Determination of Hydrogen in Zircaloy by Spark Source Mass Spectrometry

Abstract

Application of Spark Source Mass Spectrometry(SSMS) for the determination of hydrogen in zircaloy clad material used in nuclear reactors is reported. The advantage of SSMS lies in the fact that along with the metallic trace constituents even the nonmetallics including the gaseous impurities can also be determined in a single analysis using the photoplate detection system. The value obtained for H₂ using photoplate detection system is compared with that obtained in electrical detection system in SSMS and also with the value obtained employing the conventional inert gas fusion technique.     

Mass spectrometric analysis of ceramic components for solid oxide fuel cells

For the determination of trace impurities in ceramic components of solid oxide fuel cells (SOFCs), some mass spectrometric methods have been applied such as spark source mass spectrometry (SSMS), laser ionization mass spectrometry (LIMS), laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) and inductively coupled plasma mass spectrometry (ICP-MS). Due to a lack of suitable standard reference materials for quantifying of analytical results on La _x Sr _y MnO₃ cathode material a matrix-matched synthetic standard-high purity initial compounds doped with trace elements-was prepared in order to determine the relative sensitivity coefficients in SSMS and LA-ICP-MS. Radiofrequency glow discharge mass spectrometry (rf-GDMS) was developed for trace analysis and depth profiling of thick non-conducting layers. Surface analytical techniques, such as secondary ion mass spectrometry (SIMS) and sputtered neutral mass spectrometry (SNMS), were used to determine the element distribution on surfaces (homogeneity) and the surface contaminants of SOFC ceramic layers.Dedicated to Professor Dr. rer. nat. Hubertus Nickel on the occasion of his 65th birthday     

Determination of trace impurities in cobalt by spark source mass spectrometry

An analytical method, SSMS, for the determination of trace impurities in cobalt is described. This element is used as raw material for the production of⁶⁰Co in Embalse Nuclear Power Station. Tin, aluminum, lead, silicon, molybdenum, calcium, vanadium, boron, chromium, zirconium, tungsten, nickel, magnesium, iron, zinc and copper were determined. Manganese, analyzed by AAS, was used as an internal standard. The measurements were semiquantitative. The accuracy of the results was compared with that of emission spectrography and atomic absorption spectrometry, the agreement was found to be satisfactory.     

Analysis of tellurium by spark source mass spectrometry

Summary Three tellurium standards were analyzed by both spark source mass spectrometry (SSMS) and graphite furnace atomic absorption spectrophotometry (GFAAS). From these results relative sensitivity coefficients (RSC) for spark source mass spectrometry were derived for 24 elements.With these RSC's SSMS results within a factor 1.5 from the GFAAS values could be obtained for the determination of various impurities in tellurium. A comparison is made between SSMS, GFAAS and glow discharge mass spectrometry (GDMS) for the analysis of 4–6 N tellurium samples.

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Analyse von Tellurium mit Hilfe der Funkenionisations-Massenspektrometrie

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Dedicated to Prof, Dr. G. Tölg on the occasion of his 60th birthday     

Progress in multi-ion counting spark-source mass spectrometry (MIC-SSMS) for the analysis of geological samples

Spark source mass spectrometry (SSMS) has experienced important and significant improvements in nearly all analytical features by the use of a multiple ion counting (MIC) system. Two procedures have recently been developed to further increase the analytical capabilities of MIC-SSMS in geochemistry. These are a mathematical correction of interferences, which is often necessary for the ultra trace element analysis of Nb, Ta, Zr, Hf and Y, and the development of an autospark system to hold the total ion beam constant. New analytical data for geological samples, especially international reference materials, are presented using the improved MIC-SSMS technique. The data set consists of high precision and low abundance data for Zr, Nb and Y in depleted reference materials. The MIC-SSMS results are compared with those of conventional SSMS using photoplates for ion detection. The precision of the MIC-SSMS isotope ratio measurements (about 1%) is more than a factor of 3 better than that of conventional SSMS, as demonstrated by analyses of Hawaiian samples. Total uncertainties of MIC-SSMS concentration data including all sources of error are generally between 2 and 5% for concentrations higher than about 0.3 microg/g and about 10% for trace element abundances in the ng/g range.     

Progress in multi-ion counting spark-source mass spectrometry (MIC-SSMS) for the analysis of geological samples

Spark source mass spectrometry (SSMS) has experienced important and significant improvements in nearly all analytical features by the use of a multiple ion counting (MIC) system. Two procedures have recently been developed to further increase the analytical capabilities of MIC-SSMS in geochemistry. These are a mathematical correction of interferences, which is often necessary for the ultra trace element analysis of Nb, Ta, Zr, Hf and Y, and the development of an autospark system to hold the total ion beam constant. New analytical data for geological samples, especially international reference materials, are presented using the improved MIC-SSMS technique. The data set consists of high precision and low abundance data for Zr, Nb and Y in depleted reference materials. The MIC-SSMS results are compared with those of conventional SSMS using photoplates for ion detection. The precision of the MIC-SSMS isotope ratio measurements (about 1%) is more than a factor of 3 better than that of conventional SSMS, as demonstrated by analyses of Hawaiian samples. Total uncertainties of MIC-SSMS concentration data including all sources of error are generally between 2 and 5% for concentrations higher than about 0.3 μg/g and about 10% for trace element abundances in the ng/g range.     

Trace element analysis of Geological Survey of Japan silicate reference materials: Comparison of SSMS with ICP-MS data and a critical discussion of compiled values

The concentrations of 29 trace elements have precisely been determined in 15 international silicate reference materials of the Geological Survey of Japan by spark source mass spectrometry (SSMS) and inductively coupled plasma-mass spectrometry (ICP-MS). The samples span a wide range of concentration levels. Most of the SSMS and ICP-MS values agree within analytical error down to the ppb concentration range. Of particular interest are the data for Nb, Y, Zr, Th, U in samples with low trace element concentrations (<1–10 ppm), for which published data are quite variable. The results obtained generally agree with those of modern sensitive analytical techniques (such as ICP-MS, HPLC), but are often much lower than standard XRF and compiled reference values. It is suggested that these discrepancies arise from calibration and analytical problems for standard XRF and ICP-MS and incorporation of these data into compiled values. More judicious selection of data based on analytical methodology and geochemical behaviour is required for samples which challenge the detection limits of standard analysis.     

Method for increasing the accuracy of the determination of elemental impurities in metals by spark source mass spectrometry

This paper presents a method for increasing the accuracy in the determination of impurities in metals by spark source mass spectrometry (SSMS). The method is based on the application of a parametric equation to calculate sensitivity coefficients. The parameters of this equation are determined from results obtained by analysis of an appropriate standard material. Concentrations in the sample of elements certified in the standard material are determined using experimental values of sensitivity coefficients, while the concentrations of remaining elements in the test sample are determined using coefficients calculated from the proposed parametric equation.     

Water analysis by spark-source mass-spectrometry after preconcentration on activated carbon

For trace analyses of environmental waters, spark-source mass-spectrometry has been combined with a preconcentration procedure involving chelation of the dissolved trace elements with oxine and subsequent adsorption of the oxinates and naturally occurring organic and colloidal metal species onto activated carbon. The activated carbon is filtered off and ashed at low temperature. The residue is dissolved, an internal standard and pure graphite are added and, after drying, the electrodes are prepared. The photographically recorded mass spectrum is evaluated by a suitable computer routine. The error of the procedure is around 30%. While this preconcentration and analysis procedure is capable of measuring about 40 elements quantitatively, in practice 10-25 trace elements are determined simultaneously above the 0.1-mug/l. detection limit, as is illustrated by analyses of drinking water, surface and ground water samples. Although a sophisticated technique, SSMS can be considered for regular panoramic survey analyses.     

Control of the hafnium content in Co samples by SSMS

Summary The production of ⁶⁰Co requires a strict control of the chemical composition of the cobalt before irradiation in order to avoid the activation of some undesirable elements and to constrain the presence of slow neutron poisons. A methodology by SSMS for the survey analysis of metallic Co prior to its irradiation in the nuclear reactor at Embalse (Cdba., Argentina) is described. The low detection limit attained for Hf (below 0.5 ppm) is outlined. The results obtained for some other impurities without a standard reference are compared with atomic emission spectrographic data and show satisfactory agreement.

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Kontrolle des Hafniumgehaltes in Cobaltproben durch SSMS

     

Trace Impurity Removal from Air

In addition to Nitrogen, Oxygen and Argon, ambient air contains many trace impurities. These impurities include moisture, Carbon Dioxide, Oxides of Nitrogen and light Hydrocarbons. Prior to cryogenic distillation of air to produce Nitrogen, Oxygen and Argon these trace impurities have to be removed since, some of these constitute a safety hazard in the cryogenic plant. A significant amount of information is available in the literature for the removal of Water and Carbon Dioxide from air. However, only limited information is available for the removal of other trace impurities. We discuss the results of an experimental study on the removal of these trace impurities from air.These days, air pre purification is carried out primarily by adsorption based technologies. There are two main choices: Thermal Swing Adsorption (TSA) processes, and Pressure Swing Adsorption (PSA) processes. Main differences between these two approaches and the trace impurity removal results are discussed.     

Inorganic trace analysis by mass spectrometry

Mass spectrometric methods for the trace analysis of inorganic materials with their ability to provide a very sensitive multielemental analysis have been established for the determination of trace and ultratrace elements in high-purity materials (metals, semiconductors and insulators), in different technical samples (e.g. alloys, pure chemicals, ceramics, thin films, ion-implanted semiconductors), in environmental samples (waters, soils, biological and medical materials) and geological samples. Whereas such techniques as spark source mass spectrometry (SSMS), laser ionization mass spectrometry (LIMS), laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS), glow discharge mass spectrometry (GDMS), secondary ion mass spectrometry (SIMS) and inductively coupled plasma mass spectrometry (ICP-MS) have multielemental capability, other methods such as thermal ionization mass spectrometry (TIMS), accelerator mass spectrometry (AMS) and resonance ionization mass spectrometry (RIMS) have been used for sensitive mono- or oligoelemental ultratrace analysis (and precise determination of isotopic ratios) in solid samples. The limits of detection for chemical elements using these mass spectrometric techniques are in the low ng g⁻¹ concentration range. The quantification of the analytical results of mass spectrometric methods is sometimes difficult due to a lack of matrix-fitted multielement standard reference materials (SRMs) for many solid samples. Therefore, owing to the simple quantification procedure of the aqueous solution, inductively coupled plasma mass spectrometry (ICP-MS) is being increasingly used for the characterization of solid samples after sample dissolution. ICP-MS is often combined with special sample introduction equipment (e.g. flow injection, hydride generation, high performance liquid chromatography (HPLC) or electrothermal vaporization) or an off-line matrix separation and enrichment of trace impurities (especially for characterization of high-purity materials and environmental samples) is used in order to improve the detection limits of trace elements. Furthermore, the determination of chemical elements in the trace and ultratrace concentration range is often difficult and can be disturbed through mass interferences of analyte ions by molecular ions at the same nominal mass. By applying double-focusing sector field mass spectrometry at the required mass resolution—by the mass spectrometric separation of molecular ions from the analyte ions—it is often possible to overcome these interference problems. Commercial instrumental equipment, the capability (detection limits, accuracy, precision) and the analytical application fields of mass spectrometric methods for the determination of trace and ultratrace elements and for surface analysis are discussed.     

高纯氧化铕中微量稀土杂质的化学光谱测定

将高纯Ｅｕ２Ｏ２通过Ｐ５０７萃淋树脂分离富集，分离掉大量基体Ｅｕ２Ｏ３剩下微量稀土杂质用碳粉吸附，加ＫＢＨ４作载体进行光谱测定，本方法可测定９９．９９９９％，纯度的Ｅｕ２Ｏ３中微量稀土杂质。     

Identification,control strategies,and analytical approaches for the determination of potential genotoxic impurities in pharmaceuticals: A comprehensive review

Potential genotoxic impurities in pharmaceuticals at trace levels are of increasing concern to both pharmaceutical industries and regulatory agencies due to their possibility for human carcinogenesis. Molecular functional groups that render starting materials and synthetic intermediates as reactive building blocks for small molecules may also be responsible for their genotoxicity. Determination of these genotoxic impurities at trace levels requires highly sensitive and selective analytical methodologies, which poses tremendous challenges on analytical communities in pharmaceutical research and development. Experimental guidance for the analytical determination of some important classes of genotoxic impurities is still unavailable in the literature. Therefore, the present review explores the structural alerts of commonly encountered potential genotoxic impurities, draft guidance of various regulatory authorities in order to control the level of impurities in drug substances and to assess their toxicity. This review also describes the analytical considerations for the determination of potential genotoxic impurities at trace levels and finally few case studies are also discussed for the determination of some important classes of potential genotoxic impurities. It is the authors’ intention to provide a complete strategy that helps analytical scientists for the analysis of such potential genotoxic impurities in pharmaceuticals.     

火试金法测定铅冶炼渣中的金、银含量

建立了铅冶炼渣中的金银含量的测定方法,采用火试金法富集铅冶炼渣中的金、银,铅扣经灰吹后,形成金银合粒,合粒中除有金银外,还残留微量的铅铋杂质,合粒经硝酸分金后,实现金银分离,得到金粒和分金溶液。合粒中杂质保留在分金溶液中,分金溶液经酸处理,采用电感耦合等离子体发射光谱(ICP-OES)法测定其中杂质量和微量的金量。金粒质量补正分金溶液中微量金量即为样品中的金量,合粒质量减去金粒质量和杂质量即为银量。ICP-OES法测定杂质解决了合粒中铅铋残留和分金失误造成微量金进入分金溶液现象。方法精密度较好,加标回收率分别为银98.6%～100%,金96.2%～102%。方法准确、方便、快捷,能很好地满足铅冶炼渣中金、银含量的测定。     

激光剥蚀-电感耦合等离子体质谱对高温合金中17种痕量元素的测定

建立了镍基高温合金中Sc、Cu、Zn、Ga、Ge、As、Ag、Cd、In、Sn、Sb、Te、Ce、Hf、Tl、Pb、Bi17种痕量元素的激光剥蚀-电感耦合等离子体质谱测定方法。对激光剥蚀进样及质谱分析条件进行了优化,通过激光对样品表面的层层剥蚀顺利完成了对低沸点杂质元素的测定。采用格栅扫描采样,严格控制样品的聚焦位置和散焦距离以保证采样的准确性,由高温合金系列标准物质建立了18种痕量元素的校正曲线,其中14种痕量元素的线性相关性较好(r2≥0.99),In、Sn、Sb、Ce、Tl、Pb、Bi等超痕量元素的检出限和气体空白分别低于或接近0.000 005%和0.000 001%。方法对镍基高温合金样品中Cu、Ga、Ag、Cd、In、Sn、Sb、Te、Hf、Tl、Pb和Bi等痕量元素的测定结果与参考值吻合较好,且大部分元素的RSD(n=4)小于或接近30%。     

火试金法测定铅冶炼渣中的金、银含量

建立了铅冶炼渣中的金银含量的测定方法,采用火试金法富集铅冶炼渣中的金、银,铅扣经灰吹后,形成金银合粒,合粒中除有金银外,还残留微量的铅铋杂质,合粒经硝酸分金后,实现金银分离,得到金粒和分金溶液。合粒中杂质保留在分金溶液中,分金溶液经酸处理,采用电感耦合等离子体发射光谱(ICP-OES)法测定其中杂质量和微量的金量。金粒质量补正分金溶液中微量金量即为样品中的金量,合粒质量减去金粒质量和杂质量即为银量。ICP-OES法测定杂质解决了合粒中铅铋残留和分金失误造成微量金进入分金溶液现象。方法精密度较好,加标回收率分别为银98.6%～100%,金96.2%～102%。方法准确、方便、快捷,能很好地满足铅冶炼渣中金、银含量的测定。     

Gas chromatographic analysis of trace gas impurities in tungsten hexafluoride

Highly reactive fluorinated gaseous matrices require special equipment and techniques for the gas chromatographic analysis of trace impurities in these gases. The impurities that were analysed at the low-microg/l levels included oxygen, nitrogen, carbon dioxide, carbon monoxide, sulfur hexafluoride and hydrogen. This paper describes the use of a system utilising backflush column switching to protect the columns and detectors in the analysis of trace gas impurities in tungsten hexafluoride. Two separate channels were used for the analysis of H2, O2, N2, CO, CO2 and SF6 impurities with pulsed discharge helium ionisation detection.     

High performance analytical characterization of refractory metals

It is first shown what effects trace impurities generally exert on metal properties and why trace analysis is essential to modern applications of refractory metals in today's high technology. The effect of trace impurities in metals on complex systems like microelectronic components is also discussed.It is then shown, what principal analytical requirements are mandatory for trace characterization of refractory metals at levels of rising purity (4 N to 6 N). A survey of analytical methods for trace and ultratrace characterization of refractory metals is given including the following methods: flame and graphite furnace atomic absorption spectrometry, ICP and DCP-atomic emission spectrometry, X-ray fluorescence spectrometry, activation analysis, mass spectrometric methods, especially SIMS and GDMS.     

Detection of sulfur-containing impurities in pharmaceutical samples by high performance liquid chromatography/chemical reaction interface mass spectrometry

This paper describes the use of chemical reaction interface mass spectrometry (CRIMS) combined with liquid chromatography for the detection of trace level sulfur-containing impurities in pharmaceutical materials. A mixture of sulfur- and non-sulfur-containing compounds were analyzed initially to test the system. Then the determination of trace level impurities in a cimetidine drug substance was carried out. Detection of sulfur-containing impurities at less than 0.1% of the major component was obtained with good linearity. The results obtained are consistent with the expected results for this sample and illustrate the applicability of the technique.