Characterization of atmospheric aerosols using Synchroton radiation total reflection X-ray fluorescence and Fe K-edge total reflection X-ray fluorescence-X-ray absorption near-edge structure

In this study a new procedure using Synchrotron total reflection X-ray fluorescence (SR-TXRF) to characterize elemental amounts in atmospheric aerosols down to particle sizes of 0.015 um is presented. The procedure was thoroughly evaluated regarding bounce off effects and blank values. Additionally the potential of total reflection X-ray fluorescence–X-ray absorption near edge structure (SR-TXRF-XANES) for speciation of FeII/III down to amounts of 34 pg in aerosols which were collected for 1 h is shown. The aerosols were collected in the city of Hamburg with a low pressure Berner impactor on Si carriers covered with silicone over time periods of 60 and 20 min each. The particles were collected in four and ten size fractions of 10.0–8.0 μm, 8.0–2.0 μm, 2.0–0.13 μm 0.13–0.015 μm (aerodynamic particle size) and 15–30 nm, 30–60 nm, 60–130 nm, 130–250 nm, 250–500 nm, 0.5–1 μm, 1–2 μm, 2–4 μm, 4–8 μm, 8–16 μm. Prior to the sampling “bounce off” effects on Silicone and Vaseline coated Si carriers were studied with total reflection X-ray fluorescence. According to the results silicone coated carriers were chosen for the analysis. Additionally, blank levels originating from the sampling device and the calibration procedure were studied. Blank levels of Fe corresponded to 1–10% of Fe in the aerosol samples. Blank levels stemming from the internal standard were found to be negligible.     

Analysis of beers from Brazil with synchrotron radiation total reflection X-ray fluorescence

Summary In this study the concentrations of P, S, Cl, K, Ca, Mn, Fe, Zn and Br in twenty-nine brands of national and international beers were determined by synchrotron radiation total reflection X-ray fluorescence analysis (SR-TXRF). The results were compared with the limits established by the Brazilian legislation and the nutritional values established by National Agricultural Library (NAL, USA). The measurements were performed at the X-Ray Fluorescence Beamline at Brazilian National Synchrotron Light Laboratory, in Campinas, S?o Paulo, Brazil, using a polychromatic beam for excitation. A small volume of 5 ml of beers containing an internal standard used to correct geometry effects was analyzed without pretreatment. The measuring time was 100 seconds and the detection limits obtained varied from 1 mg ^. l^-1 for Mn and Fe to 15 mg ^. l^-1 for P.     

Analysis of fish samples for environmental monitoring and food safety assessment by synchrotron radiation total reflection X-ray fluorescence

Summary This study uses fishes as indicators of metal contamination in the Piracicaba Basin and also for evaluation of the risks to human health by the ingestion of fish contaminated by metals and other potentially toxic elements. Based on total reflection X-ray fluorescence analysis, Al, Si, P, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Ni, Cu, Zn and Ba were detected and evaluated in the muscle and viscus (liver, intestine and stomach) of fish collected in the Piracicaba River.     

Multi-elemental analysis of produced water by synchrotron radiation total reflection X-ray fluorescence

The synchrotron radiation total reflection X-ray fluorescence (SRTXRF) technique was used for the analysis of heavy metals in produced water samples from oil field in Rio Grande do Norte, in order to determine potential sources of pollution. Since the inorganic components in produced water generally resembling sea water, pre-concentration procedures have been applied to increase the concentration of the analyte of interest and to minimize the salt matrix effects. This technique allows us to determine the contents of V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Hg and Pb in 20 produced water samples. The great majority of the sampling points presented low elemental concentration value. However, in some sample, the Fe, Ni, Cu, Zn and Hg concentration were higher than the established limits by the Brazilian legislation.     

A wavelength-dispersive arrangement for wafer analysis with total reflection X-ray fluorescence spectrometry using synchrotron radiation

Currently, the only apparent means to enhance the detection power of the TXRF technique would be to increase the intensity of the primary beam. Using synchrotron radiation, the most powerful X-ray source available, unfortunately, not only the fluorescence signal of the contaminant elements is increased, but also in equal measure, the intensities of the Si–K radiation from the wafer together with the scattered radiation. This results in an overloading of the energy-dispersive Si (Li) detector systems used hitherto, with the effect that the available primary intensity cannot be fully exploited. Wavelength-dispersive systems are free of such problems; they generate less detector background and can withstand higher count rates. Due to their small angle of acceptance, however, their detection efficiency is quite low. In this contribution we propose a wavelength-dispersive TXRF solution, which is optimized with regard to higher efficiency on the basis of large area multilayer mirrors in combination with a position-sensitive detector. The count rates in relation to energy-dispersive instruments and the energy resolution of the new system have been calculated using ray-tracing techniques.     

Analysis of mineral water from Brazil using total reflection X-ray fluorescence by synchrotron radiation

The total reflection X-ray fluorescence using synchrotron radiation (SRTXRF) has become a competitive technique for the determination of trace elements in samples that the concentrations are lower than 100 ng ml⁻¹. In this work, thirty-seven mineral waters commonly available in supermarkets of Rio de Janeiro, Brazil, were analyzed by SRTXRF. The measurements were performed at the X-Ray Fluorescence Beamline at Brazilian National Synchrotron Light Laboratory (LNLS), in Campinas, São Paulo, using a polychromatic beam with maximum energy of 20 keV for the excitation. Standard solutions with gallium as internal standard were prepared for calibration of the system. Mineral water samples of 10 μl were added to Perspex sample carrier, dried under infrared lamp and analyzed for 200 s measuring time. It was possible to determine the concentrations of the following elements: Si, S, K, Ca, Ti, Cr, Mn, Ni, Cu, Zn, Ge, Rb, Sr, Ba and Pb. The elemental concentration values were compared with the limits established by the Brazilian legislation.     

Quo Vadis total reflection X-ray fluorescence?

The multielement trace analytical method ‘total reflection X-ray fluorescence’ (TXRF) has become a successfully established method in the semiconductor industry, particularly, in the ultra trace element analysis of silicon wafer surfaces. TXRF applications can fulfill general industrial requirements on daily routine of monitoring wafer cleanliness up to 300 mm diameter under cleanroom conditions. Nowadays, TXRF and hyphenated TXRF methods such as ‘vapor phase decomposition (VPD)-TXRF’, i.e. TXRF with a preceding surface and acid digestion and preconcentration procedure, are automated routine techniques (‘wafer surface preparation system’, WSPS). A linear range from 10⁸ to 10¹⁴ [atoms/cm²] for some elements is regularly controlled. Instrument uptime is higher than 90%. The method is not tedious and can automatically be operated for 24 h/7 days. Elements such as S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Br, Sn, Sb, Ba and Pb are included in the software for standard peak search. The detection limits of recovered elements are between 1×10¹¹ and 1×10⁷ [atoms/cm²] depending upon X-ray excitation energy and the element of interest. For the determination of low Z elements, i.e. Na, Al and Mg, TXRF has also been extended but its implementation for routine analysis needs further research. At present, VPD-TXRF determination of light elements is viable in a range of 10⁹ [atoms/cm²]. Novel detectors such as silicon drift detectors (SDD) with an active area of 5 mm², 10 mm² or 20 mm², respectively, and multi-array detectors forming up to 70 mm² are commercially available. The first SDD with 100 mm² (!) area and integrated backside FET is working under laboratory conditions. Applications of and comparison with ICP-MS, HR-ICP-MS and SR-TXRF, an extension of TXRF capabilities with an extremely powerful energy source, are also reported.     

Recent results of synchrotron radiation induced total reflection X-ray fluorescence analysis at HASYLAB,beamline L

At the Hamburger Synchrotronstrahlungslabor (HASYLAB), Beamline L, a vacuum chamber for synchrotron radiation-induced total reflection X-ray fluorescence analysis, is now available which can easily be installed using the adjustment components for microanalysis present at this beamline. The detector is now in the final version of a Vortex silicon drift detector with 50-mm² active area from Radiant Detector Technologies. With the Ni/C multilayer monochromator set to 17 keV extrapolated detection limits of 8 fg were obtained using the 50-mm² silicon drift detector with 1000 s live time on a sample containing 100 pg of Ni.Various applications are presented, especially of samples which are available in very small amounts: As synchrotron radiation-induced total reflection X-ray fluorescence analysis is much more sensitive than tube-excited total reflection X-ray fluorescence analysis, the sampling time of aerosol samples can be diminished, resulting in a more precise time resolution of atmospheric events. Aerosols, directly sampled on Si reflectors in an impactor were investigated. A further application was the determination of contamination elements in a slurry of high-purity Al₂O₃. No digestion is required; the sample is pipetted and dried before analysis. A comparison with laboratory total reflection X-ray fluorescence analysis showed the higher sensitivity of synchrotron radiation-induced total reflection X-ray fluorescence analysis, more contamination elements could be detected. Using the Si-111 crystal monochromator also available at beamline L, XANES measurements to determine the chemical state were performed. This is only possible with lower sensitivity as the flux transmitted by the crystal monochromator is about a factor of 100 lower than that transmitted by the multilayer monochromator. Preliminary results of X-ray absorption near-edge structure measurements for As in xylem sap from cucumber plants fed with As(III) and As(V) are reported. Detection limits of 170 ng/l of As in xylem sap were achieved.     

Analysis of low Z elements on Si wafer surfaces with undulator radiation induced total reflection X-ray fluorescence at the PTB beamline at BESSY II

Synchrotron radiation induced TXRF allows the nondestructive investigation of low Z contaminations on Si wafer surfaces at trace levels required by the semiconductor industry. The PTB (Physikalisch Technische Bundesanstalt) U180 undulator beamline at BESSY II, equipped with a plane grating monochromator ensuring an energy resolving power E/ΔE between 500 and 5000, can be operated either in wiggler mode for photon energies up to 1.7 keV to excite Al, Mg and Na efficiently, or in undulator mode, i.e. using one of the first odd U180 harmonics, to obtain intensive low energy radiation below 0.7 keV to excite carbon, nitrogen and oxygen. The specific feature of the beamline is its high spectral purity that allows for fundamental investigations. The TXRF wafer chamber of the Atominstitut was used for the experiments with a sidelooking Si(Li) detector with the wafer arranged vertically to take advantage of the linear polarization for background reduction. The energy dependence of the resonant Raman scattering, which is a limiter for the determination of Al at ultra trace levels excited with energies just below the Si absorption edge was studied as well as the influence of the incidence angle on the Raman peak. Droplet samples containing boron were measured and the detection limit of 3 ng determined. A single Carbon layer (5 nm) and a C–Ni–C multilayer sample on a Si wafer were characterized and it was shown that the thickness and density of these layers could be determined.     

Elemental concentration in the cortex and hippocampus of Wistar rats by X-ray total reflection fluorescence with synchrotron radiation

Summary The study of trace element levels is of great importance due to their relevance in agingand several neurodegenerative diseases. This work compares the elemental concentrations in different postnatal ages and between the temporal cortex, entorhinal cortex and hippocampus from Wistar rats, using X-ray total reflection fluorescence with synchrotron radiation. Ten elements were determined in brain samples: Ti, Cr, Mn, Fe, Cu, Zn, (at trace level) and P, S, Cl and K (at major levels). The elements that increased with aging in cortical areas were: S, K, Fe, Cu and Zn. Ca and Zn levels decreased with advancing age in the hippocampus. In addition to this, Ti, Mn and Fe levels were more conspicuous in the entorhinal cortex.     

Comparison of conventional and total reflection excitation geometry for fluorescence X-ray absorption spectroscopy on droplet samples

X-ray absorption fine structure (XAFS) experiments in fluorescence mode have been performed in total reflection excitation geometry and conventional 45°/45° excitation/detection geometry for comparison. The experimental results have shown that XAFS measurements are feasible under normal total reflection X-ray fluorescence (TXRF) conditions, i.e. on droplet samples, with excitation in grazing incidence and using a TXRF experimental chamber. The application of the total reflection excitation geometry for XAFS measurements increases the sensitivity compared to the conventional geometry leading to lower accessible concentration ranges. However, XAFS under total reflection excitation condition fails for highly concentrated samples because of the self-absorption effect.     

Picoliter solution deposition for total reflection X-ray fluorescence analysis of semiconductor samples

A deposition system capable of delivering picoliter quantities of solution in programmable arrays was investigated as a method for sample preparation for total reflection X-ray fluorescence (TXRF) spectroscopy. Arrays of trace metals in solution were deposited on Si wafers. The array deposits provide a capability of depositing closely spaced (100 μm or less), typically 5–20 μm diameter droplets in an area that can be matched to the analysis spot of the TXRF detector. The dried depositions were physically characterized and the effect of deposition type and matrix on the TXRF signal was investigated.     

Monitoring of the environmental pollution by trace element analysis in tree-rings using synchrotron radiation total reflection X-ray fluorescence

This paper aims to study the environmental pollution in the tree development, in order to evaluate its use as bioindicator in urban and country sides. The sample collection was carried out in Piracicaba city, São Paulo State, which presents high level of environmental contamination in water, soil and air, due to industrial activities, vehicles combustion, sugar-cane leaves burning in the harvesting, etc. The species Caesalpinia peltophoroides (“Sibipiruna”) was selected because it is widely used in urban forestation. Synchrotron Radiation Total Reflection X-ray Fluorescence technique (SR-TXRF) was employed to identify and quantify the elements and metals of nutritional and toxicological importance in the wood samples. The analysis was performed in the Brazilian Synchrotron Light Source Laboratory, using a white beam for excitation and a Si(Li) detector for X-ray detection. In several samples, P, K, Ca, Ti, Fe, Sr, Ba and Pb were quantified. The K/Ca, K/P and Pb/Ca ratios were found to decrease towards the bark.     

Automated nanoliter solution deposition for total reflection X-ray fluorescence analysis of semiconductor samples

In this study, a BioDot BioJet dispensing system was investigated as a nanoliter sample deposition method for total reflection X-ray fluorescence (TXRF) analysis. The BioDot system was programmed to dispense arrays of 20 nL droplets of sample solution on Si wafers. Each 20 nL droplet was approximately 100 μm in diameter. A 10 × 10 array (100 droplets) was deposited and dried in less than 2 min at room temperature and pressure, demonstrating the efficiency of the automated deposition method. Solutions of various concentrations of Ni and Ni in different matrices were made from stock trace element standards to investigate of the effect of the matrix on the TXRF signal. The concentrations were such that the levels of TXRF signal saturation could be examined. Arrays were deposited to demonstrate the capability of drying 100 μL of vapor phase decomposition-like residue in the area of a typical TXRF detector.     

Multielement determination in river-water of Sepetiba Bay tributaries (Brazil) by total reflection X-ray fluorescence using synchrotron radiation

Summary Trace elements were determined in the surface waters of tributaries of the Sepetiba Bay, Brazil (Piraquê, Itá, S?o Francisco, Guarda, Guandu Mirim, Vala do Sangue and Engenho Novo rivers) by total reflection X-ray fluorescence using synchrotron radiation (SRTXRF). Eighteen trace elements could be determined in the dissolved and the suspended particulate phases: Al, Si, P, S, Cl, K, Ca, Ti, Cr, Mn, Fe, Ni, Cu, Zn, Br, Rb, Sr and Pb. The elemental concentration values were compared to the values recommended by the Brazilian legislation.     

Pretreatment of special samples from waste incineration for analysis by total reflection X-ray fluorescence

The use of ion exchange processes as sample pretreatment steps for TXRF analysis has been studied in order to improve the detection sensitivity or to provide information on the speciation of individual elements. EDTrA cellulose proved to be an excellent exchange material for heavy metal enrichment, for Hg separation, and for elimination of alkaline and earth-alkaline salts. Sephadex SP C25 and QAE A25 can be used to separate Pb and As and to verify the ionic state of the elements V, Cr, As, Se, Mo, Sb and W.     

Element determination in medieval soil samples by total reflection X-ray fluorescence analysis

An aqua regia extraction procedure for heavy metals in soils optimised for total reflection X-ray fluorescence analysis is presented. The procedure is applied to 92 soil samples of medieval layers from the city area of Dortmund. Sixteen elements (P, S, K, Ca, Ti, Cr, Mn, Fe, Ni, Cu, Zn, Rb, Sr, Ag, Sn, and Pb) were used to characterise 17 sample sites. The results are projected onto the medieval urban structure of Dortmund. Two sites loaded with non-ferrous heavy metal could be detected and correlated with archaeological data. The efficiency and repeatability of the proposed extraction procedure is discussed.     

Synchrotron radiation total reflection X-ray fluorescence (SR-TXRF) for evaluation of food contamination

Summary The objective of this study was to use synchrotron radiation total reflection X-ray fluorescence analysis (SR-TXRF) for the determination of metals and other elements in food available to the population in commercial establishments, in order to evaluate the risks of contamination by these products. The analyzed species were vegetables, leafy vegetables, fruits, cereal and grain. The results indicated that some species were contaminated by Cr, Cu, Zn and Pb with concentrations much higher than the reference values.     

Elemental concentration analysis in brain structures from young,adult and old Wistar rats by total reflection X-ray fluorescence with synchrotron radiation

The knowledge of the spatial distribution and the local concentration of trace elements in tissues are of great importance since trace elements are involved in a number of metabolic and physiological processes in the human body, and their deficiency and excess may lead to different metabolic disorders. In this way, the main goal of this work is to compare the elemental concentration in different brain structures, namely temporal cortex, entorhinal cortex, visual cortex and hippocampus, from Wistar female rats (n = 15) with different ages: 2, 8 and 48 weeks. The measurements were performed at the Synchrotron Light Brazilian Laboratory, Campinas, São Paulo, Brazil. In the entorhinal cortex, the following elements decreased with age: Zn, S, Cl, K, Ca and Br. In the temporal cortex, Ca, Fe and Br levels increased with aging and on the other hand, P, S, Cl, K and Rb levels decreased with aging. In the visual cortex almost all the elements decreased with aging: Cl, Ca, Fe, Ni and Zn. In the hippocampus, in turn, most of the elements identified, increased with aging: Al, P, S, K, Fe, Cu, Zn and Rb. The increase of Fe with aging in the hippocampus is an important fact that will be studied, since it is involved in oxidative stress. It is believed that oxidative stress is the one of the main causes responsible for neuronal death in Parkinson's disease.