Magnetic Fields in （La0.73Bi0.27）0.67Ca0.33MnO3

Both electric and magnetic field-induced switching behaviors between a high resistive state and a low resistive one are observed in （La0.73Bi0.27）0.67Ca0.33MnO3. The effects of magnetoresistance a.nd electric-resistance suggest that the applied electric field and magnetic field greatly tune the percolative paths in the phase-separated system. According to the experimental results, the switching behaviors may come from the coexistence of the charge ordering state, and localized and freedom ferromagnetic states, in which the external field destroys partially the localized ferromagnetic states and charge ordering leads to the ferromagnetic state growth, which causes a switch between a high resistive state and low resistive one. This makes the doped manganite a good system for both electric and magnetic field sensor materials.     

Giant Temperature Coefficient of Resistance in ZnO/Si （111） Thin Films

Giant negative temperature coefficient of resistance （TCR） was observed in ZnO/Si （111） thin films. The films were grown using the pulsed laser deposition （PLD） technique, taking Si （111） wafer as substrates, with a substrate at the temperature below 450°C in the PLD. It is found that both TCR-temperature behavior and TCR value are strongly affected by deposition temperature. The maximal TCR value over -10.9%K-1 can be observed at the deposition temperature from 20°C to 350°C and reaches to -13%K-1 at deposition temperature 20°C where the film shows X-ray diffraction amorphous. The results suggest that the ZnO/Si films demonstrate great potentials when used in a low-cost, high-performance, non-cooling and highly sensitive bolometer.     

Variation of Different Characteristic Parameters of Pentacene/Poly（Methyl Methacrylate） Transistors under Electric Stress

By investigating the variation of different characteristic parameters of pentacene/poly（methyl methacrylate） transistors suffered from electric stress in an environment without O2, H2O and light, we deduce lifetimes of the transistors by different criterion parameters. Defined by the time for the parameters changing one half, the lifetime is different from the minimum of 7h （using on/off current ratio as the criterion parameter） to the maximum of 2.38 ×10^8h （using transconductance as the criterion parameter）. We also find that, under our experimental conditions, the main reason that affects the stabilities of the device is the increase of shallow traps formed in the organic semiconductors.     

Difference of Oxide Hetero-structure Junctions with Semiconductor Electronic Devices

Charge carrier injection is performed in Pr0.7Ca0.3MnO3 （PCMO） hetero-structure junctions, exhibiting the stability without electric fields and dramatic changes in both resistance and interface barriers, which are entirely different from behaviour of semiconductor devices. The disappearance and reversion of interface barriers suggest that the adjustable resistance switching of such hetero-strueture oxide devices should associate with motion of charge carriers across interfaces. The results suggest that injected carriers should be still staying in devices and result in changes of properties, which lead to a carrier self-trapping and releasing picture in a strongly correlated electronic framework. Observations in PCMO and oxygen deficient CeO2-δ devices show that oxides as functional materials could be used in mieroeleetronics with some novel properties, in which the interface is very important.     

Clockwise vs Counter-Clockwise I-V Hysteresis of Point-Contact Metal-Tip/Pr0.7 Ca0.3MnO3/Pt Devices

Metal-tip/Pr0.7Ca0.3MnO3/Pt devices possess two types of I-V hysteresis： clockwise vs counter clockwise depending on the tip materials. The criteria for categorization of these two types of devices can be simply based on whether the Gibbs free energy of oxidation for the metal tip is lower or higher than that of PCMO, respectively. While the clockwise hysteresis can be attributed to electric field induced oxidation/reduction, the counter clockwise hysteresis can be explained by oxygen vacancy migration in an electrical field. Alternating-current conductance spectra also reveal distinct hopping barriers between these two categories of devices at high resistive states.     

Electronic Structure of Si1-xⅣx/Si Superlattices on Si （001）

We have preformed systematical ab initio studies of the structural and electronic properties of short-period Si1-xⅣx/Si （x = 0.125, 0.25, 0.5, Ⅳ=Ge, Sn） superlattices （SLs） grown along the [001] direction on bulk Si. The present calculations reveal that the Si0.875Ge0.125/Si, Si0.75Ge0.25/Si and Si0.875Sn0.125/Si are the F-point direct bandgap semiconductors. The technological importance lies in the expectation that the direct gap Si1-xⅣx/Si SLs may be used as components in integrated optoelectronic devices, in conjunction with the already well-established and highly advanced silicon technology.     

Acceptor Concentration Effects on Photovoltaic Response in the La1-xSrxMnO3/SrNbyTi1-yO3 Heterojunction

Photovoltaic response in the heterojunction of La1-x SrxMnO3/SrNby Ti1-yO3 （LSMO/SNTO） is analyzed theoretically based on the drift-diffusion model. It is found that the decrease of acceptor concentration in the La1-xSrxMnO3 layer of hereto junction can increase the peak value of photovoltaic signal and the speed of photovoltaic response, whereas the changing of donor concentration in the SrNby Ti1-yO3 layer has no such evident effect. Furthermore, the result also indicates that the modulation of Sr doping in La1-xSrxMnO3 is an effective method to accommodate the sensitivity and the speed of photovoltaic response for LSMO/SNTO photoelectric devices.     

Transport Behaviour of La0.8Sr0.2AlO3 Thin Film on Oxygen Deficient SrTiO3 Substrate

La_0.8Sr_0.2AlO₃ (LSAO) thin films are grown on SrTiO₃ (STO) and MgO substrates by laser molecular beam epitaxy. The LSAO thin film on oxygen deficient STO substrate exhibits metallic behaviour over the temperature range of 80--340K. The optical transmittance spectrum indicates that theLSAO thin films on MgO substrate are insulating at room temperature. The transport properties of LSAO thin films on STO substrates deposited in different oxygen pressure are compared. Our results indicate that oxygen vacancies in STO substrates should be mainly responsible for the transport behaviour of LSAO thin films.     

Resistance switching in Fe-doped P0.7Ca0.3MnO3 thin films

An enhanced electric-pulse-induced resistance (EPIR) switching effect is observed in the Ag/P_0.7Ca_0.3Mn_1 − xFe_xO₃/YBa₂Cu₃O₇ (Ag/PCMFO/YBCO) and Ag/(PCMFO/PCMO)/YBCO structures. Unlike in the PCMO-based EPIR devices, where the Ag/PCMO interface plays a crucial role, both the Ag/PCMFO interface and the bulk PCMFO are found to have significant contributions to the EPIR switching of the PCMFO-based device. A possible explanation is to extend the pulse-driven oxygen ion/vacancy motion model at the metal/PCMO interface region to the bulk PCMFO.     

Photovoltaic Characteristic of La0.7Sr0.3MnO3/ZnO p-n Heterojunction

We report on the photovoltaic properties of Lao.7Sro.3MnO3//ZnO heterojunction fabricated by pulsed laser deposition methods. Nanosecond photovoltaic pulses are observed in this junction in the wavelength range from ultraviolet-visible to infrared. A qualitative explanation is presented, based on an analysis of the photovoltaic signals of p-n heterojunction.     

Pseudogap and Superconducting Gap in SmFeAs（O1-xFx） Superconductor from Photoemission Spectroscopy

High resolution photoemission measurements are carried out on non-superconducting SmOFeAs paxent compound and superconducting SmFeAs（O1-xFx） （x = 0.12, and 0.15） compounds. The momentum-integrated spectra exhibit a clear Fermi cutoff that shows little leading-edge shift in the superconducting state. A robust feature at 13 meV is identified in all these samples. Spectral weight suppression near IF, F with decreasing temperature is observed in both undoped and doped samples that points to a possible existence of a pseudogap in these Fe-based compounds.     

Superconductivity in Hole-Doped （S1-xKx）Fe2As2

A series of layered （Sr1-xKx）Fe2As2 compounds with nominal x = 0-0.40 are synthesized by solid state reaction method. Similar to other parent compounds of iron-based pnictide superconductors, pure SrFe2As2 shows a strong resistivity anomaly near 210 K, which was ascribed to the spin-density-wave instability. The anomaly temperature is much higher than those observed in LaOFeAs and BaFe2As2, the two prototype parent compounds with ZrCuSiAs- and ThCr2Si2-type structures. K-doping strongly suppresses this anomaly and induces superconductivity. Like in the case of K-doped BaFe2As2, sharp superconducting transitions at Tc ～ 38 K is observed. We perform the Hall coefficient measurement, and confirm that the dominant carriers are hole-type. The carrier density is enhanced by a factor of 3 in comparison to F-doped LaOFeAs superconductor.