Characteristic Growth Features and Etching of InBi Single Crystals

The characteristic growth features observed on the top free surface of InBi single crystals grown by the zone-melting method are reported. These features are analysed by stereographic technique and a possible mechanism responsible for the appearance of the characteristic growth features is discussed. A new etchant capable of revealing dislocations inclined to the cleavage plane is also reported.     

Cd0.8 Mn0.2 Te晶体生长及结晶质量评价

采用垂直布里奇曼法生长了尺寸为φ30 mm×120 mm的Cd0.8Mn0.2Te晶锭.采用X射线粉末衍射及X射线双晶摇摆曲线分析了晶体的结构与结晶质量,结果显示所生长的晶体为单一立方闪锌矿结构,半峰宽为47.2aresec,结晶质量良好.采用化学腐蚀方法显示了晶体中的多种缺陷,包括位错,Te夹杂和孪晶.采用光学显微镜,扫描电镜和X射线能谱仪对缺陷形态和分布进行了研究.结果表明,晶体中位错密度在105～106cm-2之间.晶体局部存在Te夹杂相,尺寸为l～5μm.晶体中孪晶主要以共格孪晶存在.并提出了缺陷形成的原因和减少缺陷的方法.     

6英寸低位错锗单晶生长热场设计

锗片作为衬底材料已在空间太阳电池领域得到广泛的应用,新型锗基空间太阳能电池对锗片的需求由4英寸(1英寸=2.54 cm)提高到6英寸后,低位错锗单晶的生长难度增大.本文设计开发了一种适用于直拉法生长大尺寸、低位错锗单晶的双加热器热场系统,模拟研究了不同形状主加热器的热场分布,从而得到最优的热场环境.研究发现:渐变长度为...     

AgGa0.2In0.8Se2晶体小温度梯度生长与性质表征

利用单温区机械振荡法合成出高纯单相AgGa0.2In0.8Se2多晶,单次合成量超过400 g;DSC测试结果显示其熔点为782℃,结晶温度为771℃.利用坩埚下降法在小温度梯度(2℃/cm)下生长出尺寸为φ25 mm× 75 mm高品质无开裂AgGa0.2In0.8Se2单晶.解离面(112)面摇摆曲线半峰宽为0.056°.厚度为3 mm双面抛光的(112)面晶片在1.5～18 μm波段透过率为65.0; ～ 67.5;,表明所生长AgGa0.2In0.8Se2晶体具有较低的吸收系数,为0.01 ～0.1之间.     

AlN单晶生长行为研究

本文采用物理气相传输法对不同衬底温度和温差下制备的氮化铝(AlN)晶体形貌进行研究,研究结果表明AlN晶体生长受到AlN晶面表面能、Al基元平均动能和AlN晶体表面极性的共同影响。当温差为60℃时, AlN晶体(0001)面生长速率小于(10-10)面,AlN以带状形式生长。将该工艺应用于AlN同质生长中,研究结果表明:温差为60℃时AlN晶体(0001)面呈现畴生长模式,该晶体质量最差;温差为35℃时AlN晶体(0001)面呈现台阶流生长模式,该晶体质量最优;温差为20℃时AlN晶体(0001)面呈现台阶簇生长模式,该晶体容易开裂。通过工艺优化最终获得了直径为40 mm AlN单晶衬底,完全满足器件制备需求。     

Crystal Structure and Ferromagnetic Component in Layered Perovskite Sr0.8Y0.2CoO2.65

Crystallography Reports - The crystal structure and magnetic state of Sr0.8Y0.2CoO2.65 layered perovskite have been studied using neutron diffraction and synchrotron radiation diffraction and...     

微下拉晶体光纤生长设备研制及YAG单晶生长

介绍了一种新型单晶生长技术(微下拉:micro-pulling-down),并概述了该方法在Nd∶ YAG单晶光纤生长方面的应用及发展.率先在国内开展了微下拉单晶生长炉的研制工作,填补了该领域的空白.同时,生长了直径3mm,长度100 mm、300 mm的Nd∶ YAG单晶,晶体整体透明、内部无散射点,表现出了良好的单晶性,有望作为激光工作物质使用.     

Crystal Growth from Silica Gels and Single Crystal Structure of Bariumchromate

Rhombic single crystals of bariumchromate were grown in silica gels up to 1.5 mm in size. The influence of the initial pH-value of the gel and the kind and concentration of reactants are studied. The crystal structure has been determined. The compound crystallizes in space group Pnma, with cell dimensions a = 9.113(4) Å, b = 5.528(3) Å, c = 7.336(4) Å and Z = 4. The structure was refined to R = 0.062 on the basis of 364 reflections. Every barium atome, centered in a distorted archimedian antiprism, is coordinated to 8 oxygen atoms each belonging to a chromate tetrahedron. Interatomic distances and bond angles were calculated.     

半绝缘SiC单晶生长和表征

使用升华法生长碳化硅(SiC)单晶,借助数值模拟方法优化温场,在不同条件下分别获得单一晶型的4H-SiC和6H-SiC单晶,利用拉曼光谱进行表征。采用V掺杂的方法,制备半绝缘SiC单晶,使用非接触式电阻率测试仪进行了测试,并对4H-SiC和6H-SiC电阻率进行了比较和分析。     

低位错密度4 inch GaSb(100)单晶生长及高质量衬底制备

采用液封直拉法(LEC)生长了4 inch直径(100)GaSb单晶并进行了衬底晶片的加工制备.通过优化热场,可重复生长出非掺和掺Te 整锭(100)单晶,单晶锭的重量为5~8 kg, 成晶率可达80;以上.4 inch(100)晶片大部分区域的位错腐蚀坑密度小500 cm-2,其(004)双晶衍射峰的半峰宽为29弧秒,表明晶片衬底的完整性相当好.晶体生长过程中固液界面较为平坦,因而晶片表现出良好的横向电学均匀性.经研磨和机械化学抛光,制备出具备良好平整度和表面粗糙度的开盒即用衬底晶片.通过控制本征受主缺陷浓度和掺杂浓度,制备出具有良好近红外透光率的n型GaSb单晶衬底.     

钛酸锶单晶体生长工艺研究

使用数控焰熔法晶体生长炉生长钛酸锶单晶体,研究了气体参数、生长速度和退火工艺参数对晶体生长的影响.在氢氧比为2.5,等径生长速度保持在10 mm·h-1,生长出了直径26 mm、等径长度20 mm、总长40 mm的钛酸锶单晶体,然后经过1550℃ ×72 h+1000℃ ×20 h+600℃ ×24 h的退火,消除钛酸锶单晶体的热应力和氧空位,得到完整的高品质的单晶体.偏光显微镜测试表明,晶体具有很好的完整性.     

探测器级单晶金刚石材料的生长

采用高质量高温高压单晶金刚石衬底,通过等离子体环境净化的方法获得高纯、低缺陷密度金刚石材料,有望应用于医疗、核、宇宙射线等辐射探测器.采用微波化学气相沉积方法成功外延生长出了8 mm×8 mm的高质量单晶金刚石材料.晶体内无明显的应力集中区,X射线摇摆曲线(004)峰半高宽0.008°,PL光谱中未见与氮相关杂质,基于电子顺磁共振测试孤氮杂质含量为23ppb.     

Growth Characteristics of Mercuric Iodide Single Crystal

The HgI₂ single crystal with few large smooth faces, high quality and 360 g in weight has been grown by a new technique of modified vapour phase located point method, and the growth characteristics of HgI₂ single crystals have been investigated in detail. It is found by means of X-ray diffraction that the crystals grown with the c-axis parallel or perpendicular to the pedestal plane have both the prism faces {110}.     

氮化镓单晶的液相生长

氮化镓(GaN)具有高击穿场强、高饱和电子漂移速率、抗辐射能力强和良好的化学稳定性等优良特性,是制作宽波谱、高功率、高效率光电子、电力电子和微电子的理想衬底材料。除气相法(包括HVPE(氢化物气相外延)、MOCVD(金属有机化合物化学气相沉淀)、MBE(分子束外延))生长GaN单晶外,液相法(包括氨热法和助熔剂法)近几年在制备GaN单晶方面取得了较大的进展。本文介绍了氨热法和助熔剂法的生长原理、装备特点及生长习性;综述了两种液相生长方法的研究历程及研究进展,并对液相法生长GaN单晶的发展趋势及主要挑战进行了展望。     

CdSiP2多晶提纯与单晶生长

采用重结晶技术,对CdSiP2多晶进行快速下降提纯,以提纯后的晶锭为原料,利用改进的垂直布里奇曼法生长出CdSiP2单晶体,尺寸达φ18 mm×51 mm.经能量色散仪(EDS),X射线衍射(XRD),X射线光电子能谱(XPS)以及电感耦合等离子体光谱仪(ICP)测试表明,重结晶提纯能有效降低CdSiP2多晶中Fe、Mn等影响晶体性能的微量元素含量,获得高纯四方黄铜矿结构的CdSiP2多晶材料.采用X射线衍射仪和红外傅立叶变换分光光度计分别对生长的CdSiP2单晶体自然解理面与厚度2 mm的CdSiP2晶片进行测试,获得了{101}晶面族六级衍射峰,晶片在2～7μm波段范围的红外透过率高于53;,对应的吸收系数低于0.09 cm-1.上述研究结果表明,采用提纯后原料生长的CdSiP2单晶体结晶性好,光学性能优良,可进一步用于制作CdSiP2激光频率转换器件.     

Single Crystal Growth and Electrical Properties of Gallium Monotelluride

Single crystals of GaTe were prepared in our laboratory by a special modified Bridgman technique method. Measurements of the electrical conductivity and Hall effect between 210 and 450 K were carried out on GaTe samples in two crystallographic directions. The Hall coefficient is positive and varies with the crystallographic direction. A unique mobility behaviour and strong anistropy in the carrier mobility were observed. The Hall mobilities parallel and perpendicular to the C-axis, at room temperature, were 12 cm/V · s and 25.12 cm²/V ·s, respectively. The free carrier concentration lies between 10¹³ − 10¹⁴ cm⁻³ at room temperature.     

金属单晶生长和相关物理工作的结合

从近几年的工作结果中总结了一些单晶生长和物理研究相结合的体会.在基础研究中,单晶生长工作仍具有本身的优势和特点.单晶样品促进了物理的深入,物理工作也帮助了生长方法的提高.积极参与物理问题的研究,可以具有材料制备和基础研究两方面的能力.物理工作对材料科学的指导意义可以使我们的单晶生长事半功倍.     

Polycrystalline Synthesis and Single Crystal Growth of AgGaS2

A modified two temperature vapor transport procedure has been used to synthesize AgGaS₂ polycrystalline materials at 1060 °C from high-purity Ag, Ga, S elements. The results showed that the polycrystalline materials are pure single phase AgGaS₂ by X-ray powder diffraction analysis. The polycrystalline ingot includes a few interior voids and has a high mass density. The AgGaS₂ ingot with 12 mm in diameter and 20 mm in length has been grown by the modified Bridgman technique in two-zone vertical furnace. As-grown AgGaS₂ ingot was characterized by the X-ray diffraction technique, obtained the rocking curve of the crystal (011) face, it is shown that the ingot is AgGaS₂ single crystal. The infrared transparent of the crystal at 2 ∼ 10μm is 49% (and absorption coefficient is 0.74 cm^—1).