Study of the solar flare of December 16, 1988 on the basis of the 2.223-MeV γ line and initial characteristics of flare neutrons

The third burst of the solar flare of December 16, 1988 was investigated on the assumption of both Bessel and power spectra of the initial charged particles. Refined data on the flare-neutron-production cross sections were used and two different neutron source altitudes were considered. An increase in the solar plasma density under the flare region up 2 × 10¹⁷ cm^?3 has been found throughout the photosphere; in some cases, the plasma density increased to (3–6) × 10¹⁷ cm^?3 in the initial flare stages. The dynamics of the increase in the plasma density during γ emission has been traced. It is found that the particle spectrum changes from moderately hard to soft and then to hard during γ emission in both spectral representations.     

Enhancement in electrochemical properties of ionic liquid-based nanocomposite polymer electrolytes by 100 MeV Si9+ swift heavy ion irradiation

Swift heavy ion (SHI) irradiation has been used as a tool to enhance the electrochemical properties of ionic liquid-based nanocomposite polymer electrolytes dispersed with dedoped polyaniline (PAni) nanorods; 100 MeV Si⁹⁺ ions with four different fluences of 5?×?10¹⁰, 1?×?10¹¹, 5?×?10¹¹, and 1?×?10¹² ions cm^?2 have been used as SHI. XRD results depict that with increasing ion fluence, crystallinity decreases due to chain scission up to fluence of 5?×?10¹¹ ions cm^?2, and at higher fluence, crystallinity increases due to cross-linking of polymer chains. Ionic conductivity, electrochemical stability, and dielectric properties are enhanced with increasing ion fluence attaining maximum value at the fluence of 5?×?10¹¹ ions cm^?2 and subsequently decrease. Optimum ionic conductivity of 1.5?×?10^?2 S cm^?1 and electrochemical stability up to 6.3 V have been obtained at the fluence of 5?×?10¹¹ ions cm^?2. Ac conductivity studies show that ion conduction takes place through hopping of ions from one coordination site to the other. On SHI irradiation, amorphicity of the polymer matrix increases resulting in increased segmental motion which facilitates ion hopping leading to an increase in ionic conductivity. Thermogravimetric analysis (TGA) measurements show that SHI-irradiated nanocomposite polymer electrolytes are thermally stable up to 240–260 °C.     

Effects of the AlN nucleation layer thickness on the crystal structures of an AlN epilayer grown on the 6H-SiC substrate

The influence of the LT-AlN(NL) growth times on the mosaic structure parameters of the AlN layer grown on the LT-AlN(NL)/6H-SiC structures as well as the dislocation densities and the strain behaviours in the AlN epilayers has been investigated using XRD measurements. The growth times of the LT-AlN(NL) were changed to 0, 60, 120, 180, and 240?s. We observed that the mosaic structure parameters of the AlN epilayers were slightly affected by the LT-AlN(NL) growth times. However, the dislocation densities in the AlN layer are affected by the growth times of the LT-AlN(NL) layer. The highest edge dislocation density (5.48?×?10¹⁰?±?2.3?×?10⁹?cm^?2) was measured for the sample in which 120?s grown LT-AlN(NL) was used. On the other hand, highest screw type dislocation density (1.21?×?10¹⁰?±?1.7?×?10⁹?cm^?2) measured in the sample E that contains 240?s growth LT-AlN(NL). The strain calculation results show that the samples without LT-AlN(NL) suffered maximum compressive in-plane strain (?10.9?×?10^?3?±?1.8?×?10^?4), which can be suppressed by increasing the LT-AlN(NL) growth times. The out-of-plane strain also has a compressive character and its values increase with LT-AlN(NL) growth times between 60 and 180?s. Same out-of-plane strain values were measured for the LT-AlN(NL) growth times of 180 and 240?s. Furthermore, the form of the biaxial stress in the AlN epilayer changed from compressive to tensile when the LT-AlN(NL) growth times were greater than 120?s.     

Die magnetische Suszeptibilität der Defektelektronen in Silizium und Germanium

For semiconductors it is possible, to determine the contribution of the free carriers to the magnetic susceptibility. Holes in silicon (density 10¹⁸ to 10¹⁹cm^?3) have at 297 and 141° K a small paramagnetic susceptibility. In contrast, one computes from cyclotron mass parameters for 4° K a strong diamagnetic susceptibility. Holes in germanium (density 4 · 10¹⁷ and 4 · 10¹⁹ cm^?3) have a diamagnetic susceptibility, which is much smaller, than one would expect from cyclotron resonance masses. — Neutral boron atoms contribute in small concentration at 141 °K to the susceptibility.     

Investigations on the effect of argon ion bombardment on the structural and optical properties of crystalline gallium antimonide

The effects of bombardment of 250 keV argon ions in n-type GaSb at fluences 2×10¹⁵ and 5×10¹⁵ ions cm^?2 were investigated by high-resolution X-ray diffraction (HRXRD), Fourier transform infrared (FTIR) and scanning electron microscopy (SEM). HRXRD studies revealed the presence of radiation-damaged layer (strained) peak in addition to the substrate peak. The variation in the lattice constant indicates the strain in the bombarded region. The out-of-plane (?_⊥) and in-plane strains (?_|) determined from the profiles of several symmetric and asymmetric Bragg reflections, respectively, were found to change with the ion fluence. Simulations of XRD patterns using dynamical theory of X-ray scattering (single-layer model) for the damaged layer yielded good fits to the recorded profiles. FTIR transmission studies showed that the optical density (α·d) of GaSb bombarded with different fluences increases near the band edge with increase in ion fluence, indicating the increase in the defect concentration. The density of the defects in the samples bombarded with different fluences was in the range of 3.20×10²¹–3.80×10²¹ cm^?3. The tailing energy estimated from the transmission spectra was found to change from 12.0 to 58.0 meV with increasing ion fluences, indicating the decrease of crystallinity at higher fluences. SEM micrographs showed the swelling of the bombarded surface of about 0.33 μm for the fluence of 2×10¹⁵ ions cm^?2, which increased to 0.57 μm for the fluence of 5×10¹⁵ ions cm^?2.     

Far infrared optical properties of NbSe3

We have measured the far infrared reflectance of NbSe₃ and used models of the frequency dependent conductivity to fit the data. General arguments show that at 2 K a charge density wave (CDW) energy gap exists between 120 and 190 cm^?1, the relaxation time(s) of the free carriers and CDW pinned mode is >30×10^?12 s, and the ratio of the free carrier concentration to band mass is <2×10²⁰ cm^?3/m₀.     

Measurements of emission coefficient for continuum radiation from shock-heated krypton plasmas

Using a shock tube, the ξ factor of krypton has been determined at λ = 456.1 nm by observations of the continuum radiation and simultaneous interferometric measurements of the electron number density. For the electron-density range used (1×10¹⁶cm^-3?n_e?4×10¹⁶cm^-3), we obtain an increase in the ξ factor for decreasing electron densities. These results are compared with theoretical and other experimental data.     

Charge transfer reaction of multi-charged oxygen ions with O2

The rate of transfer of electrons from O₂ to O²⁺ and O³⁺ has been measured at energies ? 2 eV using a stored ion technique. The rate for O²⁺ is k = 1.0(0.3) × 10^?9 cm³/s and for O³⁺, k = 2.5(0.3) × 10^?9 cm³/s, compared to calculated Langevin rates of 1.8 × 10^?9 cm³/s and 2.7 × 10^?9 cm³/s respectively.     

Modification of the magnetic properties of polyimide films by cobalt ion implantation

The magnetic characteristics of polyimide films implanted with Co⁺ ions with an energy of 40 keV in the dose range D = 2.50 × 10¹⁶?1.25 × 10¹⁷ cm^?2 at ion current densities j = 4, 8, and 12 μA/cm² have been investigated. It has been shown that, at implantation doses of less than 5 × 10¹⁶ cm^?2, the superparamagnetic properties of modified samples are described by the Langevin equation. At higher doses, there is an intercluster interaction. It has been found that, with an increase in the ion current, the cluster size decreases. The sizes of the formed clusters are determined and vary in the range from 3.9 to 11.0 nm, depending on the implantation dose.     

Silicon negative ion implantation induced vacancy defects in thermally grown SiO2 thin films

ABSTRACT

Thermally grown SiO₂ thin films on a silicon substrate implanted with 100?keV silicon negative ions with fluences varying from 1?×?10¹⁵ to 2?×?10¹⁷ ions cm^?2 have been investigated using Electron spin resonance, Fourier transforms infrared and Photoluminescence techniques. ESR studies revealed the presence of non-bridging oxygen hole centers, E′-centers and P_b-centers at g-values 2.0087, 2.0052 and 2.0010, respectively. These vacancy defects were found to increase with respect to ion fluence. FTIR spectra showed rocking vibration mode, stretching mode, bending vibration mode, and asymmetrical stretching absorption bands at 460, 614, 800 and 1080?cm^?1, respectively. The concentrations of Si–O and Si–Si bonds estimated from the absorption spectra were found to vary between 11.95?×?10²¹ cm^?3 and 5.20?×?10²¹ cm^?3 and between 5.90?×?10²¹ cm^?3 and 3.90?×?10²¹ cm^?3, respectively with an increase in the ion fluence. PL studies revealed the presence of vacancies related to non-bridging oxygen hole centers, which caused the light emission at a wavelength of 720?nm.     

Formation of bubbles and blisters in hydrogen ion implanted polycrystalline tungsten

ABSTRACT

Tungsten (W) has been regarded as one of the most promising plasma facing materials (PFMs) in fusion reactors. The formation of bubbles and blisters during hydrogen (H) irradiation will affect the properties of W. The dependence of implantation conditions, such as fluence and energy, is therefore of great interest. In this work, polycrystalline tungsten samples were separated into two groups for study. The thick samples were implanted by 18?keV H₃⁺ ions to fluences of 1?×?10¹⁸, 1?×?10¹⁹ and 1?×?10²⁰ H⁺/cm², respectively. Another thick sample was also implanted by 80?keV H₂⁺ ions to a fluence of 2?×?10¹⁷ H⁺/cm² for comparison. Moreover, the thin samples were implanted by 18?keV H₃⁺ ions to fluences of 9.38?×?10¹⁶, 1.88?×?10¹⁷ and 5.63?×?10¹⁷ H⁺/cm², respectively. Focused ion beam (FIB) combined with scanning electron microscopy (SEM) and transmission electron microscopy (TEM) were used for micro-structure analysis, while time-of-flight ion mass spectrometry (ToF-SIMS) was used to characterize the H depth profile. It is indicated that bubbles and blisters could form successively with increasing H⁺ fluence. H bubbles are formed at a fluence of ～5.63?×?10¹⁷ H⁺/cm², and H blisters are formed at ～1?×?10¹⁹ H⁺/cm² for 18?keV H₃⁺ implantation. On the other hand, 80?keV H₂⁺ ions can create more trapping sites in a shallow projected range, and thus enhancing the blisters formation with a relatively lower fluence of 2?×?10^17?H⁺/cm². The crack-like microstructures beneath the blisters are also observed and prefer to form on the deep side of the implanted range.     

Evaporated a-Si films with low ESR defect density by hydrogenation under NH3 ambient

a-Si films were obtained by a reactive evaporation of Si atoms with an electron gun, under a NH₃ ambient of 5 × 10^?5 torr. The H introduced amount efficiently reduces the ESR dangling bond density from 4 × 10¹⁹ cm^?3 in pure samples to 2 × 10¹⁷ cm^?3. The hydrogen presence is evidence by both the Si-H infrared bands and the strong spin-density increase with annealing. This increase, beginning at a temperature of 350°C, is attributed to the H effusion. XPS measurements show also an incorporation of bonded nitrogen.     

50 MeV Li3+ ion irradiation effect on structural, electrical, and dielectric properties of PVA-based nanocomposite polymer electrolytes

Nanocomposite polymer electrolyte thin films of polyvinyl alcohol (PVA)-orthophosphoric acid (H₃PO₄)-Al₂O₃ have been prepared by solution cast technique. Films are irradiated with 50 MeV Li³⁺ ions having four different fluences viz. 5?×?10¹⁰, 1?×?10¹¹, 5?×?10¹¹, and 1?×?10¹² ions/cm². The effect of irradiation on polymeric samples has been studied and characterized. X-ray diffraction spectra reveal that percent degree of crystallinity of samples decrease with ion fluences. Glass transition and melting temperatures have been also decreased as observed in differential scanning calorimetry. A possible complexation/interaction has been shown by Fourier transform infrared spectroscopy. Temperature-dependent ionic conductivity shows an Arrhenius behavior before and after glass transition temperature. It is observed that ionic conductivity increases with ion fluences and after a critical fluence, it starts to decrease. Maximum ionic conductivity of ～2.3?×?10^?5 S/cm owing to minimum activation energy of ～0.012 eV has been observed for irradiated electrolyte sample at fluence of 5?×?10¹¹ ions/cm². The dielectric constant and dielectric loss also increase with ion fluences while they decrease with frequency. Transference number of ions shows that the samples are of purely ionic in nature before and after ion irradiation.     

The transport properties of Dirac fermions in chemical vapour-deposited single-layer graphene

Abstract

The electronic transport properties of Dirac fermions in chemical vapour-deposited single-layer epitaxial graphene on anSiO₂/Si substrate have been investigated using the Shubnikov–de Haas (SdH) oscillations technique. The magnetoresistance measurements were performed in the temperature range between 1.8 and 43 K and at magnetic fields up to 11 T. The 2D carrier density and the Fermi energy have been determined from the period of the SdH oscillations. In addition, the in-plane effective mass as well as the quantum lifetime of 2D carriers have been calculated from the temperature and magnetic field dependences of the SdH oscillation amplitude. The sheet carrier density (1.42 × 10¹³ cm^?2 at 1.8 K), obtained from the low-field Hall Effect measurements, is larger than that of 2D carrier density (8.13 × 10¹² cm^?2). On the other hand, the magnetoresistance includes strong magnetic field dependent positive, non-oscillatory background magnetoresistance. The strong magnetic field dependence of the magnetoresistance and the differences between sheet carrier and 2D carrier density can be attributed to the 3D carriers between the graphene sheet and the SiO₂/Si substrate.     

Barrier D − complexes in a high-mobility two-dimensional electron system

The cyclotron excitation spectrum of selectively doped AlGaAs/GaAs quantum wells with a high (up to 2 × 10⁷ cm²/(V s)) mobility of electrons has been studied by means of the Raman scattering. The lines of the Raman scattering by the excitations of D ^? complexes, the objects in which two electrons localized in a quantum well are coupled to a charged impurity in a barrier, have been detected and identified. Spin-singlet D ^? complexes have been shown to exist in the entire range of the electron filling factor, from v → 0 to v = 2, owing to the specificity of the Coulomb interaction in two-dimensional systems. The excitation energies of the singlet D ^? complexes have been studied as functions of the electron density, quantum well width, and magnetic field.     

Crystalline to amorphous transformations in ion implanted GaP

Abstract

The amorphization process of GaP by ion implantation is studied. The samples of 〈111〉 oriented GaP were implanted at 130 K with various doses 5 × 10¹³-2 × 10¹⁶ cm^?2 of 150 keV N⁺ ions and with the doses of 6 × 10¹²-1.5 × 10¹⁵ cm^?2 of 150 keV Cd⁺ ions. Room temperature implantations were also performed to see the influence of temperature on defect production. Rutherford backscattering and channelling techniques were used to determine damage in crystals. The damage distributions calculated from the RBS spectra have been compared with the results of Monte-Carlo simulation of the defect creation.

The estimated threshold damage density appeared to be independent on ion mass and is equal 6.5 × 10²⁰ keV/cm³. It is suggested that amorphization of GaP is well explained on the basis of a homogenous model.     

Optical properties of Yb3+ ions in fluorophosphate glasses for 1.0 μm solid-state infrared lasers

Yb³⁺-doped fluorophosphate glasses were prepared by melt-quenching technique and characterized their spectroscopic properties to assess the laser performance parameters. The magnitude of absorption (emission) cross-sections at 975 nm for all the studied Yb³⁺-doped glasses is found to be in the range of 0.29–1.50 × 10^?20 (0.59–1.99 × 10^?20 cm²) which is much higher than those of commercial Kigre QX/Yb: 1.06 × 10^?20 (0.5 × 10^?20 cm²) laser glass. The luminescence lifetimes of ²F_5/2 level decrease (1.15–0.45 ms) with increase in Yb₂O₃ concentration (0.1–4.0 mol%). Effect of OH^? content on luminescence properties of Yb³⁺ ions has also been investigated. The effect of radiative trapping has been discussed by using McCumber (McC) and Fuchtbauer–Ladenburge (F–L) methods. The product of experimental lifetimes and emission cross-sections for 0.1 mol% Yb₂O₃-doped glass is found to be 2.28 × 10^?20 cm² ms which indicates that the higher energy storage and extraction capability could be possible. The detailed spectroscopic results suggest that the studied glasses can be considered for high-power and ultrashort pulse laser applications.     

Effects of silicon negative ion implantation in semi-insulating gallium arsenide

ABSTRACT

In the present work, effects of silicon negative ion implantation into semi-insulating gallium arsenide (GaAs) samples with fluences varying between 1?×?10¹⁵ and 4?×?10¹⁷?ions?cm^?2 at 100?keV have been described. Atomic force microscopic images obtained from samples implanted with fluence up to 1?×?10¹⁷?ion?cm^?2 showed the formation of GaAs clusters on the surface of the sample. The shape, size and density of these clusters were found to depend on ion fluence. Whereas sample implanted at higher fluence of 4?×?10¹⁷?ions?cm^?2 showed bump of arbitrary shapes due to cumulative effect of multiple silicon ion impact with GaAs on the same place. GXRD study revealed formation of silicon crystallites in the gallium arsenide sample after implantation. The silicon crystallite size estimated from the full width at half maxima of silicon (111) XRD peak using Debye-Scherrer formula was found to vary between 1.72 and 1.87?nm with respect to ion fluence. Hall measurement revealed the formation of n-type layer in gallium arsenide samples. The current–voltage measurement of the sample implanted with different fluences exhibited the diode like behavior.     

Two-dimensional electron-hole system in a HgTe-based quantum well

A two-dimensional electron-hole system consisting of light high-mobility electrons with a density of N _s = (4–7) × 10¹⁰ cm^?2 and a mobility of μ _n = (4–6) × 10⁵ cm²/V s and heavier low-mobility holes with a density of P _s = (0.7–1.6) × 10¹¹ cm^?2 and a mobility of μ _p = (3–7) × 10⁴ cm²/V s has been discovered in a quantum well based on mercury telluride with the (013) surface orientation. The system exhibits a number of specific magnetotransport properties in both the classical magnetotransport (positive magnetoresistance and alternating Hall effect) and the quantum Hall effect regime. These properties are associated with the coexistence of two-dimensional electrons and holes.     

The moment of inertia of the proto neutron star PSR J0348+0432 under neutrino trapped

The moment of inertia of the proto neutron star PSR J0348+0432 is studied in the framework of relativistic mean field theory under neutrino trapped. We find that the temperature of the PNS PSR J0348+0432 increases with the increase of the baryon number density and at the center of the star it is in the range T_c = 41.662–45.685 MeV. Corresponding to the observation mass 1.97–2.05 M_⊙, the radius of the NS PSR J0348+0432 is in the range 12.948–12.16 km whereas that of the PNS PSR J0348+0432 is in the range 14.46–13.561 km. The radius of the PNS PSR J0348+0432 has increased by 11.7%–11.5% compared with that of the NS PSR J0348+0432. The central moment of inertia of the PNS PSR J0348+0432 is in the range 2.207?×?10⁴⁵–1.914?×?10⁴⁵ g cm² whereas that of the NS PSR J0348+0432 is only in the range 1.9?×?10⁴⁵–1.552?×?10⁴⁵ g cm². Compared with the moment of inertia of the NS PSR J0348+0432, the central moment of inertia of the PNS PSR J0348+0432 increases by 16%–23%.