Stability of the magnetic domain structure of nanoparticle thin films against external fields

We investigate the effect of external magnetic fields on the magnetic structure of thin films from magnetic nanoparticles (MNP) with dipolar interaction. Such fields are present, for example, if samples are scanned with magnetic probes. Numerical simulations and experimental magnetic force microscopy (MFM) studies are presented. Numerically, we have calculated the magnetization pattern of single-layer and multilayer MNP thin films. The calculations show that unperturbed single-layer MNP films have an in-plane orientation of the magnetization with a flux-closure-domain pattern. An external field generated by a point dipole above the film induces locally an out-of-plane configuration of the magnetization. In the corresponding MFM images, the domain pattern in the film is erased and a stripe-like contrast enhancement at the edges appears. Multilayer films are found to be more robust against external fields than monolayers.     

Towards a quantitative analysis of magnetic force microscopy data matrices

Fast and efficient software tools previously developed in image processing were adapted to the analysis of raw datasets consisting of multiple stacks of images taken on a sample interacting with a measuring instrument and submitted to the effect of an external parameter. Magnetic force microscopy (MFM), a follow-up of atomic force microscopy (AFM), was selected as a first testbed example. In MFM, a specifically developed ferromagnetic scanning tip probes the stray magnetic field generated from a ferromagnetic specimen. Raw scanning probe images taken on soft patterned magnetic materials and continuous thin films were used, together with synthetic patterns exploited to assess the absolute performance ability of the proposed texture analysis tools. In this case, the parameter affecting the sample-instrument interaction is the applied magnetic field. The application discussed here is just one among the many possible, including, e.g., real-time microscopy images (both optical and electronic) taken during heat treatments, phase transformations and so on. Basically any image exhibiting a texture with a characteristic spatial or angular dependence could be processed by the proposed method. Standard imaging tools such as texture mapping and novel data representation schemes such as texture analysis, feature extraction and classification are discussed. A magnetic texture stability diagram will be presented as an original output of the entropic analysis on MFM datasets.     

Advantages of CNT-MFM probes in observation of domain walls of soft magnetic materials

The advantage of the CoFe-coated carbon nanotube (CNT) probes in a magnetic force microscope (MFM) is verified on in-plane magnetized soft magnetic materials. CoFe-coated CNT, standard and low-moment MFM probes were used to observe closure domains in square and rectangular Permalloy elements. The perturbative effect of the CNT-MFM probe was far less than that of a standard MFM probe. Domain walls were clearly observed as a pair of dark and bright lines which was in agreement with the micromagnetic simulations. The vortex core was also clearly observed using the CNT-MFM probes.     

In situ magnetic hysteresis measurement of magnetic tips in magnetic force microscope

In situ magnetic hysteresis measurements of magnetic tips in a magnetic force microscope (MFM) are demonstrated using alternating gradient force magnetometry. The measured magnetic moments of MFM tips are estimated in the range from 10⁻⁶ to 10⁻⁵ emu by this technique and the whole MFM tips in cantilevers are considered to be measured from the value of measured magnetic moments. The relationship between the magnetic hysteresis loops of MFM tips and those of coated magnetic films is discussed.     

Magnetic force microscopy of GaAs:Mn ferromagnetic semiconductors

The dependence of magnetic properties of GaAs:Mn and MnAs epitaxial films grown on GaAs (001) by laser ablation of Mn and undoped GaAs in a hydrogen atmosphere under the growth conditions has been studied by magnetic force microscopy (MFM). Magnetic probe calibration for quantitative MFM measurements was performed by scanning across the slit of the magnetic-head of a tape recorder through which controlled direct current was passed. The dipole approximation was used to describe the magnetic properties of the MFM probe. Nonuniformity of the magnetization of GaAs:Mn films related to the formation of MnAs nanoinclusions, which are ferromagnetic at 300 K, has been observed. The typical scales of the spatial nonuniformity of the magnetization of GaAs:Mn films were varied from 270 to 550 nm depending on the film-growth conditions. The MnAs phase was identified by MFM measurements at an elevated temperature (up to 80°N).     

Computer simulation of magnetic force microscopy images with a static model of magnetization distribution and dipole-dipole interaction

An algorithm for computer simulation of images obtained by magnetic force microscopy (MFM) is suggested. It is based on the Brown formalism and takes into account the shapes and the magnetic properties of the MFM tip and sample studied. The robustness and efficiency of the algorithm are tested by simulating the MFM image of a point magnetic dipole for the case where the tip is approximated by a nonmagnetic truncated cone covered by a thin uniformly magnetized layer. From the computer simulation of the MFM images of the dipole, the optimum parameters of the MFM probe are obtained.     

Direct observation of room temperature magnetism in (In,Mn)As thin films by magnetic force microscopy

Variable-temperature magnetic force microscopy (MFM) has been performed over the temperature range of 298-348 K on ferromagnetic (In,Mn)As thin films deposited by metal-organic vapor phase epitaxy (MOVPE). Ferromagnetic domains were observed with submicron resolution in both single and two phase (In,Mn)As films, persisting up to 328 K. Isolated cylindrical domains ranging from 100 to 350 nm in diameter with densities of 2-5 × 10⁸ cm⁻² were observed in phase pure films. Longer range magnetic order, in the form of ribbon-like domains up to 1 μm in length, are present in the regions between the cylindrical domains. Two phase (In,Mn)As films produced a well-resolved complex domain structure consisting of 180° parallel and antiparallel domains. Excellent agreement between the temperature dependence of the relative magnetization obtained by MFM and superconducting quantum interference device measurements was observed.     

Magnetic properties of field-annealed FeCo thin films

Fe₅₀Co₅₀ thin films with thickness of 30 and 4 nm have been produced by rf sputtering on glass substrates, and their surface has been observed with atomic force microscopy (AFM) and magnetic force microscopy (MFM); MFM images reveal a non-null component of the magnetization perpendicular to the film plane. Selected samples have been annealed in vacuum at temperatures of 300 and 350 °C for times between 20 and 120 min, under a static magnetic field of 100 Oe. DC hysteresis loops have been measured with an alternating gradient force magnetometer (AGFM) along the direction of the field applied during annealing and orthogonally to it. Samples with a thickness of 4 nm display lower coercive fields with respect to the 30 nm thick ones. Longer annealing times affect the development of a harder magnetic phase more oriented off the film plane. The field applied during annealing induces a moderate magnetic anisotropy only on 30 nm thick films.     

Electrical resistivity due to electron scattering with magnetic domain walls and magnetic properties of Ni-Fe alloy thin films

The physical properties of magnetic domain walls and electrical conductivity of permalloy thin films under external magnetic fields were studied. Using a magnetic force microscope (MFM), we observed the variation of domain configurations with the change of applied magnetic field for different film thicknesses of 245, 320, and 415 nm. A superconducting quantum interference device (SQUID) was exploited to measure the magnetization loop for the applied magnetic field either parallel or perpendicular to the normal direction of the surface. We also found that the resistivity increases significantly as the electrical current conduction changed from parallel to perpendicular to the domain walls.     

Study of interactions in Co–SiO2 granular films by means of MFM and magnetization measurements

A study of Co[SiO₂] granular films using magnetic force microscopy (MFM), transmission electron microscopy and DC magnetization is presented. MFM shows large strip magnetic domains in the percolated system and allows a more direct investigation of the magnetic interaction among grains in the film with the lowest metal volume fraction.     

Microstructural and domain effects in epitaxial CoFe2O4 films on MgO with perpendicular magnetic anisotropy

CoFe₂O₄ (CFO) epitaxial thin films of various thicknesses were grown on MgO substrates using the pulsed electron-beam deposition technique. The films have excellent in-plane coherence with the substrate, exhibit layer-by-layer growth and have well-defined thickness fringes in x-ray diffraction measurements. Atomic force microscopy (AFM) measurements indicate that misfit dislocations form in thicker films and the critical thickness for the dislocation formation is estimated. Perpendicular magnetic anisotropy in CFO due to epitaxial in-plane tensile strain from the substrate was found. A stripe-like domain structure in the demagnetized state is demonstrated using magnetic force microscopy (MFM), in agreement with previous predictions. Coercivity increased in thicker films, which is explained by domain wall pinning due to misfit dislocations at the CFO/MgO interface.     

Demonstration of ultra-high-resolution MFM images using Co90Fe10-coated CNT probes

We demonstrate ultra-high-resolution magnetic force microscopy images of perpendicular magnetic storage media using carbon nanotube probes coated by ferromagnetic Co₉₀Fe₁₀ films (20, 30, 40, and 50 nm). By optimizing ferromagnetic film thickness (effective tip diameter), we obtained best magnetic domain image with an 40 nm-Co₉₀Fe₁₀-coated tip (50 nm tip diameter) about a lateral detect density of 1200 k flux per inch on perpendicular magnetic storage medium, one of the highest resolutions in MFM imaging reported for this material system and structure. The observed dependence of tip dimension on signal contrast and image resolution was successfully explained by a theoretical analysis indicating that the signal contrast, along with the physical probe-tip dimension, should be taken into account to design magnetic probes tips for high-resolution magnetic force microscopy.     

Micromagnetic study of effect of tip-coating microstructure on the resolution of magnetic force microscopy

The properties of a magnetic force microscopy (MFM) tip are very important for high-resolution magnetic imaging. In this work, micromagnetic models of tips are set up to study the effect of tip-coating microstructure, especially the randomness of anisotropy on tip edge and tip end, on the resolution of MFM. The effective coating height and the resolution potential of tips with various microstructures and magnetic properties have been characterized by investigating the obtained signals from high-density continuous granular thin film disk media with a bit size of 8×16 nm² and bit-patterned media with a pattern period p of 50 nm. The magnetic moment distribution at the tip end should be perpendicular to the sample to realize a ‘magnetically sharp’ tip, which explains further the improved resolution in the recent experimental reports. Tips with well-controlled grain structure and magnetic anisotropy of coating materials can be applied to both high-density thin film disk media and bit-patterned media.     

Is MFM really useful?

The ill-posed linear inverse problems, characterised by Fredholm integral equations of the first kind, are encountered in many areas of science and technology. This type of problems present some loss of information under the inversion process. The loss of information often makes the inversion process very difficult. Magnetic force microscopy (MFM) is a technique where problems related to loss of information occur. Work is presented here to understand what can be measured by the magnetic force microscope. A simple model is constructed, where the magnetic tip is approximated by a point dipole. Given the force F() acting on the dipole tip, we attempt to determine the magnetization distributlon in a thin ferromagnetic film, M(). This calculation should be interesting due to the rapidiy growing interest in magnetic thin films and magnetic multilayers. Received 3 December 2001 and Received in final form 11 March 2002     

Magnetic force microscopy applied in magnetic data storage technology

Microstructured thin-film elements with critical dimensions of 1 μm or less play an increasingly important role in magnetic components for information technology applications. Devices that are directly based on such microstructures are key components in magnetoelectronics for storage and sensor applications as well as modern concepts which are likely to substitute today’s hard disk drives. Basic research on magnetic materials as well as industrial applications create an increasing demand for high-resolution magnetic imaging methods. One such method is magnetic force microscopy (MFM). In spite of considerable achievements, MFM also has some serious shortcomings, which have not been overcome to date. Under normal circumstances, the method yields only qualitative information about the magnetic object and it is difficult to improve the resolution to values below 100 nm. In this paper, we will report on advanced MFM probe preparation, based on electron beam methods, and discuss the possibilities for batch fabrication of such advanced MFM tips. We show that the advanced probes allow high-resolution imaging of fine magnetic structures within thin-film permalloy elements without perturbing them. Additionally, we present high-frequency MFM measurements on a hard disk write head. Received: 2 September 2002 / Accepted: 2 September 2002 / Published online: 5 March 2003 RID="*" ID="*"Corresponding author. Fax: +49-681/302-3790, E-mail: m.koblischka@mx.uni-saarland.de     

Free-standing urethane/urea elastomer films undoped and doped with ferro-nano-particles

We report on an experimental study of the structures presented by urethane/urea elastomeric films without and with ferromagnetic nanoparticles incorporated. The study is made by using the X-ray diffraction, nuclear magnetic resonance (NMR), optical, atomic and magnetic force (MFM) microscopy techniques, and mechanical assays. The structure of the elastomeric matrix is characterized by a distance of 0.46nm between neighboring molecular segments, almost independent on the stretching applied. The shear casting performed in order to obtain the elastomeric films tends to orient the molecules parallel to the flow direction thus introducing anisotropy in the molecular network which is reflected on the values obtained for the orientational order parameter and its increase for the stretched films. In the case of nanoparticles-doped samples, the structure remains nearly unchanged although the local order parameter is clearly larger for the undoped films. NMR experiments evidence modifications in the molecular network local ordering. Micrometer size clusters were observed by MFM for even small concentration of magnetic particles.     

Competing magnetoresistance contributions in sputtered FePt thin films

Fe-Pt thin films were deposited by rf sputtering on an MgO substrate heated at different temperatures to induce the formation of the perpendicular Fe-Pt L1₀ phase with a different grain morphology on the nanometer scale. All films are characterized by a mazelike pattern of FePt nanograins with interconnected bases. MFM images and magnetization curves indicate that all samples have a strong perpendicular magnetic anisotropy arising from (0 0 1) growth. The temperature behaviour of the electrical resistance indicates that a percolating path exists for conduction electrons in the mazelike pattern. The magnetoresistance was measured as a function of magnetic field (applied longitudinally) and temperature in the ranges −70 kOe<H<+70 kOe and 4 K<T<150 K, respectively. All samples display a complex behaviour of the electrical resistance as a function of applied field. The role of the different magnetoresistance effects (both intrinsic and extrinsic) measured in these FePt thin films is elucidated.     

A magnetic force microscopy and Kerr effect study of magnetic domains and cross-tie walls in magnetoresistive NiFe shapes

Magnetic domains were observed in 350 Å NiFe films. Cross-tie domain walls and ripple structures were observed inside the domains by MFM. The perturbative effect of the standard CoCr MFM tip on the magnetic microstructure was brought to evidence. A demagnetized, low-coercivity Fe tip gave the best images.     

磁力显微镜对相分离锰氧化物薄膜中反铁磁绝缘相融化的成像

用自制磁力显微镜研究了一个受各向异性应变的锰氧化物薄膜中的相分离以及由磁场导致的从反铁磁绝缘相到铁磁金属相的转变．磁力显微镜图片显示,在0 T这两种竞争的相就已经共存,且两种相 的畴呈非常明显的各向异性的条状分布,这可以定性解释输运上的各向异性．在2.1 T 以上,反铁磁绝缘相逐渐转变为铁磁金属相,并在3.2 T时结束．当去掉磁场时铁磁金属相能够保持．     

Structural and magnetic properties of evaporated Fe thin films on Si(1 1 1), Si(1 0 0) and glass substrates

We present experimental results on the structural and magnetic properties of series of Fe thin films evaporated onto Si(1 1 1), Si(1 0 0) and glass substrates. The Fe thickness, t, ranges from 6 to110 nm. X-ray diffraction (XRD) and atomic force microscopy (AFM) have been used to study the structure and surface morphology of these films. The magnetic properties were investigated by means of the Brillouin light scattering (BLS) and magnetic force microscopy (MFM) techniques. The Fe films grow with (1 1 0) texture; as t increases, this (1 1 0) texture becomes weaker for Fe/Si, while for Fe/glass, the texture changes from (1 1 0) to (2 1 1). Grains are larger in Fe/Si than in Fe/glass. The effective magnetization, 4πM_eff, inferred from BLS was found to be lower than the 4πM_S bulk value. Stress induced anisotropy might be in part responsible for this difference. MFM images reveal stripe domain structure for the 110 nm thick Fe/Si(1 0 0) only.