Performance of a polarizer using synthetic mica crystal in the 12–25 nm wavelength range

To develop polarizer functioning in the extreme ultraviolet (EUV) and soft X-ray region, the polarization performance of synthetic mica has been investigated theoretically with a simulation code using Fresnel equations and optical constants from the Henke database. The reflectance of synthetic mica crystal for s and p polarization was measured to investigate its polarization performance in a home-made synchrotron radiation soft X-ray polarimeter at beamline 3W1B, Beijing Synchrotron Radiation Facility (BSRF...     

Performance of a polarizer using synthetic mica crystal in the 12-25 nm wavelength range

To develop polarizer functioning in the extreme ultraviolet (EUV) and soft X-ray region, the polar- ization performance of synthetic mica has been investigated theoretically with a simulation code using Fresnel equations and optical constants from the Henke database. The reflectance of synthetic mica crystal for s and p polarization was measured to investigate its polarization performance in a home-made synchrotron radiation soft X-ray polarimeter at beamline 3W1B, Beijing Synchrotron Radiation Facility (BSRF). The reflectivity of the synthetic mica crystal at an angle of grazing incidence of 48° was obtained from the experimental data, which is about 4.8x10<'-3> at 25 nm and 6.0×10<'-4> at 12 nm, and the linear polarizance of the X-ray reflected by the synthetic mica crystal that we measured using an analyzer-rotating method increases from 80% to 96.6% in this EUV region, while higher than 98.2% in the simulation. The result indicates that this synthetic mica crystal works as a practical polarizer in this EUV region of 12-25 nm, and also in an extensive wavelength region higher than 25 nm.     

磁控溅射法制备极紫外6.8～11.0nm波段Mo/B_4C横向梯度多层膜（英文）

用直流磁控溅射法结合掩模板控制膜厚的方法在Si衬底上制备了工作于6.8～11.0nm波段的[Mo/B_4C]60横向梯度多层膜。利用X射线掠入射反射测试以及同步辐射反射率测试对梯度多层膜的结构及性能进行了测试。X射线掠入射反射测试结果表明,多层膜周期厚度沿着长轴方向从4.39nm逐渐增加到7.82nm,周期厚度平均梯度为0.054nm/mm。对横向梯度多层膜沿长轴方向每隔5mm进行了一次同步辐射反射率测试,结果显示,横向梯度多层膜在45°入射角下的反射率约为10%,反射峰的半高全宽介于0.13nm到0.31nm之间。     

Optimization of the structure of an optical fiber polarizer with a metal film at a wavelength of 980 nm

The dependence of the extinction ratio of a 980-nm fiber polarizer with an Al film on the thickness of magnesium fluoride buffer layer has been experimentally and theoretically investigated. At the optimal thickness of the buffer layer, h _b = 0.078 (normalized to the wavelength), extinction ratios of 23 and 41 dB were obtained for polarizers having fiber shell residual layers of 2.01 and 1.607 μm, respectively. The optimal thin-film structure is determined, which will make it possible to design polarizers with extinction ratios up to 100 dB.     

Designing of a polarization beam splitter for the wavelength of 1310 nm on dual-core photonic crystal fiber with high birefringence and double-zero dispersion

We have proposed a novel kind of photonic crystal fiber which contains two asymmetric cores. The bireti＇ingence and the dispersion are numerically analyzed based on finite element method when the size of the air holes and the pitch of two adjacent air holes are changed. It is shown that the proposed photonic crystal fiber has high birefringence up to the order of 10-2 and double-zero dispersion points are at the wavelengths of 1310 nm and 800 rim, simultaneously. At the same time, the normalized power and the extinction ratios of the proposed photonic crystal fiber have been simulated. It is demonstrated that, at the wavelength of 1310 rim, the x-polarized mode and the y-polarized mode are separated when the propagation distance is 2.481 ram.     

Iridium/silicon multilayers for extreme ultraviolet applications in the 20-35 nm wavelength range

We have developed an Ir/Si multilayer for extreme ultraviolet (EUV) applications. Normal incidence reflectance measurements of a prototype film tuned to 30 nm wavelength show superior performance relative to a conventional Mo/Si multilayer structure; we also find good stability over time. Transmission electron microscopy and electron dispersive x-ray spectroscopy have been used to examine the microstructure and interface properties of this system: we find amorphous Si layers and polycrystalline Ir layers, with asymmetric interlayer regions of mixed composition. Potential applications of Ir/Si multilayers include instrumentation for solar physics and laboratory EUV beam manipulation.     

Br_2分子在360—610 nm的光解离动力学研究

利用包含转动自由度在内的含时薛定谔方程研究了Br_2分子在波长范围为360—610 nm的光解离动力学.通过计算得到了Br_2分子在四个特征波长处的切片解离影像,并经过分析得到了与切片解离影像相对应的动能分布;计算了Br_2分子在波长范围为360—610 nm内总的动能分布,以及从A,B和C三个电子态解离的碎片各自所对应的动能分布;计算了A,B和C三个电子态各自的解离概率以及碎片产物的分支比Γ(Br~*/(Br+Br~*))随波长的变化.     

Dielectric anisotropy of 5CB liquid crystal in a decimeter wavelength range

Parallel and perpendicular components of the dielectric constant for 5CB nematic liquid crystal are measured in a relaxation region. Two frequencies f ₁≈30 and f ₂≈350 MHz are determined at which the inversion of the dielectric anisotropy sign is observed. It is shown that the observed sizable high-frequency shift of f ₂ with respect to the value calculated according the Debye theory is caused by the dielectric resonance near the relaxation region.     

Design of a neutron polarizer using polarizing super mirrors for the TOF-SANS instrument at the J-PARC

Small-angle neutron scattering technique using polarized neutrons is powerful for studying structures in the range between nm and μm of magnetic materials. In addition, they have been used for the incident beam of focusing-geometry SANS instruments using a magnetic neutron lens, where a high polarization degree of about 99.9% is necessary because the imperfectness of the neutron polarization increases the background level. We are going to install such a magnetic focusing system on the new time-of-flight SANS (TOF-SANS) instrument at the J-PARC so as to make q_min smaller than 10⁻³ Å⁻¹ and improve the resolution of the conventional TOF-SANS at low q. As a polarizing device of the instrument, two V-shaped polarizing super mirrors arranged in crossed geometry to enhance the polarization degree has been considered. In this paper, we present the concept and the detailed design of this device and its performance estimated by Monte Carlo simulations.     

Effect of radiation-induced mean wavelength shift in optical fibers on the scale factor of interferometric fiber optic gyroscope at a wavelength of 1300 nm

In order to analyze the effect of wavelength-dependent radiation-induced attenuation (RIA) on the mean transmission wavelength in optical fiber and the scale factor of interferometric fiber optic gyroscopes (IFOGs), three types of polarization-maintaining (PM) fibers is tested by using a ⁶⁰Co γ -radiation source. The observed different mean wavelength shift (MWS) behaviors for different fibers are interpreted by color-center theory involving dose rate-dependent absorption bands in ultraviolet and visible range and total dose-dependent near infrared absorption bands. To evaluate the mean wavelength variation in fiber coil and the induced scale factor change for space-borne IFOG under low radiation dose in space environment, the influence of dose rate on the mean wavelength is investigated by testing four germanium (Ge) doped fibers and two germanium-phosphorus (Ge-P) codoped fibers irradiated at different dose rates. Experimental results indicate that the Ge-doped fibers show the least mean wavelength shift during irradiation and their mean wavelength of optical signal transmitting in fibers will shift to shorter wavelength in low-dose-rate radiation environment. Finally, the change in the scale factor of IFOG resulting from the mean wavelength shift is estimated and tested, and it is found that the significant radiation-induced scale factor variation must be considered during the design of space-borne IFOG.