ELECTROLUMINESCENCE SPECTRA OF GexSi1-x/Si SINGLE QUANTUM WELL

The electroluminescence of Ge_xSi_1-x/Si single quantum well was measured at temper-atures above room temperature along the growth direction and the direction normal to it. TO and NP peaks were resolved.     

单频导纳谱法测量锗硅量子阱的能带偏移

提出了用单频导纳谱法测量储硅单量子阶的能带偏移，与常规的多频导纳谱相比，它只需测一个频率的导纳谱就能得到更精确的实验结果。用该方法对Ｓｉ／Ｇｅ_０．３３Ｓｉ_０．６７／Ｓｉ单量子阱进行测试，得到激活能为Ｅ_a＝０．２０ｅＶ。为了计算出能带偏移值，必须能准确确定具有单量子阱结构样品中的费密能级位置，由于在单量子阱结构中费密能级的位置与阱材料、垒材料的掺杂浓度、阱的高度（即能带偏移）及温度等几个因素均有关。为此，本文通过解泊松方程，计算出结合本文样品 关键词：     

ELECTROREFLECTANCE SPECTRA OF GexSi1-x/Si STRAINED LAYER MULTIPLE-QUANTUM WELLS

We have investigated the optical transitions above the fundamental gap of a set of Ge_xSi_1-x/Si strained layer multiple-quantum wells by electroreflectance (ER). The sam-ples were grown by molecular beam espitaxy (MBE). The thickness of the strained layer of Ge_xSi_1-x was 5nm with Ge concentration x in the range from 0.4 to 0.5, and the Si barrier layer greater than 16nm. Considering the energy shift caused by strain and quantum well confinement, we were able to clearly recognize the transitions from different quantum well structures associated with the critical points E₀, E′₀, and E₁. The transitions of the critical points E₀ and E′₀, which are very weak in bulk mateials, are apparently enhanced in the quantum well structures.     

GexSi1-x/Si超晶格的X射线小角衍射分析

用分子束外延生长了23周期的Ge_xSi_1-x/Si超晶格,用计算机控制的衍射仪(CuK_a辐射)测量了X射线衍射曲线,共观察到13级超晶格结构的衍射峰。超晶格的周期和Ge平均含量可以根据考虑折射修正的布喇格定律得出。用光学多层膜反射理论分析衍射曲线可以确定超晶格的结构参数,第2级衍射峰与第一级峰的强度比对应于超晶格两种材料的相对厚度变化非常灵敏,通过比较实验和计算的I₂/I₁值,可以确定Si,Ge_xSi_1-x层的厚度以及合金组份x。用光学多层膜反射理谁计算得到的衍射曲线与实验曲线趋于一致。 关键词：     

GexSi1-x/Si超晶格的俄歇深度剖面分析

用氩离子刻蚀和俄歇电子能谱测量Ge_xSi_1-x/Si应变层超晶格的成分深度分布,得到Ge,Si两种成分随深度的周期性变化,在二次电子象中观察到刻蚀坑边缘的明暗交替的周期性结构。讨论了用俄歇深度剖面分布作超晶格结构分析的特点及其局限性。 关键词：     

p型GexSi1-x/Si多量子阱的红外吸收及其分析

通过测量GeSi多量子阱的红外谱，同时观察到了相应于量子阱内重空穴基态HH1到重空穴激发态HH1、轻空穴激发态LH1和自旋分裂带SO及连续态间的跃迁吸收．测量了GeSi多量子阱探测器的正入射光电流谱，看到了明显的光响应峰．理论计算中计及了轻、重和自旋分裂带间的耦合及能带的非抛物性，并自洽考虑了哈特里势和交换相关势．与实验结果比较，认为带之间的耦合，使子带间的跃迁情况变得复杂，是正入射吸收产生的原因 关键词：     

GexSi1-x/Si应变层超晶格的分子束外延生长及其特性研究

在Si(100)衬底上用分子束外延在不同的温度下生长了不同组份的Ge_xSi_1-x/Si应变层超晶格。用反射式高能电子衍射、X射线双晶衍射、卢瑟福背散射、透射电子显微镜以及Raman。散射等测试方法研究了Ge_xSi_1-x/Si超晶格的生长及其结构特性。结果表明,对不同合金组份的超晶格,其最佳生长温度不同。x值小,生长温度高;反之,则要求生长温度低。对于x为0.1—0.6,在400—600℃的生长温度范围能够长成界面平整、 关键词：     

高完整GexSi1-x/Si应变超晶格的X射线双晶衍射研究

本文用X射线双晶衍射技术对分子束外延生长的Ge_xSi_1-x/Si应变超晶格的结构参数进行研究,分别采用X射线运动学理论和动力学理论对超晶格的双晶摆动曲线进行计算模拟,得出超晶格的全部结构参数;并对这两种理论计算模拟的结果进行比较,发现这两种理论计算的结果基本一致,只是在细微结构上略有差别,对高完整Ge_xSi_1-x/Si超晶格,用动力学理论计算的曲线更接近于实验曲线。 关键词：     

ORDER ALLOY IN GexSi1-x/Si(100) STRAINED-LAYER SUPERLATFICES

The Ge_xSi_1-x/Si(100) strained-layer superlattices have been investigated by means of the transmission electron microscopy of the cross-sectional specimen (XTEM) and the high resolution electron microscopy (HREM), The order alloy with a period of modulation twice as large as the lattice constant along <100> zone axis has been found in the alloy layers of the superlattices with x≈0.4-0.5. This order struc-ture makes the superlattices inhomogeneously strained. The result of the compuler simulation shows that the order alloy exhibits an altemating stack of 2 monolayers of Ge atoms and 2 monolayers of Si atoms along the <100> zone axis. Thc calculated elastic strain energy of the disorder alloy reported in the litera-ture is very close to that of the order alloy along <100> zone axis. Thus, during the MBE growth of the alloy layers, both the disorder and order alloys can be formed along <100> zone axis.     

The equilibrium composition in GexSi1-x/Si self-assembled alloy quantum dot

<正>The equilibrium composition in strained quantum dot is the result of both elastic relaxation and chemical mixing effects,which have a direct relationship to the optical and electronic properties of the quantum-dot-based device.Using the method of moving asymptotes and finite element tools,an efficient technique has been developed to compute the composition profile by minimising the Gibbs free energy in self-assembled alloy quantum dot.In this paper,the composition of dome-shaped Ge_xSi_(1-x)/Si quantum dot is optimized,and the contribution of the different energy to equilibrium composition is discussed.The effect of composition on the critical size for shape transition of pyramid-shaped GeSi quantum dot is also studied.     

RAMAN SCATTERING INTENSITIES OF FOLDED LONGITUDINAL ACOUSTIC PHONONS IN GexSi1-x/Si SUPERLATTICES

In terms of photoelastic mechanism we have investigated the Raman scattering intensities of the folded longitudinal acoustic (FLA) phonons in Ge_xSi_1-x/ Si superlattices (SLs), taking into account the differences between the acoustic and photoelastic parameters of the two constituents in the SLs. The relative intensities calculated for the FLA phonons are in excellent agreement with the experimental results at the frequencies up to about 50 cm^-1. The broadening of the linewidth arising from the so called strong acoustic attenuation, which was reported previously located around the frequency 15 cm^-1 in Ge_xSi_1-x/Si SLs(x≈0.5), has not been observed in this work.     

生长在Si(001)衬底上应变合金层GexSi1-x的光学性质

采用经验的紧束缚方法对生长在Si(001)衬底上的应变合金Ge_xSi_1-x的光学常数进行了计算。应变对电子能带结构的影响,通过紧束缚参数随键角方向余弦的变化以及键长按经验的标度定则的变化而进行计算。其中标度指数根据对Ge和Si的畸变势常数的实验值进行拟合而确定。计算介电常数虚部时出现的动量矩阵元,根据对Ge和Si的介电常数虚部的实验曲线拟合而决定。列出了当x=0.2和1时的光学常数——介电常数虚部ε₂、折射率n、吸收系数α和反射率R的计算结     

高能电子衍射研究H钝化偏角Si衬底上Si,GexSi1-x的分子束外延生长模式

用高能电子衍射(RHEED)研究H钝化偏角Si衬底上Si,Ge_xSi_1-x材料的分子束外延(MBE)生长模式,发现经低温处理的H钝化Si衬底上要经过10nm左右的Si生长才能获得比较平整的表面.Si,Ge_xSi_1-x外延时的稳定表面均以双原子台阶为主,双原子台阶与单原子台阶并存的结构.Si双原子台阶上的Si二聚体列(dimerrow)取向垂直于台阶边缘,而Ge_xSi_1-x双原 关键词：     

ABNORMAL ENERGY DEPENDENCE OF AXIAL MINIMUM CHANNELING YIELDS IN GexSi1-x/Si(100) STRAINED

An energy dependence of the axial minimum channeling yield in Ge_xSi_1-x/Si(100) Strained-layer superlattice is observed in the energy range of impinging He⁺ ione from 1.2 to 3.0 MeV. For [100] axial channeling, the measurements ere in agreement with what have been known in a single crystal. However, for [110] axial channeling, it is found that the minimum channeling yields increase markedly with the increase of He⁺ ion energy, which is contrary to the general channeling behaviors in a single crystal. A tentative model is suggested to explain this aberrance.     

SiGe/Si量子阱的低温光荧光和电注入发光

使用Si-MBE生长了阶梯形折射率分布SiGe/Si量子阱材料,在低温下观测到无声子参与的光荧光和电注入发光。阶梯形折射率分布SiGe/Si电子阱结构有利于提高发光效率。讨论了这种结构的光学和电学特性。     

MBE GaAs1-xSbx/GaAs应变层量子阱的光调制反射光谱

本文采用光调制反射光谱技术研究了MBE GaAs_1-xSb_x/GaAs应变层量子阱。通过实验分析和理论上对受应力作用后能带结构的估算,确认在这一系统中流体静压力作用引起的能带结构变化主要出现在导带上,同时也证实了GaAs_1-xSb_x/GaAs应变层量子阱属于第Ⅱ型量子阱结构。实验结果与理论估算符合很好。 关键词：     

用深能级瞬态谱方法研究赝晶Si/Ge0.25Si0.75/Si单量子阱的价带偏移

应变的Ge_xSi_1-x层和未应变的硅层间的能带偏移主要是价带偏移。量子阱中载流子的热发射能与界面的能带偏移有着密切的关系。本文用深能级瞬态谱(DLTS)研究分子束外延生长的p型Si/Ge_0.25Si_0.75/Si单量子阱的价带偏移,阱宽为15nm,考虑到电场的影响和量子阱中第一子能级的位置,对从DLTS得到的热发射能进行适当的修正,可以计算出Si/Ge_0.25Si_0.75/S 关键词：     

AlyGa1-yAs/AlxGa1-xAs量子阱激光器材料的光致荧光谱

测量了Al_yGa_1-yAs/Al_xGa_1-xAs量子阱激光材料的光致荧光谱.发现在室温连续激光器材料的光致荧光谱中有两个峰,而不能激射的材料中则只有一个很宽的峰.将高能峰归属于准费密能级电子的跃迁. 关键词：     

Ge1-xSix混晶声子谱

本文在虚晶背景中嵌入5原子集团,采用Recursion方法计算了Ge_1-xSi_x混晶的声子谱,详细分析了振动模式的形成和发展过程。 关键词：     

浅ZnCdSe/ZnSe量子阱的光泵受激发射

本文主要研究浅ZnCdSe/ZnSe单量子阱在77K温度下的光致发光。在不同激发密度下,讨论了该结构的发光机制,把77K温度下的受激发射归结为是激子-激子散射所引起的。文中还分析了在浅ZnCdSe/ZnSe量子阱中能够实现与激子相关的受激发射的原因。