The use of laser ligth in the study of metal surfaces

Optical methods are available for evaluating the surface finish of metals. This paper covers measurements of the specular and diffuse reflection from ground and lapped surfaces using helium-neon laser light. The specular reflection gives information on the probability distribution of roughness height, while the diffuse reflection depends on the roughness slope distribution.     

SrTiO3基片的晶体质量及表面粗糙结构的X射线研究

用X射线双晶衍射摇摆曲线以及双晶X射线形貌对两个SrTiO₃基片的单晶质量进行了对比研究，并用X射线掠入射镜面反射及漫散射研究了它们的表面粗糙结构．结果表明，两个SrTiO₃基片中都存在镶嵌缺陷，其中一个样品的晶体质量相对较高．两个样品的表面粗糙结构相差很大，包括均方根粗糙度σ和横向相关长度ξ．σ分别为（0.5±0.1）和（1.3±0.1）nm，ξ分别为（1200±200）和（300±20）nm．样品的表面粗糙将增加Ｘ射线的漫散射强度而降低镜面反射的强度．晶体质 关键词：     

Surface roughness measurement using spatial-average analysis of objective speckle pattern in specular direction

The speckle contrast method (SCM) and the light scattering method (LSM) are two of the most promising optical techniques for on-line surface roughness measurement of slightly-rough surface. However, due to the lack of capability in eliminating the influence from the diffuse component of scattered light, SCM and LSM are both sensitive to the variations of surface correlation length. Additionally, for LSM, the presence of speckle noise leads to fluctuations in the measuring results. To solve these problems, an approach based on the spatial-average analysis of the objective speckle pattern in the specular direction, simply called spatial-average method (SAM), is proposed. The SAM establishes the quantitative relationship between a new characteristic parameter extracted from the recorded speckle image and the rms surface roughness, eliminates to a large extent the influence of diffuse light component on the measuring results, and immunizes itself from the speckle noise. The theoretical foundation of SAM is given in details. A computer simulation is then performed to make comparisons among these three methods. Finally an experiment is presented.     

基于数字微镜器件的自适应高动态范围成像方法及应用

在结构光三维扫描测量中,强反射表面因编码结构光照射后易产生局部镜面反射的特性,引起相机曝光饱和,淹没了所要检测的表面几何特征信息.为解决强反射表面的视觉成像难题,基于数字微镜器件(digital micromirror device,DMD)具有调制入射光线空间信息的特性,本文提出一种基于DMD的自适应高动态范围成像方法.设计与搭建了一套新型可编程的计算成像系统,建立其光学系统模型,并实现了DMD微镜与CMOS像素的匹配与映射;分析了基于逐像素编码曝光的高动态范围成像原理,并设计了基于DMD的光强编码控制算法,实现对入射光线强度的自适应精确调制,从而使进入成像系统中的入射光强始终处于相机的合适曝光强度内.实验表明:该方法突破了普通数字相机的动态范围限制,能够精确地控制被测强反射表面各个区域的入射光线强弱,并实现了对强反射表面的局部过曝光区域的清晰成像.该研究成果将为从根源上解决强反射表面因局部过曝光造成的三维点云缺失问题提供重要的解决方案.     

A step forward in the study of the electroerosion by optical methods

This work develops two theoretical models of surfaces to explain the behavior of the light scattered by samples that suffers some alteration.

In a first model, it is evaluated the mean intensity scattered by the sample, analyzing the different curves obtained as function of the eroded/total surface ratio. The theoretical results are compared with those obtained experimentally. It can be seen that there exists a strong relation between the electroerosion level and the light scattered by the sample.

A second model analyzes a surface with random changes in its roughness. A translucent surface with its roughness changing in a controlled way is studied. Then, the correlation coefficient variation as function of the roughness variation is determined by the transmission speckle correlation method. The obtained experimental values are compared with those obtained with this model.

In summary, it can be shown that the first- and second-order statistics properties of the transmitted or reflected light by a sample with a variable topography can be taken account as a parameter to analyze these morphologic changes.     

Transition radiation from rough surfaces

The light emission of normally incident 77 keV electrons on silver surfaces of different roughness has been investigated. The roughness was quantitatively determined by measuring the scattered light of a normally incident laser beam. In addition to the transition radiation, which is expected for smooth surfaces, light emission of surface plasmons via surface roughness occurs. The shape and the intensity of the spectral distribution of this emission show a characteristic change with the surface roughness.     

Far-field intensity of electromagnetic waves scattered from random,self-affine fractal metal surfaces

Abstract

By means of the rigorous Green theorem integral equation formulation, we study the far-field intensity of linearly polarized, monochromatic electromagnetic waves scattered from a one-dimensionally rough silver surface characterized by a self-affine fractal structure. These surface fractal properties are ensured for the entire range of relevant length scales, from the illuminated spot size down to a sufficiently small (in terms of the wavelength) lower cut-off length. A peak in the specular direction is found in the angular distribution of the diffuse component of the mean scattered intensity, which becomes broader and smaller with increasing fractal dimension. For large fractal dimensions, enhanced backscattering in the case of p-polarization is observed owing to the roughness-induced excitation of surface plasmon polaritons. The interplay of different length scales of the fractal surface in the scattering process is analysed for an intermediate fractal dimension.     

Effect of dimension and type of model on statistical characteristics of scattered light

The effect of the type of the model describing a non-Gaussian relief, as well as of the problem dimension, on the statistical characteristics of scattered monochromatic light is considered. A difference in the shape of diffuse scattering indicatrices was observed for different types of surface models (with identical height distributions and autocorrelation functions). The effects revealed because more pronounced with an increase in the deviation of surface height distribution from normal and with an increase in the roughness height.     

An angular cutoff composite model for investigation on electromagnetic scattering from two-dimensional rough sea surfaces

Based on the local configuration angle division to select the corresponding method for electromagnetic scattering calculation from rough sea surface,this paper presents an angular cutoff composite model:when the local scattered angle is in the specular region that is given by an approximately 20 degrees cone around the specular direction,the Kirchhoff approximation is applied to evaluate the specular reflection,which dominates the total scattering in this region;the small perturbation method is employed to handle the diffuse reflection which is predominant as the local scattered angle is situated out of the specular region.Numerical results are compared with those of experimental and theoretical models in several configurations as a function of incident angle,wind speed,wind direction.The comparison of numerical results of other experimental and theoretical models in several configurations shows that the new composite model is robust to give accurate numerical evaluations for the sea surface scattering.     

Radiative intensity solution and thermal emission analysis of a semitransparent medium layer with a sinusoidal refractive index

The radiative intensity in a sinusoidal refractive index semitransparent medium layer is solved by the curved ray-tracing method in combination with the pseudo-source adding method. One boundary of the medium layer is an opaque diffuse substrate wall. The other boundary is a semitransparent specular or diffuse surface, from which the medium thermal emission emerges. With considering a linear temperature distribution, the radiative intensity formulae are, respectively, deduced under the two boundary conditions. On the basis of the radiative intensity solutions, the directional and hemispherical emission of the medium layer with a specular surface as well as the hemispherical emission of that with a diffuse surface are calculated. The influences of the optical thickness, sinusoidal refractive index distribution and linear temperature distribution on the thermal emission are investigated. The results show that the effects of refractive index and temperature distribution are significant and are different under the two reflecting modes of the surface.     

Measurement of surface roughness properties using speckle patterns with non-gaussian statistics

The surface roughness properties (i.e. the rms surface roughness and the correlation length) of strong diffuse objects are investigated by using the speckle patterns which obeys the non-gaussian statistics. The intimate linear relation is found to exist between the rms surface roughness of objects and the maximum contrast obtained from the varying curves of the average image speckle contrast as a function of the point spread of an optical imaging system. The correlation length of surface roughness of objects is related to the averaged intensity distribution of speckle patterns produced at the far-field diffraction plane. It now becomes clear that the rms roughness and the correlation length of strong diffuse objects are determined, respectively, from the maximum speckle contrast at the image plane and the averaged speckle intensity distribution at the far-field diffraction plane.     

点光源反射镜法向标校技术

针对基于反射式点光源进行在轨辐射定标过程中反射镜法向标校建模不够完善的问题,提出基于反射镜与相机几何模型的反射镜法向标校及矢量控制算法.通过解算模型求解相机与反射镜间的几何误差,建立了太阳图像质心坐标与反射镜法向之间的关系,可实现多点自动化标校反射镜法向,提高镜法向标校及系统指向精度.实验结果表明,利用解算后的几何模型反解不同时刻质心坐标进行多点反射镜法向标校,相机观测太阳像素角分辨率标准误差分别为:X轴方向0.02165°、Y轴方向0.01982°,综合角分辨率误差为0.02936°,优于太阳观测器对反射镜法向标校精度.实现了相机观测太阳取代人工借助太阳观测器观测太阳的自动化镜法向标校,扩展了标校灵活度,系统综合指向精度优于0.1°,为固定实验场联网自动化集中控制不同能级梯度的点光源阵列在轨辐射定标和调制传递函数检测奠定基础.     

Diffuse contribution to specular spectra and the specular contribution to diffuse spectra in X-ray scattering from rough interfaces

The angular dependences of the intensity of X-ray radiation scattered from multilayer systems with nonideal interfaces are investigated with due regard for the real geometry of a receiver. The influence of the interface roughness and the longitudinal and transverse correlations of the interface roughnesses on the specular- and diffuse-scattering spectra is analyzed. It is demonstrated that the inclusion of the diffuse contribution to the specular-scattering spectra provides information on the correlation lengths in the plane and in the direction perpendicular to the plane of the interface. The roughness parameters determine the ratio between the heights of the central Bragg peak and the diffuse plateau in the diffuse-scattering spectra. The spectra measured for several widths of the detector slit make it possible to separate the true specular and diffuse contributions. This allows one to interpret experimental data more accurately. The results of the calculations are illustrated by analyzing experimental scattering spectra for multilayer systems.     

表面散射光对激光三角法位移测量的影响

三角测量法是一种位移测量方法, 其测量精度不但受到传感器本身因素如光源、探测器、机械结构特性等因素的影响, 还受到被测表面特性如色泽、材料、粗糙度、倾斜度以及外界环境的影响。国内外的一些学者提出了许多提高传感器测量精度的方法, 但这些研究都是针对某一特性表面进行的, 没有涉及到对不同表面的测量时存在的问题。利用随机行走理论对物体表面的散射场进行了分析, 给出了不同粗糙度表面下弱散射光强与散射角及入射角的关系。由于设计制造的传感器量程范围内接收散射光的角度在15°至25°内变化, 因此取20°作为散射角角度, 理论计算模拟的三种不同粗糙面散射光强变化最大能达到300%左右。该结果对于优化激光三角传感器的设计和提高测量精度有一定的意义。     

Single layer homogeneous model for surface roughness by polarized light scattering

In this paper a homogeneous single layer model for surface roughness by polarized light has been developed. It has been shown that the reflectance change in non-absorbing layer is directly proportional to the refractive index of the ambient and substrate media for s polarization but inversely proportional to the p polarization and it is directly proportional to the square of the thickness of the layer for both the polarization. In an absorbing layer, it has been shown that the thickness of the layer is equal to the twice of surface roughness of the single layer identical system for s polarization but it is ratio of twice of surface roughness to the square of refractive index of thin film for p polarization. The extinction coefficient of the layer is directly proportional to the thickness of that layer for both the polarization. The consequence of the scattered light on the specular reflectance and transmittance for oblique incidence shows that there is reduction in reflectance (in both non-absorbing and absorbing cases) and transmittance (in the absorbing case for p polarization only), due to roughness on the surface under the Drude effective-medium approximation. Thus such an absorbing layer provides a valid model for the effect of scatter on the transmittance for p polarization only.     

Travel-time statistics for signals scattered at a rough surface

Abstract

The travel time of signals reflected or refracted by a rough surface is investigated in the geometrical optics approximation. It is shown that surface roughness typically decreases the mean travel time in the case of large-scale roughness, when only one specularly reflecting point moves randomly around its unperturbed position, resulting in a negative travel-time bias (toward early echoes). In the opposite limiting case of multipath propagation, when many specular points exist on a random surface, the travel-time bias is always positive. General results are illustrated by two examples related to ocean remote sensing which involve sound scattering from the ocean surface and bottom.     

混浊介质二维后向漫散射穆勒矩阵的测量

研制了一套实验系统用于测量混浊介质的后向漫散射穆勒矩阵.在系统中,激光被调制成所需偏振态,聚焦于混浊介质表面.利用CCD相机配合相应的偏振元件,测量入射点周围区域的后向散射光中特定偏振态的能量空间分布,并由测量值计算出介质的后向漫散射穆勒矩阵.描述了系统的组成、测量原理以及方法,分别测量了消偏振分光棱镜的反射穆勒矩阵和浓度1.5％的脂肪乳溶液的后向漫散射穆勒矩阵.实验证明:该系统能够完全消除样品表面镜面反射光的干扰,精确的测量混浊介质的后向漫散射穆勒矩阵;并可望用于生物组织的研究中.     

Effect of Density and Surface Roughness on Optical Properties of Silicon Carbide Optical Components

The effect of density and surface roughness on the optical properties of silicon carbide optical components is investigated. The density is the major factor of the total reflectance while the surface roughness is the major factor of the diffuse reflectance. The specular reflectance of silicon carbide optical components can be improved by increasing the density and decreasing the surface roughness, in the form of reducing bulk absorption and surface-related scattering, respectively. The contribution of the surface roughness to the specular reflectance is much greater than that of the density. When the rms surface roughness decreases to 2.228nm, the specular reflectance decreases to less than 0. 7% accordingly.     

Statistics of travel time and intensity of two first arrivals of short pulses backscattered by a rough 3D surface

The time history of a pulse backscattered by a rough surface contains information about the position of the surface and the properties of the scatterers. This information is utilized successfully in a number of remote sensing techniques ranging from echo sounding of the ocean bottom to medical ultrasonics and satellite altimetry. In the current paper, statistical properties of backscattered waves are considered in a geometrical optics approximation. The probing pulse duration is assumed to be sufficiently short so that signals backscattered in the vicinity of individual specular points on a rough surface do not overlap in time. Theoretical results previously obtained for a 2D problem [I. M. Fuks and O. A. Godin, 2005, Waves in Random and Complex Media, 14, 539-562; M. I. Charnotskii and I. M. Fuks, 2005, Waves in Random and Complex Media, 15, 451-467] are extended to wave scattering by 3D rough surfaces by following a mathematical approach developed in stochastic geometry. Predictions of an asymptotic theory are verified against results of Monte-Carlo simulations. Probability density functions of travel times and intensities of the first and second arrivals of the backscattered wave are quantified in terms of statistical moments of roughness assuming normal distribution of elevations. It is found that, as in the 2D case, the travel time and the intensity are strongly correlated; on average, the earlier a signal arrives, the smaller is its intensity.