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Rudolf Ochs W. Fresenius P. Saccardi Weber J. M. Kolthoff H. Hamer H. Röttger E. Schowalter E. Spaeth A. Gompf J. Gerum G. Metge A. Röhrig L. Fresenius G. de Astis A. Bornträger H. Astruc Radet M. Martini A. Nourrisson L. Roos A. Kling A. Lassieur M. François Ch. Lormand J. Dubaquié P. Chauvet J. L. Chelle G. Filaudeau Bonis H. Boßelmannn F. Mach M. Fischler C. von der Heide Joh Pinnow D. Fonzes-Diakon L. Semichon K. Kroemer R. Meissner A. Widmer O. Kalberer L. Minder Th. v. Fellenberg G. Chancel P. Balavoine X. Roques C. Lagneau von der Heide 《Analytical and bioanalytical chemistry》1926,68(12):469-480
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It was shown that, on the basis of their properties as regards high-frequency technique, single-stage quartz oscillators can be used for the determination of dielectric constants, dielectric losses, and high-frequency conductivities. According to the properties to be measured, the measurements are carried out by a compensation method or a deflection method. In view of the measuring cells available, the technique can be applied in various ways to problems of chemical analysis, since relationships (mostly empirical) exist between the above-mentioned dielectric properties and the composition of chemical systems. A review of the possibilities of application of high-frequency measuring technique to analytical chemistry is given, as well as a collection of the most recent literature in this field. 相似文献
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