利用直流磁控溅射法在柔性衬底上制备ZnO: Zr新型透明导电薄膜

室温下利用直流磁控溅射法在有ZnO缓冲层的柔性衬底 PET上制备出了可见光透过率高、电阻率低的掺锆氧化锌(ZnO: Zr)透明导电薄膜,研究了厚度对ZnO: Zr薄膜结构及光电性能的影响.结果表明,ZnO: Zr薄膜为六方纤锌矿结构的多晶薄膜.实验获得ZnO: Zr薄膜的最小电阻率为2.4×10-3 Ω·cm,其霍尔迁移率为18.9 cm2·V-1·s-1 ,载流子浓度为2.3×1020 cm-3.实验制备的ZnO: Zr薄膜具有良好的附着性能,其可见光平均透过率超过92;.     

LaNiO3缓冲层对化学溶液法制备的Pb(Mg1/3Nb2/3)O3-PbTiO3薄膜的结构与电学性能的影响

采用化学溶液法在Pt/TiO2/SiO2/Si衬底上制备了92;Pb(Mg1/3/Nb2/3)O3-8;PbTiO3(PMNT)薄膜,对于在衬底上引入缓冲层LaNiO3(LNO)和没有引入缓冲层LNO所制备的PMNT薄膜结构及电学性能进行了比较和研究.x射线衍射测试结果表明:直接在Pt/TiO2/SiO2/Si衬底上所制备的PMNT薄膜含有大量的烧绿石相,且薄膜呈现高度的(111)择优取向;而当在Pt/TiO2/SiO2/Si衬底上引入LNO缓冲层后,所制备的PMNT薄膜是纯钙钛矿相,且薄膜呈现(100)择优取向.通过铁电和介电性能测试表明:当在Pt/TiO2/SiO2/Si衬底上引入缓冲层LNO后,所制备的PMNT薄膜的剩余极化和介电常数也都得到了较大提高.     

不同缓冲层对ZnO薄膜的性能影响

用射频反应磁控溅射法在玻璃基底上分别以SnO2、SiO2和Al2O3为缓冲层制备ZnO薄膜.利用X射线衍射仪(XRD)、扫描电镜(SEM)、紫外-可见分光光度计和荧光分光光度计对薄膜的结构和光学性能进行了表征.XRD和SEM的分析结果表明,在SiO2和Al2O3缓冲层上生长的ZnO薄膜具有较好的c轴择优取向,薄膜表面光滑平整,薄膜的结晶质量得到改善;透射光谱表明所有样品在可见光范围内的平均透过率超过70;;通过对薄膜光致发光谱的分析,认为422 nm左右的紫峰来自于电子从晶粒边界的界面缺陷能级到价带的辐射跃迁;PL谱中蓝光和绿光的发光机制与薄膜中的本征缺陷有关.     

同质缓冲层对氧化铟锡薄膜特性的影响

采用射频磁控溅射法在玻璃衬底上制备出了具有不同厚度ITO同质缓冲层的ITO薄膜.利用X射线衍射、半导体特性测试仪、紫外-可见光分光光度计等测试了薄膜的特性.结果表明:与单层ITO薄膜相比,具有厚度16nm ITO同质缓冲层的ITO薄膜的电阻率下降了30;,薄膜的电阻率达到2.65×10-4 Ω·cm,可见光范围内的平均透过率为91.5;.     

缓冲层对溶胶凝胶制备ZnO∶ Sn薄膜性能的影响

采用溶胶凝胶旋涂法,在石英衬底上引入缓冲层制备ZnO∶Sn薄膜.利用四探针电阻率测试仪、X射线衍射仪(XRD)、光致发光(PL)谱仪、场发射扫描电子显微镜(FE-SEM)等测试手段对薄膜的微观结构和光电性能进行表征.结果表明:所制样品均呈现六角纤锌矿晶体结构并沿C轴择优生长,薄膜的结晶质量和光电性能达到改善,适当厚度的缓冲层可以有效缓解薄膜和衬底间的晶格失配.随着缓冲层厚度的增加,薄膜的电导率以及在可见光范围的透过率先增大后减小.制备两层缓冲层薄膜性能最优,电阻率达到9.5×10-3 Ω·cm,可见光波段的平均透过率为91;.     

沉积温度对磁控溅射BiFeO3薄膜结构和性能的影响

应用磁控溅射法在以SrRuO3 (SRO)薄膜为缓冲层的Pt/TiO2/SiO2/Si(001)基片上制备了多晶BiFeO3 (BFO)薄膜,构架了SRO/BFO/SRO异质结电容器.采用X射线衍射、铁电测试仪等研究沉积温度对BFO薄膜结构和性能的影响.X射线衍射图谱显示BFO薄膜为多晶结构.在2.5 kHz测试频率下,500℃生长的BFO薄膜呈现比较饱和的电滞回线,2Pr为145μC/cm2,矫顽场Ec为158 kV/cm,漏电流密度约为2.4×104 A/cm2.漏电机制研究表明,在低电场区,SRO/BFO/SRO电容器满足欧姆导电机制,在高电场区,满足普尔-弗兰克导电机理.实验发现:SRO/BFO/SRO电容器经过109翻转后仍具有良好的抗疲劳特性.     

加磁场对GZO薄膜结构及光电性能的影响

采用射频磁控溅射法在玻璃基底上制备了Ga掺杂ZnO (GZO)薄膜,在传统磁控溅射系统中引入外加磁场,探究了磁场强度变化对GZO薄膜晶体结构和光电性能的影响.结果表明:所制得的GZO薄膜结构均为六角纤锌结构且在[002]方向沿C轴择优取向;外加磁场强度对薄膜的光电性能具有较大影响,在可见光范围内,薄膜的平均透光率超过93;,并出现了Moss-Burstein效应;薄膜的电学性能得到提升,其电阻率从4.96×10-3 Ω·cm降至3.17×10-4Ω·cm,霍尔迁移率从7.36cm2 ·V-1 ·S-1增至9.53 cm2·V-1·S-1.     

非晶 Ti-Al 过渡层对 Pt/Ba0.6Sr0.4TiO3/Pt电容器结构和性能的影响

应用磁控溅射法在 Pt/Ti/SiO2/Si(001)衬底上制备 5 mm 厚超薄非晶 Ti-Al 薄膜作为过渡层,利用脉冲激光沉积法制备 Ba0.6 Sr0.4TiO3 薄膜,构造了 Pt/Ba0.6Sr0.4TiO3/Pt(Pt/BST/Pt)和 Pt/Ti-Al/Ba0.6Sr0.4TiO3/Ti-Al/Pt(Pt/Ti-Al/BST/Ti-Al/Pt)结构的电容器,研究了 Ti-Al 过渡层对 Pt/BST/Pt 电容器结构及其性能的影响.实验表明,过渡层的引入有效地阻止了 Pt 电极和 BST 薄膜的互扩散,降低了 BST 薄膜氧空位的浓度,提高了铁电电容器的介电性能.当测试频率为 1 kHz、直流偏压为0 V时,介电常数由引入过渡层前的 530 增大到引入后的 601,介电损耗则由0.09减小到0.03.而且过渡层的引入有效地降低了 BST 薄膜的漏电流,使正负向漏电流趋于对称,在测试电压为5 V 时,漏电流密度由3.8×10-5 A/cm2 减小到 8.25 ×10-6 A/cm2.     

SiO2阻挡层对直流磁控溅射制备AZO薄膜性能的影响

在AZO薄膜制备温度下,浮法玻璃衬底中的杂质可能会引入"掺杂"效应而导致薄膜迁移率的降低。为了提高薄膜的迁移率,增加载流子在薄膜中的输运能力,本实验提出SiO2/AZO复合薄膜制备技术。SiO2薄膜与普通玻璃相比,具有纯度高、透过率高的特点,本实验通过SiO2/AZO复合结构提高薄膜的迁移率。采用SiO2/AZO复合结构溅射制备AZO薄膜,使薄膜的载流子迁移率由19.8 cm2.V-1.s-1提高到57.1 cm2.V-1.s-1。     

射频功率对ITZO薄膜结构、形貌及光电特性的影响

在室温下采用射频磁控溅射方法在玻璃衬底上制备了200 nm厚的铟锡锌氧化物(ITZO)薄膜,研究了不同功率下薄膜结构、形貌、光学和电学性能的变化规律.结果表明,ITZO薄膜为非晶薄膜并且有着良好的光电特性,其平均光学透过率超过了84;,载流子霍尔迁移率高达24 em2·V-1·s-1.随着射频功率从50 W上升到100 W,薄膜的光学带隙从3.68 eV逐渐增加到3.76 eV.研究发现,薄膜的电学性能强烈依赖于射频功率.随着功率的增加,薄膜的电学性能呈现出先变好后变差的变化规律.当射频功率为80 W时,ITZO薄膜拥有最佳的电学性能,其电阻率为3.80×10-4Ω·cm,载流子浓度为6.45×1020 cm-3,霍尔迁移率为24.14 cm2·V-1· s-1.     

Modelling of mechanism of agglomeration of KCl crystallization

The article presents an analysis into agglomeration during KCl vacuum crystallization. The theoretical and experimental investigations into the mechanism of agglomeration during mass crystallization result in an extension of the growth phenomena within the known model equations. The basis for this is essentially constituted by the collision model concepts of the theory of floculation in disperse systems. The parameters derived from the microprocess analysis (energy dissipation, content of solids, growth rate of individual grains) lead to model equations which are confirmed by laboratory and test trials.     

Relationship of Morphological Types of Dynamic Forms of Crystals

Crystallography Reports - The relationship of morphological spectra (sets of data on the morphological types of real polyhedral crystals and their probabilities under current physicochemical...     

Velocities of Disappearance and Lifetime of Faces of Growing Crystals

The formulae for absolute R_disap and relative R velocities of disappearance and lifetime τ of faces of growing crystals have been derived for stationary growth. It was shown that the quantities are determined by the relative growth velocity R_A/R_critA of the vanishing face A with respect to the critical growth velocity R_critA and by the geometry of a crystal expressed by the trigonometric functions of interfacial angles β and γ formed between face A and the adjacent faces. R increases and τ decreases with the increase in R_A/R_critA to certain limiting values. The calculations have been verified and illustrated by the experimental results for triclinic potassium bichromate (KBC) crystals. Results enable ones to predict values of velocities of disappearance and lifetimes of undesirable, supplementary faces of any real crystal.     

Development of Pauling's concepts of geometric characteristics of atoms

The evolution of the geometric characteristics introduced by Pauling and their dependence on the specific features of the structure and chemical bonds have been considered. The values of the covalent and van der Waals radii are given as well as their relationships and mutual transitions.     

Dependence of the parameters of equations of viscous flow on chemical composition of silicate melts

The temperature dependence of viscosity of silicate melts is discussed in the framework of the Avramov–Milchev (AM) equation. The composition is described by means of two parameters: the molar fraction, x, and the “lubricant fraction”, l. The molar fraction is the sum of the molar parts x_i of all oxides dissolved in SiO₂, the molar fraction of the latter being 1 ? x. It is shown that, with sufficient precision, two of the parameters of the AM equation can be presented as unique functions of the molar fraction. On the other hand, x is not sufficient to determine properly the reference temperature T_r , at which viscosity is η_r = 10¹³ [dPa.s]. Therefore, additional parameter, “lubricant fraction” l, is introduced. For each of the components, l_i is a product of molar part x_i and a specific dimensionless coefficient 0 ≤ k_i ≤ 1 accounting for the specific contribution of this component to the increased mobility of the system. It is demonstrated that, for l > 0, the reference temperature is related to the “lubricant fraction” l through the reference temperature T_r,SiO2 of pure SiO₂.     

Comparative analysis of two methods of calculation of the orientation of domain walls in ferroelastics

Two types of domain-wall equations are analyzed: the equations derived by the Sapriel method and the equations obtained by interface matching of the thermal-expansion tensor. It is shown that, for W-type domain walls, these methods yield the same equations. For W′-type domain walls, the equations obtained by different methods coincide for proper ferroelastics and differ for improper ferroelastics.     

A review of measurement of thermophysical properties of silicon melt

Measurements of thermophysical properties of Si melt and supplementary study of X-ray scattering/diffraction by the authors' group were reviewed. The values obtained differed variously from those of literature. Density was 2–3% larger, surface tension 20–30% smaller, viscosity up to 40% larger, electrical conductivity 8% smaller, spectral emissivity more or less in good agreement with literature values, and thermal diffusivity a few percent larger. An anomalous density jump was found near the melting point. Surface tension and viscosity also showed anomaly. A strange time-dependent change of density was observed over 3 h after melting. X-ray analyses suggested a slight change in local atom ordering, but showed no sign of cluster formation. An addition of 0.1 at% gallium caused the density jump to disappear, while that of boron caused no change. An EXAFS study of the former melt indicated a strong interaction between Ga and Si atoms as if molecules of GaSi₃ existed. The implications of the measured properties are a possibility of soft-turbulence in an Si melt in a relatively large crucible, a more complicated manner of intake of oxygen depleted molten Si from the free surface region to underneath the growing crystal, and a relaxation of the melt after melting arising from trapped gas species.     

Generation of crystal structures of heteromolecular compounds by the method of discrete modeling of packings

Within the method of discrete modeling of packings, an algorithm of generation of possible crystal structures of heteromolecular compounds containing two or three molecules in the primitive unit cell, one of which has an arbitrary shape and the other (two others) has a shape close to spherical, is proposed. On the basis of this algorithm, a software package for personal computers is developed. This package has been approved for a number of compounds, investigated previously by X-ray diffraction analysis. The results of generation of structures of five compounds—four organic salts (with one or two spherical anions) and one solvate—are represented.